{"id":"https://openalex.org/W2807956864","doi":"https://doi.org/10.1109/tetc.2018.2802788","title":"Guest Editorial: <italic>IEEE Transactions on Emerging Topics in Computing</italic> Special Issue on Design & Technology of Integrated Systems in Deep Submicron Era","display_name":"Guest Editorial: <italic>IEEE Transactions on Emerging Topics in Computing</italic> Special Issue on Design & Technology of Integrated Systems in Deep Submicron Era","publication_year":2018,"publication_date":"2018-04-01","ids":{"openalex":"https://openalex.org/W2807956864","doi":"https://doi.org/10.1109/tetc.2018.2802788","mag":"2807956864"},"language":"en","primary_location":{"id":"doi:10.1109/tetc.2018.2802788","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tetc.2018.2802788","pdf_url":null,"source":{"id":"https://openalex.org/S2496326734","display_name":"IEEE Transactions on Emerging Topics in Computing","issn_l":"2168-6750","issn":["2168-6750","2376-4562"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Emerging Topics in Computing","raw_type":"journal-article"},"type":"editorial","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5078888989","display_name":"Giorgio Di Natale","orcid":"https://orcid.org/0000-0001-8063-5388"},"institutions":[{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4405261681"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Giorgio Di Natale","raw_affiliation_strings":["Microelectronic Department, LIRMM Laboratory (Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier), Montpellier, France"],"raw_orcid":"https://orcid.org/0000-0001-8063-5388","affiliations":[{"raw_affiliation_string":"Microelectronic Department, LIRMM Laboratory (Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier), Montpellier, France","institution_ids":["https://openalex.org/I4210101743"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5048232172","display_name":"Marco Ottavi","orcid":"https://orcid.org/0000-0002-5064-7342"},"institutions":[{"id":"https://openalex.org/I116067653","display_name":"University of Rome Tor Vergata","ror":"https://ror.org/02p77k626","country_code":"IT","type":"education","lineage":["https://openalex.org/I116067653"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Marco Ottavi","raw_affiliation_strings":["Department of Electronic Engineering, University of Rome Tor Vergata, Rome, Italy"],"raw_orcid":"https://orcid.org/0000-0002-5064-7342","affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, University of Rome Tor Vergata, Rome, Italy","institution_ids":["https://openalex.org/I116067653"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.2305,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.49121744,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"6","issue":"2","first_page":"170","last_page":"171"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.7946000099182129,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.7946000099182129,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.7851999998092651,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.7784000039100647,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6549352407455444},{"id":"https://openalex.org/keywords/special-section","display_name":"Special section","score":0.6493600010871887},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6112872362136841},{"id":"https://openalex.org/keywords/cover","display_name":"Cover (algebra)","score":0.4796583950519562},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.41788798570632935},{"id":"https://openalex.org/keywords/computer-security","display_name":"Computer security","score":0.32948800921440125},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.3284682333469391},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.3278629183769226},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.25626975297927856},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.15140113234519958},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.13612768054008484}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6549352407455444},{"id":"https://openalex.org/C2993458768","wikidata":"https://www.wikidata.org/wiki/Q3477549","display_name":"Special section","level":2,"score":0.6493600010871887},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6112872362136841},{"id":"https://openalex.org/C2780428219","wikidata":"https://www.wikidata.org/wiki/Q16952335","display_name":"Cover (algebra)","level":2,"score":0.4796583950519562},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.41788798570632935},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.32948800921440125},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.3284682333469391},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.3278629183769226},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.25626975297927856},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15140113234519958},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.13612768054008484},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C61696701","wikidata":"https://www.wikidata.org/wiki/Q770766","display_name":"Engineering physics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/tetc.2018.2802788","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tetc.2018.2802788","pdf_url":null,"source":{"id":"https://openalex.org/S2496326734","display_name":"IEEE Transactions on Emerging Topics in Computing","issn_l":"2168-6750","issn":["2168-6750","2376-4562"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Emerging Topics in Computing","raw_type":"journal-article"},{"id":"pmh:oai:HAL:lirmm-02520118v1","is_oa":false,"landing_page_url":"https://hal-lirmm.ccsd.cnrs.fr/lirmm-02520118","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Transactions on Emerging Topics in Computing, 2018, 6 (2), pp.170-171. ⟨10.1109/TETC.2018.2802788⟩","raw_type":"info:eu-repo/semantics/article"},{"id":"pmh:oai:art.torvergata.it:2108/199454","is_oa":false,"landing_page_url":"https://www.scopus.com/inward/record.uri?eid=2-s2.0-85048220805&doi=10.1109%2fTETC.2018.2802788&partnerID=40&md5=86495a463c0ce4b9c6053f436f0f355c","pdf_url":null,"source":{"id":"https://openalex.org/S4306400993","display_name":"Cineca Institutional Research Information System (Tor Vergata University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I116067653","host_organization_name":"University of Rome Tor Vergata","host_organization_lineage":["https://openalex.org/I116067653"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6800000071525574,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W623607250","https://openalex.org/W272374983","https://openalex.org/W4245505501","https://openalex.org/W4255529442","https://openalex.org/W4212927854","https://openalex.org/W1545246811","https://openalex.org/W4251798144","https://openalex.org/W4236448199","https://openalex.org/W4383877548","https://openalex.org/W4236954027"],"abstract_inverted_index":{"The":[0],"ten":[1],"papers":[2,25],"in":[3,20],"this":[4],"special":[5],"section":[6],"address":[7],"issues":[8,34],"related":[9],"to":[10],"the":[11,21,33,38,40,42],"design,":[12,37],"reliability,":[13,41],"security":[14,43],"and":[15,44],"testing":[16],"of":[17,30,35,46],"integrated":[18],"systems":[19],"nanoscale":[22],"era.":[23],"These":[24],"cover":[26],"a":[27],"wide":[28],"spectrum":[29],"techniques,":[31],"including":[32],"low-power":[36],"test,":[39],"trust":[45],"circuits":[47],"manufactured":[48],"with":[49],"emerging":[50],"technologies.":[51]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2019,"cited_by_count":1}],"updated_date":"2026-07-02T09:51:11.867554","created_date":"2018-06-21T00:00:00"}