{"id":"https://openalex.org/W2417591378","doi":"https://doi.org/10.1109/tie.2016.2577623","title":"Real-Time Optimization of Automatic Control Systems With Application to BLDC Motor Test Rig","display_name":"Real-Time Optimization of Automatic Control Systems With Application to BLDC Motor Test Rig","publication_year":2016,"publication_date":"2016-06-07","ids":{"openalex":"https://openalex.org/W2417591378","doi":"https://doi.org/10.1109/tie.2016.2577623","mag":"2417591378"},"language":"en","primary_location":{"id":"doi:10.1109/tie.2016.2577623","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2016.2577623","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5087736924","display_name":"Hao Luo","orcid":"https://orcid.org/0000-0003-2143-2438"},"institutions":[{"id":"https://openalex.org/I62318514","display_name":"University of Duisburg-Essen","ror":"https://ror.org/04mz5ra38","country_code":"DE","type":"education","lineage":["https://openalex.org/I62318514"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Hao Luo","raw_affiliation_strings":["Institute for Automatic Control and Complex Systems, University of Duisburg-Essen, Duisburg, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute for Automatic Control and Complex Systems, University of Duisburg-Essen, Duisburg, Germany","institution_ids":["https://openalex.org/I62318514"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082664553","display_name":"Minjia Krueger","orcid":"https://orcid.org/0000-0002-9894-5314"},"institutions":[{"id":"https://openalex.org/I62318514","display_name":"University of Duisburg-Essen","ror":"https://ror.org/04mz5ra38","country_code":"DE","type":"education","lineage":["https://openalex.org/I62318514"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Minjia Krueger","raw_affiliation_strings":["Institute for Automatic Control and Complex Systems, University of Duisburg-Essen, Duisburg, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute for Automatic Control and Complex Systems, University of Duisburg-Essen, Duisburg, Germany","institution_ids":["https://openalex.org/I62318514"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057633302","display_name":"Tim Koenings","orcid":null},"institutions":[{"id":"https://openalex.org/I62318514","display_name":"University of Duisburg-Essen","ror":"https://ror.org/04mz5ra38","country_code":"DE","type":"education","lineage":["https://openalex.org/I62318514"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Tim Koenings","raw_affiliation_strings":["Institute for Automatic Control and Complex Systems, University of Duisburg-Essen, Duisburg, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute for Automatic Control and Complex Systems, University of Duisburg-Essen, Duisburg, Germany","institution_ids":["https://openalex.org/I62318514"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5046071840","display_name":"Steven X. Ding","orcid":"https://orcid.org/0000-0002-5149-5918"},"institutions":[{"id":"https://openalex.org/I62318514","display_name":"University of Duisburg-Essen","ror":"https://ror.org/04mz5ra38","country_code":"DE","type":"education","lineage":["https://openalex.org/I62318514"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Steven X. Ding","raw_affiliation_strings":["Institute for Automatic Control and Complex Systems, University of Duisburg-Essen, Duisburg, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute for Automatic Control and Complex Systems, University of Duisburg-Essen, Duisburg, Germany","institution_ids":["https://openalex.org/I62318514"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5038596046","display_name":"Shane Dominic","orcid":null},"institutions":[{"id":"https://openalex.org/I62318514","display_name":"University of Duisburg-Essen","ror":"https://ror.org/04mz5ra38","country_code":"DE","type":"education","lineage":["https://openalex.org/I62318514"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Shane Dominic","raw_affiliation_strings":["Institute for Automatic Control and Complex Systems, University of Duisburg-Essen, Duisburg, Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute for Automatic Control and Complex Systems, University of Duisburg-Essen, Duisburg, Germany","institution_ids":["https://openalex.org/I62318514"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101440474","display_name":"Xu Yang","orcid":"https://orcid.org/0000-0001-8299-7200"},"institutions":[{"id":"https://openalex.org/I92403157","display_name":"University of Science and Technology Beijing","ror":"https://ror.org/02egmk993","country_code":"CN","type":"education","lineage":["https://openalex.org/I92403157"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xu Yang","raw_affiliation_strings":["School of Automation and Electrical Engineering, University of Science and Technology Beijing, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Automation and Electrical Engineering, University of Science and Technology Beijing, Beijing, China","institution_ids":["https://openalex.org/I92403157"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":7.3679,"has_fulltext":false,"cited_by_count":49,"citation_normalized_percentile":{"value":0.97331988,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":100},"biblio":{"volume":"64","issue":"5","first_page":"4306","last_page":"4314"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10791","display_name":"Advanced Control Systems Optimization","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11372","display_name":"Hydraulic and Pneumatic Systems","score":0.996999979019165,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.6384575963020325},{"id":"https://openalex.org/keywords/control-engineering","display_name":"Control engineering","score":0.6373231410980225},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5804795622825623},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5735561847686768},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.5572912693023682},{"id":"https://openalex.org/keywords/control-system","display_name":"Control system","score":0.5536648631095886},{"id":"https://openalex.org/keywords/realization","display_name":"Realization (probability)","score":0.5431517362594604},{"id":"https://openalex.org/keywords/residual","display_name":"Residual","score":0.45522722601890564},{"id":"https://openalex.org/keywords/dc-motor","display_name":"DC motor","score":0.43811506032943726},{"id":"https://openalex.org/keywords/isolation","display_name":"Isolation (microbiology)","score":0.428210973739624},{"id":"https://openalex.org/keywords/process-control","display_name":"Process control","score":0.42704713344573975},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4185757637023926},{"id":"https://openalex.org/keywords/control","display_name":"Control (management)","score":0.39478278160095215},{"id":"https://openalex.org/keywords/automotive-engineering","display_name":"Automotive engineering","score":0.3585721552371979},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.336925208568573},{"id":"https://openalex.org/keywords/actuator","display_name":"Actuator","score":0.15561828017234802}],"concepts":[{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.6384575963020325},{"id":"https://openalex.org/C133731056","wikidata":"https://www.wikidata.org/wiki/Q4917288","display_name":"Control engineering","level":1,"score":0.6373231410980225},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5804795622825623},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5735561847686768},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.5572912693023682},{"id":"https://openalex.org/C17500928","wikidata":"https://www.wikidata.org/wiki/Q959968","display_name":"Control system","level":2,"score":0.5536648631095886},{"id":"https://openalex.org/C2781089630","wikidata":"https://www.wikidata.org/wiki/Q21856745","display_name":"Realization (probability)","level":2,"score":0.5431517362594604},{"id":"https://openalex.org/C155512373","wikidata":"https://www.wikidata.org/wiki/Q287450","display_name":"Residual","level":2,"score":0.45522722601890564},{"id":"https://openalex.org/C76684090","wikidata":"https://www.wikidata.org/wiki/Q3842034","display_name":"DC motor","level":2,"score":0.43811506032943726},{"id":"https://openalex.org/C2775941552","wikidata":"https://www.wikidata.org/wiki/Q25212305","display_name":"Isolation (microbiology)","level":2,"score":0.428210973739624},{"id":"https://openalex.org/C155386361","wikidata":"https://www.wikidata.org/wiki/Q1649571","display_name":"Process control","level":3,"score":0.42704713344573975},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4185757637023926},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.39478278160095215},{"id":"https://openalex.org/C171146098","wikidata":"https://www.wikidata.org/wiki/Q124192","display_name":"Automotive engineering","level":1,"score":0.3585721552371979},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.336925208568573},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.15561828017234802},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C89423630","wikidata":"https://www.wikidata.org/wiki/Q7193","display_name":"Microbiology","level":1,"score":0.0},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tie.2016.2577623","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2016.2577623","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","score":0.6100000143051147,"id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320322725","display_name":"China Scholarship Council","ror":"https://ror.org/04atp4p48"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":24,"referenced_works":["https://openalex.org/W607110411","https://openalex.org/W1500134124","https://openalex.org/W1579424694","https://openalex.org/W1979513004","https://openalex.org/W2003639131","https://openalex.org/W2014441923","https://openalex.org/W2037044427","https://openalex.org/W2039036801","https://openalex.org/W2040639441","https://openalex.org/W2068649373","https://openalex.org/W2081955932","https://openalex.org/W2106901410","https://openalex.org/W2127053284","https://openalex.org/W2144581542","https://openalex.org/W2159027556","https://openalex.org/W2283952362","https://openalex.org/W2494112937","https://openalex.org/W2593498774","https://openalex.org/W4206037775","https://openalex.org/W4230674069","https://openalex.org/W4231197448","https://openalex.org/W4232408374","https://openalex.org/W4285719527","https://openalex.org/W4301014524"],"related_works":["https://openalex.org/W2022544890","https://openalex.org/W2394097730","https://openalex.org/W2769996735","https://openalex.org/W4312353617","https://openalex.org/W2113405914","https://openalex.org/W4385301753","https://openalex.org/W2171501125","https://openalex.org/W2617234683","https://openalex.org/W2375947351","https://openalex.org/W4250351468"],"abstract_inverted_index":{"Driven":[0],"by":[1],"the":[2,11,46,49,59,64,77,88],"increasing":[3],"demands":[4],"on":[5,93],"production":[6],"quality,":[7],"system":[8],"performance,":[9],"and":[10,13,26,80,85],"reliability":[12],"safety":[14],"issues":[15],"of":[16,41,48,87],"process":[17,24],"industry,":[18],"this":[19],"paper":[20],"proposes":[21],"an":[22,38],"integrated":[23],"monitoring":[25],"control":[27,32,61],"design":[28],"technique":[29],"for":[30,76],"industrial":[31],"systems.":[33],"The":[34,83],"proposed":[35,89],"approach":[36,90],"is":[37,67,74],"alternative":[39],"realization":[40],"Youla":[42],"parameterization":[43],"which":[44],"allows":[45],"performance":[47,86],"controlled":[50],"systems":[51],"to":[52],"be":[53],"improved":[54],"without":[55],"modifying":[56],"or":[57],"replacing":[58],"predesigned":[60],"systems,":[62],"while":[63],"closed-loop":[65],"stability":[66],"guaranteed.":[68],"In":[69],"addition,":[70],"a":[71,94],"residual":[72],"signal":[73],"available":[75],"fault":[78],"detection":[79],"isolation":[81],"purpose.":[82],"effectiveness":[84],"are":[91],"demonstrated":[92],"brushless":[95],"direct":[96],"current":[97],"motor":[98],"test":[99],"rig.":[100]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":2},{"year":2022,"cited_by_count":6},{"year":2021,"cited_by_count":5},{"year":2020,"cited_by_count":6},{"year":2019,"cited_by_count":16},{"year":2018,"cited_by_count":11},{"year":2016,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}