{"id":"https://openalex.org/W2538208118","doi":"https://doi.org/10.1109/tie.2016.2619322","title":"Scheduled Health Monitoring of Hybrid Systems With Multiple Distinct Faults","display_name":"Scheduled Health Monitoring of Hybrid Systems With Multiple Distinct Faults","publication_year":2016,"publication_date":"2016-10-19","ids":{"openalex":"https://openalex.org/W2538208118","doi":"https://doi.org/10.1109/tie.2016.2619322","mag":"2538208118"},"language":"en","primary_location":{"id":"doi:10.1109/tie.2016.2619322","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2016.2619322","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5076920288","display_name":"Ming Yu","orcid":"https://orcid.org/0000-0003-3703-9163"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ming Yu","raw_affiliation_strings":["School of Electrical Engineering and Automation, Hefei University of Technology, Hefei, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Automation, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004388039","display_name":"Hao Xia","orcid":"https://orcid.org/0000-0003-1041-3880"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hao Xia","raw_affiliation_strings":["School of Electrical Engineering and Automation, Hefei University of Technology, Hefei, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Automation, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020019416","display_name":"Yigang He","orcid":"https://orcid.org/0000-0002-6642-0740"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yigang He","raw_affiliation_strings":["School of Electrical Engineering and Automation, Hefei University of Technology, Hefei, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Automation, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009768180","display_name":"Hai Wang","orcid":"https://orcid.org/0000-0003-2789-9530"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hai Wang","raw_affiliation_strings":["School of Electrical Engineering and Automation, Hefei University of Technology, Hefei, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Automation, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010836733","display_name":"Canghua Jiang","orcid":"https://orcid.org/0000-0003-4061-3031"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Canghua Jiang","raw_affiliation_strings":["School of Electrical Engineering and Automation, Hefei University of Technology, Hefei, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Automation, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101968485","display_name":"Si Chen","orcid":"https://orcid.org/0000-0002-2071-054X"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Si Chen","raw_affiliation_strings":["School of Electrical Engineering and Automation, Hefei University of Technology, Hefei, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Automation, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5104805558","display_name":"Mengxin Li","orcid":"https://orcid.org/0009-0000-9855-1334"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Mengxin Li","raw_affiliation_strings":["School of Electrical Engineering and Automation, Hefei University of Technology, Hefei, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Automation, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5003856310","display_name":"Juan Xu","orcid":"https://orcid.org/0000-0002-6626-1700"},"institutions":[{"id":"https://openalex.org/I16365422","display_name":"Hefei University of Technology","ror":"https://ror.org/02czkny70","country_code":"CN","type":"education","lineage":["https://openalex.org/I16365422"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Juan Xu","raw_affiliation_strings":["School of Automobile and Transportation Engineering, Hefei University of Technology, Hefei, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Automobile and Transportation Engineering, Hefei University of Technology, Hefei, China","institution_ids":["https://openalex.org/I16365422"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":8,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.8902,"has_fulltext":false,"cited_by_count":25,"citation_normalized_percentile":{"value":0.8709315,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":"64","issue":"2","first_page":"1517","last_page":"1528"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10663","display_name":"Advanced Battery Technologies Research","score":0.9968000054359436,"subfield":{"id":"https://openalex.org/subfields/2203","display_name":"Automotive Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13717","display_name":"Advanced Algorithms and Applications","score":0.9740999937057495,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6164441704750061},{"id":"https://openalex.org/keywords/estimator","display_name":"Estimator","score":0.601520836353302},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.5931699872016907},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.549592912197113},{"id":"https://openalex.org/keywords/scheduling","display_name":"Scheduling (production processes)","score":0.46692773699760437},{"id":"https://openalex.org/keywords/fault-indicator","display_name":"Fault indicator","score":0.45321741700172424},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.4438537061214447},{"id":"https://openalex.org/keywords/filter","display_name":"Filter (signal processing)","score":0.43880704045295715},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.43123796582221985},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.4282560646533966},{"id":"https://openalex.org/keywords/estimation","display_name":"Estimation","score":0.4271836578845978},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3465583920478821},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.12491363286972046},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.09006699919700623},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.0858449637889862},{"id":"https://openalex.org/keywords/systems-engineering","display_name":"Systems engineering","score":0.06146398186683655}],"concepts":[{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6164441704750061},{"id":"https://openalex.org/C185429906","wikidata":"https://www.wikidata.org/wiki/Q1130160","display_name":"Estimator","level":2,"score":0.601520836353302},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.5931699872016907},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.549592912197113},{"id":"https://openalex.org/C206729178","wikidata":"https://www.wikidata.org/wiki/Q2271896","display_name":"Scheduling (production processes)","level":2,"score":0.46692773699760437},{"id":"https://openalex.org/C21267803","wikidata":"https://www.wikidata.org/wiki/Q5438159","display_name":"Fault indicator","level":4,"score":0.45321741700172424},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.4438537061214447},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.43880704045295715},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.43123796582221985},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.4282560646533966},{"id":"https://openalex.org/C96250715","wikidata":"https://www.wikidata.org/wiki/Q965330","display_name":"Estimation","level":2,"score":0.4271836578845978},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3465583920478821},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.12491363286972046},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.09006699919700623},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0858449637889862},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.06146398186683655},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tie.2016.2619322","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2016.2619322","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"},{"id":"pmh:oai:researchrepository.murdoch.edu.au:53390","is_oa":false,"landing_page_url":"https://researchrepository.murdoch.edu.au/id/eprint/53390/","pdf_url":null,"source":{"id":"https://openalex.org/S4306400274","display_name":"Murdoch Research Repository (Murdoch University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I176790772","host_organization_name":"Murdoch University","host_organization_lineage":["https://openalex.org/I176790772"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"  Yu, M., Xia, H., He, Y., Wang, H. <https://researchrepository.murdoch.edu.au/view/author/Wang, Hai.html>ORCID: 0000-0003-2789-9530 <http://orcid.org/0000-0003-2789-9530>, Jiang, C., Chen, S., Li, M. and Xu, J.   (2017)  Scheduled health monitoring of hybrid systems with multiple distinct faults.    IEEE Transactions on Industrial Electronics, 64  (2).   pp. 1517-1528.  ","raw_type":"Journal Article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1275970061","display_name":null,"funder_award_id":"61673154","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G5549287422","display_name":null,"funder_award_id":"61503113","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G6496176865","display_name":null,"funder_award_id":"51577046","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":39,"referenced_works":["https://openalex.org/W1015042224","https://openalex.org/W1513008779","https://openalex.org/W1597576211","https://openalex.org/W1628954589","https://openalex.org/W1979663416","https://openalex.org/W1989716375","https://openalex.org/W1995430360","https://openalex.org/W1995927826","https://openalex.org/W2002546114","https://openalex.org/W2005523062","https://openalex.org/W2020215991","https://openalex.org/W2033336377","https://openalex.org/W2037250283","https://openalex.org/W2075143718","https://openalex.org/W2078279667","https://openalex.org/W2089477254","https://openalex.org/W2098729161","https://openalex.org/W2105091160","https://openalex.org/W2106290330","https://openalex.org/W2106944202","https://openalex.org/W2106970315","https://openalex.org/W2109559642","https://openalex.org/W2129039806","https://openalex.org/W2134788745","https://openalex.org/W2140654319","https://openalex.org/W2142724780","https://openalex.org/W2145769223","https://openalex.org/W2145909043","https://openalex.org/W2160337655","https://openalex.org/W2187422466","https://openalex.org/W2265081862","https://openalex.org/W2293935233","https://openalex.org/W2342265232","https://openalex.org/W3005511161","https://openalex.org/W3149179730","https://openalex.org/W4294719703","https://openalex.org/W4298330376","https://openalex.org/W6675951399","https://openalex.org/W6774024813"],"related_works":["https://openalex.org/W3171530565","https://openalex.org/W3186790058","https://openalex.org/W2024194466","https://openalex.org/W3148663848","https://openalex.org/W2051500795","https://openalex.org/W2163103195","https://openalex.org/W4210447066","https://openalex.org/W2896156965","https://openalex.org/W1974225921","https://openalex.org/W4389064908"],"abstract_inverted_index":{"Health":[0],"monitoring":[1,69],"of":[2,27,57,111,135,146],"hybrid":[3,19],"systems":[4,20],"has":[5],"attracted":[6],"substantial":[7],"attention":[8],"in":[9,16,74,169],"recent":[10],"years.":[11],"However,":[12],"two":[13,64],"issues":[14],"exist":[15],"the":[17,25,55,84,88,99,102,109,117,124,133,141,144,152,165,170,180],"monitored":[18],"which":[21,53,122,163],"could":[22],"add":[23],"to":[24,97,116,178],"difficulty":[26],"algorithm":[28],"development:":[29],"First,":[30,77],"multiple":[31],"faults":[32],"with":[33,62],"unknown":[34],"distinct":[35],"nature":[36,90],"may":[37],"occur":[38],"simultaneously;":[39],"and":[40,45,149],"second,":[41],"fault":[42,58,80,85,89,103,112,125,136,147],"detection":[43,113],"time":[44,48,110,121],"mode":[46,119],"change":[47,120],"might":[49],"be":[50,106],"negatively":[51],"correlated":[52],"obstructs":[54],"completion":[56],"estimation.":[59],"To":[60],"deal":[61],"these":[63],"problems,":[65],"a":[66,78,127,155],"scheduled":[67],"health":[68],"(SHM)":[70],"method":[71,129],"is":[72,91,93,114,130,138,161],"developed":[73,131,162],"this":[75],"paper.":[76],"unified":[79],"modeling":[81],"that":[82,101],"enables":[83],"estimation,":[86],"when":[87,108],"unknown,":[92],"proposed.":[94],"After":[95],"that,":[96],"tackle":[98],"problem":[100,168],"estimation":[104,148],"cannot":[105],"completed":[107],"close":[115],"following":[118],"makes":[123],"undetectable,":[126],"scheduling":[128],"where":[132],"activation":[134],"estimator":[137],"controlled":[139],"by":[140],"scheduler.":[142],"For":[143],"purpose":[145],"prognosis":[150],"under":[151],"SHM":[153],"framework,":[154],"diversity":[156],"enhanced":[157],"particle":[158],"filter":[159],"(PF)":[160],"alleviates":[164],"sample":[166],"impoverishment":[167],"traditional":[171],"PF.":[172],"Finally,":[173],"experimental":[174],"investigations":[175],"are":[176],"conducted":[177],"validate":[179],"proposed":[181],"methodology.":[182]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":8},{"year":2020,"cited_by_count":4},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":4},{"year":2017,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}