{"id":"https://openalex.org/W2081207263","doi":"https://doi.org/10.1109/tgrs.2012.2201259","title":"Measurement of Complex Permittivity of Cylindrical Objects in the E-Plane of a Rectangular Waveguide","display_name":"Measurement of Complex Permittivity of Cylindrical Objects in the E-Plane of a Rectangular Waveguide","publication_year":2012,"publication_date":"2012-07-10","ids":{"openalex":"https://openalex.org/W2081207263","doi":"https://doi.org/10.1109/tgrs.2012.2201259","mag":"2081207263"},"language":"en","primary_location":{"id":"doi:10.1109/tgrs.2012.2201259","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tgrs.2012.2201259","pdf_url":null,"source":{"id":"https://openalex.org/S111326731","display_name":"IEEE Transactions on Geoscience and Remote Sensing","issn_l":"0196-2892","issn":["0196-2892","1558-0644"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Geoscience and Remote Sensing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5042578932","display_name":"M. Jaleel Akhtar","orcid":"https://orcid.org/0000-0001-6918-3595"},"institutions":[{"id":"https://openalex.org/I94234084","display_name":"Indian Institute of Technology Kanpur","ror":"https://ror.org/05pjsgx75","country_code":"IN","type":"education","lineage":["https://openalex.org/I94234084"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"M. Jaleel Akhtar","raw_affiliation_strings":["Department of Electrical Engineering, Indian Institute of Technology Kanpur, Kanpur, India","Dept. of Electr. Eng., Indian Inst. of Technol. Kanpur, Kanpur, India"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Indian Institute of Technology Kanpur, Kanpur, India","institution_ids":["https://openalex.org/I94234084"]},{"raw_affiliation_string":"Dept. of Electr. Eng., Indian Inst. of Technol. Kanpur, Kanpur, India","institution_ids":["https://openalex.org/I94234084"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5017141171","display_name":"M. Thumm","orcid":"https://orcid.org/0000-0003-1909-3166"},"institutions":[{"id":"https://openalex.org/I102335020","display_name":"Karlsruhe Institute of Technology","ror":"https://ror.org/04t3en479","country_code":"DE","type":"education","lineage":["https://openalex.org/I102335020","https://openalex.org/I1305996414"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Manfred Thumm","raw_affiliation_strings":["Institut f\u00fcr Hochleistungsimpuls-und Mikrowellentechnik, Karlsruhe Institut f\u00fcr Technologie, Karlsruhe, Germany","Inst. fur Hochleistungsimpuls- und Mikrowellentech., Karlsruhe Inst. fur Technol., Karlsruhe, Germany"],"affiliations":[{"raw_affiliation_string":"Institut f\u00fcr Hochleistungsimpuls-und Mikrowellentechnik, Karlsruhe Institut f\u00fcr Technologie, Karlsruhe, Germany","institution_ids":["https://openalex.org/I102335020"]},{"raw_affiliation_string":"Inst. fur Hochleistungsimpuls- und Mikrowellentech., Karlsruhe Inst. fur Technol., Karlsruhe, Germany","institution_ids":["https://openalex.org/I102335020"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5042578932"],"corresponding_institution_ids":["https://openalex.org/I94234084"],"apc_list":null,"apc_paid":null,"fwci":0.5029,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.70005912,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"51","issue":"1","first_page":"122","last_page":"131"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11312","display_name":"Soil Moisture and Remote Sensing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2305","display_name":"Environmental Engineering"},"field":{"id":"https://openalex.org/fields/23","display_name":"Environmental Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11312","display_name":"Soil Moisture and Remote Sensing","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2305","display_name":"Environmental Engineering"},"field":{"id":"https://openalex.org/fields/23","display_name":"Environmental Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10262","display_name":"Microwave Engineering and