{"id":"https://openalex.org/W2913783910","doi":"https://doi.org/10.1109/test.2018.8624890","title":"Modeling and Testing of Aging Faults in FinFET Memories for Automotive Applications","display_name":"Modeling and Testing of Aging Faults in FinFET Memories for Automotive Applications","publication_year":2018,"publication_date":"2018-10-01","ids":{"openalex":"https://openalex.org/W2913783910","doi":"https://doi.org/10.1109/test.2018.8624890","mag":"2913783910"},"language":"en","primary_location":{"id":"doi:10.1109/test.2018.8624890","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2018.8624890","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE International Test Conference (ITC)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5087036362","display_name":"Grigor Tshagharyan","orcid":null},"institutions":[{"id":"https://openalex.org/I1335490905","display_name":"Synopsys (Switzerland)","ror":"https://ror.org/03mb54f81","country_code":"CH","type":"company","lineage":["https://openalex.org/I1335490905","https://openalex.org/I4210088951"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"G. Tshagharyan","raw_affiliation_strings":["Synopsys Inc"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Synopsys Inc","institution_ids":["https://openalex.org/I1335490905"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041707514","display_name":"G. Harutyunyan","orcid":"https://orcid.org/0000-0002-9709-8336"},"institutions":[{"id":"https://openalex.org/I1335490905","display_name":"Synopsys (Switzerland)","ror":"https://ror.org/03mb54f81","country_code":"CH","type":"company","lineage":["https://openalex.org/I1335490905","https://openalex.org/I4210088951"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"G. Harutyunyan","raw_affiliation_strings":["Synopsys Inc"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Synopsys Inc","institution_ids":["https://openalex.org/I1335490905"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108606295","display_name":"Y. Zorian","orcid":null},"institutions":[{"id":"https://openalex.org/I1335490905","display_name":"Synopsys (Switzerland)","ror":"https://ror.org/03mb54f81","country_code":"CH","type":"company","lineage":["https://openalex.org/I1335490905","https://openalex.org/I4210088951"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Y. Zorian","raw_affiliation_strings":["Synopsys Inc"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Synopsys Inc","institution_ids":["https://openalex.org/I1335490905"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020422864","display_name":"Anteneh Gebregiorgis","orcid":"https://orcid.org/0000-0002-8408-5691"},"institutions":[{"id":"https://openalex.org/I102335020","display_name":"Karlsruhe Institute of Technology","ror":"https://ror.org/04t3en479","country_code":"DE","type":"education","lineage":["https://openalex.org/I102335020","https://openalex.org/I1305996414"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"A. Gebregiorgis","raw_affiliation_strings":["Karlsruhe Institute of Technology (KIT), Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Karlsruhe Institute of Technology (KIT), Germany","institution_ids":["https://openalex.org/I102335020"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5045078282","display_name":"Mohammad Saber Golanbari","orcid":"https://orcid.org/0000-0002-3488-9106"},"institutions":[{"id":"https://openalex.org/I102335020","display_name":"Karlsruhe Institute of Technology","ror":"https://ror.org/04t3en479","country_code":"DE","type":"education","lineage":["https://openalex.org/I102335020","https://openalex.org/I1305996414"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"M. S. Golanbari","raw_affiliation_strings":["Karlsruhe Institute of Technology (KIT), Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Karlsruhe Institute of Technology (KIT), Germany","institution_ids":["https://openalex.org/I102335020"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5090692955","display_name":"Rajendra Bishnoi","orcid":"https://orcid.org/0000-0002-0516-7112"},"institutions":[{"id":"https://openalex.org/I102335020","display_name":"Karlsruhe Institute of Technology","ror":"https://ror.org/04t3en479","country_code":"DE","type":"education","lineage":["https://openalex.org/I102335020","https://openalex.org/I1305996414"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"R. Bishnoi","raw_affiliation_strings":["Karlsruhe Institute of Technology (KIT), Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Karlsruhe Institute of Technology (KIT), Germany","institution_ids":["https://openalex.org/I102335020"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5064445713","display_name":"Mehdi B. Tahoori","orcid":"https://orcid.org/0000-0002-8829-5610"},"institutions":[{"id":"https://openalex.org/I102335020","display_name":"Karlsruhe Institute of Technology","ror":"https://ror.org/04t3en479","country_code":"DE","type":"education","lineage":["https://openalex.org/I102335020","https://openalex.org/I1305996414"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"M. B. Tahoori","raw_affiliation_strings":["Karlsruhe Institute of Technology (KIT), Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Karlsruhe Institute of Technology (KIT), Germany","institution_ids":["https://openalex.org/I102335020"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.7793,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.69835297,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"10"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/automotive-industry","display_name":"Automotive industry","score":0.8134985566139221},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.7080205678939819},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6975314617156982},{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.5774025321006775},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5215194821357727},{"id":"https://openalex.org/keywords/failure-mode-and-effects-analysis","display_name":"Failure mode and effects