{"id":"https://openalex.org/W2995310383","doi":"https://doi.org/10.1109/tetc.2019.2960491","title":"Exploiting Asymmetry in eDRAM Errors for Redundancy-Free Error-Tolerant Design","display_name":"Exploiting Asymmetry in eDRAM Errors for Redundancy-Free Error-Tolerant Design","publication_year":2019,"publication_date":"2019-12-17","ids":{"openalex":"https://openalex.org/W2995310383","doi":"https://doi.org/10.1109/tetc.2019.2960491","mag":"2995310383"},"language":"en","primary_location":{"id":"doi:10.1109/tetc.2019.2960491","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tetc.2019.2960491","pdf_url":null,"source":{"id":"https://openalex.org/S2496326734","display_name":"IEEE Transactions on Emerging Topics in Computing","issn_l":"2168-6750","issn":["2168-6750","2376-4562"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Emerging Topics in Computing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100417119","display_name":"Shanshan Liu","orcid":"https://orcid.org/0000-0001-6226-2880"},"institutions":[{"id":"https://openalex.org/I12912129","display_name":"Northeastern University","ror":"https://ror.org/04t5xt781","country_code":"US","type":"education","lineage":["https://openalex.org/I12912129"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"SHANSHAN LIU","raw_affiliation_strings":["Department of Electronics and Communication Engineering, Northeastern University, Boston, MA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronics and Communication Engineering, Northeastern University, Boston, MA, USA","institution_ids":["https://openalex.org/I12912129"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080322790","display_name":"Pedro Reviriego","orcid":"https://orcid.org/0000-0003-2540-5234"},"institutions":[{"id":"https://openalex.org/I12912129","display_name":"Northeastern University","ror":"https://ror.org/04t5xt781","country_code":"US","type":"education","lineage":["https://openalex.org/I12912129"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"PEDRO REVIRIEGO","raw_affiliation_strings":["Department of Electronics and Communication Engineering, Northeastern University, Boston, MA, USA"],"raw_orcid":"https://orcid.org/0000-0003-2540-5234","affiliations":[{"raw_affiliation_string":"Department of Electronics and Communication Engineering, Northeastern University, Boston, MA, USA","institution_ids":["https://openalex.org/I12912129"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008575633","display_name":"Jing Guo","orcid":"https://orcid.org/0000-0002-6434-5281"},"institutions":[{"id":"https://openalex.org/I50357001","display_name":"Universidad Carlos III de Madrid","ror":"https://ror.org/03ths8210","country_code":"ES","type":"education","lineage":["https://openalex.org/I50357001"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"JING GUO","raw_affiliation_strings":["Universidad Carlos III de Madrid, Legan\u00e9s, Madrid, Spain"],"raw_orcid":"https://orcid.org/0000-0002-6434-5281","affiliations":[{"raw_affiliation_string":"Universidad Carlos III de Madrid, Legan\u00e9s, Madrid, Spain","institution_ids":["https://openalex.org/I50357001"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005550142","display_name":"Jie Han","orcid":"https://orcid.org/0000-0002-8849-4994"},"institutions":[{"id":"https://openalex.org/I135714990","display_name":"North University of China","ror":"https://ror.org/047bp1713","country_code":"CN","type":"education","lineage":["https://openalex.org/I135714990"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"JIE HAN","raw_affiliation_strings":["School of Instrument and Electronics, North University of China, Taiyuan, China"],"raw_orcid":"https://orcid.org/0000-0002-8849-4994","affiliations":[{"raw_affiliation_string":"School of Instrument and Electronics, North University of China, Taiyuan, China","institution_ids":["https://openalex.org/I135714990"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5001979328","display_name":"Fabrizio Lombardi","orcid":"https://orcid.org/0000-0003-3152-3245"},"institutions":[{"id":"https://openalex.org/I154425047","display_name":"University of Alberta","ror":"https://ror.org/0160cpw27","country_code":"CA","type":"education","lineage":["https://openalex.org/I154425047"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"FABRIZIO LOMBARDI","raw_affiliation_strings":["Department of Electronics and Communication Engineering, University of Alberta, Edmonton, Canada"],"raw_orcid":"https://orcid.org/0000-0003-3152-3245","affiliations":[{"raw_affiliation_string":"Department of Electronics and Communication Engineering, University of