{"id":"https://openalex.org/W4387987027","doi":"https://doi.org/10.1109/tetc.2023.3324331","title":"Reliability Evaluation and Fault Tolerant Design for KLL Sketches","display_name":"Reliability Evaluation and Fault Tolerant Design for KLL Sketches","publication_year":2023,"publication_date":"2023-10-27","ids":{"openalex":"https://openalex.org/W4387987027","doi":"https://doi.org/10.1109/tetc.2023.3324331"},"language":"en","primary_location":{"id":"doi:10.1109/tetc.2023.3324331","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tetc.2023.3324331","pdf_url":null,"source":{"id":"https://openalex.org/S2496326734","display_name":"IEEE Transactions on Emerging Topics in Computing","issn_l":"2168-6750","issn":["2168-6750","2376-4562"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Emerging Topics in Computing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://oa.upm.es/76690/1/FT_KLL_TETC_R1.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5086818582","display_name":"Zhen Gao","orcid":"https://orcid.org/0000-0001-9887-1418"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Zhen Gao","raw_affiliation_strings":["Tianjin University, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"Tianjin University, Tianjin, China","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069494177","display_name":"Jinhua Zhu","orcid":"https://orcid.org/0000-0001-8136-8111"},"institutions":[{"id":"https://openalex.org/I162868743","display_name":"Tianjin University","ror":"https://ror.org/012tb2g32","country_code":"CN","type":"education","lineage":["https://openalex.org/I162868743"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jinhua Zhu","raw_affiliation_strings":["Tianjin University, Tianjin, China"],"affiliations":[{"raw_affiliation_string":"Tianjin University, Tianjin, China","institution_ids":["https://openalex.org/I162868743"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5080322790","display_name":"Pedro Reviriego","orcid":"https://orcid.org/0000-0003-2540-5234"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Pedro Reviriego","raw_affiliation_strings":["Universidad Politécnica de Madrid, Madrid, Spain"],"affiliations":[{"raw_affiliation_string":"Universidad Politécnica de Madrid, Madrid, Spain","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5086818582"],"corresponding_institution_ids":["https://openalex.org/I162868743"],"apc_list":null,"apc_paid":null,"fwci":0.1737,"has_fulltext":true,"cited_by_count":1,"citation_normalized_percentile":{"value":0.57911165,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":"12","issue":"4","first_page":"1002","last_page":"1013"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11689","display_name":"Adversarial Robustness in Machine Learning","score":0.9937000274658203,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11689","display_name":"Adversarial Robustness in Machine Learning","score":0.9937000274658203,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9918000102043152,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9886999726295471,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7820295095443726},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.5268707871437073},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5071017742156982},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.4953662157058716},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.47929614782333374},{"id":"https://openalex.org/keywords/sketch","display_name":"Sketch","score":0.4715483486652374},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3663415312767029},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.23783618211746216},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.1378542184829712},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.0824873149394989}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7820295095443726},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.5268707871437073},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5071017742156982},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.4953662157058716},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.47929614782333374},{"id":"https://openalex.org/C2779231336","wikidata":"https://www.wikidata.org/wiki/Q7534724","display_name":"Sketch","level":2,"score":0.4715483486652374},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3663415312767029},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.23783618211746216},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.1378542184829712},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.0824873149394989},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tetc.2023.3324331","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tetc.2023.3324331","pdf_url":null,"source":{"id":"https://openalex.org/S2496326734","display_name":"IEEE Transactions on Emerging Topics in Computing","issn_l":"2168-6750","issn":["2168-6750","2376-4562"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Emerging Topics in Computing","raw_type":"journal-article"},{"id":"pmh:oai:oa.upm.es:76690","is_oa":true,"landing_page_url":"https://oa.upm.es/76690/","pdf_url":"https://oa.upm.es/76690/1/FT_KLL_TETC_R1.pdf","source":{"id":"https://openalex.org/S4377196323","display_name":"UPM