{"id":"https://openalex.org/W2144187919","doi":"https://doi.org/10.1109/tie.2008.2005018","title":"Bearing Fault Detection Via Stator Current Noise Cancellation and Statistical Control","display_name":"Bearing Fault Detection Via Stator Current Noise Cancellation and Statistical Control","publication_year":2008,"publication_date":"2008-09-26","ids":{"openalex":"https://openalex.org/W2144187919","doi":"https://doi.org/10.1109/tie.2008.2005018","mag":"2144187919"},"language":"en","primary_location":{"id":"doi:10.1109/tie.2008.2005018","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2008.2005018","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100773770","display_name":"Wei Zhou","orcid":"https://orcid.org/0000-0002-2175-726X"},"institutions":[{"id":"https://openalex.org/I87828566","display_name":"Edison International (United States)","ror":"https://ror.org/03q0f4n26","country_code":"US","type":"company","lineage":["https://openalex.org/I87828566"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Wei Zhou","raw_affiliation_strings":["Southern California Edison Company Limited, Rosemead, CA, USA","Southern California Edison, Rosemead CA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Southern California Edison Company Limited, Rosemead, CA, USA","institution_ids":["https://openalex.org/I87828566"]},{"raw_affiliation_string":"Southern California Edison, Rosemead CA","institution_ids":["https://openalex.org/I87828566"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054979012","display_name":"T.G. Habetler","orcid":"https://orcid.org/0000-0001-6598-2429"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"T.G. Habetler","raw_affiliation_strings":["School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA","[School of Electrical & Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]},{"raw_affiliation_string":"[School of Electrical & Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA]","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5105356524","display_name":"Ronald G. Harley","orcid":null},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"R.G. Harley","raw_affiliation_strings":["School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA","[School of Electrical & Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]},{"raw_affiliation_string":"[School of Electrical & Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA]","institution_ids":["https://openalex.org/I130701444"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":16.5639,"has_fulltext":false,"cited_by_count":164,"citation_normalized_percentile":{"value":0.99110705,"is_in_top_1_percent":true,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":95,"max":100},"biblio":{"volume":"55","issue":"12","first_page":"4260","last_page":"4269"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10534","display_name":"Structural Health Monitoring Techniques","score":0.9904999732971191,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11062","display_name":"Gear and Bearing Dynamics Analysis","score":0.9855999946594238,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/stator","display_name":"Stator","score":0.6991727948188782},{"id":"https://openalex.org/keywords/bearing","display_name":"Bearing (navigation)","score":0.6498757600784302},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.6380314826965332},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4802742004394531},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4663735032081604},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.4368559420108795},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.3646566867828369},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.27666592597961426},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.15920746326446533}],"concepts":[{"id":"https://openalex.org/C2776529397","wikidata":"https://www.wikidata.org/wiki/Q190312","display_name":"Stator","level":2,"score":0.6991727948188782},{"id":"https://openalex.org/C199978012","wikidata":"https://www.wikidata.org/wiki/Q1273815","display_name":"Bearing (navigation)","level":2,"score":0.6498757600784302},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.6380314826965332},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4802742004394531},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4663735032081604},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.4368559420108795},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3646566867828369},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.27666592597961426},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.15920746326446533},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tie.2008.2005018","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tie.2008.2005018","pdf_url":null,"source":{"id":"https://openalex.org/S58031724","display_name":"IEEE