{"id":"https://openalex.org/W2913988244","doi":"https://doi.org/10.1109/tfuzz.2019.2898617","title":"Reliability Modeling for Repairable Systems With Stochastic Lifetimes and Uncertain Repair Times","display_name":"Reliability Modeling for Repairable Systems With Stochastic Lifetimes and Uncertain Repair Times","publication_year":2019,"publication_date":"2019-02-12","ids":{"openalex":"https://openalex.org/W2913988244","doi":"https://doi.org/10.1109/tfuzz.2019.2898617","mag":"2913988244"},"language":"en","primary_location":{"id":"doi:10.1109/tfuzz.2019.2898617","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tfuzz.2019.2898617","pdf_url":null,"source":{"id":"https://openalex.org/S134177497","display_name":"IEEE Transactions on Fuzzy Systems","issn_l":"1063-6706","issn":["1063-6706","1941-0034"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Fuzzy Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5118519942","display_name":"Ying Liu","orcid":"https://orcid.org/0009-0003-6009-2007"},"institutions":[{"id":"https://openalex.org/I132369690","display_name":"Tianjin University of Science and Technology","ror":"https://ror.org/018rbtf37","country_code":"CN","type":"education","lineage":["https://openalex.org/I132369690"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Ying Liu","raw_affiliation_strings":["College of Computer Sciences and Information Engineering and Advanced Structural Integrity International Joint Research Centre, Tianjin University of Science and Technology, Tianjin, China"],"raw_orcid":"https://orcid.org/0000-0002-4960-6703","affiliations":[{"raw_affiliation_string":"College of Computer Sciences and Information Engineering and Advanced Structural Integrity International Joint Research Centre, Tianjin University of Science and Technology, Tianjin, China","institution_ids":["https://openalex.org/I132369690"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082691643","display_name":"Zhigang Qu","orcid":"https://orcid.org/0000-0002-8141-4074"},"institutions":[{"id":"https://openalex.org/I132369690","display_name":"Tianjin University of Science and Technology","ror":"https://ror.org/018rbtf37","country_code":"CN","type":"education","lineage":["https://openalex.org/I132369690"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhigang Qu","raw_affiliation_strings":["College of Electronic Information and Automation and Advanced Structural Integrity International Joint Research Centre, Tianjin University of Science and Technology, Tianjin, China"],"raw_orcid":"https://orcid.org/0000-0002-8141-4074","affiliations":[{"raw_affiliation_string":"College of Electronic Information and Automation and Advanced Structural Integrity International Joint Research Centre, Tianjin University of Science and Technology, Tianjin, China","institution_ids":["https://openalex.org/I132369690"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076886940","display_name":"Xiaozhong Li","orcid":"https://orcid.org/0000-0002-2911-7814"},"institutions":[{"id":"https://openalex.org/I132369690","display_name":"Tianjin University of Science and Technology","ror":"https://ror.org/018rbtf37","country_code":"CN","type":"education","lineage":["https://openalex.org/I132369690"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaozhong Li","raw_affiliation_strings":["College of Computer Sciences and Information Engineering, Tianjin University of Science and Technology, Tianjin, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Computer Sciences and Information Engineering, Tianjin University of Science and Technology, Tianjin, China","institution_ids":["https://openalex.org/I132369690"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100459624","display_name":"Yang An","orcid":"https://orcid.org/0000-0002-3304-1349"},"institutions":[{"id":"https://openalex.org/I132369690","display_name":"Tianjin University of Science and Technology","ror":"https://ror.org/018rbtf37","country_code":"CN","type":"education","lineage":["https://openalex.org/I132369690"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yang An","raw_affiliation_strings":["College of Electronic Information and Automation and Advanced Structural Integrity International Joint Research Centre, Tianjin University of Science and Technology, Tianjin, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Electronic Information and Automation and Advanced Structural Integrity International Joint Research Centre, Tianjin University of Science and Technology, Tianjin, China","institution_ids":["https://openalex.org/I132369690"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100732225","display_name":"Wuliang Yin","orcid":"https://orcid.org/0000-0001-5927-3052"},"institutions":[{"id":"https://openalex.org/I28407311","display_name":"University