Waveguides","score":0.9909999966621399,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dielectric","display_name":"Dielectric","score":0.8135337233543396},{"id":"https://openalex.org/keywords/permittivity","display_name":"Permittivity","score":0.7745579481124878},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.6560624241828918},{"id":"https://openalex.org/keywords/waveguide","display_name":"Waveguide","score":0.6484556794166565},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.6258481740951538},{"id":"https://openalex.org/keywords/relative-permittivity","display_name":"Relative permittivity","score":0.5836988687515259},{"id":"https://openalex.org/keywords/reflection","display_name":"Reflection (computer programming)","score":0.5245745182037354},{"id":"https://openalex.org/keywords/scattering","display_name":"Scattering","score":0.5117440223693848},{"id":"https://openalex.org/keywords/scattering-parameters","display_name":"Scattering parameters","score":0.5006325244903564},{"id":"https://openalex.org/keywords/cross-section","display_name":"Cross section (physics)","score":0.4554634988307953},{"id":"https://openalex.org/keywords/reflection-coefficient","display_name":"Reflection coefficient","score":0.4440363943576813},{"id":"https://openalex.org/keywords/approximation-error","display_name":"Approximation error","score":0.4231576919555664},{"id":"https://openalex.org/keywords/plane","display_name":"Plane (geometry)","score":0.4177156090736389},{"id":"https://openalex.org/keywords/acoustics","display_name":"Acoustics","score":0.35567784309387207},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.23209217190742493},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.1958475112915039},{"id":"https://openalex.org/keywords/geometry","display_name":"Geometry","score":0.19011127948760986},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.16964605450630188},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.15875095129013062},{"id":"https://openalex.org/keywords/mathematical-analysis","display_name":"Mathematical analysis","score":0.14445924758911133}],"concepts":[{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.8135337233543396},{"id":"https://openalex.org/C168651791","wikidata":"https://www.wikidata.org/wiki/Q211569","display_name":"Permittivity","level":3,"score":0.7745579481124878},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.6560624241828918},{"id":"https://openalex.org/C200687136","wikidata":"https://www.wikidata.org/wiki/Q11233438","display_name":"Waveguide","level":2,"score":0.6484556794166565},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6258481740951538},{"id":"https://openalex.org/C13760523","wikidata":"https://www.wikidata.org/wiki/Q4027242","display_name":"Relative permittivity","level":4,"score":0.5836988687515259},{"id":"https://openalex.org/C65682993","wikidata":"https://www.wikidata.org/wiki/Q1056451","display_name":"Reflection (computer programming)","level":2,"score":0.5245745182037354},{"id":"https://openalex.org/C191486275","wikidata":"https://www.wikidata.org/wiki/Q210028","display_name":"Scattering","level":2,"score":0.5117440223693848},{"id":"https://openalex.org/C195266298","wikidata":"https://www.wikidata.org/wiki/Q2165620","display_name":"Scattering parameters","level":2,"score":0.5006325244903564},{"id":"https://openalex.org/C52234038","wikidata":"https://www.wikidata.org/wiki/Q17128025","display_name":"Cross section (physics)","level":2,"score":0.4554634988307953},{"id":"https://openalex.org/C41700454","wikidata":"https://www.wikidata.org/wiki/Q1852282","display_name":"Reflection coefficient","level":2,"score":0.4440363943576813},{"id":"https://openalex.org/C122383733","wikidata":"https://www.wikidata.org/wiki/Q865920","display_name":"Approximation error","level":2,"score":0.4231576919555664},{"id":"https://openalex.org/C17825722","wikidata":"https://www.wikidata.org/wiki/Q17285","display_name":"Plane (geometry)","level":2,"score":0.4177156090736389},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.35567784309387207},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.23209217190742493},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.1958475112915039},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.19011127948760986},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.16964605450630188},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.15875095129013062},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.14445924758911133},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tgrs.2012.2201259","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tgrs.2012.2201259","pdf_url":null,"source":{"id":"https://openalex.org/S111326731","display_name":"IEEE