Transactions on Industrial Electronics","issn_l":"0278-0046","issn":["0278-0046","1557-9948"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Electronics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":47,"referenced_works":["https://openalex.org/W123426918","https://openalex.org/W587954119","https://openalex.org/W596210739","https://openalex.org/W1542762590","https://openalex.org/W1593743950","https://openalex.org/W1602659231","https://openalex.org/W1983381468","https://openalex.org/W1985957739","https://openalex.org/W1985965778","https://openalex.org/W1999491908","https://openalex.org/W2007949320","https://openalex.org/W2010574910","https://openalex.org/W2028614992","https://openalex.org/W2029027380","https://openalex.org/W2030007971","https://openalex.org/W2038430984","https://openalex.org/W2078912993","https://openalex.org/W2080773601","https://openalex.org/W2091311817","https://openalex.org/W2098039475","https://openalex.org/W2099017769","https://openalex.org/W2102796028","https://openalex.org/W2104588038","https://openalex.org/W2108530032","https://openalex.org/W2108744642","https://openalex.org/W2109725353","https://openalex.org/W2113172277","https://openalex.org/W2119811001","https://openalex.org/W2132265582","https://openalex.org/W2136764259","https://openalex.org/W2138461713","https://openalex.org/W2138889863","https://openalex.org/W2140870834","https://openalex.org/W2143615450","https://openalex.org/W2143839036","https://openalex.org/W2166219441","https://openalex.org/W2180421593","https://openalex.org/W2319842223","https://openalex.org/W2478884216","https://openalex.org/W2491646000","https://openalex.org/W2538440524","https://openalex.org/W2540543110","https://openalex.org/W3142020600","https://openalex.org/W4232447824","https://openalex.org/W4238314457","https://openalex.org/W4238387670","https://openalex.org/W6632476650"],"related_works":["https://openalex.org/W623794290","https://openalex.org/W2372255233","https://openalex.org/W2361693169","https://openalex.org/W2329787827","https://openalex.org/W2575656761","https://openalex.org/W2065631063","https://openalex.org/W2378667342","https://openalex.org/W2594567802","https://openalex.org/W2363739414","https://openalex.org/W2371385416"],"abstract_inverted_index":{"This":[0],"paper":[1],"proposes":[2],"a":[3,65,81,113,121],"new":[4],"approach":[5],"to":[6,52,71,80,97,154],"detect":[7,155],"<i":[8,11,21,24,156,159],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[9,12,22,25,157,160],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">in</i>":[10,23,158],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">situ</i>":[13,26,161],"bearing":[14,27,31,45,83,114,162],"faults":[15,163],"via":[16],"stator":[17,59,91,118,173],"current":[18,119],"monitoring.":[19],"For":[20],"faults,":[28],"the":[29,44,53,57,89,98,102,110,116,139,143,166,171],"characteristic":[30],"fault":[32,46],"frequencies":[33],"may":[34],"not":[35,78],"exist,":[36],"particularly":[37],"at":[38],"an":[39],"early":[40],"stage.":[41],"In":[42],"addition,":[43],"signatures":[47],"are":[48,77,93],"usually":[49],"subtle":[50],"compared":[51],"dominant":[54,74],"components":[55,75],"in":[56,62,129,168,181],"sampled":[58],"current.":[60],"Therefore,":[61,150],"this":[63,182],"paper,":[64],"noise":[66],"cancellation":[67],"technique":[68],"is":[69,106,135,152],"used":[70],"suppress":[72],"those":[73],"that":[76,108],"related":[79,96],"potential":[82],"fault.":[84],"The":[85,132],"remaining":[86],"components,":[87],"i.e.,":[88],"noise-cancelled":[90,117,172],"current,":[92,174],"then":[94],"closely":[95],"health":[99],"condition":[100],"of":[101,112,124,126,170],"bearing.":[103],"Furthermore,":[104],"it":[105,151],"observed":[107],"under":[109],"presence":[111],"fault,":[115],"displays":[120],"significant":[122],"amount":[123],"degrees":[125],"uncontrolled":[127,133],"variation":[128,134,167],"its":[130],"magnitude.":[131],"detected":[136],"by":[137,164,177],"observing":[138],"samples":[140],"falling":[141],"outside":[142],"three-sigma":[144],"limits":[145],"on":[146],"Shewhart's":[147],"control":[148],"charts.":[149],"possible":[153],"detecting":[165],"magnitude":[169],"as":[175],"verified":[176],"online":[178],"experiments":[179],"performed":[180],"paper.":[183]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":8},{"year":2023,"cited_by_count":9},{"year":2022,"cited_by_count":6},{"year":2021,"cited_by_count":9},{"year":2020,"cited_by_count":13},{"year":2019,"cited_by_count":10},{"year":2018,"cited_by_count":12},{"year":2017,"cited_by_count":14},{"year":2016,"cited_by_count":13},{"year":2015,"cited_by_count":15},{"year":2014,"cited_by_count":14},{"year":2013,"cited_by_count":9},{"year":2012,"cited_by_count":8}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}