{"id":"https://openalex.org/W3113626191","doi":"https://doi.org/10.1109/tgrs.2020.3042460","title":"A Multi-Degradation Aided Method for Unsupervised Remote Sensing Image Super Resolution With Convolution Neural Networks","display_name":"A Multi-Degradation Aided Method for Unsupervised Remote Sensing Image Super Resolution With Convolution Neural Networks","publication_year":2020,"publication_date":"2020-12-21","ids":{"openalex":"https://openalex.org/W3113626191","doi":"https://doi.org/10.1109/tgrs.2020.3042460","mag":"3113626191"},"language":"en","primary_location":{"id":"doi:10.1109/tgrs.2020.3042460","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tgrs.2020.3042460","pdf_url":null,"source":{"id":"https://openalex.org/S111326731","display_name":"IEEE Transactions on Geoscience and Remote Sensing","issn_l":"0196-2892","issn":["0196-2892","1558-0644"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Geoscience and Remote Sensing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100404849","display_name":"Ning Zhang","orcid":"https://orcid.org/0000-0002-1920-0649"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210088164","display_name":"Changchun Institute of Optics, Fine Mechanics and Physics","ror":"https://ror.org/012rct222","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210088164"]},{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ning Zhang","raw_affiliation_strings":["Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun, China","School of Optoelectronics, University of Chinese Academy of Sciences, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-1920-0649","affiliations":[{"raw_affiliation_string":"Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun, China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210088164"]},{"raw_affiliation_string":"School of Optoelectronics, University of Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210165038"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5037082491","display_name":"Yongcheng Wang","orcid":"https://orcid.org/0000-0002-1647-2956"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210088164","display_name":"Changchun Institute of Optics, Fine Mechanics and Physics","ror":"https://ror.org/012rct222","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210088164"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yongcheng Wang","raw_affiliation_strings":["Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun, China"],"raw_orcid":"https://orcid.org/0000-0002-1647-2956","affiliations":[{"raw_affiliation_string":"Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun, China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210088164"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100327448","display_name":"Xin Zhang","orcid":"https://orcid.org/0000-0002-4026-4284"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210088164","display_name":"Changchun Institute of Optics, Fine Mechanics and Physics","ror":"https://ror.org/012rct222","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210088164"]},{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xin Zhang","raw_affiliation_strings":["Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun, China","School of Optoelectronics, University of Chinese Academy of Sciences, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-4026-4284","affiliations":[{"raw_affiliation_string":"Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun, China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210088164"]},{"raw_affiliation_string":"School of Optoelectronics, University of Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210165038"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5000320630","display_name":"Dongdong Xu","orcid":"https://orcid.org/0000-0002-1528-4363"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210088164","display_name":"Changchun Institute of Optics, Fine Mechanics and Physics","ror":"https://ror.org/012rct222","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210088164"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Dongdong Xu","raw_affiliation_strings":["Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun, China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210088164"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100382629","display_name":"Xiaodong Wang","orcid":"https://orcid.org/0000-0001-5997-4174"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210088164","display_name":"Changchun Institute of Optics, Fine Mechanics and Physics","ror":"https://ror.org/012rct222","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210088164"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaodong Wang","raw_affiliation_strings":["Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun, China"],"raw_orcid":"https://orcid.org/0000-0001-5997-4174","affiliations":[{"raw_affiliation_string":"Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun, China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210088164"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007694942","display_name":"Guangli Ben","orcid":"https://orcid.org/0000-0002-9418-0641"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210088164","display_name":"Changchun Institute of Optics, Fine Mechanics and Physics","ror":"https://ror.org/012rct222","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210088164"]},{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Guangli Ben","raw_affiliation_strings":["Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun, China","School of Optoelectronics, University of Chinese Academy of Sciences, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0002-9418-0641","affiliations":[{"raw_affiliation_string":"Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun, China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210088164"]},{"raw_affiliation_string":"School