{"id":"https://openalex.org/W2013074634","doi":"https://doi.org/10.1109/tgrs.2013.2252909","title":"Polarization Features in Bistatic Scattering From Rough Surfaces","display_name":"Polarization Features in Bistatic Scattering From Rough Surfaces","publication_year":2014,"publication_date":"2014-01-03","ids":{"openalex":"https://openalex.org/W2013074634","doi":"https://doi.org/10.1109/tgrs.2013.2252909","mag":"2013074634"},"language":"en","primary_location":{"id":"doi:10.1109/tgrs.2013.2252909","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tgrs.2013.2252909","pdf_url":null,"source":{"id":"https://openalex.org/S111326731","display_name":"IEEE Transactions on Geoscience and Remote Sensing","issn_l":"0196-2892","issn":["0196-2892","1558-0644"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Geoscience and Remote Sensing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5004567285","display_name":"Joel T. Johnson","orcid":"https://orcid.org/0000-0002-6921-6059"},"institutions":[{"id":"https://openalex.org/I52357470","display_name":"The Ohio State University","ror":"https://ror.org/00rs6vg23","country_code":"US","type":"education","lineage":["https://openalex.org/I52357470"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Joel T. Johnson","raw_affiliation_strings":["Department of Electrical and Computer Engineering and ElectroScience Laboratory, The Ohio State University, Columbus, OH, USA","Dept. of Electr., Ohio State Univ., Columbus, OH, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering and ElectroScience Laboratory, The Ohio State University, Columbus, OH, USA","institution_ids":["https://openalex.org/I52357470"]},{"raw_affiliation_string":"Dept. of Electr., Ohio State Univ., Columbus, OH, USA","institution_ids":["https://openalex.org/I52357470"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5025649287","display_name":"Jeffrey D. Ouellette","orcid":"https://orcid.org/0000-0003-3718-2509"},"institutions":[{"id":"https://openalex.org/I52357470","display_name":"The Ohio State University","ror":"https://ror.org/00rs6vg23","country_code":"US","type":"education","lineage":["https://openalex.org/I52357470"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jeffrey D. Ouellette","raw_affiliation_strings":["Department of Electrical and Computer Engineering and ElectroScience Laboratory, The Ohio State University, Columbus, OH, USA","Dept. of Electr., Ohio State Univ., Columbus, OH, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering and ElectroScience Laboratory, The Ohio State University, Columbus, OH, USA","institution_ids":["https://openalex.org/I52357470"]},{"raw_affiliation_string":"Dept. of Electr., Ohio State Univ., Columbus, OH, USA","institution_ids":["https://openalex.org/I52357470"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5004567285"],"corresponding_institution_ids":["https://openalex.org/I52357470"],"apc_list":null,"apc_paid":null,"fwci":6.0669,"has_fulltext":false,"cited_by_count":59,"citation_normalized_percentile":{"value":0.96120971,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":93,"max":99},"biblio":{"volume":"52","issue":"3","first_page":"1616","last_page":"1626"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11312","display_name":"Soil Moisture and Remote Sensing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2305","display_name":"Environmental Engineering"},"field":{"id":"https://openalex.org/fields/23","display_name":"Environmental Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11312","display_name":"Soil Moisture and Remote Sensing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2305","display_name":"Environmental Engineering"},"field":{"id":"https://openalex.org/fields/23","display_name":"Environmental Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10739","display_name":"Electromagnetic Scattering and Analysis","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10801","display_name":"Synthetic Aperture Radar (SAR) Applications and Techniques","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/scattering","display_name":"Scattering","score":0.8152784109115601},{"id":"https://openalex.org/keywords/bistatic-radar","display_name":"Bistatic radar","score":0.7222806811332703},{"id":"https://openalex.org/keywords/surface-roughness","display_name":"Surface roughness","score":0.6944977641105652},{"id":"https://openalex.org/keywords/azimuth","display_name":"Azimuth","score":0.6882323026657104},{"id":"https://openalex.org/keywords/polarization","display_name":"Polarization (electrochemistry)","score":0.664857029914856},{"id":"https://openalex.org/keywords/maxima-and-minima","display_name":"Maxima and minima","score":0.6507503986358643},{"id":"https://openalex.org/keywords/surface-finish","display_name":"Surface finish","score":0.6103185415267944},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.6076393127441406},{"id":"https://openalex.org/keywords/permittivity","display_name":"Permittivity","score":0.6069740056991577},{"id":"https://openalex.org/keywords/radar-cross-section","display_name":"Radar cross-section","score":0.5360071659088135},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.45901456475257874},{"id":"https://openalex.org/keywords/radar","display_name":"Radar","score":0.4484196603298187},{"id":"https://openalex.org/keywords/forward-scatter","display_name":"Forward scatter","score":0.4242221415042877},{"id":"https://openalex.org/keywords/surface","display_name":"Surface (topology)","score":0.4176557660102844},{"id":"https://openalex.org/keywords/computational-physics","display_name":"Computational physics","score":0.4052388668060303},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3234848976135254},{"id":"https://openalex.org/keywords/radar-imaging","display_name":"Radar imaging","score":0.2830809950828552},{"id":"https://openalex.org/keywords/geometry","display_name":"Geometry","score":0.2426726222038269},{"id":"https://openalex.org/keywords/dielectric","display_name":"Dielectric","score":0.20488232374191284},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.1557861566543579},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.14154064655303955},{"id":"https://openalex.org/keywords/mathematical-analysis","display_name":"Mathematical analysis","score":0.11487051844596863},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.09091624617576599},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.07838639616966248}],"concepts":[{"id":"https://openalex.org/C191486275","wikidata":"https://www.wikidata.org/wiki/Q210028","display_name":"Scattering","level":2,"score":0.8152784109115601},{"id":"https://openalex.org/C100102862","wikidata":"https://www.wikidata.org/wiki/Q2625855","display_name":"Bistatic radar","level":4,"score":0.7222806811332703},{"id":"https://openalex.org/C107365816","wikidata":"https://www.wikidata.org/wiki/Q114817","display_name":"Surface roughness","level":2,"score":0.6944977641105652},{"id":"https://openalex.org/C159737794","wikidata":"https://www.wikidata.org/wiki/Q124274","display_name":"Azimuth","level":2,"score":0.6882323026657104},{"id":"https://openalex.org/C205049153","wikidata":"https://www.wikidata.org/wiki/Q2698605","display_name":"Polarization (electrochemistry)","level":2,"score":0.664857029914856},{"id":"https://openalex.org/C186633575","wikidata":"https://www.wikidata.org/wiki/Q845060","display_name":"Maxima and minima","level":2,"score":0.6507503986358643},{"id":"https://openalex.org/C71039073","wikidata":"https://www.wikidata.org/wiki/Q3439090","display_name":"Surface finish","level":2,"score":0.6103185415267944},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.6076393127441406},{"id":"https://openalex.org/C168651791","wikidata":"https://www.wikidata.org/wiki/Q211569","display_name":"Permittivity","level":3,"score":0.6069740056991577},{"id":"https://openalex.org/C101457746","wikidata":"https://www.wikidata.org/wiki/Q560430","display_name":"Radar cross-section","level":3,"score":0.5360071659088135},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.45901456475257874},{"id":"https://openalex.org/C554190296","wikidata":"https://www.wikidata.org/wiki/Q47528","display_name":"Radar","level":2,"score":0.4484196603298187},{"id":"https://openalex.org/C54644633","wikidata":"https://www.wikidata.org/wiki/Q5473287","display_name":"Forward scatter","level":3,"score":0.4242221415042877},{"id":"https://openalex.org/C2776799497","wikidata":"https://www.wikidata.org/wiki/Q484298","display_name":"Surface (topology)","level":2,"score":0.4176557660102844},{"id":"https://openalex.org/C30475298","wikidata":"https://www.wikidata.org/wiki/Q909554","display_name":"Computational physics","level":1,"score":0.4052388668060303},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3234848976135254},{"id":"https://openalex.org/C10929652","wikidata":"https://www.wikidata.org/wiki/Q7279985","display_name":"Radar