{"id":"https://openalex.org/W2549039965","doi":"https://doi.org/10.1109/tie.2016.2623582","title":"Fault-Tolerant Control for an Internet-Based Three-Tank System: Accommodation to Sensor Bias Faults","display_name":"Fault-Tolerant Control for an Internet-Based Three-Tank System: Accommodation to Sensor Bias Faults","publication_year":2016,"publication_date":"2016-11-01","ids":{"openalex":"https://openalex.org/W2549039965","doi":"https://doi.org/10.1109/tie.2016.2623582","mag":"2549039965"},"language":"en","primary_location":{"id":"doi:10.1109/tie.2016.2623582","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2016.2623582","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5042605160","display_name":"Xiao He","orcid":"https://orcid.org/0000-0003-3998-7060"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiao He","raw_affiliation_strings":["Department of Automation, Tsinghua University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Automation, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100699858","display_name":"Zidong Wang","orcid":"https://orcid.org/0000-0002-9576-7401"},"institutions":[{"id":"https://openalex.org/I59433898","display_name":"Brunel University of London","ror":"https://ror.org/00dn4t376","country_code":"GB","type":"education","lineage":["https://openalex.org/I124357947","https://openalex.org/I59433898"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Zidong Wang","raw_affiliation_strings":["Department of Computer Science, Brunel University London, London, U.K"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science, Brunel University London, London, U.K","institution_ids":["https://openalex.org/I59433898"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100605759","display_name":"Yang Liu","orcid":"https://orcid.org/0000-0003-0253-0358"},"institutions":[{"id":"https://openalex.org/I80143920","display_name":"Shandong University of Science and Technology","ror":"https://ror.org/04gtjhw98","country_code":"CN","type":"education","lineage":["https://openalex.org/I80143920"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yang Liu","raw_affiliation_strings":["College of Electrical Engineering and Automation, Shandong University of Science and Technology, Qingdao, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Electrical Engineering and Automation, Shandong University of Science and Technology, Qingdao, China","institution_ids":["https://openalex.org/I80143920"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044288415","display_name":"Li\u2010Guo Qin","orcid":"https://orcid.org/0000-0003-1802-5532"},"institutions":[{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Liguo Qin","raw_affiliation_strings":["Department of Automation, Tsinghua University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Automation, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5001517167","display_name":"Donghua Zhou","orcid":"https://orcid.org/0000-0003-0169-8490"},"institutions":[{"id":"https://openalex.org/I80143920","display_name":"Shandong University of Science and Technology","ror":"https://ror.org/04gtjhw98","country_code":"CN","type":"education","lineage":["https://openalex.org/I80143920"]},{"id":"https://openalex.org/I99065089","display_name":"Tsinghua University","ror":"https://ror.org/03cve4549","country_code":"CN","type":"education","lineage":["https://openalex.org/I99065089"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Donghua Zhou","raw_affiliation_strings":["College of Electrical Engineering and Automation, Shandong University of Science and Technology, Qingdao, China","Department of Automation, Tsinghua University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Electrical Engineering and Automation, Shandong University of Science and Technology, Qingdao, China","institution_ids":["https://openalex.org/I80143920"]},{"raw_affiliation_string":"Department of Automation, Tsinghua University, Beijing, China","institution_ids":["https://openalex.org/I99065089"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":7.5608,"has_fulltext":false,"cited_by_count":96,"citation_normalized_percentile":{"value":0.97463567,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":95,"max":100},"biblio":{"volume":"64","issue":"3","first_page":"2266","last_page":"2275"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10791","display_name":"Advanced Control Systems Optimization","score":0.9947999715805054,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10080","display_name":"Energy Efficient Wireless Sensor Networks","score":0.9768000245094299,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6812999248504639},{"id":"https://openalex.org/keywords/fault-indicator","display_name":"Fault