{"id":"https://openalex.org/W2050659754","doi":"https://doi.org/10.1109/tgrs.2013.2273554","title":"Measurement of Sharpness and Its Application in ISAR Imaging","display_name":"Measurement of Sharpness and Its Application in ISAR Imaging","publication_year":2013,"publication_date":"2013-08-07","ids":{"openalex":"https://openalex.org/W2050659754","doi":"https://doi.org/10.1109/tgrs.2013.2273554","mag":"2050659754"},"language":"en","primary_location":{"id":"doi:10.1109/tgrs.2013.2273554","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tgrs.2013.2273554","pdf_url":null,"source":{"id":"https://openalex.org/S111326731","display_name":"IEEE Transactions on Geoscience and Remote Sensing","issn_l":"0196-2892","issn":["0196-2892","1558-0644"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Geoscience and Remote Sensing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100377330","display_name":"Junfeng Wang","orcid":"https://orcid.org/0000-0002-7197-7404"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Junfeng Wang","raw_affiliation_strings":["Department of Electronic Engineering, Shanghai Jiao Tong University, Shanghai, China","Dept of Electron. Eng., Shanghai Jiao Tong Univ., Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]},{"raw_affiliation_string":"Dept of Electron. Eng., Shanghai Jiao Tong Univ., Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5061319150","display_name":"Xingzhao Liu","orcid":"https://orcid.org/0000-0002-4533-3904"},"institutions":[{"id":"https://openalex.org/I183067930","display_name":"Shanghai Jiao Tong University","ror":"https://ror.org/0220qvk04","country_code":"CN","type":"education","lineage":["https://openalex.org/I183067930"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xingzhao Liu","raw_affiliation_strings":["Department of Electronic Engineering, Shanghai Jiao Tong University, Shanghai, China","Dept of Electron. Eng., Shanghai Jiao Tong Univ., Shanghai, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, Shanghai Jiao Tong University, Shanghai, China","institution_ids":["https://openalex.org/I183067930"]},{"raw_affiliation_string":"Dept of Electron. Eng., Shanghai Jiao Tong Univ., Shanghai, China","institution_ids":["https://openalex.org/I183067930"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I183067930"],"apc_list":null,"apc_paid":null,"fwci":3.1703,"has_fulltext":false,"cited_by_count":25,"citation_normalized_percentile":{"value":0.90271678,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":97},"biblio":{"volume":"51","issue":"9","first_page":"4885","last_page":"4892"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10662","display_name":"Ultrasonics and Acoustic Wave Propagation","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10662","display_name":"Ultrasonics and Acoustic Wave Propagation","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11038","display_name":"Advanced SAR Imaging Techniques","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10500","display_name":"Sparse and Compressive Sensing Techniques","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/inverse-synthetic-aperture-radar","display_name":"Inverse synthetic aperture radar","score":0.8307561874389648},{"id":"https://openalex.org/keywords/synthetic-aperture-radar","display_name":"Synthetic aperture radar","score":0.7926962375640869},{"id":"https://openalex.org/keywords/measure","display_name":"Measure (data warehouse)","score":0.7890803813934326},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6780407428741455},{"id":"https://openalex.org/keywords/class","display_name":"Class (philosophy)","score":0.6713156700134277},{"id":"https://openalex.org/keywords/relation","display_name":"Relation (database)","score":0.6650099754333496},{"id":"https://openalex.org/keywords/radar-imaging","display_name":"Radar imaging","score":0.6140308380126953},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5765208005905151},{"id":"https://openalex.org/keywords/inverse-problem","display_name":"Inverse problem","score":0.46574175357818604},{"id":"https://openalex.org/keywords/radar","display_name":"Radar","score":0.4486097991466522},{"id":"https://openalex.org/keywords/inverse","display_name":"Inverse","score":0.44080469012260437},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.42322057485580444},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.3658955693244934},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2291812300682068},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.20818191766738892}],"concepts":[{"id":"https://openalex.org/C109094680","wikidata":"https://www.wikidata.org/wiki/Q6060432","display_name":"Inverse synthetic aperture