Alberta, Edmonton, Canada","institution_ids":["https://openalex.org/I154425047"]}]}],"institutions":[],"countries_distinct_count":4,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.7108,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.74732148,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"9","issue":"4","first_page":"2064","last_page":"2075"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11478","display_name":"Caching and Content Delivery","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11478","display_name":"Caching and Content Delivery","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11181","display_name":"Advanced Data Storage Technologies","score":0.9977999925613403,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9962000250816345,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7712026834487915},{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.717789888381958},{"id":"https://openalex.org/keywords/error-detection-and-correction","display_name":"Error detection and correction","score":0.7135432958602905},{"id":"https://openalex.org/keywords/dram","display_name":"Dram","score":0.688072919845581},{"id":"https://openalex.org/keywords/memory-refresh","display_name":"Memory refresh","score":0.4824817478656769},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.44962602853775024},{"id":"https://openalex.org/keywords/parity-bit","display_name":"Parity bit","score":0.44597649574279785},{"id":"https://openalex.org/keywords/data-retention","display_name":"Data retention","score":0.43404191732406616},{"id":"https://openalex.org/keywords/memory-cell","display_name":"Memory cell","score":0.4168768525123596},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.30219176411628723},{"id":"https://openalex.org/keywords/semiconductor-memory","display_name":"Semiconductor memory","score":0.2630033493041992},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.1585245132446289},{"id":"https://openalex.org/keywords/computer-memory","display_name":"Computer memory","score":0.09648802876472473}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7712026834487915},{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.717789888381958},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.7135432958602905},{"id":"https://openalex.org/C7366592","wikidata":"https://www.wikidata.org/wiki/Q1255620","display_name":"Dram","level":2,"score":0.688072919845581},{"id":"https://openalex.org/C87907426","wikidata":"https://www.wikidata.org/wiki/Q6815755","display_name":"Memory refresh","level":4,"score":0.4824817478656769},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.44962602853775024},{"id":"https://openalex.org/C131521367","wikidata":"https://www.wikidata.org/wiki/Q625502","display_name":"Parity bit","level":2,"score":0.44597649574279785},{"id":"https://openalex.org/C2780866740","wikidata":"https://www.wikidata.org/wiki/Q5227345","display_name":"Data retention","level":2,"score":0.43404191732406616},{"id":"https://openalex.org/C2776638159","wikidata":"https://www.wikidata.org/wiki/Q18343761","display_name":"Memory cell","level":4,"score":0.4168768525123596},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.30219176411628723},{"id":"https://openalex.org/C98986596","wikidata":"https://www.wikidata.org/wiki/Q1143031","display_name":"Semiconductor memory","level":2,"score":0.2630033493041992},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.1585245132446289},{"id":"https://openalex.org/C92855701","wikidata":"https://www.wikidata.org/wiki/Q5830907","display_name":"Computer memory","level":3,"score":0.09648802876472473},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tetc.2019.2960491","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tetc.2019.2960491","pdf_url":null,"source":{"id":"https://openalex.org/S2496326734","display_name":"IEEE Transactions on Emerging Topics in Computing","issn_l":"2168-6750","issn":["2168-6750","2376-4562"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Emerging Topics in Computing","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/16","display_name":"Peace, Justice and strong