Transactions on Geoscience and Remote Sensing","issn_l":"0196-2892","issn":["0196-2892","1558-0644"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Geoscience and Remote Sensing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6100000143051147,"display_name":"Life in Land","id":"https://metadata.un.org/sdg/15"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":32,"referenced_works":["https://openalex.org/W1654925401","https://openalex.org/W1966764234","https://openalex.org/W1980832230","https://openalex.org/W2023412501","https://openalex.org/W2055130415","https://openalex.org/W2057419199","https://openalex.org/W2062271167","https://openalex.org/W2073182742","https://openalex.org/W2105946397","https://openalex.org/W2111068907","https://openalex.org/W2111278203","https://openalex.org/W2111846395","https://openalex.org/W2112835976","https://openalex.org/W2117780698","https://openalex.org/W2121460155","https://openalex.org/W2126603719","https://openalex.org/W2126861886","https://openalex.org/W2135588486","https://openalex.org/W2144111693","https://openalex.org/W2144160872","https://openalex.org/W2148699319","https://openalex.org/W2149055119","https://openalex.org/W2151224241","https://openalex.org/W2152766186","https://openalex.org/W2157364536","https://openalex.org/W2160863626","https://openalex.org/W2164222760","https://openalex.org/W2171137779","https://openalex.org/W3126101940","https://openalex.org/W4210302136","https://openalex.org/W4247381894","https://openalex.org/W6678994759"],"related_works":["https://openalex.org/W2107320019","https://openalex.org/W4391114742","https://openalex.org/W2905363763","https://openalex.org/W2313079490","https://openalex.org/W3091232865","https://openalex.org/W4238822153","https://openalex.org/W2333849723","https://openalex.org/W2600143927","https://openalex.org/W2521355531","https://openalex.org/W4380686309"],"abstract_inverted_index":{"Remote":[0],"sensing":[1],"of":[2,15,26,34,55,63,75,80,90,95,98,126,140,143,163,167],"dielectric":[3,32,57,96,138,165],"properties":[4,33,97,139],"is":[5,29,70,107,174],"used":[6],"for":[7,38,50],"numerous":[8],"applications":[9],"such":[10],"as":[11],"the":[12,20,39,52,61,73,81,99,103,111,121,127,131,154,161,164],"field":[13],"evaluation":[14],"soil":[16],"water,":[17],"salinity,":[18],"or":[19],"organic":[21],"matter":[22],"content.":[23],"The":[24,43,67,93,137,157],"objective":[25],"this":[27],"study":[28],"to":[30,176],"measure":[31],"cylindrical":[35,56,128],"shaped":[36],"samples":[37,169],"previously":[40],"specified":[41],"applications.":[42],"proposed":[44,113,155],"method":[45],"employs":[46],"an":[47],"analytical":[48],"approach":[49],"determining":[51],"complex":[53],"permittivity":[54,172],"objects":[58],"placed":[59],"in":[60,160],"E-plane":[62],"a":[64,88,141],"rectangular":[65,91,134],"waveguide.":[66,92],"overall":[68],"procedure":[69],"based":[71],"on":[72],"measurement":[74],"reflection":[76],"and":[77,148],"transmission":[78],"coefficients":[79,106],"test":[82,100],"specimen":[83],"by":[84,119],"placing":[85],"it":[86],"inside":[87],"section":[89,125],"reconstruction":[94,162],"sample":[101,129],"from":[102],"measured":[104],"scattering":[105],"carried":[108],"out":[109],"using":[110,153],"newly":[112],"closed-form":[114],"expressions,":[115],"which":[116],"are":[117,151],"derived":[118],"transforming":[120],"actual":[122],"circular":[123],"cross":[124,135],"into":[130],"equivalent":[132],"multilayered":[133],"sections.":[136],"number":[142],"specimens,":[144],"including":[145],"typical":[146,158],"plastics":[147],"vegetation":[149],"samples,":[150],"determined":[152],"approach.":[156],"error":[159],"constant":[166],"these":[168],"having":[170],"moderate":[171],"values":[173],"found":[175],"be":[177],"less":[178],"than":[179],"5%.":[180]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2020,"cited_by_count":2},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}