of Manchester","ror":"https://ror.org/027m9bs27","country_code":"GB","type":"education","lineage":["https://openalex.org/I28407311"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Wuliang Yin","raw_affiliation_strings":["School of Electrical and Electronic Engineering, University of Manchester, Manchester, U.K"],"raw_orcid":"https://orcid.org/0000-0001-5927-3052","affiliations":[{"raw_affiliation_string":"School of Electrical and Electronic Engineering, University of Manchester, Manchester, U.K","institution_ids":["https://openalex.org/I28407311"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5118519942"],"corresponding_institution_ids":["https://openalex.org/I132369690"],"apc_list":null,"apc_paid":null,"fwci":1.4436,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.83033705,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"27","issue":"12","first_page":"2396","last_page":"2405"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10050","display_name":"Multi-Criteria Decision Making","score":0.996399998664856,"subfield":{"id":"https://openalex.org/subfields/1803","display_name":"Management Science and Operations Research"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},"topics":[{"id":"https://openalex.org/T10050","display_name":"Multi-Criteria Decision Making","score":0.996399998664856,"subfield":{"id":"https://openalex.org/subfields/1803","display_name":"Management Science and Operations Research"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T12135","display_name":"Fuzzy Systems and Optimization","score":0.9955999851226807,"subfield":{"id":"https://openalex.org/subfields/2613","display_name":"Statistics and Probability"},"field":{"id":"https://openalex.org/fields/26","display_name":"Mathematics"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9955000281333923,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7746433019638062},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.7114447951316833},{"id":"https://openalex.org/keywords/series","display_name":"Series (stratigraphy)","score":0.6043179631233215},{"id":"https://openalex.org/keywords/random-variable","display_name":"Random variable","score":0.6017375588417053},{"id":"https://openalex.org/keywords/stochastic-process","display_name":"Stochastic process","score":0.5707147717475891},{"id":"https://openalex.org/keywords/mean-time-between-failures","display_name":"Mean time between failures","score":0.5171175003051758},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5103403925895691},{"id":"https://openalex.org/keywords/reliability-theory","display_name":"Reliability theory","score":0.5084208846092224},{"id":"https://openalex.org/keywords/series-and-parallel-circuits","display_name":"Series and parallel circuits","score":0.470724493265152},{"id":"https://openalex.org/keywords/maintenance-engineering","display_name":"Maintenance engineering","score":0.43024763464927673},{"id":"https://openalex.org/keywords/stochastic-modelling","display_name":"Stochastic modelling","score":0.42632627487182617},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.28034788370132446},{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.23774024844169617},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2003573179244995},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.16241362690925598}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7746433019638062},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.7114447951316833},{"id":"https://openalex.org/C143724316","wikidata":"https://www.wikidata.org/wiki/Q312468","display_name":"Series (stratigraphy)","level":2,"score":0.6043179631233215},{"id":"https://openalex.org/C122123141","wikidata":"https://www.wikidata.org/wiki/Q176623","display_name":"Random variable","level":2,"score":0.6017375588417053},{"id":"https://openalex.org/C8272713","wikidata":"https://www.wikidata.org/wiki/Q176737","display_name":"Stochastic process","level":2,"score":0.5707147717475891},{"id":"https://openalex.org/C44154001","wikidata":"https://www.wikidata.org/wiki/Q754940","display_name":"Mean time between failures","level":3,"score":0.5171175003051758},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5103403925895691},{"id":"https://openalex.org/C201729545","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability theory","level":3,"score":0.5084208846092224},{"id":"https://openalex.org/C95023266","wikidata":"https://www.wikidata.org/wiki/Q55738334","display_name":"Series and parallel circuits","level":3,"score":0.470724493265152},{"id":"https://openalex.org/C23725684","wikidata":"https://www.wikidata.org/wiki/Q616377","display_name":"Maintenance