{"id":"https://openalex.org/W2074827808","doi":"https://doi.org/10.1109/tie.2012.2207658","title":"Pretest Gap Mura on TFT LCDs Using the Optical Interference Pattern Sensing Method and Neural Network Classification","display_name":"Pretest Gap Mura on TFT LCDs Using the Optical Interference Pattern Sensing Method and Neural Network Classification","publication_year":2012,"publication_date":"2012-07-10","ids":{"openalex":"https://openalex.org/W2074827808","doi":"https://doi.org/10.1109/tie.2012.2207658","mag":"2074827808"},"language":"en","primary_location":{"id":"doi:10.1109/tie.2012.2207658","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2012.2207658","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5057613195","display_name":"Tung-Yen Li","orcid":null},"institutions":[{"id":"https://openalex.org/I22265921","display_name":"National Central University","ror":"https://ror.org/00944ve71","country_code":"TW","type":"education","lineage":["https://openalex.org/I22265921"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Tung-Yen Li","raw_affiliation_strings":["Department of Electrical Engineering, National Central University, Jhong li, Taiwan","(Department of Electrical Engineering, National Central University, Jhongli, Taiwan)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Central University, Jhong li, Taiwan","institution_ids":["https://openalex.org/I22265921"]},{"raw_affiliation_string":"(Department of Electrical Engineering, National Central University, Jhongli, Taiwan)","institution_ids":["https://openalex.org/I22265921"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004841945","display_name":"Jang\u2010Zern Tsai","orcid":"https://orcid.org/0000-0001-7996-3130"},"institutions":[{"id":"https://openalex.org/I22265921","display_name":"National Central University","ror":"https://ror.org/00944ve71","country_code":"TW","type":"education","lineage":["https://openalex.org/I22265921"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Jang-Zern Tsai","raw_affiliation_strings":["Department of Electrical Engineering, National Central University, Jhong li, Taiwan","(Department of Electrical Engineering, National Central University, Jhongli, Taiwan)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National Central University, Jhong li, Taiwan","institution_ids":["https://openalex.org/I22265921"]},{"raw_affiliation_string":"(Department of Electrical Engineering, National Central University, Jhongli, Taiwan)","institution_ids":["https://openalex.org/I22265921"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017543615","display_name":"Rong\u2010Seng Chang","orcid":null},"institutions":[{"id":"https://openalex.org/I22265921","display_name":"National Central University","ror":"https://ror.org/00944ve71","country_code":"TW","type":"education","lineage":["https://openalex.org/I22265921"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Rong-Seng Chang","raw_affiliation_strings":["Department of Optics and Photonics, National Central University, Jhong li, Taiwan","Department of Optics and Photonics, National Central University, Jhongli, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Optics and Photonics, National Central University, Jhong li, Taiwan","institution_ids":["https://openalex.org/I22265921"]},{"raw_affiliation_string":"Department of Optics and Photonics, National Central University, Jhongli, Taiwan","institution_ids":["https://openalex.org/I22265921"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048916817","display_name":"Li-Wei Ho","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Li-Wei Ho","raw_affiliation_strings":["HY Neural Technologies, Limited, Taipei, Taiwan","HY Neural Technologies, Ltd., Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"HY Neural Technologies, Limited, Taipei, Taiwan","institution_ids":[]},{"raw_affiliation_string":"HY Neural Technologies, Ltd., Taiwan","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5109187474","display_name":"Ching-Fu Yang","orcid":null},"institutions":[{"id":"https://openalex.org/I22265921","display_name":"National Central University","ror":"https://ror.org/00944ve71","country_code":"TW","type":"education","lineage":["https://openalex.org/I22265921"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Ching-Fu Yang","raw_affiliation_strings":["Department of Optics and Photonics, National Central University, Jhong li, Taiwan","Department of Optics and Photonics, National Central University, Jhongli, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Optics and Photonics, National Central University, Jhong li, Taiwan","institution_ids":["https://openalex.org/I22265921"]},{"raw_affiliation_string":"Department of Optics and Photonics, National Central University, Jhongli, Taiwan","institution_ids":["https://openalex.org/I22265921"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":3.3908,"has_fulltext":false,"cited_by_count":35,"citation_normalized_percentile":{"value":0.92194041,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"60","issue":"9","first_page":"3976","last_page":"3982"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9890999794006348,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/mura","display_name":"Mura","score":0.8161115646362305},{"id":"https://openalex.org/keywords/interference","display_name":"Interference (communication)","score":0.7166597247123718},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.6484148502349854},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.6421555280685425},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.6161124110221863},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5764788389205933},{"id":"https://openalex.org/keywords/thin-film-transistor","display_name":"Thin-film transistor","score":0.5544890761375427},{"id":"https://openalex.org/keywords/liquid-crystal-display","display_name":"Liquid-crystal display","score":0.5329006314277649},{"id":"https://openalex.org/keywords/visual-inspection","display_name":"Visual inspection","score":0.4647831916809082},{"id":"https://openalex.org/keywords/mean-squared-error","display_name":"Mean squared