of Optoelectronics, University of Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210165038"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5031947021","display_name":"Zhikang Zhao","orcid":"https://orcid.org/0000-0002-6515-1454"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210088164","display_name":"Changchun Institute of Optics, Fine Mechanics and Physics","ror":"https://ror.org/012rct222","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210088164"]},{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhikang Zhao","raw_affiliation_strings":["Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun, China","School of Optoelectronics, University of Chinese Academy of Sciences, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun, China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210088164"]},{"raw_affiliation_string":"School of Optoelectronics, University of Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210165038"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101762239","display_name":"Zheng Li","orcid":"https://orcid.org/0000-0002-3078-1886"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210088164","display_name":"Changchun Institute of Optics, Fine Mechanics and Physics","ror":"https://ror.org/012rct222","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210088164"]},{"id":"https://openalex.org/I4210165038","display_name":"University of Chinese Academy of Sciences","ror":"https://ror.org/05qbk4x57","country_code":"CN","type":"education","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210165038"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zheng Li","raw_affiliation_strings":["Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun, China","School of Optoelectronics, University of Chinese Academy of Sciences, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun, China","institution_ids":["https://openalex.org/I19820366","https://openalex.org/I4210088164"]},{"raw_affiliation_string":"School of Optoelectronics, University of Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210165038"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.1539,"has_fulltext":false,"cited_by_count":25,"citation_normalized_percentile":{"value":0.78936821,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":"60","issue":null,"first_page":"1","last_page":"14"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11105","display_name":"Advanced Image Processing Techniques","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11105","display_name":"Advanced Image Processing Techniques","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11659","display_name":"Advanced Image Fusion Techniques","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11019","display_name":"Image Enhancement Techniques","score":0.9965000152587891,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/bicubic-interpolation","display_name":"Bicubic interpolation","score":0.7544403672218323},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.6477131247520447},{"id":"https://openalex.org/keywords/convolution","display_name":"Convolution (computer science)","score":0.5631334781646729},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5515900254249573},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5289932489395142},{"id":"https://openalex.org/keywords/notation","display_name":"Notation","score":0.5241382718086243},{"id":"https://openalex.org/keywords/image-resolution","display_name":"Image resolution","score":0.5189006924629211},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.5103597044944763},{"id":"https://openalex.org/keywords/unsupervised-learning","display_name":"Unsupervised learning","score":0.47437602281570435},{"id":"https://openalex.org/keywords/convolutional-neural-network","display_name":"Convolutional neural network","score":0.42206257581710815},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.4172118902206421},{"id":"https://openalex.org/keywords/deep-learning","display_name":"Deep learning","score":0.413728803396225},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.3659241199493408},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.34399309754371643},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.28148603439331055}],"concepts":[{"id":"https://openalex.org/C49608258","wikidata":"https://www.wikidata.org/wiki/Q611705","display_name":"Bicubic interpolation","level":4,"score":0.7544403672218323},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.6477131247520447},{"id":"https://openalex.org/C45347329","wikidata":"https://www.wikidata.org/wiki/Q5166604","display_name":"Convolution (computer science)","level":3,"score":0.5631334781646729},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5515900254249573},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5289932489395142},{"id":"https://openalex.org/C45357846","wikidata":"https://www.wikidata.org/wiki/Q2001982","display_name":"Notation","level":2,"score":0.5241382718086243},{"id":"https://openalex.org/C205372480","wikidata":"https://www.wikidata.org/wiki/Q210521","display_name":"Image resolution","level":2,"score":0.5189006924629211},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.5103597044944763},{"id":"https://openalex.org/C8038995","wikidata":"https://www.wikidata.org/wiki/Q1152135","display_name":"Unsupervised learning","level":2,"score":0.47437602281570435},{"id":"https://openalex.org/C81363708","wikidata":"https://www.wikidata.org/wiki/Q17084460","display_name":"Convolutional neural