engineering","level":2,"score":0.43024763464927673},{"id":"https://openalex.org/C127491075","wikidata":"https://www.wikidata.org/wiki/Q7617825","display_name":"Stochastic modelling","level":2,"score":0.42632627487182617},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.28034788370132446},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.23774024844169617},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2003573179244995},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.16241362690925598},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tfuzz.2019.2898617","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tfuzz.2019.2898617","pdf_url":null,"source":{"id":"https://openalex.org/S134177497","display_name":"IEEE Transactions on Fuzzy Systems","issn_l":"1063-6706","issn":["1063-6706","1941-0034"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Fuzzy Systems","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.4699999988079071}],"awards":[{"id":"https://openalex.org/G5025325068","display_name":null,"funder_award_id":"61873187","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G901436207","display_name":null,"funder_award_id":"51674176","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":43,"referenced_works":["https://openalex.org/W1512763107","https://openalex.org/W1657098524","https://openalex.org/W1929567380","https://openalex.org/W1968667459","https://openalex.org/W1978363227","https://openalex.org/W1987435815","https://openalex.org/W1987462501","https://openalex.org/W1993152301","https://openalex.org/W2022733466","https://openalex.org/W2022988502","https://openalex.org/W2025899851","https://openalex.org/W2027485747","https://openalex.org/W2056221786","https://openalex.org/W2060385055","https://openalex.org/W2074339547","https://openalex.org/W2093905688","https://openalex.org/W2097745492","https://openalex.org/W2117156647","https://openalex.org/W2151376743","https://openalex.org/W2185760344","https://openalex.org/W2186603519","https://openalex.org/W2187961073","https://openalex.org/W2217611946","https://openalex.org/W2274279545","https://openalex.org/W2298673759","https://openalex.org/W2310846724","https://openalex.org/W2343711371","https://openalex.org/W2414029657","https://openalex.org/W2552684054","https://openalex.org/W2582824042","https://openalex.org/W2601623226","https://openalex.org/W2613553863","https://openalex.org/W2792162769","https://openalex.org/W2803460043","https://openalex.org/W2809293408","https://openalex.org/W3120784921","https://openalex.org/W4285719527","https://openalex.org/W6640349673","https://openalex.org/W6682597882","https://openalex.org/W6686515627","https://openalex.org/W6686791216","https://openalex.org/W6686810846","https://openalex.org/W6788376386"],"related_works":["https://openalex.org/W2168011386","https://openalex.org/W2067546965","https://openalex.org/W2938469583","https://openalex.org/W1987410736","https://openalex.org/W2130822275","https://openalex.org/W2046350053","https://openalex.org/W2624804828","https://openalex.org/W1971823982","https://openalex.org/W4248211233","https://openalex.org/W2951109280"],"abstract_inverted_index":{"In":[0,39],"actual":[1],"industrial":[2],"systems,":[3,117,120,123],"there":[4],"are":[5,12,18,46,58,101,106,128,141,147],"often":[6],"situations":[7],"where":[8],"the":[9,15,26,42,53,110,132,151,154],"fault":[10],"data":[11,17],"sufficient,":[13],"whereas":[14],"repair":[16,54],"insufficient.":[19],"It":[20],"is":[21],"not":[22],"appropriate":[23],"to":[24,48,60,149],"treat":[25],"system":[27,31,35,66,75,140],"as":[28,70,89],"a":[29],"stochastic":[30],"or":[32],"an":[33,71],"uncertain":[34,62,72],"in":[36],"this":[37,40],"case.":[38],"paper,":[41],"lifetimes":[43],"of":[44,56,85,114,134,137,153],"components":[45,57],"assumed":[47,59],"be":[49,61,68],"random":[50,73],"variables":[51],"and":[52,97,103,124],"times":[55],"variables.":[63],"The":[64],"entire":[65],"can":[67],"regarded":[69],"repairable":[74,86,115,118,121,125,139],"accordingly.":[76],"Based":[77],"on":[78],"chance":[79],"theory,":[80],"some":[81,104,144],"common":[82],"reliability":[83,111,135,155],"indexes":[84,136],"system,":[87],"such":[88],"availability,":[90],"steady-state":[91],"failure":[92],"frequency,":[93],"mean":[94,98],"up":[95],"time,":[96,100],"down":[99],"redefined":[102],"properties":[105],"also":[107],"presented.":[108],"Then,":[109],"mathematical":[112],"models":[113],"series":[116],"parallel":[119],"series-parallel":[122],"parallel-series":[126],"systems":[127],"established,":[129],"respectively.":[130],"Furthermore,":[131],"formulas":[133],"each":[138],"obtained.":[142],"Finally,":[143],"numerical":[145],"examples":[146],"presented":[148],"illustrate":[150],"calculation":[152],"indexes.":[156]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}