{"id":"https://openalex.org/W2103468612","doi":"https://doi.org/10.1109/tetc.2014.2304492","title":"Test Versus Security: Past and Present","display_name":"Test Versus Security: Past and Present","publication_year":2014,"publication_date":"2014-02-06","ids":{"openalex":"https://openalex.org/W2103468612","doi":"https://doi.org/10.1109/tetc.2014.2304492","mag":"2103468612"},"language":"en","primary_location":{"id":"doi:10.1109/tetc.2014.2304492","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tetc.2014.2304492","pdf_url":"https://ieeexplore.ieee.org/ielx7/6245516/6824880/06733305.pdf","source":{"id":"https://openalex.org/S2496326734","display_name":"IEEE Transactions on Emerging Topics in Computing","issn_l":"2168-6750","issn":["2168-6750","2376-4562"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Emerging Topics in Computing","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"bronze","oa_url":"https://ieeexplore.ieee.org/ielx7/6245516/6824880/06733305.pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5017715153","display_name":"Jean Da Rolt","orcid":null},"institutions":[{"id":"https://openalex.org/I130442723","display_name":"Universidade Federal do Rio Grande do Sul","ror":"https://ror.org/041yk2d64","country_code":"BR","type":"education","lineage":["https://openalex.org/I130442723"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Jean Da Rolt","raw_affiliation_strings":["UFRGS, Porto Alegre, Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"UFRGS, Porto Alegre, Brazil","institution_ids":["https://openalex.org/I130442723"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040950219","display_name":"A. Das","orcid":"https://orcid.org/0000-0002-0849-6587"},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Amitabh Das","raw_affiliation_strings":["University of Leuven, Leuven, Belgium","University of Leuven, LEUVEN, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Leuven, Leuven, Belgium","institution_ids":["https://openalex.org/I99464096"]},{"raw_affiliation_string":"University of Leuven, LEUVEN, Belgium","institution_ids":["https://openalex.org/I99464096"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078888989","display_name":"Giorgio Di Natale","orcid":"https://orcid.org/0000-0001-8063-5388"},"institutions":[{"id":"https://openalex.org/I19894307","display_name":"Universit\u00e9 de Montpellier","ror":"https://ror.org/051escj72","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Giorgio Di Natale","raw_affiliation_strings":["University of Montpellier II, Montpellier Cedex, France",", University of Montpellier II, Montpellier Cedex, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Montpellier II, Montpellier Cedex, France","institution_ids":["https://openalex.org/I19894307"]},{"raw_affiliation_string":", University of Montpellier II, Montpellier Cedex, France","institution_ids":["https://openalex.org/I19894307"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081237741","display_name":"Marie-Lise Flottes","orcid":"https://orcid.org/0000-0002-7231-3976"},"institutions":[{"id":"https://openalex.org/I19894307","display_name":"Universit\u00e9 de Montpellier","ror":"https://ror.org/051escj72","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Marie-Lise Flottes","raw_affiliation_strings":["University of Montpellier II, Montpellier Cedex, France",", University of Montpellier II, Montpellier Cedex, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Montpellier II, Montpellier Cedex, France","institution_ids":["https://openalex.org/I19894307"]},{"raw_affiliation_string":", University of Montpellier II, Montpellier Cedex, France","institution_ids":["https://openalex.org/I19894307"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5035518436","display_name":"Bruno Rouzeyre","orcid":null},"institutions":[{"id":"https://openalex.org/I19894307","display_name":"Universit\u00e9 de Montpellier","ror":"https://ror.org/051escj72","country_code":"FR","type":"education","lineage":["https://openalex.org/I19894307"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Bruno Rouzeyre","raw_affiliation_strings":["University of Montpellier II, Montpellier Cedex, France",", University of Montpellier II, Montpellier Cedex, France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Montpellier