{"id":"https://openalex.org/W2594921997","doi":"https://doi.org/10.1109/tie.2017.2677348","title":"Evaluation of SiC Schottky Diodes Using Pressure Contacts","display_name":"Evaluation of SiC Schottky Diodes Using Pressure Contacts","publication_year":2017,"publication_date":"2017-03-02","ids":{"openalex":"https://openalex.org/W2594921997","doi":"https://doi.org/10.1109/tie.2017.2677348","mag":"2594921997"},"language":"en","primary_location":{"id":"doi:10.1109/tie.2017.2677348","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2017.2677348","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://nottingham-repository.worktribe.com/output/966117","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5046587401","display_name":"Jose Ortiz Gonzalez","orcid":"https://orcid.org/0000-0002-1461-3735"},"institutions":[{"id":"https://openalex.org/I39555362","display_name":"University of Warwick","ror":"https://ror.org/01a77tt86","country_code":"GB","type":"education","lineage":["https://openalex.org/I39555362"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Jose Ortiz Gonzalez","raw_affiliation_strings":["School of Engineering, University of Warwick, Coventry, U.K"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Engineering, University of Warwick, Coventry, U.K","institution_ids":["https://openalex.org/I39555362"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030984031","display_name":"Olayiwola Alatise","orcid":"https://orcid.org/0000-0003-0993-2624"},"institutions":[{"id":"https://openalex.org/I39555362","display_name":"University of Warwick","ror":"https://ror.org/01a77tt86","country_code":"GB","type":"education","lineage":["https://openalex.org/I39555362"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Olayiwola Alatise","raw_affiliation_strings":["School of Engineering, University of Warwick, Coventry, U.K"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Engineering, University of Warwick, Coventry, U.K","institution_ids":["https://openalex.org/I39555362"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5055977986","display_name":"Attahir Murtala Aliyu","orcid":"https://orcid.org/0000-0001-8978-8516"},"institutions":[{"id":"https://openalex.org/I142263535","display_name":"University of Nottingham","ror":"https://ror.org/01ee9ar58","country_code":"GB","type":"education","lineage":["https://openalex.org/I142263535"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Attahir Murtala Aliyu","raw_affiliation_strings":["Power Electronics, Machines and Control Group, University of Nottingham, Nottingham, U.K"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Power Electronics, Machines and Control Group, University of Nottingham, Nottingham, U.K","institution_ids":["https://openalex.org/I142263535"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003453747","display_name":"Pushparajah Rajaguru","orcid":"https://orcid.org/0000-0002-6041-0517"},"institutions":[{"id":"https://openalex.org/I55060895","display_name":"University of Greenwich","ror":"https://ror.org/00bmj0a71","country_code":"GB","type":"education","lineage":["https://openalex.org/I55060895"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Pushparajah Rajaguru","raw_affiliation_strings":["Computational Mechanics and Reliability Group, University of Greenwich, London, U.K"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Computational Mechanics and Reliability Group, University of Greenwich, London, U.K","institution_ids":["https://openalex.org/I55060895"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056248361","display_name":"Alberto Castellazzi","orcid":"https://orcid.org/0000-0003-0079-3293"},"institutions":[{"id":"https://openalex.org/I142263535","display_name":"University of Nottingham","ror":"https://ror.org/01ee9ar58","country_code":"GB","type":"education","lineage":["https://openalex.org/I142263535"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Alberto Castellazzi","raw_affiliation_strings":["Power Electronics, Machines and Control Group, University of Nottingham, Nottingham, U.K"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Power Electronics, Machines and Control Group, University of Nottingham, Nottingham, U.K","institution_ids":["https://openalex.org/I142263535"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100428090","display_name":"Li Ran","orcid":"https://orcid.org/0000-0002-9626-6799"},"institutions":[{"id":"https://openalex.org/I39555362","display_name":"University of