{"id":"https://openalex.org/W1995927826","doi":"https://doi.org/10.1109/tie.2014.2327557","title":"An Integrated Approach to Prognosis of Hybrid Systems With Unknown Mode Changes","display_name":"An Integrated Approach to Prognosis of Hybrid Systems With Unknown Mode Changes","publication_year":2014,"publication_date":"2014-05-30","ids":{"openalex":"https://openalex.org/W1995927826","doi":"https://doi.org/10.1109/tie.2014.2327557","mag":"1995927826"},"language":"en","primary_location":{"id":"doi:10.1109/tie.2014.2327557","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2014.2327557","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5076920288","display_name":"Ming Yu","orcid":"https://orcid.org/0000-0003-3703-9163"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":true,"raw_author_name":"Ming Yu","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore","Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, , Singapore"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]},{"raw_affiliation_string":"Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, , Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083472752","display_name":"Danwei Wang","orcid":null},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Danwei Wang","raw_affiliation_strings":["School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore","Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, , Singapore"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]},{"raw_affiliation_string":"Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, , Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101440398","display_name":"Ming Luo","orcid":"https://orcid.org/0000-0002-6156-6230"},"institutions":[{"id":"https://openalex.org/I115228651","display_name":"Agency for Science, Technology and Research","ror":"https://ror.org/036wvzt09","country_code":"SG","type":"government","lineage":["https://openalex.org/I115228651"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Ming Luo","raw_affiliation_strings":["SIMTech A*Star Research Agency, Singapore","SIMTech A*Star Res. Agency, Singapore, Singapore"],"affiliations":[{"raw_affiliation_string":"SIMTech A*Star Research Agency, Singapore","institution_ids":["https://openalex.org/I115228651"]},{"raw_affiliation_string":"SIMTech A*Star Res. Agency, Singapore, Singapore","institution_ids":["https://openalex.org/I115228651"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5076920288"],"corresponding_institution_ids":["https://openalex.org/I172675005"],"apc_list":null,"apc_paid":null,"fwci":5.6806,"has_fulltext":false,"cited_by_count":33,"citation_normalized_percentile":{"value":0.95759567,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"62","issue":"1","first_page":"503","last_page":"515"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9909999966621399,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/bond-graph","display_name":"Bond graph","score":0.7479230165481567},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.6635016202926636},{"id":"https://openalex.org/keywords/particle-filter","display_name":"Particle filter","score":0.6500352025032043},{"id":"https://openalex.org/keywords/hybrid-system","display_name":"Hybrid system","score":0.4988536834716797},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.49264127016067505},{"id":"https://openalex.org/keywords/mode","display_name":"Mode (computer interface)","score":0.48628270626068115},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4826817810535431},{"id":"https://openalex.org/keywords/filter","display_name":"Filter (signal processing)","score":0.47320693731307983},{"id":"https://openalex.org/keywords/probability-density-function","display_name":"Probability density function","score":0.47166574001312256},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.46233460307121277},{"id":"https://openalex.org/keywords/graph","display_name":"Graph","score":0.4269437789916992},{"id":"https://openalex.org/keywords/failure-mode-and-effects-analysis","display_name":"Failure mode and effects analysis","score":0.4206879138946533},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.33406519889831543},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.32627731561660767},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.29352590441703796},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.19413703680038452},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.19303372502326965},{"id":"https://openalex.org/keywords/theoretical-computer-science","display_name":"Theoretical computer science","score":0.15604370832443237},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.15419942140579224},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.11971268057823181}],"concepts":[{"id":"https://openalex.org/C187593909","wikidata":"https://www.wikidata.org/wiki/Q838024","display_name":"Bond graph","level":2,"score":0.7479230165481567},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.6635016202926636},{"id":"https://openalex.org/C52421305","wikidata":"https://www.wikidata.org/wiki/Q1151499","display_name":"Particle filter","level":3,"score":0.6500352025032043},{"id":"https://openalex.org/C50897621","wikidata":"https://www.wikidata.org/wiki/Q2665508","display_name":"Hybrid system","level":2,"score":0.4988536834716797},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.49264127016067505},{"id":"https://openalex.org/C48677424","wikidata":"https://www.wikidata.org/wiki/Q6888088","display_name":"Mode (computer