indicator","score":0.6750844717025757},{"id":"https://openalex.org/keywords/stuck-at-fault","display_name":"Stuck-at fault","score":0.5636842846870422},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.5604314208030701},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.5576481819152832},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.5151532888412476},{"id":"https://openalex.org/keywords/residual","display_name":"Residual","score":0.5149579644203186},{"id":"https://openalex.org/keywords/control-reconfiguration","display_name":"Control reconfiguration","score":0.511859118938446},{"id":"https://openalex.org/keywords/network-packet","display_name":"Network packet","score":0.49786829948425293},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.4759361743927002},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.47047027945518494},{"id":"https://openalex.org/keywords/filter","display_name":"Filter (signal processing)","score":0.4597814679145813},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.435380756855011},{"id":"https://openalex.org/keywords/control-system","display_name":"Control system","score":0.4331301152706146},{"id":"https://openalex.org/keywords/dropout","display_name":"Dropout (neural networks)","score":0.4257054924964905},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4033159911632538},{"id":"https://openalex.org/keywords/control-engineering","display_name":"Control engineering","score":0.35267651081085205},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.21068525314331055},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.19127044081687927},{"id":"https://openalex.org/keywords/control","display_name":"Control (management)","score":0.1798635721206665},{"id":"https://openalex.org/keywords/actuator","display_name":"Actuator","score":0.13241076469421387},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.12748724222183228},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.11650589108467102},{"id":"https://openalex.org/keywords/computer-network","display_name":"Computer network","score":0.10429885983467102},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.07436078786849976}],"concepts":[{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6812999248504639},{"id":"https://openalex.org/C21267803","wikidata":"https://www.wikidata.org/wiki/Q5438159","display_name":"Fault indicator","level":4,"score":0.6750844717025757},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.5636842846870422},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.5604314208030701},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.5576481819152832},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.5151532888412476},{"id":"https://openalex.org/C155512373","wikidata":"https://www.wikidata.org/wiki/Q287450","display_name":"Residual","level":2,"score":0.5149579644203186},{"id":"https://openalex.org/C119701452","wikidata":"https://www.wikidata.org/wiki/Q5165881","display_name":"Control reconfiguration","level":2,"score":0.511859118938446},{"id":"https://openalex.org/C158379750","wikidata":"https://www.wikidata.org/wiki/Q214111","display_name":"Network packet","level":2,"score":0.49786829948425293},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.4759361743927002},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.47047027945518494},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.4597814679145813},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.435380756855011},{"id":"https://openalex.org/C17500928","wikidata":"https://www.wikidata.org/wiki/Q959968","display_name":"Control system","level":2,"score":0.4331301152706146},{"id":"https://openalex.org/C2776145597","wikidata":"https://www.wikidata.org/wiki/Q25339462","display_name":"Dropout (neural networks)","level":2,"score":0.4257054924964905},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4033159911632538},{"id":"https://openalex.org/C133731056","wikidata":"https://www.wikidata.org/wiki/Q4917288","display_name":"Control engineering","level":1,"score":0.35267651081085205},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.21068525314331055},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.19127044081687927},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.1798635721206665},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.13241076469421387},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.12748724222183228},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.11650589108467102},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.10429885983467102},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.07436078786849976},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tie.2016.2623582","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