{"id":"https://openalex.org/W4296079325","doi":"https://doi.org/10.1109/tetc.2022.3205808","title":"Anatomy of On-Chip Memory Hardware Fault Effects Across the Layers","display_name":"Anatomy of On-Chip Memory Hardware Fault Effects Across the Layers","publication_year":2022,"publication_date":"2022-09-16","ids":{"openalex":"https://openalex.org/W4296079325","doi":"https://doi.org/10.1109/tetc.2022.3205808"},"language":"en","primary_location":{"id":"doi:10.1109/tetc.2022.3205808","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tetc.2022.3205808","pdf_url":null,"source":{"id":"https://openalex.org/S2496326734","display_name":"IEEE Transactions on Emerging Topics in Computing","issn_l":"2168-6750","issn":["2168-6750","2376-4562"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Emerging Topics in Computing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5036767968","display_name":"George N. Papadimitriou","orcid":"https://orcid.org/0000-0002-3772-5019"},"institutions":[{"id":"https://openalex.org/I200777214","display_name":"National and Kapodistrian University of Athens","ror":"https://ror.org/04gnjpq42","country_code":"GR","type":"education","lineage":["https://openalex.org/I200777214"]}],"countries":["GR"],"is_corresponding":true,"raw_author_name":"George Papadimitriou","raw_affiliation_strings":["Department of Informatics and Telecommunications, National and Kapodistrian University of Athens, Panepistimiopolis, Ilissia, Greece"],"affiliations":[{"raw_affiliation_string":"Department of Informatics and Telecommunications, National and Kapodistrian University of Athens, Panepistimiopolis, Ilissia, Greece","institution_ids":["https://openalex.org/I200777214"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5007119083","display_name":"Dimitris Gizopoulos","orcid":"https://orcid.org/0000-0002-1613-9061"},"institutions":[{"id":"https://openalex.org/I200777214","display_name":"National and Kapodistrian University of Athens","ror":"https://ror.org/04gnjpq42","country_code":"GR","type":"education","lineage":["https://openalex.org/I200777214"]}],"countries":["GR"],"is_corresponding":false,"raw_author_name":"Dimitris Gizopoulos","raw_affiliation_strings":["Department of Informatics and Telecommunications, National and Kapodistrian University of Athens, Panepistimiopolis, Ilissia, Greece"],"affiliations":[{"raw_affiliation_string":"Department of Informatics and Telecommunications, National and Kapodistrian University of Athens, Panepistimiopolis, Ilissia, Greece","institution_ids":["https://openalex.org/I200777214"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5036767968"],"corresponding_institution_ids":["https://openalex.org/I200777214"],"apc_list":null,"apc_paid":null,"fwci":1.372,"has_fulltext":false,"cited_by_count":15,"citation_normalized_percentile":{"value":0.80304331,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":96,"max":98},"biblio":{"volume":"11","issue":"2","first_page":"420","last_page":"431"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9944999814033508,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.8223021626472473},{"id":"https://openalex.org/keywords/vulnerability","display_name":"Vulnerability (computing)","score":0.6744565963745117},{"id":"https://openalex.org/keywords/microarchitecture","display_name":"Microarchitecture","score":0.668339729309082},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.636898934841156},{"id":"https://openalex.org/keywords/microprocessor","display_name":"Microprocessor","score":0.6079254746437073},{"id":"https://openalex.org/keywords/abstraction","display_name":"Abstraction","score":0.5485629439353943},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5392590165138245},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5023689270019531},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.49039649963378906},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.4675513505935669},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.4357331693172455},{"id":"https://openalex.org/keywords/abstraction-layer","display_name":"Abstraction layer","score":0.43382614850997925},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.32869040966033936},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.1438809335231781},{"id":"https://openalex.org/keywords/computer-security","display_name":"Computer security","score":0.10129496455192566}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.8223021626472473},{"id":"https://openalex.org/C95713431","wikidata":"https://www.wikidata.org/wiki/Q631425","display_name":"Vulnerability (computing)","level":2,"score":0.6744565963745117},{"id":"https://openalex.org/C107598950","wikidata":"https://www.wikidata.org/wiki/Q259864","display_name":"Microarchitecture","level":2,"score":0.668339729309082},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.636898934841156},{"id":"https://openalex.org/C2780728072","wikidata":"https://www.wikidata.org/wiki/Q5297","display_name":"Microprocessor","level":2,"score":0.6079254746437073},{"id":"https://openalex.org/C124304363","wikidata":"https://www.wikidata.org/wiki/Q673661","display_name":"Abstraction","level":2,"score":0.5485629439353943},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5392590165138245},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5023689270019531},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.49039649963378906},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.4675513505935669},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.4357331693172455},{"id":"https://openalex.org/C147358964","wikidata":"https://www.wikidata.org/wiki/Q1200992","display_name":"Abstraction