institutions","score":0.8199999928474426}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":40,"referenced_works":["https://openalex.org/W160422864","https://openalex.org/W1515422725","https://openalex.org/W1901662065","https://openalex.org/W1988664198","https://openalex.org/W1993284846","https://openalex.org/W2000881669","https://openalex.org/W2044931308","https://openalex.org/W2047693419","https://openalex.org/W2050900502","https://openalex.org/W2074041765","https://openalex.org/W2080234606","https://openalex.org/W2083839254","https://openalex.org/W2099335407","https://openalex.org/W2123845384","https://openalex.org/W2126540423","https://openalex.org/W2127478143","https://openalex.org/W2143137068","https://openalex.org/W2146625936","https://openalex.org/W2151529344","https://openalex.org/W2152933730","https://openalex.org/W2166585241","https://openalex.org/W2176722529","https://openalex.org/W2504504472","https://openalex.org/W2546844239","https://openalex.org/W2554180852","https://openalex.org/W2613654735","https://openalex.org/W2731118616","https://openalex.org/W2758257794","https://openalex.org/W2794447465","https://openalex.org/W2798670698","https://openalex.org/W2889628459","https://openalex.org/W2906802999","https://openalex.org/W2962870204","https://openalex.org/W3103339143","https://openalex.org/W3149410719","https://openalex.org/W4242108284","https://openalex.org/W4244096863","https://openalex.org/W4246578358","https://openalex.org/W6674824689","https://openalex.org/W6681335473"],"related_works":["https://openalex.org/W1966671390","https://openalex.org/W2999623539","https://openalex.org/W2068579290","https://openalex.org/W2122895920","https://openalex.org/W1550132780","https://openalex.org/W2108861336","https://openalex.org/W4285361316","https://openalex.org/W3185952280","https://openalex.org/W2016072378","https://openalex.org/W2995310383"],"abstract_inverted_index":{"For":[0,46,182,235],"some":[1,47,95,154,187],"applications,":[2],"errors":[3,49,69,92,107,138,191,205,243,315],"have":[4,272],"a":[5,18,21,32,56,73,250],"different":[6,289],"impact":[7,135],"on":[8,14,144],"data":[9,266],"and":[10,75,139,159,164,280,300],"memory":[11,88,98,129,295],"systems":[12],"depending":[13],"whether":[15],"they":[16],"change":[17],"zero":[19,35,37,188,196],"to":[20,34,38,186,189,195,208,217,282,319],"one":[22,33,84,190,194],"or":[23,121,149,166,213],"the":[24,44,61,103,106,134,145,175,201,219,222,284,304,311],"other":[25],"way":[26],"around;":[27],"for":[28,53,87,114,133,179,278],"an":[29],"unsigned":[30],"integer,":[31],"(or":[36,42],"one)":[39],"error":[40,322],"reduces":[41],"increases)":[43],"value.":[45],"memories,":[48],"are":[50,83,124,172],"also":[51,247],"asymmetric;":[52],"example,":[54],"in":[55,72,97,105,108,126,170,206,242,286,303,325],"DRAM,":[57],"retention":[58,137,204,314],"failures":[59],"discharge":[60],"storage":[62],"cell.":[63],"The":[64,268],"tolerance":[65,185],"of":[66,128,136,142,153,203,288,291,313],"such":[67,293],"asymmetric":[68],"can":[70,226,244,316],"result":[71],"robust":[74],"efficient":[76],"system":[77],"design.":[78],"Error":[79],"Control":[80],"Codes":[81],"(ECCs)":[82],"common":[85],"technique":[86],"protection":[89],"against":[90],"these":[91],"by":[93,248],"introducing":[94],"redundancy":[96],"cells.":[99,130],"In":[100],"this":[101,180,237],"paper,":[102],"asymmetry":[104,202,241,312],"Embedded":[109],"DRAMs":[110],"(eDRAMs)":[111],"is":[112,157,198,215],"exploited":[113,246],"error-tolerant":[115,252],"designs":[116],"without":[117],"using":[118,249],"any":[119],"ECC":[120,212],"parity,":[122],"which":[123,254],"redundancy-free":[125,251,270],"terms":[127,287],"A":[131],"model":[132],"refresh":[140,224],"time":[141,225],"eDRAMs":[143,171,207],"False":[146,150],"Positive":[147],"rate":[148,152],"Negative":[151],"eDRAM":[155,223],"applications":[156],"proposed":[158,269],"analyzed.":[160],"Bloom":[161],"Filters":[162],"(BFs)":[163],"read-only":[165],"write-through":[167],"caches":[168,281],"implemented":[169],"considered":[173],"as":[174,294],"first":[176],"case":[177,306],"studies":[178],"model.":[181],"BFs,":[183],"their":[184],"(but":[192],"not":[193],"errors)":[197],"combined":[199],"with":[200,275],"show":[209,283,309],"that":[210,240,310],"no":[211,260,265],"parity":[214],"needed":[216],"protect":[218],"filter;":[220],"moreover,":[221],"significantly":[227],"be":[228,245,317],"increased,":[229],"thus":[230],"reducing":[231],"its":[232],"power":[233],"consumption.":[234],"caches,":[236],"paper":[238],"shows":[239],"scheme,":[253],"only":[255],"introduces":[256],"false":[257,261],"negatives,":[258],"but":[259],"positives,":[262],"therefore":[263],"causing":[264],"corruption.":[267],"implementations":[271],"been":[273],"compared":[274],"existing":[276],"schemes":[277],"BFs":[279],"benefits":[285],"figures":[290],"merit":[292],"size,":[296],"area,":[297],"decoder/encoder":[298],"complexity":[299],"delay.":[301],"Finally,":[302],"last":[305],"study,":[307],"we":[308],"used":[318],"develop":[320],"additional":[321],"correction":[323],"capabilities":[324],"Modular":[326],"Redundancy":[327],"Schemes.":[328]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}