{"id":"https://openalex.org/W7117147328","doi":"https://doi.org/10.1109/tetc.2025.3640505","title":"Concurrent Self-Testing and Uncertainty Estimation of Neural Networks Using Uncertainty Fingerprint","display_name":"Concurrent Self-Testing and Uncertainty Estimation of Neural Networks Using Uncertainty Fingerprint","publication_year":2025,"publication_date":"2025-12-24","ids":{"openalex":"https://openalex.org/W7117147328","doi":"https://doi.org/10.1109/tetc.2025.3640505"},"language":null,"primary_location":{"id":"doi:10.1109/tetc.2025.3640505","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tetc.2025.3640505","pdf_url":null,"source":{"id":"https://openalex.org/S2496326734","display_name":"IEEE Transactions on Emerging Topics in Computing","issn_l":"2168-6750","issn":["2168-6750","2376-4562"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Emerging Topics in Computing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5030858550","display_name":"Soyed Tuhin Ahmed","orcid":"https://orcid.org/0000-0001-5179-2392"},"institutions":[{"id":"https://openalex.org/I102335020","display_name":"Karlsruhe Institute of Technology","ror":"https://ror.org/04t3en479","country_code":"DE","type":"education","lineage":["https://openalex.org/I102335020","https://openalex.org/I1305996414"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Soyed Tuhin Ahmed","raw_affiliation_strings":["Department of Computer Science, Karlsruhe Institute of Technology, Karlsruhe, Germany"],"raw_orcid":"https://orcid.org/0000-0001-5179-2392","affiliations":[{"raw_affiliation_string":"Department of Computer Science, Karlsruhe Institute of Technology, Karlsruhe, Germany","institution_ids":["https://openalex.org/I102335020"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5064445713","display_name":"Mehdi B. Tahoori","orcid":"https://orcid.org/0000-0002-8829-5610"},"institutions":[{"id":"https://openalex.org/I102335020","display_name":"Karlsruhe Institute of Technology","ror":"https://ror.org/04t3en479","country_code":"DE","type":"education","lineage":["https://openalex.org/I102335020","https://openalex.org/I1305996414"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Mehdi B. Tahoori","raw_affiliation_strings":["Department of Computer Science, Karlsruhe Institute of Technology, Karlsruhe, Germany"],"raw_orcid":"https://orcid.org/0000-0002-8829-5610","affiliations":[{"raw_affiliation_string":"Department of Computer Science, Karlsruhe Institute of Technology, Karlsruhe, Germany","institution_ids":["https://openalex.org/I102335020"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5030858550"],"corresponding_institution_ids":["https://openalex.org/I102335020"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.54422217,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"14","issue":"1","first_page":"118","last_page":"133"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.536300003528595,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.536300003528595,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11689","display_name":"Adversarial Robustness in Machine Learning","score":0.31189998984336853,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","score":0.04639999940991402,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.6205000281333923},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.6147000193595886},{"id":"https://openalex.org/keywords/task","display_name":"Task (project management)","score":0.5023999810218811},{"id":"https://openalex.org/keywords/matching","display_name":"Matching (statistics)","score":0.49799999594688416},{"id":"https://openalex.org/keywords/fingerprint","display_name":"Fingerprint (computing)","score":0.4530999958515167},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.3750999867916107},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.35190001130104065},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.34200000762939453},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.3305000066757202}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.8317000269889832},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.6205000281333923},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.6147000193595886},{"id":"https://openalex.org/C2780451532","wikidata":"https://www.wikidata.org/wiki/Q759676","display_name":"Task (project management)","level":2,"score":0.5023999810218811},{"id":"https://openalex.org/C165064840","wikidata":"https://www.wikidata.org/wiki/Q1321061","display_name":"Matching (statistics)","level":2,"score":0.49799999594688416},{"id":"https://openalex.org/C2777826928","wikidata":"https://www.wikidata.org/wiki/Q3745713","display_name":"Fingerprint (computing)","level":2,"score":0.4530999958515167},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.44279998540878296},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.39559999108314514},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.3750999867916107},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.3544999957084656},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.35190001130104065},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.3443000018596649},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.34200000762939453},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.3305000066757202},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.3206000030040741},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.3172000050544739},{"id":"https://openalex.org/C168406668","wikidata":"https://www.wikidata.org/wiki/Q178022","display_name":"Fingerprint recognition","level":3,"score":0.31679999828338623},{"id":"https://openalex.org/C40969351","wikidata":"https://www.wikidata.org/wiki/Q3516228","display_name":"Word error rate","level":2,"score":0.31630000472068787},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.31439998745918274},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.31209999322891235},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3043000102043152},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.29159998893737793},{"id":"https://openalex.org/C2777851325","wikidata":"https://www.wikidata.org/wiki/Q7094102","display_name":"Online