{"id":"https://openalex.org/W2047634217","doi":"https://doi.org/10.1109/tie.2013.2263773","title":"Multicell Fault Current Limiter","display_name":"Multicell Fault Current Limiter","publication_year":2013,"publication_date":"2013-05-17","ids":{"openalex":"https://openalex.org/W2047634217","doi":"https://doi.org/10.1109/tie.2013.2263773","mag":"2047634217"},"language":"en","primary_location":{"id":"doi:10.1109/tie.2013.2263773","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2013.2263773","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5046027742","display_name":"Wenyong Guo","orcid":"https://orcid.org/0000-0002-9461-7620"},"institutions":[{"id":"https://openalex.org/I4210128819","display_name":"Institute of Electrical Engineering","ror":"https://ror.org/033js6g46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210128819"]},{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Wenyong Guo","raw_affiliation_strings":["Institute of Electrical Engineering, Chinese Academy of Sciences, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Institute of Electrical Engineering, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210128819","https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102853055","display_name":"Liye Xiao","orcid":"https://orcid.org/0009-0009-3261-3796"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210128819","display_name":"Institute of Electrical Engineering","ror":"https://ror.org/033js6g46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210128819"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Liye Xiao","raw_affiliation_strings":["Institute of Electrical Engineering, Chinese Academy of Sciences, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Institute of Electrical Engineering, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210128819","https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044185552","display_name":"Shaotao Dai","orcid":"https://orcid.org/0000-0001-5547-8245"},"institutions":[{"id":"https://openalex.org/I4210128819","display_name":"Institute of Electrical Engineering","ror":"https://ror.org/033js6g46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210128819"]},{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shaotao Dai","raw_affiliation_strings":["Institute of Electrical Engineering, Chinese Academy of Sciences, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Institute of Electrical Engineering, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210128819","https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100444220","display_name":"Zhifeng Zhang","orcid":"https://orcid.org/0000-0002-9001-9850"},"institutions":[{"id":"https://openalex.org/I4210128819","display_name":"Institute of Electrical Engineering","ror":"https://ror.org/033js6g46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210128819"]},{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhifeng Zhang","raw_affiliation_strings":["Institute of Electrical Engineering, Chinese Academy of Sciences, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Institute of Electrical Engineering, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210128819","https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100674896","display_name":"Tao Ma","orcid":"https://orcid.org/0000-0003-0087-5301"},"institutions":[{"id":"https://openalex.org/I4210128819","display_name":"Institute of Electrical Engineering","ror":"https://ror.org/033js6g46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210128819"]},{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Tao Ma","raw_affiliation_strings":["Institute of Electrical Engineering, Chinese Academy of Sciences, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Institute of Electrical Engineering, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210128819","https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077802694","display_name":"Yuanhe Li","orcid":"https://orcid.org/0000-0003-2128-5634"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Yuanhe Li","raw_affiliation_strings":["Shandong Xinfengguang Electronic Technology Development Co., Ltd., Jining, China"],"affiliations":[{"raw_affiliation_string":"Shandong Xinfengguang Electronic Technology Development Co., Ltd., Jining, China","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100696663","display_name":"Xi Xu","orcid":"https://orcid.org/0000-0003-4728-615X"},"institutions":[{"id":"https://openalex.org/I4210128819","display_name":"Institute of Electrical Engineering","ror":"https://ror.org/033js6g46","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210128819"]},{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"funder","lineage":["https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xi Xu","raw_affiliation_strings":["Institute of Electrical Engineering, Chinese Academy of Sciences, Beijing, China"],"affiliations":[{"raw_affiliation_string":"Institute of Electrical Engineering, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210128819","https://openalex.org/I19820366"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5046027742"],"corresponding_institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210128819"],"apc_list":null,"apc_paid":null,"fwci":0.9458,"has_fulltext":false,"cited_by_count":15,"citation_normalized_percentile":{"value":0.78461617,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":97},"biblio":{"volume":"61","issue":"4","first_page":"2071","last_page":"2080"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11102","display_name":"HVDC Systems and Fault Protection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11102","display_name":"HVDC Systems and Fault Protection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9972000122070312,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10228","display_name":"Multilevel Inverters and Converters","score":0.9919999837875366,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault-current-limiter","display_name":"Fault current limiter","score":0.8388320803642273},{"id":"https://openalex.org/keywords/current-limiting","display_name":"Current