Digital Archive (Technical University of Madrid)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I88060688","host_organization_name":"Universidad Polit\u00e9cnica de Madrid","host_organization_lineage":["https://openalex.org/I88060688"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Transactions on Emerging Topics in Computing, 2023","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":{"id":"pmh:oai:oa.upm.es:76690","is_oa":true,"landing_page_url":"https://oa.upm.es/76690/","pdf_url":"https://oa.upm.es/76690/1/FT_KLL_TETC_R1.pdf","source":{"id":"https://openalex.org/S4377196323","display_name":"UPM Digital Archive (Technical University of Madrid)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I88060688","host_organization_name":"Universidad Polit\u00e9cnica de Madrid","host_organization_lineage":["https://openalex.org/I88060688"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Transactions on Emerging Topics in Computing, 2023","raw_type":"info:eu-repo/semantics/article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4387987027.pdf","grobid_xml":"https://content.openalex.org/works/W4387987027.grobid-xml"},"referenced_works_count":38,"referenced_works":["https://openalex.org/W1853859481","https://openalex.org/W2017511448","https://openalex.org/W2048185145","https://openalex.org/W2062470986","https://openalex.org/W2112452856","https://openalex.org/W2147312192","https://openalex.org/W2161118867","https://openalex.org/W2212270310","https://openalex.org/W2295655272","https://openalex.org/W2739512903","https://openalex.org/W2751321818","https://openalex.org/W2787263232","https://openalex.org/W2900470714","https://openalex.org/W2911564443","https://openalex.org/W2922441637","https://openalex.org/W2953181934","https://openalex.org/W2953409949","https://openalex.org/W2963274201","https://openalex.org/W2971243175","https://openalex.org/W2989160455","https://openalex.org/W2998784970","https://openalex.org/W3004286518","https://openalex.org/W3007580178","https://openalex.org/W3011997511","https://openalex.org/W3015189862","https://openalex.org/W3016971220","https://openalex.org/W3025921580","https://openalex.org/W3032208369","https://openalex.org/W3047786962","https://openalex.org/W3048205019","https://openalex.org/W3104812533","https://openalex.org/W3178088256","https://openalex.org/W3190210848","https://openalex.org/W3198071185","https://openalex.org/W4239880781","https://openalex.org/W4300835888","https://openalex.org/W4303101694","https://openalex.org/W6760358840"],"related_works":["https://openalex.org/W2378994405","https://openalex.org/W2385974820","https://openalex.org/W2373478030","https://openalex.org/W2378679551","https://openalex.org/W1862835629","https://openalex.org/W2099111379","https://openalex.org/W2136799148","https://openalex.org/W2897533804","https://openalex.org/W2890506991","https://openalex.org/W1906576859"],"abstract_inverted_index":{"Quantile":[0],"estimation":[1,15,59],"is":[2,43,73,87],"a":[3,110,125],"fundamental":[4],"task":[5],"in":[6,53,103,113],"Big":[7,23],"Data":[8,24],"analysis.":[9],"In":[10,61,164],"order":[11],"to":[12,84],"achieve":[13],"high-speed":[14],"with":[16],"low":[17,33],"memory":[18,55,189],"consumption,":[19],"especially":[20],"for":[21,75,176],"streaming":[22],"processing,":[25],"data":[26],"sketches":[27],"which":[28,184],"provide":[29],"approximate":[30],"estimates":[31],"at":[32],"overhead":[34],"are":[35,121],"commonly":[36],"used,":[37],"and":[38,92,130,154],"the":[39,46,64,70,76,80,101,104,114,132,137,144,150,157,161,166,181],"Karnin-Lang-Liberty":[40],"(KLL)":[41],"sketch":[42,72],"one":[44],"of":[45,66,82,136,152],"most":[47],"popular":[48],"options.":[49],"However,":[50],"soft":[51,67,85],"errors":[52,68,86,102],"KLL":[54,71,83,105,138],"may":[56,108],"significantly":[57,148],"degrade":[58],"performance.":[60],"this":[62],"article,":[63],"influence":[65],"on":[69,124,131,160],"considered":[74],"first":[77],"time.":[78],"First,":[79],"reliability":[81,151],"studied":[88],"through":[89],"theoretical":[90],"analysis":[91],"fault":[93],"injection":[94],"experiments.":[95],"The":[96],"evaluation":[97,141],"results":[98],"show":[99],"that":[100,143,169],"construction":[106],"phase":[107],"cause":[109],"large":[111],"deviation":[112],"estimated":[115],"value.":[116],"Then,":[117],"two":[118],"protection":[119,175],"schemes":[120,146],"proposed":[122,145],"based":[123],"single":[126],"parity":[127],"check":[128],"(SPC)":[129],"incremental":[133],"property":[134],"(IP)":[135],"memory.":[139],"Further":[140],"shows":[142],"can":[147],"improve":[149],"KLL,":[153],"even":[155],"remove":[156],"effect":[158],"SEUs":[159],"highest":[162],"bits.":[163],"particular,":[165],"SPC":[167],"scheme":[168,183],"requires":[170],"additional":[171],"memory,":[172],"provides":[173],"better":[174],"middle":[177],"bit":[178],"positions":[179],"than":[180],"IP":[182],"does":[185],"not":[186],"introduce":[187],"any":[188],"overhead.":[190]},"counts_by_year":[{"year":2024,"cited_by_count":1}],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}