analysis","score":0.48281750082969666},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4587784707546234},{"id":"https://openalex.org/keywords/semiconductor-industry","display_name":"Semiconductor industry","score":0.418605238199234},{"id":"https://openalex.org/keywords/circumstantial-evidence","display_name":"Circumstantial evidence","score":0.41090333461761475},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.35994288325309753},{"id":"https://openalex.org/keywords/automotive-engineering","display_name":"Automotive engineering","score":0.33572274446487427},{"id":"https://openalex.org/keywords/manufacturing-engineering","display_name":"Manufacturing engineering","score":0.18408486247062683}],"concepts":[{"id":"https://openalex.org/C526921623","wikidata":"https://www.wikidata.org/wiki/Q190117","display_name":"Automotive industry","level":2,"score":0.8134985566139221},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.7080205678939819},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6975314617156982},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.5774025321006775},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5215194821357727},{"id":"https://openalex.org/C66283442","wikidata":"https://www.wikidata.org/wiki/Q1389268","display_name":"Failure mode and effects analysis","level":2,"score":0.48281750082969666},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4587784707546234},{"id":"https://openalex.org/C2987888538","wikidata":"https://www.wikidata.org/wiki/Q2986369","display_name":"Semiconductor industry","level":2,"score":0.418605238199234},{"id":"https://openalex.org/C80114427","wikidata":"https://www.wikidata.org/wiki/Q634260","display_name":"Circumstantial evidence","level":2,"score":0.41090333461761475},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.35994288325309753},{"id":"https://openalex.org/C171146098","wikidata":"https://www.wikidata.org/wiki/Q124192","display_name":"Automotive engineering","level":1,"score":0.33572274446487427},{"id":"https://openalex.org/C117671659","wikidata":"https://www.wikidata.org/wiki/Q11049265","display_name":"Manufacturing engineering","level":1,"score":0.18408486247062683},{"id":"https://openalex.org/C199539241","wikidata":"https://www.wikidata.org/wiki/Q7748","display_name":"Law","level":1,"score":0.0},{"id":"https://openalex.org/C17744445","wikidata":"https://www.wikidata.org/wiki/Q36442","display_name":"Political science","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2018.8624890","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2018.8624890","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE International Test Conference (ITC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","score":0.5799999833106995,"id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":36,"referenced_works":["https://openalex.org/W1753784006","https://openalex.org/W1971784117","https://openalex.org/W1974338211","https://openalex.org/W1993007240","https://openalex.org/W1997325123","https://openalex.org/W1997825961","https://openalex.org/W2010771403","https://openalex.org/W2025338205","https://openalex.org/W2035025053","https://openalex.org/W2045775916","https://openalex.org/W2081580265","https://openalex.org/W2082209063","https://openalex.org/W2089307123","https://openalex.org/W2106339466","https://openalex.org/W2125169487","https://openalex.org/W2132663077","https://openalex.org/W2134822007","https://openalex.org/W2135818056","https://openalex.org/W2143591075","https://openalex.org/W2497595099","https://openalex.org/W2536886358","https://openalex.org/W2585078402","https://openalex.org/W2735763570","https://openalex.org/W2766575985","https://openalex.org/W2781952442","https://openalex.org/W2808199063","https://openalex.org/W2810112695","https://openalex.org/W3142089438","https://openalex.org/W4239927061","https://openalex.org/W6649741387","https://openalex.org/W6659174997","https://openalex.org/W6679523228","https://openalex.org/W6723865647","https://openalex.org/W6728795750","https://openalex.org/W6741228026","https://openalex.org/W6752873000"],"related_works":["https://openalex.org/W2300986900","https://openalex.org/W4241190159","https://openalex.org/W2794794518","https://openalex.org/W2354250574","https://openalex.org/W4312199808","https://openalex.org/W4400567306","https://openalex.org/W2805262768","https://openalex.org/W3182905616","https://openalex.org/W3008031866","https://openalex.org/W2015043232"],"abstract_inverted_index":{"Automotive":[0],"has":[1],"become":[2],"one":[3,96],"of":[4,9,56,85,91,97,137],"the":[5,10,23,46,53,78,86,98,128,134,138],"most":[6],"prevailing":[7],"sectors":[8],"modern":[11,66],"semiconductor":[12],"industry.":[13],"Due":[14],"to":[15,51],"strict":[16],"requirements":[17,130],"for":[18,29,58,73,101,114],"safety,":[19],"reliability,":[20],"and":[21,41,76,117,131],"security":[22],"proposed":[24,125],"test":[25,120],"&":[26,121],"repair":[27,122],"solutions":[28],"automotive":[30,129],"applications":[31],"undergo":[32],"a":[33,106],"circumstantial":[34],"verification":[35],"before":[36],"exploitation.":[37],"Traditionally":[38],"production":[39],"defects":[40],"soft":[42],"errors":[43],"occurring":[44],"in":[45,65,81],"operation":[47],"mode":[48],"were":[49],"considered":[50],"be":[52],"main":[54,99],"source":[55],"failures":[57],"System-on-Chips":[59],"(SoC).":[60],"Nevertheless,":[61],"aging-induced":[62],"faults":[63,111],"especially":[64],"technology":[67],"nodes":[68],"also":[69],"pose":[70],"certain":[71],"challenges":[72],"SoC":[74],"lifetime":[75],"impact":[77],"overall":[79],"Failure":[80],"Time":[82],"(FIT)":[83],"rate":[84,94,136],"system.":[87,139],"Meanwhile":[88],"keeping":[89],"hold":[90],"low":[92],"FIT":[93,135],"is":[95,112,124],"criteria":[100],"reliability.":[102],"In":[103],"this":[104],"paper,":[105],"comprehensive":[107],"study":[108],"on":[109],"aging":[110],"conducted":[113],"FinFET":[115],"memories":[116],"an":[118],"efficient":[119],"methodology":[123],"that":[126],"meets":[127],"allows":[132],"decreasing":[133]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2019,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}