error","score":0.4152466356754303},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.38844266533851624},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.36683911085128784},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.33386749029159546},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2497779130935669},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.16670653223991394},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.11680781841278076},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.09799617528915405},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.09441298246383667}],"concepts":[{"id":"https://openalex.org/C2776147852","wikidata":"https://www.wikidata.org/wiki/Q6937160","display_name":"Mura","level":3,"score":0.8161115646362305},{"id":"https://openalex.org/C32022120","wikidata":"https://www.wikidata.org/wiki/Q797225","display_name":"Interference (communication)","level":3,"score":0.7166597247123718},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.6484148502349854},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.6421555280685425},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.6161124110221863},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5764788389205933},{"id":"https://openalex.org/C87359718","wikidata":"https://www.wikidata.org/wiki/Q1271916","display_name":"Thin-film transistor","level":3,"score":0.5544890761375427},{"id":"https://openalex.org/C128019096","wikidata":"https://www.wikidata.org/wiki/Q83341","display_name":"Liquid-crystal display","level":2,"score":0.5329006314277649},{"id":"https://openalex.org/C168820333","wikidata":"https://www.wikidata.org/wiki/Q448889","display_name":"Visual inspection","level":2,"score":0.4647831916809082},{"id":"https://openalex.org/C139945424","wikidata":"https://www.wikidata.org/wiki/Q1940696","display_name":"Mean squared error","level":2,"score":0.4152466356754303},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.38844266533851624},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.36683911085128784},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.33386749029159546},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2497779130935669},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.16670653223991394},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.11680781841278076},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.09799617528915405},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.09441298246383667},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tie.2012.2207658","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2012.2207658","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.6100000143051147}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":27,"referenced_works":["https://openalex.org/W1496897188","https://openalex.org/W1977834677","https://openalex.org/W1983369686","https://openalex.org/W1986487527","https://openalex.org/W1996722869","https://openalex.org/W2096529776","https://openalex.org/W2103880841","https://openalex.org/W2111554073","https://openalex.org/W2117287759","https://openalex.org/W2122073985","https://openalex.org/W2126513618","https://openalex.org/W2127044649","https://openalex.org/W2129007671","https://openalex.org/W2151260244","https://openalex.org/W2151765289","https://openalex.org/W2160679755","https://openalex.org/W2165888424","https://openalex.org/W2170874783","https://openalex.org/W2171428093","https://openalex.org/W2536507534","https://openalex.org/W4237938455","https://openalex.org/W4241214195","https://openalex.org/W6629760412","https://openalex.org/W6677740798","https://openalex.org/W6678335751","https://openalex.org/W6682926373","https://openalex.org/W6728460219"],"related_works":["https://openalex.org/W2883564816","https://openalex.org/W1976630228","https://openalex.org/W2168051707","https://openalex.org/W2141796872","https://openalex.org/W2083881355","https://openalex.org/W1995584621","https://openalex.org/W2353338342","https://openalex.org/W1979381067","https://openalex.org/W2036852092","https://openalex.org/W2349084057"],"abstract_inverted_index":{"Recently,":[0],"thin-film":[1],"transistor":[2],"liquid":[3],"crystal":[4],"displays":[5],"(TFT":[6],"LCDs)":[7],"have":[8],"had":[9],"a":[10,64],"high":[11],"demand":[12],"in":[13,54],"the":[14,34,38,52,82,84,102,110,116,121,124,129,133,147,156,164,169,184,188,208],"market,":[15],"which":[16],"entails":[17],"careful":[18],"product":[19],"quality":[20,39],"control":[21,40],"and":[22,62,113,145,149,160,211],"more":[23],"stringent":[24],"defect":[25,30,71,158],"detection":[26,31],"procedures.":[27],"A":[28],"good":[29],"rate":[32,131],"is":[33,57,74,140],"basic":[35],"requirement":[36],"of":[37,44,67,86,123,181,213],"process.":[41,135],"The":[42,136,196],"use":[43,115],"conventional":[45],"human":[46],"visual":[47],"inspection":[48,72,98,159],"methods":[49],"to":[50,80,89,108,119,142],"find":[51,81,109],"defects":[53,87,148],"TFT":[55],"LCDs":[56],"simply":[58],"not":[59],"accurate":[60],"enough":[61],"consumes":[63],"large":[65],"amount":[66],"resources.":[68],"An":[69],"automatic":[70],"method":[73,107,139,205],"thus":[75],"necessary":[76],"for":[77,132],"this":[78,204],"industry;":[79],"defects,":[83],"type":[85],"needs":[88],"be":[90,200,216],"recognized":[91],"as":[92],"well.":[93],"Here,":[94],"we":[95],"propose":[96],"an":[97],"procedure":[99],"based":[100],"on":[101,155],"optical":[103],"interference":[104,111,125],"pattern":[105],"sensing":[106],"fringes":[112],"then":[114],"image":[117],"processing":[118,210],"enhance":[120],"contrast":[122],"fringes,":[126],"thereby":[127],"increasing":[128],"recognition":[130],"latter":[134],"neural":[137,178],"network":[138,179],"used":[141],"learn":[143],"about":[144],"identify":[146],"their":[150],"types.":[151],"This":[152],"paper":[153],"focuses":[154],"mura":[157],"classification":[161],"method.":[162],"Before":[163],"learning":[165],"process":[166],"has":[167],"begun,":[168],"mean":[170,189],"squared":[171,190],"error":[172,191],"was":[173,192],"roughly":[174],"three,":[175],"but":[176],"after":[177],"retraining":[180],"these":[182],"samples,":[183],"results":[185],"showed":[186],"that":[187,207],"less":[193],"than":[194],"0.01.":[195],"defective":[197],"panels":[198],"can":[199,215],"sorted":[201],"out":[202],"using":[203],"so":[206],"next":[209],"waste":[212],"materials":[214],"avoided.":[217]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":4},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":4},{"year":2020,"cited_by_count":4},{"year":2019,"cited_by_count":4},{"year":2018,"cited_by_count":6},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":3},{"year":2014,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}