Warwick","ror":"https://ror.org/01a77tt86","country_code":"GB","type":"education","lineage":["https://openalex.org/I39555362"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Li Ran","raw_affiliation_strings":["School of Engineering, University of Warwick, Coventry, U.K"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Engineering, University of Warwick, Coventry, U.K","institution_ids":["https://openalex.org/I39555362"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011209376","display_name":"Philip Mawby","orcid":"https://orcid.org/0000-0002-7800-5536"},"institutions":[{"id":"https://openalex.org/I39555362","display_name":"University of Warwick","ror":"https://ror.org/01a77tt86","country_code":"GB","type":"education","lineage":["https://openalex.org/I39555362"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Philip A. Mawby","raw_affiliation_strings":["School of Engineering, University of Warwick, Coventry, U.K"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Engineering, University of Warwick, Coventry, U.K","institution_ids":["https://openalex.org/I39555362"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5060460052","display_name":"C. Bailey","orcid":"https://orcid.org/0000-0002-9438-3879"},"institutions":[{"id":"https://openalex.org/I55060895","display_name":"University of Greenwich","ror":"https://ror.org/00bmj0a71","country_code":"GB","type":"education","lineage":["https://openalex.org/I55060895"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Chris Bailey","raw_affiliation_strings":["Computational Mechanics and Reliability Group, University of Greenwich, London, U.K"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Computational Mechanics and Reliability Group, University of Greenwich, London, U.K","institution_ids":["https://openalex.org/I55060895"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.8446,"has_fulltext":false,"cited_by_count":17,"citation_normalized_percentile":{"value":0.74375967,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"64","issue":"10","first_page":"8213","last_page":"8223"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.996999979019165,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11102","display_name":"HVDC Systems and Fault Protection","score":0.9954000115394592,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/schottky-diode","display_name":"Schottky diode","score":0.8527113199234009},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.833444356918335},{"id":"https://openalex.org/keywords/diode","display_name":"Diode","score":0.7369108200073242},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.6804362535476685},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5743980407714844},{"id":"https://openalex.org/keywords/power-semiconductor-device","display_name":"Power semiconductor device","score":0.5565057396888733},{"id":"https://openalex.org/keywords/silicon-carbide","display_name":"Silicon carbide","score":0.4710012972354889},{"id":"https://openalex.org/keywords/wide-bandgap-semiconductor","display_name":"Wide-bandgap semiconductor","score":0.46672549843788147},{"id":"https://openalex.org/keywords/pin-diode","display_name":"PIN diode","score":0.45517849922180176},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4418468177318573},{"id":"https://openalex.org/keywords/power-module","display_name":"Power module","score":0.4412304759025574},{"id":"https://openalex.org/keywords/antiparallel","display_name":"Antiparallel (mathematics)","score":0.4175138473510742},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.40078005194664},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.22405794262886047},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.11651453375816345},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.09387335181236267}],"concepts":[{"id":"https://openalex.org/C205200001","wikidata":"https://www.wikidata.org/wiki/Q176066","display_name":"Schottky diode","level":3,"score":0.8527113199234009},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.833444356918335},{"id":"https://openalex.org/C78434282","wikidata":"https://www.wikidata.org/wiki/Q11656","display_name":"Diode","level":2,"score":0.7369108200073242},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.6804362535476685},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5743980407714844},{"id":"https://openalex.org/C129014197","wikidata":"https://www.wikidata.org/wiki/Q906544","display_name":"Power semiconductor