interface)","level":2,"score":0.48628270626068115},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4826817810535431},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.47320693731307983},{"id":"https://openalex.org/C197055811","wikidata":"https://www.wikidata.org/wiki/Q207522","display_name":"Probability density function","level":2,"score":0.47166574001312256},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.46233460307121277},{"id":"https://openalex.org/C132525143","wikidata":"https://www.wikidata.org/wiki/Q141488","display_name":"Graph","level":2,"score":0.4269437789916992},{"id":"https://openalex.org/C66283442","wikidata":"https://www.wikidata.org/wiki/Q1389268","display_name":"Failure mode and effects analysis","level":2,"score":0.4206879138946533},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.33406519889831543},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.32627731561660767},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.29352590441703796},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.19413703680038452},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.19303372502326965},{"id":"https://openalex.org/C80444323","wikidata":"https://www.wikidata.org/wiki/Q2878974","display_name":"Theoretical computer science","level":1,"score":0.15604370832443237},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.15419942140579224},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.11971268057823181},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C114614502","wikidata":"https://www.wikidata.org/wiki/Q76592","display_name":"Combinatorics","level":1,"score":0.0},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tie.2014.2327557","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2014.2327557","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/12","display_name":"Responsible consumption and production","score":0.5400000214576721}],"awards":[{"id":"https://openalex.org/G1721875155","display_name":null,"funder_award_id":"91120308","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G6223979802","display_name":null,"funder_award_id":"61074185","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":27,"referenced_works":["https://openalex.org/W301389136","https://openalex.org/W1556459174","https://openalex.org/W1605916706","https://openalex.org/W1979663416","https://openalex.org/W2014180740","https://openalex.org/W2017670332","https://openalex.org/W2032103001","https://openalex.org/W2045013876","https://openalex.org/W2059119683","https://openalex.org/W2062964467","https://openalex.org/W2064323378","https://openalex.org/W2086105717","https://openalex.org/W2098729161","https://openalex.org/W2103112267","https://openalex.org/W2105091160","https://openalex.org/W2106290330","https://openalex.org/W2124156864","https://openalex.org/W2134844385","https://openalex.org/W2135296533","https://openalex.org/W2140654319","https://openalex.org/W2148317777","https://openalex.org/W2156742582","https://openalex.org/W2160337655","https://openalex.org/W2169301607","https://openalex.org/W2335415707","https://openalex.org/W6610749603","https://openalex.org/W6633355566"],"related_works":["https://openalex.org/W3009669764","https://openalex.org/W1958094387","https://openalex.org/W2032170356","https://openalex.org/W2614520266","https://openalex.org/W2371731813","https://openalex.org/W2358330211","https://openalex.org/W2367105195","https://openalex.org/W2391669314","https://openalex.org/W2570127249","https://openalex.org/W2348999414"],"abstract_inverted_index":{"A":[0],"new":[1],"framework":[2,156],"to":[3,90,109],"design":[4],"model-based":[5],"prognosis":[6,111,155],"for":[7,50,67,95,106],"hybrid":[8,29,43],"systems":[9],"with":[10],"unknown":[11],"mode":[12,51],"changes":[13],"is":[14,22,48,65],"proposed":[15],"in":[16,35],"this":[17],"paper.":[18],"The":[19,80,149],"key":[20,150],"step":[21],"the":[23,36,39,41,60,84,92,96,100,117,119,125,138,145,153],"construction":[24],"of":[25,86,124,152],"an":[26],"interacting":[27],"diagnostic":[28,42],"bond":[30,44],"graph-particle":[31],"filter":[32,62],"(IDHBG-PF)":[33],"module":[34],"framework.":[37],"In":[38],"module,":[40],"graph":[45],"(DHBG)":[46],"part":[47,64,82,102],"employed":[49],"tracking":[52],"after":[53],"fault":[54,57,114],"occurrence":[55],"and":[56,59,70,112,144],"isolation,":[58],"particle":[61],"(PF)":[63],"used":[66],"joint":[68],"state":[69],"parameter":[71],"estimation":[72],"as":[73,75],"well":[74],"remaining":[76,127],"useful":[77,128],"life":[78,129],"prediction.":[79],"DHBG":[81],"provides":[83],"set":[85],"suspected":[87],"faults":[88,105],"(SSF)":[89],"augment":[91],"dynamic":[93],"model":[94],"PF":[97,101],"part,":[98],"whereas":[99],"outputs":[103],"true":[104],"SSF":[107],"refinement":[108],"facilitate":[110],"further":[113],"isolation.":[115],"During":[116],"prognosis,":[118],"probability":[120],"density":[121],"function":[122],"(pdf)":[123],"predicted":[126],"under":[130],"different":[131],"operating":[132],"modes":[133],"can":[134],"be":[135],"calculated":[136],"using":[137],"estimated":[139],"mode-dependent":[140],"degradation":[141],"rate":[142],"(MD-DR)":[143],"user-selected":[146],"failure":[147],"threshold.":[148],"concepts":[151],"developed":[154],"are":[157],"validated":[158],"by":[159],"experimental":[160],"results.":[161]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":4},{"year":2019,"cited_by_count":4},{"year":2018,"cited_by_count":5},{"year":2017,"cited_by_count":6},{"year":2016,"cited_by_count":3},{"year":2015,"cited_by_count":5}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}