{"id":"https://openalex.org/W7128440182","doi":"https://doi.org/10.1109/tetc.2026.3658512","title":"Variation Resilient Schemes and Approximation-Free Offset Compensation for Reliable ReRAM-Based DNN Accelerators","display_name":"Variation Resilient Schemes and Approximation-Free Offset Compensation for Reliable ReRAM-Based DNN Accelerators","publication_year":2026,"publication_date":"2026-01-01","ids":{"openalex":"https://openalex.org/W7128440182","doi":"https://doi.org/10.1109/tetc.2026.3658512"},"language":null,"primary_location":{"id":"doi:10.1109/tetc.2026.3658512","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tetc.2026.3658512","pdf_url":null,"source":{"id":"https://openalex.org/S2496326734","display_name":"IEEE Transactions on Emerging Topics in Computing","issn_l":"2168-6750","issn":["2168-6750","2376-4562"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Emerging Topics in Computing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5113373463","display_name":"Je-Woo Jang","orcid":null},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Je-Woo Jang","raw_affiliation_strings":["School of Electrical, Electronic Engineering, Yonsei University, Seoul, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical, Electronic Engineering, Yonsei University, Seoul, South Korea","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067577176","display_name":"Junyong Oh","orcid":null},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Junyong Oh","raw_affiliation_strings":["School of Electrical, Electronic Engineering, Yonsei University, Seoul, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical, Electronic Engineering, Yonsei University, Seoul, South Korea","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5125446698","display_name":"Sung-Hyuk Cho","orcid":null},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sung-Hyuk Cho","raw_affiliation_strings":["School of Electrical, Electronic Engineering, Yonsei University, Seoul, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical, Electronic Engineering, Yonsei University, Seoul, South Korea","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Jae-Youn Hong","orcid":null},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jae-Youn Hong","raw_affiliation_strings":["School of Electrical, Electronic Engineering, Yonsei University, Seoul, South Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical, Electronic Engineering, Yonsei University, Seoul, South Korea","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Muhammad Imran","orcid":"https://orcid.org/0000-0002-6246-6143"},"institutions":[{"id":"https://openalex.org/I4210143942","display_name":"National University of Technology","ror":"https://ror.org/05e21fw44","country_code":"PK","type":"education","lineage":["https://openalex.org/I4210143942"]}],"countries":["PK"],"is_corresponding":false,"raw_author_name":"Muhammad Imran","raw_affiliation_strings":["Department of Electrical Engineering, National University of Sciences, Technology, Islamabad, Pakistan"],"raw_orcid":"https://orcid.org/0000-0002-6246-6143","affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, National University of Sciences, Technology, Islamabad, Pakistan","institution_ids":["https://openalex.org/I4210143942"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083580750","display_name":"JaeYong Chung","orcid":null},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jaeyong Chung","raw_affiliation_strings":["Department of Semiconductor Systems Engineering, Yonsei University, Seoul, South Korea"],"raw_orcid":"https://orcid.org/0000-0001-5819-1995","affiliations":[{"raw_affiliation_string":"Department of Semiconductor Systems Engineering, Yonsei University, Seoul, South Korea","institution_ids":["https://openalex.org/I193775966"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5026627679","display_name":"Joon-Sung Yang","orcid":"https://orcid.org/0000-0002-1502-5353"},"institutions":[{"id":"https://openalex.org/I193775966","display_name":"Yonsei University","ror":"https://ror.org/01wjejq96","country_code":"KR","type":"education","lineage":["https://openalex.org/I193775966"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Joon-Sung