device","level":3,"score":0.5565057396888733},{"id":"https://openalex.org/C2780722187","wikidata":"https://www.wikidata.org/wiki/Q412356","display_name":"Silicon carbide","level":2,"score":0.4710012972354889},{"id":"https://openalex.org/C189278905","wikidata":"https://www.wikidata.org/wiki/Q2157708","display_name":"Wide-bandgap semiconductor","level":2,"score":0.46672549843788147},{"id":"https://openalex.org/C52236655","wikidata":"https://www.wikidata.org/wiki/Q2628074","display_name":"PIN diode","level":3,"score":0.45517849922180176},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4418468177318573},{"id":"https://openalex.org/C141812795","wikidata":"https://www.wikidata.org/wiki/Q7236534","display_name":"Power module","level":3,"score":0.4412304759025574},{"id":"https://openalex.org/C142089489","wikidata":"https://www.wikidata.org/wiki/Q1053976","display_name":"Antiparallel (mathematics)","level":3,"score":0.4175138473510742},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.40078005194664},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.22405794262886047},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.11651453375816345},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.09387335181236267},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C115260700","wikidata":"https://www.wikidata.org/wiki/Q11408","display_name":"Magnetic field","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":4,"locations":[{"id":"doi:10.1109/tie.2017.2677348","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2017.2677348","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"},{"id":"pmh:oai:gala.gre.ac.uk:17115","is_oa":false,"landing_page_url":null,"pdf_url":null,"source":{"id":"https://openalex.org/S4306401244","display_name":"Greenwich Academic Literature Archive (University of Greenwich)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I55060895","host_organization_name":"University of Greenwich","host_organization_lineage":["https://openalex.org/I55060895"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":"","raw_type":"Article"},{"id":"pmh:oai:eprints.nottingham.ac.uk:44371","is_oa":false,"landing_page_url":"http://ieeexplore.ieee.org/document/7869354/","pdf_url":null,"source":{"id":"https://openalex.org/S4306402014","display_name":"Nottingham ePrints (University of Nottingham)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I142263535","host_organization_name":"University of Nottingham","host_organization_lineage":["https://openalex.org/I142263535"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Article"},{"id":"pmh:oai:nottingham-repository.worktribe.com:966117","is_oa":true,"landing_page_url":"https://nottingham-repository.worktribe.com/output/966117","pdf_url":null,"source":{"id":"https://openalex.org/S4306402483","display_name":"Repository@Nottingham (University of Nottingham)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I142263535","host_organization_name":"University of Nottingham","host_organization_lineage":["https://openalex.org/I142263535"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Journal Article"}],"best_oa_location":{"id":"pmh:oai:nottingham-repository.worktribe.com:966117","is_oa":true,"landing_page_url":"https://nottingham-repository.worktribe.com/output/966117","pdf_url":null,"source":{"id":"https://openalex.org/S4306402483","display_name":"Repository@Nottingham (University of Nottingham)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I142263535","host_organization_name":"University of Nottingham","host_organization_lineage":["https://openalex.org/I142263535"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Journal Article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.8299999833106995,"display_name":"Affordable and clean energy"}],"awards":[{"id":"https://openalex.org/G2221575920","display_name":"Underpinning Power Electronics 2012: Devices Theme","funder_award_id":"EP/L007010/1","funder_id":"https://openalex.org/F4320334627","funder_display_name":"Engineering and Physical Sciences Research Council"},{"id":"https://openalex.org/G3201286531","display_name":null,"funder_award_id":"EP/K035304/1","funder_id":"https://openalex.org/F4320334627","funder_display_name":"Engineering and Physical Sciences Research Council"},{"id":"https://openalex.org/G324759819","display_name":null,"funder_award_id":"EP/L007010/1","funder_id":"https://openalex.org/F4320334627","funder_display_name":"Engineering and Physical Sciences Research