II, Montpellier Cedex, France","institution_ids":["https://openalex.org/I19894307"]},{"raw_affiliation_string":", University of Montpellier II, Montpellier Cedex, France","institution_ids":["https://openalex.org/I19894307"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5082347771","display_name":"Ingrid Verbauwhede","orcid":"https://orcid.org/0000-0002-0879-076X"},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Ingrid Verbauwhede","raw_affiliation_strings":["University of Leuven, Leuven, Belgium","University of Leuven, LEUVEN, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Leuven, Leuven, Belgium","institution_ids":["https://openalex.org/I99464096"]},{"raw_affiliation_string":"University of Leuven, LEUVEN, Belgium","institution_ids":["https://openalex.org/I99464096"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":9.2408,"has_fulltext":true,"cited_by_count":91,"citation_normalized_percentile":{"value":0.98267523,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":100},"biblio":{"volume":"2","issue":"1","first_page":"50","last_page":"62"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.8319665789604187},{"id":"https://openalex.org/keywords/side-channel-attack","display_name":"Side channel attack","score":0.8168566823005676},{"id":"https://openalex.org/keywords/cryptography","display_name":"Cryptography","score":0.6561530232429504},{"id":"https://openalex.org/keywords/power-analysis","display_name":"Power analysis","score":0.5669504404067993},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.543860912322998},{"id":"https://openalex.org/keywords/plaintext","display_name":"Plaintext","score":0.5424796342849731},{"id":"https://openalex.org/keywords/computer-security","display_name":"Computer security","score":0.5325174927711487},{"id":"https://openalex.org/keywords/cryptographic-primitive","display_name":"Cryptographic primitive","score":0.510120689868927},{"id":"https://openalex.org/keywords/vulnerability","display_name":"Vulnerability (computing)","score":0.5099681615829468},{"id":"https://openalex.org/keywords/testability","display_name":"Testability","score":0.48100408911705017},{"id":"https://openalex.org/keywords/hardware-security-module","display_name":"Hardware security module","score":0.4185551106929779},{"id":"https://openalex.org/keywords/masking","display_name":"Masking (illustration)","score":0.41714394092559814},{"id":"https://openalex.org/keywords/test-compression","display_name":"Test compression","score":0.4121174216270447},{"id":"https://openalex.org/keywords/advanced-encryption-standard","display_name":"Advanced Encryption Standard","score":0.41050541400909424},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.34304574131965637},{"id":"https://openalex.org/keywords/encryption","display_name":"Encryption","score":0.3349301218986511},{"id":"https://openalex.org/keywords/cryptographic-protocol","display_name":"Cryptographic protocol","score":0.3180199861526489},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.21513232588768005},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.1301843822002411}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.8319665789604187},{"id":"https://openalex.org/C49289754","wikidata":"https://www.wikidata.org/wiki/Q2267081","display_name":"Side channel attack","level":3,"score":0.8168566823005676},{"id":"https://openalex.org/C178489894","wikidata":"https://www.wikidata.org/wiki/Q8789","display_name":"Cryptography","level":2,"score":0.6561530232429504},{"id":"https://openalex.org/C71743495","wikidata":"https://www.wikidata.org/wiki/Q2845210","display_name":"Power analysis","level":3,"score":0.5669504404067993},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.543860912322998},{"id":"https://openalex.org/C92717368","wikidata":"https://www.wikidata.org/wiki/Q1162538","display_name":"Plaintext","level":3,"score":0.5424796342849731},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.5325174927711487},{"id":"https://openalex.org/C15927051","wikidata":"https://www.wikidata.org/wiki/Q246593","display_name":"Cryptographic primitive","level":4,"score":0.510120689868927},{"id":"https://openalex.org/C95713431","wikidata":"https://www.wikidata.org/wiki/Q631425","display_name":"Vulnerability (computing)","level":2,"score":0.5099681615829468},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.48100408911705017},{"id":"https://openalex.org/C39217717","wikidata":"https://www.wikidata.org/wiki/Q1432354","display_name":"Hardware security module","level":3,"score":0.4185551106929779},{"id":"https://openalex.org/C2777402240","wikidata":"https://www.wikidata.org/wiki/Q6783436","display_name":"Masking (illustration)","level":2,"score":0.41714394092559814},{"id":"https://openalex.org/C29652920","wikidata":"https://www.wikidata.org/wiki/Q7705757","display_name":"Test compression","level":4,"score":0.4121174216270447},{"id":"https://openalex.org/C94520183","wikidata":"https://www.wikidata.org/wiki/Q190746","display_name":"Advanced Encryption Standard","level":3,"score":0.41050541400909424},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.34304574131965637},{"id":"https://openalex.org/C148730421","wikidata":"https://www.wikidata.org/wiki/Q141090","display_name":"Encryption","level":2,"score":0.3349301218986511},{"id":"https://openalex.org/C33884865","wikidata":"https://www.wikidata.org/wiki/Q1254335","display_name":"Cryptographic protocol","level":3,"score":0.3180199861526489},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.21513232588768005},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.1301843822002411},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C153349607","wikidata":"https://www.wikidata.org/wiki/Q36649","display_name":"Visual arts","level":1,"score":0.0},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/tetc.2014.2304492","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tetc.2014.2304492","pdf_url":"https://ieeexplore.ieee.org/ielx7/6245516/6824880/06733305.pdf","source":{"id":"https://openalex.org/S2496326734","display_name":"IEEE Transactions on Emerging Topics in Computing","issn_l":"2168-6750","issn":["2168-6750","2376-4562"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Emerging Topics in Computing","raw_type":"journal-article"},{"id":"pmh:oai:HAL:lirmm-00989627v1","is_oa":false,"landing_page_url":"https://hal-lirmm.ccsd.cnrs.fr/lirmm-00989627","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.computer.org/csdl/trans/ec/preprint/06733305-abs.html","raw_type":"info:eu-repo/semantics/article"},{"id":"pmh:oai:lirias2repo.kuleuven.be:123456789/511246","is_oa":false,"landing_page_url":"https://lirias.kuleuven.be/bitstream/123456789/511246/1/article-2416.pdf","pdf_url":null,"source":{"id":"https://openalex.org/S7407055369","display_name":"Lirias","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE Transactions on Emerging Topics in Computing, vol. 2 (1), Art.No. 1, (50-62)","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":{"id":"doi:10.1109/tetc.2014.2304492","is_oa":true,"landing_page_url":"https://doi.org/10.1109/tetc.2014.2304492","pdf_url":"https://ieeexplore.ieee.org/ielx7/6245516/6824880/06733305.pdf","source":{"id":"https://openalex.org/S2496326734","display_name":"IEEE Transactions on Emerging Topics in Computing","issn_l":"2168-6750","issn":["2168-6750","2376-4562"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Emerging Topics in Computing","raw_type":"journal-article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure","score":0.6299999952316284}],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W2103468612.pdf","grobid_xml":"https://content.openalex.org/works/W2103468612.grobid-xml"},"referenced_works_count":56,"referenced_works":["https://openalex.org/W11356556","https://openalex.org/W156271197","https://openalex.org/W824951967","https://openalex.org/W1561363170","https://openalex.org/W1563937974","https://openalex.org/W1613252625","https://openalex.org/W1664227763","https://openalex.org/W1849928240","https://openalex.org/W1968452000","https://openalex.org/W1976475840","https://openalex.org/W1982643606","https://openalex.org/W1987339131","https://openalex.org/W1992008051","https://openalex.org/W2010903499","https://openalex.org/W2025669099","https://openalex.org/W2030474490","https://openalex.org/W2030873248","https://openalex.org/W2040080049","https://openalex.org/W2048183989","https://openalex.org/W2052912197","https://openalex.org/W2062658790","https://openalex.org/W2070