model","level":2,"score":0.29159998893737793},{"id":"https://openalex.org/C2984842247","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep neural networks","level":3,"score":0.28119999170303345},{"id":"https://openalex.org/C199845137","wikidata":"https://www.wikidata.org/wiki/Q145490","display_name":"Network topology","level":2,"score":0.28110000491142273},{"id":"https://openalex.org/C175154964","wikidata":"https://www.wikidata.org/wiki/Q380077","display_name":"Task analysis","level":3,"score":0.2800999879837036},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.2757999897003174},{"id":"https://openalex.org/C12267149","wikidata":"https://www.wikidata.org/wiki/Q282453","display_name":"Support vector machine","level":2,"score":0.2734000086784363},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.2667999863624573},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.266400009393692},{"id":"https://openalex.org/C77618280","wikidata":"https://www.wikidata.org/wiki/Q1155772","display_name":"Scheme (mathematics)","level":2,"score":0.2632000148296356},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.2612000107765198},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.25040000677108765}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tetc.2025.3640505","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tetc.2025.3640505","pdf_url":null,"source":{"id":"https://openalex.org/S2496326734","display_name":"IEEE Transactions on Emerging Topics in Computing","issn_l":"2168-6750","issn":["2168-6750","2376-4562"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Emerging Topics in Computing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":34,"referenced_works":["https://openalex.org/W2016073777","https://openalex.org/W2118033476","https://openalex.org/W2194775991","https://openalex.org/W2510192911","https://openalex.org/W2613989746","https://openalex.org/W2626719825","https://openalex.org/W2748528844","https://openalex.org/W2765081478","https://openalex.org/W2812853021","https://openalex.org/W2896500468","https://openalex.org/W2901848761","https://openalex.org/W2946530807","https://openalex.org/W2977250065","https://openalex.org/W2991372685","https://openalex.org/W2997055188","https://openalex.org/W3006150812","https://openalex.org/W3013186618","https://openalex.org/W3018877817","https://openalex.org/W3022634314","https://openalex.org/W3034297393","https://openalex.org/W3091984031","https://openalex.org/W3216041851","https://openalex.org/W4210519761","https://openalex.org/W4214819750","https://openalex.org/W4297337482","https://openalex.org/W4312454012","https://openalex.org/W4312921031","https://openalex.org/W4319068960","https://openalex.org/W4319865974","https://openalex.org/W4367044084","https://openalex.org/W4379115996","https://openalex.org/W4386574794","https://openalex.org/W4390872020","https://openalex.org/W4402301597"],"related_works":[],"abstract_inverted_index":{"Neural":[0],"networks":[1],"(NNs)":[2],"are":[3,32,64,193,205],"increasingly":[4],"used":[5],"in":[6,78,117,145,149],"always-on":[7,67],"safety-critical":[8,26],"applications":[9],"deployed":[10],"on":[11],"hardware":[12,56],"accelerators":[13,57],"employing":[14],"various":[15],"memory":[16,179],"technologies.":[17],"Reliable,":[18],"continuous":[19],"operation":[20],"of":[21,95,114,167],"NN":[22,102,116],"is":[23,181],"essential":[24],"for":[25,55,66],"applications.":[27],"During":[28,123],"online":[29,92,125],"operation,":[30,126],"NNs":[31,136],"susceptible":[33],"to":[34,43,106,139,172,176,185,197,209],"(single":[35],"and":[36,39,49,69,75,110,148,189,202],"multiple)":[37],"permanent":[38],"soft":[40],"errors":[41],"due":[42],"factors":[44],"such":[45],"as":[46],"radiation,":[47],"aging,":[48],"thermal":[50],"effects.":[51],"Explicit":[52],"testing":[53],"methods":[54],"cannot":[58],"detect":[59],"transient":[60],"faults":[61],"during":[62],"inference,":[63],"unsuitable":[65],"applications,":[68],"require":[70],"extensive":[71],"test":[72],"vector":[73],"generation":[74],"storage.":[76],"Therefore,":[77],"this":[79],"paper,":[80],"we":[81,98,132],"propose":[82,99],"the":[83,91,111,115,124,129,146,150,165,168,173],"<italic":[84,118],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[85,119,141,199,211],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">uncertainty":[86],"fingerprint</i>":[87],"approach":[88],"that":[89],"represents":[90],"fault":[93],"status":[94],"NN.":[96],"Furthermore,":[97],"a":[100,154,158],"dual-head":[101],"topology":[103],"specifically":[104],"designed":[105],"produce":[107],"uncertainty":[108,130],"fingerprints":[109],"primary":[112,169],"prediction":[113],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">a":[120],"single":[121],"shot</i>.":[122],"by":[127,183,195,207],"matching":[128],"fingerprint,":[131],"can":[133],"concurrently":[134],"self-test":[135],"with":[137,157],"up":[138,184,196,208],"<inline-formula":[140,198,210],"xmlns:xlink=\"http://www.w3.org/1999/xlink\"><tex-math":[142,200,212],"notation=\"LaTeX\">$100\\%$</tex-math></inline-formula>":[143],"coverage":[144],"backbone":[147],"full":[151],"model":[152],"(with":[153],"modified":[155],"approach)":[156],"low":[159],"false":[160],"positive":[161],"rate":[162],"while":[163],"maintaining":[164],"performance":[166],"task":[170],"similar":[171],"baseline.":[174],"Compared":[175],"existing":[177],"works,":[178],"overhead":[180],"reduced":[182,194,206],"243.7":[186],"MB,":[187],"multiply":[188],"accumulate":[190],"(MAC)":[191],"operations":[192],"notation=\"LaTeX\">$10000\\times$</tex-math></inline-formula>,":[201],"false-positive":[203],"rates":[204],"notation=\"LaTeX\">$89\\%$</tex-math></inline-formula>.":[213]},"counts_by_year":[],"updated_date":"2026-05-05T08:41:31.759640","created_date":"2025-12-24T00:00:00"}