layer","level":3,"score":0.43382614850997925},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.32869040966033936},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.1438809335231781},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.10129496455192566},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tetc.2022.3205808","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tetc.2022.3205808","pdf_url":null,"source":{"id":"https://openalex.org/S2496326734","display_name":"IEEE Transactions on Emerging Topics in Computing","issn_l":"2168-6750","issn":["2168-6750","2376-4562"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Emerging Topics in Computing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":40,"referenced_works":["https://openalex.org/W366168198","https://openalex.org/W1598941862","https://openalex.org/W1619770058","https://openalex.org/W1935809293","https://openalex.org/W1965936844","https://openalex.org/W1972649107","https://openalex.org/W1979951430","https://openalex.org/W2012035814","https://openalex.org/W2017521824","https://openalex.org/W2026387607","https://openalex.org/W2031411490","https://openalex.org/W2068092644","https://openalex.org/W2099569658","https://openalex.org/W2100307454","https://openalex.org/W2100597484","https://openalex.org/W2123907700","https://openalex.org/W2135719553","https://openalex.org/W2135921689","https://openalex.org/W2146579060","https://openalex.org/W2147657366","https://openalex.org/W2150267144","https://openalex.org/W2152652532","https://openalex.org/W2171823768","https://openalex.org/W2313420215","https://openalex.org/W2322585385","https://openalex.org/W2408771053","https://openalex.org/W2413549506","https://openalex.org/W2626574314","https://openalex.org/W2766281607","https://openalex.org/W2884175902","https://openalex.org/W2969507426","https://openalex.org/W3011765223","https://openalex.org/W3149134903","https://openalex.org/W3189398641","https://openalex.org/W4232751114","https://openalex.org/W4239813889","https://openalex.org/W4246094986","https://openalex.org/W4249144718","https://openalex.org/W4250541405","https://openalex.org/W6674682125"],"related_works":["https://openalex.org/W4376607496","https://openalex.org/W1984744919","https://openalex.org/W3100547819","https://openalex.org/W2770599040","https://openalex.org/W1901380330","https://openalex.org/W2132930690","https://openalex.org/W4213087105","https://openalex.org/W4248324254","https://openalex.org/W3017219868","https://openalex.org/W3009812692"],"abstract_inverted_index":{"Reliability":[0],"evaluation":[1,60,74],"of":[2,34,42,53,97,166],"a":[3,100],"microprocessor":[4,179],"design":[5],"may":[6],"reveal":[7],"vulnerable":[8],"silicon":[9],"areas":[10],"that":[11,20,72,81,103],"require":[12],"protection":[13],"against":[14],"faults,":[15],"but":[16],"also":[17],"hardware":[18,86],"structures":[19],"are":[21,174],"inherently":[22],"more":[23],"resilient":[24],"to":[25,107,117,125,142,185],"faults.":[26],"In":[27],"this":[28],"paper,":[29],"we":[30,70],"revisit":[31],"the":[32,40,46,51,73,84,95,108,111,143,153,156,164,170],"concept":[33],"system":[35,68],"vulnerability":[36,59],"stack":[37],"by":[38,162],"analyzing":[39],"anatomy":[41,165],"fault":[43,58],"effects":[44],"across":[45,169],"abstraction":[47],"layers":[48],"and":[49,110,121,151],"identify":[50],"sources":[52],"error":[54,98],"in":[55,99],"well-established":[56],"transient":[57],"methodologies.":[61],"By":[62],"providing":[63],"insights":[64],"for":[65],"all":[66,79],"distinct":[67],"layers,":[69],"showcase":[71],"should":[75],"take":[76],"into":[77],"consideration":[78],"faults":[80,167],"arrive":[82],"from":[83],"underlying":[85],"as":[87,89],"well":[88],"their":[90],"distribution.":[91],"We":[92,128],"additionally":[93],"quantify":[94],"level":[96],"PVF":[101,132],"estimation":[102,133,150],"can":[104,122,134],"be":[105],"attributed":[106],"microarchitecture":[109],"architecture.":[112],"Current":[113],"established":[114],"methodologies":[115,158],"fail":[116],"capture":[118],"these":[119],"aspects":[120],"potentially":[123],"lead":[124],"misleading":[126],"findings.":[127],"experimentally":[129],"show":[130],"how":[131],"follow":[135],"opposite":[136],"(and":[137],"thus":[138],"misleading)":[139],"trends":[140],"compared":[141],"correct,":[144],"full-stack":[145],"Architectural":[146],"Vulnerability":[147],"Factor":[148],"(AVF)":[149],"explain":[152],"reasons":[154],"why":[155],"higher-level":[157],"provide":[159],"diverging":[160],"results":[161],"showing":[163],"manifestation":[168],"layers.":[171],"Our":[172],"experiments":[173],"performed":[175],"on":[176],"an":[177],"Armv8":[178],"model,":[180],"using":[181],"different":[182],"input":[183],"datasets":[184],"thoroughly":[186],"demonstrate":[187],"our":[188],"insights.":[189]},"counts_by_year":[{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":6},{"year":2023,"cited_by_count":6}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}