820601","https://openalex.org/W2078353671","https://openalex.org/W2091195302","https://openalex.org/W2095507076","https://openalex.org/W2101863706","https://openalex.org/W2101900253","https://openalex.org/W2104810638","https://openalex.org/W2116881166","https://openalex.org/W2123283296","https://openalex.org/W2124928244","https://openalex.org/W2125846166","https://openalex.org/W2130364905","https://openalex.org/W2130468378","https://openalex.org/W2141624968","https://openalex.org/W2142537526","https://openalex.org/W2143180464","https://openalex.org/W2149494050","https://openalex.org/W2155450755","https://openalex.org/W2156692142","https://openalex.org/W2166832790","https://openalex.org/W2224364690","https://openalex.org/W2284345771","https://openalex.org/W2294278942","https://openalex.org/W2615409614","https://openalex.org/W3014325818","https://openalex.org/W3146245284","https://openalex.org/W3147830305","https://openalex.org/W4245152844","https://openalex.org/W6623152415","https://openalex.org/W6636797535","https://openalex.org/W6666443212","https://openalex.org/W6679267926","https://openalex.org/W6681086539","https://openalex.org/W6681113282","https://openalex.org/W6681931124"],"related_works":["https://openalex.org/W2369513516","https://openalex.org/W2029006445","https://openalex.org/W2913264063","https://openalex.org/W2389269032","https://openalex.org/W2384300182","https://openalex.org/W1491708407","https://openalex.org/W2059218952","https://openalex.org/W2891272018","https://openalex.org/W135615942","https://openalex.org/W1789896601"],"abstract_inverted_index":{"Cryptographic":[0],"circuits":[1],"need":[2],"to":[3,81,171],"be":[4,23],"protected":[5],"against":[6,70,135],"side-channel":[7,40,92],"attacks,":[8],"which":[9,117],"target":[10],"their":[11,133],"physical":[12],"attributes":[13],"while":[14],"the":[15,42,63,88,103,120,124,152],"cryptographic":[16,98],"algorithm":[17],"is":[18,41,80,167],"in":[19,90,102,169],"execution.":[20],"There":[21],"can":[22,57],"various":[24,164],"side-channels,":[25],"such":[26,38,111],"as":[27,112,149],"power,":[28],"timing,":[29],"electromagnetic":[30],"radiation,":[31],"fault":[32],"response,":[33],"and":[34,49,96,105,115,143],"so":[35],"on.":[36],"One":[37],"important":[39],"design-for-testability":[43],"(DfT)":[44],"infrastructure":[45],"present":[46,83],"for":[47,131,181],"effective":[48],"timely":[50],"testing":[51],"of":[52,77,107,151,160],"VLSI":[53],"circuits.":[54],"The":[55,75],"attacker":[56],"extract":[58],"secret":[59],"information":[60],"stored":[61],"on":[62,87,94],"chip":[64],"by":[65],"scanning":[66],"out":[67],"test":[68,113,154],"responses":[69],"some":[71],"chosen":[72],"plaintext":[73],"inputs.":[74],"purpose":[76],"this":[78],"paper":[79],"first":[82],"a":[84],"detailed":[85],"survey":[86],"state-of-the-art":[89],"scan-based":[91],"attacks":[93],"symmetric":[95],"public-key":[97],"hardware":[99],"implementations,":[100],"both":[101],"absence":[104],"presence":[106],"advanced":[108],"DfT":[109],"structures,":[110],"compression":[114],"X-masking,":[116],"may":[118],"make":[119,177],"attack":[121,127],"difficult.":[122],"Then,":[123],"existing":[125,161],"scan":[126,137],"countermeasures":[128,145,162],"are":[129,146],"evaluated":[130],"determining":[132],"security":[134,144,175],"known":[136],"attacks.":[138],"In":[139],"addition,":[140],"JTAG":[141],"vulnerability":[142],"also":[147],"analyzed":[148],"part":[150],"external":[153],"interface.":[155],"A":[156],"comparative":[157],"area-timing-security":[158],"analysis":[159],"at":[163],"abstraction":[165],"levels":[166],"presented":[168],"order":[170],"help":[172],"an":[173,178],"embedded":[174],"designer":[176],"informed":[179],"choice":[180],"his":[182],"intended":[183],"application.":[184]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":6},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":6},{"year":2022,"cited_by_count":7},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":9},{"year":2019,"cited_by_count":9},{"year":2018,"cited_by_count":15},{"year":2017,"cited_by_count":14},{"year":2016,"cited_by_count":8},{"year":2015,"cited_by_count":6},{"year":2014,"cited_by_count":2}],"updated_date":"2026-07-02T09:51:11.867554","created_date":"2025-10-10T00:00:00"}