network","level":2,"score":0.42206257581710815},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.4172118902206421},{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.413728803396225},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.3659241199493408},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.34399309754371643},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.28148603439331055},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C171836373","wikidata":"https://www.wikidata.org/wiki/Q2266329","display_name":"Linear interpolation","level":3,"score":0.0},{"id":"https://openalex.org/C94375191","wikidata":"https://www.wikidata.org/wiki/Q11205","display_name":"Arithmetic","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tgrs.2020.3042460","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tgrs.2020.3042460","pdf_url":null,"source":{"id":"https://openalex.org/S111326731","display_name":"IEEE Transactions on Geoscience and Remote Sensing","issn_l":"0196-2892","issn":["0196-2892","1558-0644"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Geoscience and Remote Sensing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320321133","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":53,"referenced_works":["https://openalex.org/W233979554","https://openalex.org/W1513879401","https://openalex.org/W1710476689","https://openalex.org/W1885185971","https://openalex.org/W1930824406","https://openalex.org/W1976416062","https://openalex.org/W1980038761","https://openalex.org/W2081385919","https://openalex.org/W2087380704","https://openalex.org/W2088909704","https://openalex.org/W2102166818","https://openalex.org/W2117865218","https://openalex.org/W2121058967","https://openalex.org/W2170965888","https://openalex.org/W2200125188","https://openalex.org/W2276858186","https://openalex.org/W2432643382","https://openalex.org/W2534320940","https://openalex.org/W2560755969","https://openalex.org/W2582369608","https://openalex.org/W2592962403","https://openalex.org/W2593697158","https://openalex.org/W2621121458","https://openalex.org/W2774112877","https://openalex.org/W2799929262","https://openalex.org/W2800388963","https://openalex.org/W2810821452","https://openalex.org/W2866634454","https://openalex.org/W2900595774","https://openalex.org/W2901044172","https://openalex.org/W2903779395","https://openalex.org/W2907551576","https://openalex.org/W2931993473","https://openalex.org/W2957558419","https://openalex.org/W2962903125","https://openalex.org/W2963372104","https://openalex.org/W2963470893","https://openalex.org/W2963704386","https://openalex.org/W2963774720","https://openalex.org/W2964013315","https://openalex.org/W2964277374","https://openalex.org/W2976372274","https://openalex.org/W2986795095","https://openalex.org/W2997019934","https://openalex.org/W3005198074","https://openalex.org/W3005521100","https://openalex.org/W3007002906","https://openalex.org/W3016355810","https://openalex.org/W3035302306","https://openalex.org/W3038923562","https://openalex.org/W3103699521","https://openalex.org/W4229921563","https://openalex.org/W6757108679"],"related_works":["https://openalex.org/W4321369474","https://openalex.org/W2731899572","https://openalex.org/W3133861977","https://openalex.org/W4200173597","https://openalex.org/W3116150086","https://openalex.org/W2999805992","https://openalex.org/W4291897433","https://openalex.org/W3011074480","https://openalex.org/W3192840557","https://openalex.org/W4312417841"],"abstract_inverted_index":{"In":[0],"remote":[1,176],"sensing,":[2],"it":[3],"is":[4,25,36],"desirable":[5],"to":[6,83,97],"improve":[7],"image":[8,13,86,114,117,133,135],"resolution":[9,131],"by":[10,137,180],"using":[11],"the":[12,22,38,51,56,85,109,154,181,193],"super-resolution":[14],"(SR)":[15],"technique.":[16],"However,":[17],"there":[18],"are":[19,30],"two":[20,58],"challenges:":[21],"first":[23],"one":[24,35],"that":[26,37,150],"high-resolution":[27],"(HR)":[28],"images":[29,49,178],"insufficient":[31],"or":[32],"unavailable;":[33],"another":[34],"single":[39],"degradation":[40,87,147],"model":[41,88],"such":[42],"as":[43,118],"bicubic":[44],"(BIC)":[45],"cannot":[46],"super-resolve":[47],"favorable":[48],"in":[50,167,195],"real":[52,175],"world.":[53],"To":[54],"address":[55],"above":[57],"problems,":[59],"this":[60],"article":[61],"presents":[62],"a":[63,76,90],"multi-degradation,":[64],"unsupervised":[65,142,160],"SR":[66,99,113,120,138,161,171],"method":[67,152,185],"based":[68],"on":[69,145],"deep":[70],"learning.":[71,143],"This":[72],"framework":[73],"consists":[74],"of":[75],"degrader":[77],"<inline-formula>":[78,92,103],"<tex-math":[79,93,104],"notation=\"LaTeX\">$":[80,94,105],"{D}$":[81,106],"</tex-math></inline-formula>":[82,96],"fit":[84],"and":[89,115,134,163],"generator":[91],"{G}$":[95],"generate":[98],"image.":[100],"By":[101],"introducing":[102],"</tex-math></inline-formula>,":[107],"calculating":[108,127],"loss":[110,128],"function":[111],"between":[112,129],"HR":[116],"supervised":[119,170],"methods":[121],"did":[122],"can":[123],"be":[124],"converted":[125],"into":[126],"low":[130],"(LR)":[132],"degraded":[136],"image,":[139],"thereby":[140],"realizing":[141],"Experiments":[144],"several":[146],"models":[148],"show":[149],"our":[151,184],"renders":[153],"state-of-the-art":[155],"results":[156,166,189],"compared":[157],"with":[158,169],"existing":[159],"methods,":[162],"achieves":[164],"competitive":[165],"contrast":[168],"methods.":[172],"Moreover,":[173],"for":[174],"sensing":[177],"obtained":[179,186],"Jilin-1":[182],"satellite,":[183],"more":[187],"plausible":[188],"visually,":[190],"which":[191],"demonstrate":[192],"potential":[194],"real-world":[196],"applications.":[197]},"counts_by_year":[{"year":2025,"cited_by_count":6},{"year":2024,"cited_by_count":7},{"year":2023,"cited_by_count":8},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":3}],"updated_date":"2026-07-22T07:51:19.307946","created_date":"2025-10-10T00:00:00"}