Yang","raw_affiliation_strings":["School of Electrical, Electronic Engineering, Yonsei University, Seoul, South Korea"],"raw_orcid":"https://orcid.org/0000-0002-1502-5353","affiliations":[{"raw_affiliation_string":"School of Electrical, Electronic Engineering, Yonsei University, Seoul, South Korea","institution_ids":["https://openalex.org/I193775966"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5113373463"],"corresponding_institution_ids":["https://openalex.org/I193775966"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.2733698,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"14","issue":"1","first_page":"272","last_page":"285"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.878000020980835,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.878000020980835,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.05779999867081642,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","score":0.02669999934732914,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.6294999718666077},{"id":"https://openalex.org/keywords/offset","display_name":"Offset (computer science)","score":0.5917999744415283},{"id":"https://openalex.org/keywords/resistive-random-access-memory","display_name":"Resistive random-access memory","score":0.5659999847412109},{"id":"https://openalex.org/keywords/software-deployment","display_name":"Software deployment","score":0.49410000443458557},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.44200000166893005},{"id":"https://openalex.org/keywords/efficient-energy-use","display_name":"Efficient energy use","score":0.3950999975204468},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.37380000948905945},{"id":"https://openalex.org/keywords/variation","display_name":"Variation (astronomy)","score":0.3700999915599823}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.8464999794960022},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.6294999718666077},{"id":"https://openalex.org/C175291020","wikidata":"https://www.wikidata.org/wiki/Q1156822","display_name":"Offset (computer science)","level":2,"score":0.5917999744415283},{"id":"https://openalex.org/C182019814","wikidata":"https://www.wikidata.org/wiki/Q1143830","display_name":"Resistive random-access memory","level":3,"score":0.5659999847412109},{"id":"https://openalex.org/C105339364","wikidata":"https://www.wikidata.org/wiki/Q2297740","display_name":"Software deployment","level":2,"score":0.49410000443458557},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.44200000166893005},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.40709999203681946},{"id":"https://openalex.org/C2742236","wikidata":"https://www.wikidata.org/wiki/Q924713","display_name":"Efficient energy use","level":2,"score":0.3950999975204468},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.37380000948905945},{"id":"https://openalex.org/C2778334786","wikidata":"https://www.wikidata.org/wiki/Q1586270","display_name":"Variation (astronomy)","level":2,"score":0.3700999915599823},{"id":"https://openalex.org/C2776257435","wikidata":"https://www.wikidata.org/wiki/Q1576430","display_name":"Bandwidth (computing)","level":2,"score":0.3336000144481659},{"id":"https://openalex.org/C93389723","wikidata":"https://www.wikidata.org/wiki/Q7247313","display_name":"Process variation","level":3,"score":0.32269999384880066},{"id":"https://openalex.org/C2778915421","wikidata":"https://www.wikidata.org/wiki/Q3643177","display_name":"Performance improvement","level":2,"score":0.28929999470710754},{"id":"https://openalex.org/C123745756","wikidata":"https://www.wikidata.org/wiki/Q1665949","display_name":"Interconnection","level":2,"score":0.28630000352859497},{"id":"https://openalex.org/C125411270","wikidata":"https://www.wikidata.org/wiki/Q18653","display_name":"Encoding (memory)","level":2,"score":0.2838999927043915},{"id":"https://openalex.org/C557945733","wikidata":"https://www.wikidata.org/wiki/Q389772","display_name":"Data transmission","level":2,"score":0.28380000591278076},{"id":"https://openalex.org/C2780023022","wikidata":"https://www.wikidata.org/wiki/Q1338171","display_name":"Compensation (psychology)","level":2,"score":0.27880001068115234},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.2718000113964081},{"id":"https://openalex.org/C2984842247","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep neural networks","level":3,"score":0.25619998574256897},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.2549999952316284},{"id":"https://openalex.org/C67186912","wikidata":"https://www.wikidata.org/wiki/Q367664","display_name":"Data modeling","level":2,"score":0.25209999084472656}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tetc.2026.3658512","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tetc.2026.3658512","pdf_url":null,"source":{"id":"https://openalex.org/S2496326734","display_name":"IEEE Transactions on Emerging Topics in Computing","issn_l":"2168-6750","issn":["2168-6750","2376-4562"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Emerging Topics in Computing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.9020481109619141}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":22,"referenced_works":["https://openalex.org/W2508602506","https://openalex.org/W2612375349","https://openalex.org/W2794288888","https://openalex.org/W2795127895","https://openalex.org/W2889553449","https://openalex.org/W2946047477","https://openalex.org/W2948661249","https://openalex.org/W2970608956","https://openalex.org/W3005619596","https://openalex.org/W3015980402","https://openalex.org/W3036092616","https://openalex.org/W3048152613","https://openalex.org/W3102536408","https://openalex.org/W3121647714","https://openalex.org/W3200875582","https://openalex.org/W3212633509","https://openalex.org/W4226216109","https://openalex.org/W4236126228","https://openalex.org/W4243519499","https://openalex.org/W4280488201","https://openalex.org/W4366389026","https://openalex.org/W4389166806"],"related_works":[],"abstract_inverted_index":{"Deep":[0],"Neural":[1],"Networks":[2],"(DNNs)":[3],"have":[4],"achieved":[5],"out":[6],"standing":[7],"performance":[8,21,169],"in":[9,18,70,130,163],"various":[10,150],"fields.":[11],"However,":[12,53],"as":[13],"DNNs":[14],"continue":[15],"to":[16,46,60,125,174],"grow":[17],"size,":[19],"their":[20],"is":[22],"hindered":[23],"by":[24],"the":[25,86,90,108,128,133,142,157,175],"memory":[26,31],"wall":[27],"problem,":[28],"where":[29],"data":[30,50,123],"bandwidth":[32],"becomes":[33],"a":[34,100,121,138],"bottleneck.":[35],"Resistive":[36],"Random":[37],"Access":[38],"Memory":[39],"(ReRAM)-based":[40],"DNN":[41,78,151],"accelerators":[42],"offer":[43],"promising":[44],"solutions":[45],"this":[47,97,118],"challenge,":[48],"enhancing":[49,110],"processing":[51,81],"efficiency.":[52],"these":[54],"architectures":[55],"face":[56],"reliability":[57,87],"issues":[58,88],"due":[59],"cell":[61],"immaturity,":[62],"notably":[63],"device":[64],"conductance":[65],"variation":[66,111,164,181],"and":[67,80,136,153,166,170],"offset":[68,143],"currents":[69],"High":[71],"Resistance":[72],"State":[73],"(HRS)":[74],"cells,":[75],"which":[76],"compromise":[77],"accuracy":[79],"performance.":[82],"This":[83],"paper":[84,98,119],"addresses":[85],"of":[89,104],"ReRAM-based":[91],"computing-in-memory":[92],"(CIM)":[93],"accelerator.":[94],"In":[95,116],"particular,":[96],"introduces":[99,137],"novel":[101],"design":[102,135],"methodology":[103],"shared-exponent":[105],"deployment":[106],"on":[107,149],"accelerator,":[109],"tolerance":[112,165],"through":[113],"fine-grained":[114],"quantization.":[115],"addition,":[117],"proposes":[120],"variation-resilient":[122],"encoding":[124],"further":[126],"improve":[127],"robustness":[129],"combination":[131],"with":[132],"proposed":[134,158],"programming":[139],"scheme":[140],"for":[141],"current":[144],"compensation.":[145],"Experimental":[146],"results":[147],"conducted":[148],"models":[152],"datasets":[154],"reveal":[155],"that":[156],"techniques":[159],"outperform":[160],"existing":[161],"methods":[162],"significantly":[167],"improves":[168],"energy":[171],"efficiency":[172],"compared":[173],"conventional":[176],"baseline,":[177],"even":[178],"under":[179],"high":[180],"environments.":[182]},"counts_by_year":[],"updated_date":"2026-03-14T06:41:57.775601","created_date":"2026-02-10T00:00:00"}