imaging","level":3,"score":0.2830809950828552},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.2426726222038269},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.20488232374191284},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.1557861566543579},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.14154064655303955},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.11487051844596863},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.09091624617576599},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.07838639616966248},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C147789679","wikidata":"https://www.wikidata.org/wiki/Q11372","display_name":"Physical chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tgrs.2013.2252909","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tgrs.2013.2252909","pdf_url":null,"source":{"id":"https://openalex.org/S111326731","display_name":"IEEE Transactions on Geoscience and Remote Sensing","issn_l":"0196-2892","issn":["0196-2892","1558-0644"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Geoscience and Remote Sensing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Sustainable cities and communities","score":0.5899999737739563,"id":"https://metadata.un.org/sdg/11"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":35,"referenced_works":["https://openalex.org/W1618779158","https://openalex.org/W1972066449","https://openalex.org/W1972570553","https://openalex.org/W1974176187","https://openalex.org/W1976200524","https://openalex.org/W1977485235","https://openalex.org/W1985475381","https://openalex.org/W1988413763","https://openalex.org/W1997671882","https://openalex.org/W1999625028","https://openalex.org/W2010086826","https://openalex.org/W2014228318","https://openalex.org/W2035424325","https://openalex.org/W2037780531","https://openalex.org/W2054565622","https://openalex.org/W2057321870","https://openalex.org/W2066758575","https://openalex.org/W2067615318","https://openalex.org/W2077913833","https://openalex.org/W2094315764","https://openalex.org/W2096140206","https://openalex.org/W2096939319","https://openalex.org/W2100054272","https://openalex.org/W2112005110","https://openalex.org/W2113130306","https://openalex.org/W2114778030","https://openalex.org/W2142612228","https://openalex.org/W2151173926","https://openalex.org/W2155411643","https://openalex.org/W2161374143","https://openalex.org/W2162903493","https://openalex.org/W2166265439","https://openalex.org/W3196167428","https://openalex.org/W4297846306","https://openalex.org/W6652991377"],"related_works":["https://openalex.org/W1971489344","https://openalex.org/W2358496650","https://openalex.org/W1577762516","https://openalex.org/W2373103466","https://openalex.org/W2749793405","https://openalex.org/W1726654622","https://openalex.org/W2909443172","https://openalex.org/W2131863848","https://openalex.org/W2124462420","https://openalex.org/W2902667892"],"abstract_inverted_index":{"A":[0],"study":[1],"of":[2,7,30,41,66,85,110,121,125],"the":[3,28,34,42,64,71,83,86,98,108,122],"bistatic":[4,112],"scattering":[5,46],"patterns":[6],"rough":[8,116],"surfaces":[9,131],"is":[10,49,89,132],"reported.":[11],"We":[12],"utilize":[13],"both":[14],"approximate":[15],"and":[16,23,44,59,69],"numerically":[17],"exact":[18],"models":[19],"for":[20,57,74,79,114,128],"surface":[21,99,117,126],"scattering,":[22],"focus":[24],"in":[25,33,63,107],"particular":[26],"on":[27,82],"location":[29],"local":[31],"minima":[32,53],"normalized":[35],"radar":[36],"cross-section":[37],"as":[38,97,134],"a":[39],"function":[40],"polar":[43],"azimuthal":[45],"angles.":[47],"It":[48,88],"shown":[50,91],"that":[51,70,92],"these":[52,93],"locations":[54,73],"are":[55,77,95],"distinct":[56],"HH":[58],"VV":[60,75],"polarized":[61],"returns":[62],"case":[65,81],"slight":[67],"roughness,":[68],"minimum":[72],"polarization":[76],"dependent":[78],"this":[80],"permittivity":[84,127],"surface.":[87],"also":[90],"behaviors":[94],"modified":[96],"roughness":[100],"increases.":[101],"These":[102],"results":[103],"may":[104],"be":[105],"useful":[106],"design":[109],"future":[111],"methods":[113],"sensing":[115,124],"properties;":[118],"initial":[119],"consideration":[120],"remote":[123],"small":[129],"height":[130],"provided":[133],"an":[135],"example.":[136]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":6},{"year":2019,"cited_by_count":5},{"year":2018,"cited_by_count":9},{"year":2017,"cited_by_count":8},{"year":2016,"cited_by_count":6},{"year":2015,"cited_by_count":7},{"year":2014,"cited_by_count":4}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}