{"id":"https://openalex.org/W2052184082","doi":"https://doi.org/10.1109/tie.2014.2328316","title":"Data-Driven Control and Process Monitoring for Industrial Applications\u2014Part II","display_name":"Data-Driven Control and Process Monitoring for Industrial Applications\u2014Part II","publication_year":2014,"publication_date":"2014-06-04","ids":{"openalex":"https://openalex.org/W2052184082","doi":"https://doi.org/10.1109/tie.2014.2328316","mag":"2052184082"},"language":"en","primary_location":{"id":"doi:10.1109/tie.2014.2328316","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2014.2328316","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5069744156","display_name":"Shen Yin","orcid":"https://orcid.org/0000-0002-3802-9269"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shen Yin","raw_affiliation_strings":["Research Institute of Intelligent Control and Systems, Harbin Institute of Technology, Harbin, China","Research Institute of Intelligent Control and Systems Harbin Institute of Technology Harbin China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Research Institute of Intelligent Control and Systems, Harbin Institute of Technology, Harbin, China","institution_ids":["https://openalex.org/I204983213"]},{"raw_affiliation_string":"Research Institute of Intelligent Control and Systems Harbin Institute of Technology Harbin China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5036684787","display_name":"Huijun Gao","orcid":"https://orcid.org/0000-0001-5554-5452"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]},{"id":"https://openalex.org/I97009856","display_name":"Bohai University","ror":"https://ror.org/01kdzej58","country_code":"CN","type":"education","lineage":["https://openalex.org/I97009856"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Huijun Gao","raw_affiliation_strings":["Research Institute of Intelligent Control and Systems, Bohai University, Jinzhou, China","Research Institute of Intelligent Control and Systems Harbin Institute of Technology Harbin China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Research Institute of Intelligent Control and Systems, Bohai University, Jinzhou, China","institution_ids":["https://openalex.org/I97009856"]},{"raw_affiliation_string":"Research Institute of Intelligent Control and Systems Harbin Institute of Technology Harbin China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5066257732","display_name":"Okyay Kaynak","orcid":"https://orcid.org/0000-0002-4789-6700"},"institutions":[{"id":"https://openalex.org/I4405392","display_name":"Bo\u011fazi\u00e7i University","ror":"https://ror.org/03z9tma90","country_code":"TR","type":"education","lineage":["https://openalex.org/I4405392"]}],"countries":["TR"],"is_corresponding":false,"raw_author_name":"Okyay Kaynak","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, Bogazici University, Istanbul, Turkey","[Dept. of Electrical and Electronic Eng, Bogazici University, Istanbul, Turkey]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Bogazici University, Istanbul, Turkey","institution_ids":["https://openalex.org/I4405392"]},{"raw_affiliation_string":"[Dept. of Electrical and Electronic Eng, Bogazici University, Istanbul, Turkey]","institution_ids":["https://openalex.org/I4405392"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":14.104,"has_fulltext":false,"cited_by_count":82,"citation_normalized_percentile":{"value":0.98964103,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":100},"biblio":{"volume":"62","issue":"1","first_page":"583","last_page":"586"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10791","display_name":"Advanced Control Systems Optimization","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12282","display_name":"Mineral Processing and Grinding","score":0.9868000149726868,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/process-control","display_name":"Process control","score":0.6028134822845459},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5371402502059937},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.48153334856033325},{"id":"https://openalex.org/keywords/advanced-process-control","display_name":"Advanced process control","score":0.457744300365448},{"id":"https://openalex.org/keywords/control","display_name":"Control (management)","score":0.4119841158390045},{"id":"https://openalex.org/keywords/control-engineering","display_name":"Control engineering","score":0.3535589575767517},{"id":"https://openalex.org/keywords/process-engineering","display_name":"Process engineering","score":0.32286888360977173},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.29229533672332764},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.15042072534561157},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.1204821765422821}],"concepts":[{"id":"https://openalex.org/C155386361","wikidata":"https://www.wikidata.org/wiki/Q1649571","display_name":"Process control","level":3,"score":0.6028134822845459},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5371402502059937},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.48153334856033325},{"id":"https://openalex.org/C157978775","wikidata":"https://www.wikidata.org/wiki/Q13574356","display_name":"Advanced process control","level":4,"score":0.457744300365448},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.4119841158390045},{"id":"https://openalex.org/C133731056","wikidata":"https://www.wikidata.org/wiki/Q4917288","display_name":"Control engineering","level":1,"score":0.3535589575767517},{"id":"https://openalex.org/C21880701","wikidata":"https://www.wikidata.org/wiki/Q2144042","display_name":"Process engineering","level":1,"score":0.32286888360977173},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.29229533672332764},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.15042072534561157},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.1204821765422821}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tie.2014.2328316","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2014.2328316","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure","score":0.46000000834465027}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":28,"referenced_works":["https://openalex.org/W1965875070","https://openalex.org/W1973862219","https://openalex.org/W1984672166","https://openalex.org/W1990067914","https://openalex.org/W1997412659","https://openalex.org/W2000910171","https://openalex.org/W2001721683","https://openalex.org/W2004039783","https://openalex.org/W2005081781","https://openalex.org/W2006169073","https://openalex.org/W2006710139","https://openalex.org/W2013166183","https://openalex.org/W2014441923","https://openalex.org/W2026039230","https://openalex.org/W2035933463","https://openalex.org/W2040871222","https://openalex.org/W2050066983","https://openalex.org/W2052663203","https://openalex.org/W2059315199","https://openalex.org/W2060686658","https://openalex.org/W2063823978","https://openalex.org/W2068649373","https://openalex.org/W2079013017","https://openalex.org/W2093463998","https://openalex.org/W2133826245","https://openalex.org/W2140327685","https://openalex.org/W2158958729","https://openalex.org/W4253930725"],"related_works":["https://openalex.org/W2361493164","https://openalex.org/W1596531975","https://openalex.org/W2004186751","https://openalex.org/W1969909374","https://openalex.org/W2072097587","https://openalex.org/W2371536993","https://openalex.org/W2638730922","https://openalex.org/W3155069932","https://openalex.org/W2165750643","https://openalex.org/W717723"],"abstract_inverted_index":{"The":[0],"eight":[1],"papers":[2],"in":[3],"this":[4],"second":[5],"part":[6],"of":[7],"the":[8],"special":[9],"section":[10],"on":[11],"data-driven":[12],"control":[13],"and":[14],"process":[15],"monitoring":[16],"are":[17],"summarized":[18],"here.":[19]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":12},{"year":2020,"cited_by_count":12},{"year":2019,"cited_by_count":10},{"year":2018,"cited_by_count":6},{"year":2017,"cited_by_count":12},{"year":2016,"cited_by_count":13},{"year":2015,"cited_by_count":7},{"year":2014,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}