Council"},{"id":"https://openalex.org/G5529577317","display_name":"Underpinning Power Electronics 2012: Hub","funder_award_id":"EP/K035304/1","funder_id":"https://openalex.org/F4320334627","funder_display_name":"Engineering and Physical Sciences Research Council"},{"id":"https://openalex.org/G5545152593","display_name":"Underpinning Power Electronics 2012: Components Theme","funder_award_id":"EP/K034804/1","funder_id":"https://openalex.org/F4320334627","funder_display_name":"Engineering and Physical Sciences Research Council"},{"id":"https://openalex.org/G8389130158","display_name":null,"funder_award_id":"EP/K034804/1","funder_id":"https://openalex.org/F4320334627","funder_display_name":"Engineering and Physical Sciences Research Council"}],"funders":[{"id":"https://openalex.org/F4320334627","display_name":"Engineering and Physical Sciences Research Council","ror":"https://ror.org/0439y7842"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":29,"referenced_works":["https://openalex.org/W267840210","https://openalex.org/W1027468591","https://openalex.org/W1641947315","https://openalex.org/W1909791061","https://openalex.org/W1987278992","https://openalex.org/W2004731663","https://openalex.org/W2015928941","https://openalex.org/W2017148518","https://openalex.org/W2024878069","https://openalex.org/W2026012753","https://openalex.org/W2031534830","https://openalex.org/W2049000331","https://openalex.org/W2054996043","https://openalex.org/W2055896144","https://openalex.org/W2086092207","https://openalex.org/W2103194180","https://openalex.org/W2104182114","https://openalex.org/W2106349405","https://openalex.org/W2144325198","https://openalex.org/W2156481705","https://openalex.org/W2167926720","https://openalex.org/W2225578340","https://openalex.org/W2251987984","https://openalex.org/W2434493045","https://openalex.org/W2520264389","https://openalex.org/W2550484295","https://openalex.org/W3142168324","https://openalex.org/W6689241413","https://openalex.org/W6729559499"],"related_works":["https://openalex.org/W4317382130","https://openalex.org/W2182475138","https://openalex.org/W2207954180","https://openalex.org/W2077026322","https://openalex.org/W2095002504","https://openalex.org/W4384158566","https://openalex.org/W1508568262","https://openalex.org/W3207919737","https://openalex.org/W2568603120","https://openalex.org/W2363801810"],"abstract_inverted_index":{"The":[0,119,155],"thermomechanical":[1],"reliability":[2,147],"of":[3,12,95,128,138,148,157,164],"SiC":[4,87,129,149],"power":[5,19],"devices":[6,166],"and":[7,29,146],"modules":[8],"is":[9,22,76,85,122,167],"increasingly":[10],"becoming":[11],"interest":[13],"especially":[14],"for":[15,38,60,71],"high-power":[16,39,67],"applications,":[17,68],"where":[18],"cycling":[20],"performance":[21],"critical.":[23,86],"Press-pack":[24],"assemblies":[25],"are":[26,115],"a":[27,77],"trusted":[28],"reliable":[30],"packaging":[31],"solution":[32],"that":[33],"has":[34],"traditionally":[35],"been":[36],"used":[37],"thyristor-based":[40],"applications":[41],"in":[42,152],"FACTS/HVDC,":[43],"although":[44],"press-pack":[45,54,153],"IGBTs":[46,55],"have":[47,106],"become":[48],"commercially":[49],"available":[50],"more":[51,116],"recently.":[52],"These":[53],"require":[56],"antiparallel":[57],"PiN":[58,102,139],"diodes":[59,89,131,151],"enabling":[61],"reverse":[62],"conduction":[63,74],"capability.":[64],"In":[65],"these":[66],"paralleling":[69],"chips":[70],"high":[72],"current":[73,83],"capability":[75],"requirement,":[78],"hence,":[79],"electrothermal":[80,162],"stability":[81,163],"during":[82],"sharing":[84],"Schottky":[88,130,150],"not":[90],"only":[91],"exhibit":[92],"the":[93,125,135,144,161],"advantages":[94],"wide":[96],"bandgap":[97],"technology":[98],"compared":[99],"to":[100,124,134],"silicon":[101],"diodes,":[103],"but":[104],"they":[105,114],"significantly":[107],"lower":[108,120],"zero":[109],"temperature":[110],"coefficient":[111],"(ZTC),":[112],"meaning":[113],"electrothermally":[117],"stable.":[118],"ZTC":[121],"due":[123],"unipolar":[126],"nature":[127,137],"as":[132],"opposed":[133],"bipolar":[136],"diodes.":[140],"This":[141],"paper":[142],"investigates":[143],"implementation":[145],"assemblies.":[154],"impact":[156],"pressure":[158],"loss":[159],"on":[160],"parallel":[165],"investigated.":[168]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":3},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":1}],"updated_date":"2026-07-02T09:51:11.867554","created_date":"2025-10-10T00:00:00"}