{"id":"https://openalex.org/W2084154781","doi":"https://doi.org/10.1109/tie.2015.2404306","title":"Some Basic Properties of the Failure Rate of Redundant Reliability Systems in Industrial Electronics Applications","display_name":"Some Basic Properties of the Failure Rate of Redundant Reliability Systems in Industrial Electronics Applications","publication_year":2015,"publication_date":"2015-02-16","ids":{"openalex":"https://openalex.org/W2084154781","doi":"https://doi.org/10.1109/tie.2015.2404306","mag":"2084154781"},"language":"en","primary_location":{"id":"doi:10.1109/tie.2015.2404306","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2015.2404306","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5028742377","display_name":"E. Chiodo","orcid":"https://orcid.org/0000-0003-1138-5973"},"institutions":[{"id":"https://openalex.org/I71267560","display_name":"University of Naples Federico II","ror":"https://ror.org/05290cv24","country_code":"IT","type":"education","lineage":["https://openalex.org/I71267560"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"Elio Chiodo","raw_affiliation_strings":["Department of Electrical Engineering and Information Technology, University of Naples Federico II, Naples, Italy","Dept. of Electr. Eng. & Inf. Technol., Univ. of Naples, \u201cFederico II\u201d, Naples, Italy"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and Information Technology, University of Naples Federico II, Naples, Italy","institution_ids":["https://openalex.org/I71267560"]},{"raw_affiliation_string":"Dept. of Electr. Eng. & Inf. Technol., Univ. of Naples, \u201cFederico II\u201d, Naples, Italy","institution_ids":["https://openalex.org/I71267560"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5066385357","display_name":"D. Lauria","orcid":"https://orcid.org/0000-0002-8938-2599"},"institutions":[{"id":"https://openalex.org/I71267560","display_name":"University of Naples Federico II","ror":"https://ror.org/05290cv24","country_code":"IT","type":"education","lineage":["https://openalex.org/I71267560"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Davide Lauria","raw_affiliation_strings":["Department of Industrial Engineering, University of Naples Federico II, Naples, Italy","Dept. of Ind. Eng., Univ. of Naples \u201cFederico II\u201d, Naples, Italy"],"affiliations":[{"raw_affiliation_string":"Department of Industrial Engineering, University of Naples Federico II, Naples, Italy","institution_ids":["https://openalex.org/I71267560"]},{"raw_affiliation_string":"Dept. of Ind. Eng., Univ. of Naples \u201cFederico II\u201d, Naples, Italy","institution_ids":["https://openalex.org/I71267560"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5028742377"],"corresponding_institution_ids":["https://openalex.org/I71267560"],"apc_list":null,"apc_paid":null,"fwci":8.5734,"has_fulltext":false,"cited_by_count":41,"citation_normalized_percentile":{"value":0.97270768,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":"62","issue":"8","first_page":"5055","last_page":"5062"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11941","display_name":"Power System Reliability and Maintenance","score":0.9941999912261963,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.7469527721405029},{"id":"https://openalex.org/keywords/mean-time-between-failures","display_name":"Mean time between failures","score":0.7222411036491394},{"id":"https://openalex.org/keywords/weibull-distribution","display_name":"Weibull distribution","score":0.6486471891403198},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6108937859535217},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.571425199508667},{"id":"https://openalex.org/keywords/constant","display_name":"Constant (computer programming)","score":0.5517803430557251},{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.5488555431365967},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5012805461883545},{"id":"https://openalex.org/keywords/function","display_name":"Function (biology)","score":0.46986114978790283},{"id":"https://openalex.org/keywords/exponential-function","display_name":"Exponential function","score":0.43000662326812744},{"id":"https://openalex.org/keywords/series-and-parallel-circuits","display_name":"Series and parallel circuits","score":0.4250567555427551},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.25553011894226074},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.21156519651412964},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.15785536170005798},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.1418485939502716},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.09117785096168518}],"concepts":[{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.7469527721405029},{"id":"https://openalex.org/C44154001","wikidata":"https://www.wikidata.org/wiki/Q754940","display_name":"Mean time between failures","level":3,"score":0.7222411036491394},{"id":"https://openalex.org/C173291955","wikidata":"https://www.wikidata.org/wiki/Q732332","display_name":"Weibull distribution","level":2,"score":0.6486471891403198},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6108937859535217},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.571425199508667},{"id":"https://openalex.org/C2777027219","wikidata":"https://www.wikidata.org/wiki/Q1284190","display_name":"Constant (computer programming)","level":2,"score":0.5517803430557251},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.5488555431365967},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5012805461883545},{"id":"https://openalex.org/C14036430","wikidata":"https://www.wikidata.org/wiki/Q3736076","display_name":"Function (biology)","level":2,"score":0.46986114978790283},{"id":"https://openalex.org/C151376022","wikidata":"https://www.wikidata.org/wiki/Q168698","display_name":"Exponential function","level":2,"score":0.43000662326812744},{"id":"https://openalex.org/C95023266","wikidata":"https://www.wikidata.org/wiki/Q55738334","display_name":"Series and parallel circuits","level":3,"score":0.4250567555427551},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.25553011894226074},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.21156519651412964},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.15785536170005798},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.1418485939502716},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.09117785096168518},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C78458016","wikidata":"https://www.wikidata.org/wiki/Q840400","display_name":"Evolutionary biology","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tie.2015.2404306","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2015.2404306","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":30,"referenced_works":["https://openalex.org/W46398601","https://openalex.org/W603375353","https://openalex.org/W645913295","https://openalex.org/W1534257613","https://openalex.org/W1966368126","https://openalex.org/W1969497765","https://openalex.org/W1971721782","https://openalex.org/W1982340803","https://openalex.org/W1984714883","https://openalex.org/W2001572080","https://openalex.org/W2023285254","https://openalex.org/W2028330544","https://openalex.org/W2040495054","https://openalex.org/W2054101951","https://openalex.org/W2067124771","https://openalex.org/W2068819442","https://openalex.org/W2073009863","https://openalex.org/W2074041516","https://openalex.org/W2086949796","https://openalex.org/W2093312049","https://openalex.org/W2107177232","https://openalex.org/W2171831288","https://openalex.org/W2334199576","https://openalex.org/W2342402126","https://openalex.org/W2802034669","https://openalex.org/W3187968606","https://openalex.org/W3204372681","https://openalex.org/W4205461305","https://openalex.org/W4237165034","https://openalex.org/W4254061683"],"related_works":["https://openalex.org/W2118309485","https://openalex.org/W3097728737","https://openalex.org/W2382998060","https://openalex.org/W2044425520","https://openalex.org/W2612366884","https://openalex.org/W2360037012","https://openalex.org/W2053233382","https://openalex.org/W2034080945","https://openalex.org/W2337334590","https://openalex.org/W2006898677"],"abstract_inverted_index":{"This":[0,87],"paper":[1],"discusses":[2],"some":[3,33],"common":[4],"reliability":[5,85,168,175],"architectures,":[6],"such":[7,25,42,180],"as":[8,26,59,181],"\u201cparallel\u201d":[9],"and":[10,77,170],"\u201ck":[11],"out":[12,165],"of":[13,36,41,62,68,111,117,132,149,155,166],"n\u201d":[14],"systems,":[15,24,43,169],"adopted":[16],"to":[17,163,172],"add":[18],"redundancy":[19],"in":[20,49,93],"many":[21],"modern":[22],"industrial":[23],"parallel-inverter":[27],"systems.":[28],"The":[29],"focus":[30],"is":[31,55,74,88,114,125,140],"on":[32],"crucial":[34],"properties":[35],"the":[37,46,52,60,63,69,80,90,96,108,130,153,156,182,185],"failure":[38],"rate":[39],"(FR)":[40],"motivated":[44],"by":[45],"fact":[47],"that,":[48],"applied":[50],"literature,":[51],"system":[53,81,97,109,135],"FR":[54,110,131,138],"often":[56],"simply":[57,126],"evaluated":[58],"reciprocal":[61],"\u201cMean":[64],"Time":[65],"To":[66],"Failure\u201d":[67],"system.":[70],"However,":[71],"this":[72],"relationship":[73],"valid":[75],"if,":[76,79],"only":[78,91],"has":[82,98],"a":[83,99,115,133],"\u201cseries\u201d":[84],"architecture.":[86],"indeed":[89,128],"case":[92],"which":[94,119],"also":[95,171],"constant":[100,137],"FR,":[101,179],"i.e.,":[102],"an":[103,141],"Exponential":[104],"lifetime":[105],"distribution.":[106],"Instead,":[107],"redundant":[112],"systems":[113],"function":[116,148],"time,":[118,150],"can":[120],"never":[121],"be":[122],"constant.":[123],"It":[124],"shown":[127],"that":[129],"parallel":[134],"with":[136,177],"components":[139],"increasing,":[142,145],"or":[143,184],"\u201cfirst":[144],"then":[146],"decreasing\u201d":[147],"eventually":[151],"reaching":[152],"value":[154],"smallest":[157],"FR.":[158],"These":[159],"results":[160],"are":[161],"extended":[162],"k":[164],"n":[167],"more":[173],"general":[174],"models":[176],"nonconstant":[178],"Weibull":[183],"\u201cbathtub\u201d":[186],"model.":[187]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":5},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":8},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":5},{"year":2016,"cited_by_count":5},{"year":2015,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}