limiting","score":0.8211941123008728},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5928159952163696},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5863274335861206},{"id":"https://openalex.org/keywords/limiter","display_name":"Limiter","score":0.5768648386001587},{"id":"https://openalex.org/keywords/inductor","display_name":"Inductor","score":0.567184329032898},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.538884162902832},{"id":"https://openalex.org/keywords/varistor","display_name":"Varistor","score":0.4992516040802002},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4880141317844391},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.4750140607357025},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4505383372306824},{"id":"https://openalex.org/keywords/flexibility","display_name":"Flexibility (engineering)","score":0.44096407294273376},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.39284104108810425},{"id":"https://openalex.org/keywords/electric-power-system","display_name":"Electric power system","score":0.27719181776046753},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.09171685576438904}],"concepts":[{"id":"https://openalex.org/C129187525","wikidata":"https://www.wikidata.org/wiki/Q10858078","display_name":"Fault current limiter","level":4,"score":0.8388320803642273},{"id":"https://openalex.org/C204106720","wikidata":"https://www.wikidata.org/wiki/Q15856134","display_name":"Current limiting","level":3,"score":0.8211941123008728},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5928159952163696},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5863274335861206},{"id":"https://openalex.org/C45011657","wikidata":"https://www.wikidata.org/wiki/Q1613840","display_name":"Limiter","level":2,"score":0.5768648386001587},{"id":"https://openalex.org/C144534570","wikidata":"https://www.wikidata.org/wiki/Q5325","display_name":"Inductor","level":3,"score":0.567184329032898},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.538884162902832},{"id":"https://openalex.org/C58289394","wikidata":"https://www.wikidata.org/wiki/Q465115","display_name":"Varistor","level":3,"score":0.4992516040802002},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4880141317844391},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.4750140607357025},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4505383372306824},{"id":"https://openalex.org/C2780598303","wikidata":"https://www.wikidata.org/wiki/Q65921492","display_name":"Flexibility (engineering)","level":2,"score":0.44096407294273376},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.39284104108810425},{"id":"https://openalex.org/C89227174","wikidata":"https://www.wikidata.org/wiki/Q2388981","display_name":"Electric power system","level":3,"score":0.27719181776046753},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.09171685576438904},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tie.2013.2263773","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2013.2263773","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.9100000262260437,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":27,"referenced_works":["https://openalex.org/W1984809653","https://openalex.org/W1988762449","https://openalex.org/W1993830253","https://openalex.org/W1998006736","https://openalex.org/W2004142044","https://openalex.org/W2011975264","https://openalex.org/W2022144424","https://openalex.org/W2037239418","https://openalex.org/W2041462624","https://openalex.org/W2050927743","https://openalex.org/W2055669071","https://openalex.org/W2057957478","https://openalex.org/W2066148277","https://openalex.org/W2072386841","https://openalex.org/W2097757537","https://openalex.org/W2099334962","https://openalex.org/W2100110226","https://openalex.org/W2116803632","https://openalex.org/W2120072243","https://openalex.org/W2124781363","https://openalex.org/W2129352463","https://openalex.org/W2134088442","https://openalex.org/W2136813585","https://openalex.org/W2140747623","https://openalex.org/W2149604046","https://openalex.org/W2150041691","https://openalex.org/W2507034709"],"related_works":["https://openalex.org/W2899084033","https://openalex.org/W2368395944","https://openalex.org/W4312281296","https://openalex.org/W4226171722","https://openalex.org/W1991369231","https://openalex.org/W2048343867","https://openalex.org/W3037723529","https://openalex.org/W2165231405","https://openalex.org/W2900602138","https://openalex.org/W2163877812"],"abstract_inverted_index":{"A":[0,142],"multicell":[1],"fault":[2,17,22,29,54,80,100],"current":[3,18,23,30,55,101],"limiter":[4],"(MCFCL)":[5],"is":[6,13,118,145],"proposed":[7,39,164],"in":[8,44,105],"this":[9],"paper.":[10],"The":[11,38,58,76,130,149],"MCFCL":[12,40,59,77,112,139],"composed":[14],"of":[15,27,53,85,137,162],"multiple":[16,103],"limiting":[19,24,31,56],"cells.":[20,57],"Each":[21],"cell":[25],"consists":[26],"a":[28,34,106],"inductor":[32],"and":[33,63,133,147,151,160],"power":[35],"electronic":[36],"module.":[37],"has":[41,60,113],"the":[42,46,51,79,91,111,138,158,163],"flexibility":[43],"expanding":[45],"operation":[47],"voltage":[48,65],"by":[49],"increasing":[50],"number":[52],"excellent":[61],"static":[62],"dynamic":[64],"equalizing":[66],"capability":[67],"between":[68],"different":[69],"cells,":[70],"which":[71,94,117],"makes":[72,95],"it":[73,96],"highly":[74],"reliable.":[75],"utilizes":[78],"energy":[81],"absorption":[82],"bypasses":[83],"instead":[84],"varistors":[86],"to":[87,98,120,156],"prevent":[88],"overvoltages":[89],"across":[90],"semiconductor":[92,128],"devices,":[93],"able":[97],"repeat":[99],"limitation":[102],"times":[104],"short":[107],"time":[108],"interval.":[109],"Moreover,":[110],"rather":[114],"high":[115],"efficiency,":[116],"expected":[119],"be":[121],"no":[122],"less":[123],"than":[124],"99.9%":[125],"with":[126],"appropriate":[127],"devices.":[129],"operational":[131],"principles":[132],"parameter":[134],"design":[135],"methods":[136],"are":[140,154],"presented.":[141],"medium-voltage":[143],"prototype":[144],"developed":[146],"tested.":[148],"simulation":[150],"experimental":[152],"results":[153],"presented":[155],"clarify":[157],"theory":[159],"feasibility":[161],"approaches.":[165]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":3},{"year":2021,"cited_by_count":3},{"year":2019,"cited_by_count":2},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":2},{"year":2014,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}