2016.2623582","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1576489429","display_name":null,"funder_award_id":"61490701","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G188555455","display_name":null,"funder_award_id":"61273156","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G4022434662","display_name":null,"funder_award_id":"61522309","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G7697070187","display_name":null,"funder_award_id":"61473163","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G7841354962","display_name":null,"funder_award_id":"61210012","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":40,"referenced_works":["https://openalex.org/W108857541","https://openalex.org/W1494628843","https://openalex.org/W1544497799","https://openalex.org/W1654016072","https://openalex.org/W1880947799","https://openalex.org/W1979706043","https://openalex.org/W1982187748","https://openalex.org/W1982695012","https://openalex.org/W1984672166","https://openalex.org/W1992524006","https://openalex.org/W1997713206","https://openalex.org/W2017936975","https://openalex.org/W2023883274","https://openalex.org/W2030300389","https://openalex.org/W2034896936","https://openalex.org/W2037660732","https://openalex.org/W2051913506","https://openalex.org/W2060515809","https://openalex.org/W2061684497","https://openalex.org/W2062074596","https://openalex.org/W2065354259","https://openalex.org/W2077853471","https://openalex.org/W2079844094","https://openalex.org/W2084729587","https://openalex.org/W2095509930","https://openalex.org/W2124367922","https://openalex.org/W2128187465","https://openalex.org/W2128969277","https://openalex.org/W2139494503","https://openalex.org/W2142991906","https://openalex.org/W2150465821","https://openalex.org/W2152520525","https://openalex.org/W2156279034","https://openalex.org/W2159550366","https://openalex.org/W2161258584","https://openalex.org/W2176616346","https://openalex.org/W2335509095","https://openalex.org/W2520654854","https://openalex.org/W3040830169","https://openalex.org/W4231980343"],"related_works":["https://openalex.org/W3148663848","https://openalex.org/W3186790058","https://openalex.org/W2024194466","https://openalex.org/W2051500795","https://openalex.org/W2566529656","https://openalex.org/W2163103195","https://openalex.org/W1978303825","https://openalex.org/W1974225921","https://openalex.org/W2390533148","https://openalex.org/W2386936363"],"abstract_inverted_index":{"This":[0],"paper":[1,157],"focuses":[2],"on":[3,142,164],"the":[4,14,50,59,68,88,93,103,110,115,125,143,148,165,172,175,178],"fault-tolerant":[5,43,136],"control":[6,44,137],"problem":[7],"for":[8,38],"an":[9,26,77,161],"Internet-based":[10,22,167],"three-tank":[11,23,168],"system":[12,24,37],"in":[13,49,55,124,155],"presence":[15],"of":[16,177],"possible":[17],"sensor":[18,69],"bias":[19,70,81],"faults.":[20],"The":[21,151],"is":[25,53,65,74,117,132,139,158],"experimental":[27,162],"setup":[28],"that":[29],"can":[30,83,105,120],"be":[31,84,106,121],"regarded":[32],"as":[33,67],"a":[34,98,135],"typical":[35],"networked":[36,40],"evaluating":[39],"fault-diagnosis":[41,149],"and":[42,58,97,134,174],"methods.":[45],"Packet":[46],"dropout":[47],"phenomenon":[48],"sensor-to-controller":[51],"link":[52],"considered":[54],"this":[56,156],"paper,":[57],"fault":[60,94,104,116,129,144],"type":[61],"we":[62],"deal":[63],"with":[64],"chosen":[66],"fault.":[71],"Fault-diagnosis":[72],"unit":[73],"designed":[75],"toward":[76],"auxiliary":[78],"system.":[79,169],"Sensor":[80],"faults":[82],"detected":[85],"by":[86,92,108,147],"comparing":[87],"residual":[89,111],"signal":[90],"generated":[91],"detection":[95],"filter":[96],"prescribed":[99],"threshold.":[100],"After":[101],"that,":[102],"isolated":[107],"using":[109],"analysis":[112],"approach.":[113],"Once":[114],"isolated,":[118],"it":[119],"estimated":[122],"iteratively":[123],"least-squares":[126],"sense.":[127],"A":[128],"accommodation":[130],"method":[131],"proposed,":[133],"strategy":[138],"achieved":[140],"based":[141],"information":[145],"provided":[146],"unit.":[150],"approach":[152],"brought":[153],"forward":[154],"demonstrated":[159],"via":[160],"study":[163],"practical":[166],"Results":[170],"show":[171],"effectiveness":[173],"applicability":[176],"proposed":[179],"techniques.":[180]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":7},{"year":2024,"cited_by_count":9},{"year":2023,"cited_by_count":8},{"year":2022,"cited_by_count":13},{"year":2021,"cited_by_count":11},{"year":2020,"cited_by_count":19},{"year":2019,"cited_by_count":10},{"year":2018,"cited_by_count":11},{"year":2017,"cited_by_count":7}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}