radar","level":4,"score":0.8307561874389648},{"id":"https://openalex.org/C87360688","wikidata":"https://www.wikidata.org/wiki/Q740686","display_name":"Synthetic aperture radar","level":2,"score":0.7926962375640869},{"id":"https://openalex.org/C2780009758","wikidata":"https://www.wikidata.org/wiki/Q6804172","display_name":"Measure (data warehouse)","level":2,"score":0.7890803813934326},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6780407428741455},{"id":"https://openalex.org/C2777212361","wikidata":"https://www.wikidata.org/wiki/Q5127848","display_name":"Class (philosophy)","level":2,"score":0.6713156700134277},{"id":"https://openalex.org/C25343380","wikidata":"https://www.wikidata.org/wiki/Q277521","display_name":"Relation (database)","level":2,"score":0.6650099754333496},{"id":"https://openalex.org/C10929652","wikidata":"https://www.wikidata.org/wiki/Q7279985","display_name":"Radar imaging","level":3,"score":0.6140308380126953},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5765208005905151},{"id":"https://openalex.org/C135252773","wikidata":"https://www.wikidata.org/wiki/Q1567213","display_name":"Inverse problem","level":2,"score":0.46574175357818604},{"id":"https://openalex.org/C554190296","wikidata":"https://www.wikidata.org/wiki/Q47528","display_name":"Radar","level":2,"score":0.4486097991466522},{"id":"https://openalex.org/C207467116","wikidata":"https://www.wikidata.org/wiki/Q4385666","display_name":"Inverse","level":2,"score":0.44080469012260437},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.42322057485580444},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.3658955693244934},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2291812300682068},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.20818191766738892},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tgrs.2013.2273554","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tgrs.2013.2273554","pdf_url":null,"source":{"id":"https://openalex.org/S111326731","display_name":"IEEE Transactions on Geoscience and Remote Sensing","issn_l":"0196-2892","issn":["0196-2892","1558-0644"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Geoscience and Remote Sensing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/10","display_name":"Reduced inequalities","score":0.49000000953674316}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W611947542","https://openalex.org/W1602107991","https://openalex.org/W1995875735","https://openalex.org/W1996276645","https://openalex.org/W2017832133","https://openalex.org/W2019024593","https://openalex.org/W2037665665","https://openalex.org/W2048659479","https://openalex.org/W2054220418","https://openalex.org/W2081438586","https://openalex.org/W2082476922","https://openalex.org/W2090265124","https://openalex.org/W2097924784","https://openalex.org/W2099885111","https://openalex.org/W2114169008","https://openalex.org/W2127271355","https://openalex.org/W2137765378","https://openalex.org/W2145096794","https://openalex.org/W2148525506","https://openalex.org/W2154684095","https://openalex.org/W2168850184","https://openalex.org/W2296616510","https://openalex.org/W2536281972","https://openalex.org/W4250955649","https://openalex.org/W6674938092"],"related_works":["https://openalex.org/W2996630340","https://openalex.org/W2540450177","https://openalex.org/W2170580735","https://openalex.org/W1552305638","https://openalex.org/W2112228652","https://openalex.org/W2545123933","https://openalex.org/W1994788526","https://openalex.org/W1915418828","https://openalex.org/W2613451563","https://openalex.org/W1966299760"],"abstract_inverted_index":{"It":[0],"is":[1,16,29,68],"necessary":[2],"to":[3,52,64,72],"measure":[4,67],"the":[5,22,42,54,59,65,83],"sharpness":[6,28,37,46,55],"of":[7,14,44,61,85],"distributions":[8],"in":[9,18,88],"many":[10],"situations.":[11],"A":[12],"class":[13,26,35,63,87],"functions":[15],"investigated":[17],"this":[19,25,32,34,62,86],"paper.":[20],"First,":[21],"relation":[23,60],"between":[24],"and":[27,31,48,81],"clarified,":[30],"justifies":[33],"as":[36],"measures.":[38],"Then,":[39],"we":[40,79],"analyze":[41],"performance":[43],"different":[45],"measures":[47],"present":[49],"a":[50,73],"guide":[51],"select":[53],"measure.":[56],"In":[57],"addition,":[58],"sparsity":[66],"addressed,":[69],"which":[70],"leads":[71],"deeper":[74],"understanding":[75],"about":[76],"sparsity.":[77],"Finally,":[78],"show":[80],"discuss":[82],"application":[84],"inverse":[89],"synthetic":[90],"aperture":[91],"radar":[92],"imaging.":[93]},"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":3},{"year":2019,"cited_by_count":2},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":3},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}