{"id":"https://openalex.org/W2913356818","doi":"https://doi.org/10.1109/test.2018.8624753","title":"Fast and accurate linearity test for DACs with various architectures using segmented models","display_name":"Fast and accurate linearity test for DACs with various architectures using segmented models","publication_year":2018,"publication_date":"2018-10-01","ids":{"openalex":"https://openalex.org/W2913356818","doi":"https://doi.org/10.1109/test.2018.8624753","mag":"2913356818"},"language":"en","primary_location":{"id":"doi:10.1109/test.2018.8624753","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2018.8624753","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE International Test Conference (ITC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5023673688","display_name":"Shravan K. Chaganti","orcid":"https://orcid.org/0000-0001-5930-5894"},"institutions":[{"id":"https://openalex.org/I173911158","display_name":"Iowa State University","ror":"https://ror.org/04rswrd78","country_code":"US","type":"education","lineage":["https://openalex.org/I173911158"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Shravan K. Chaganti","raw_affiliation_strings":["Iowa State University, Ames, USA"],"affiliations":[{"raw_affiliation_string":"Iowa State University, Ames, USA","institution_ids":["https://openalex.org/I173911158"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081596132","display_name":"Abalhassan Sheikh","orcid":"https://orcid.org/0000-0001-8106-4732"},"institutions":[{"id":"https://openalex.org/I173911158","display_name":"Iowa State University","ror":"https://ror.org/04rswrd78","country_code":"US","type":"education","lineage":["https://openalex.org/I173911158"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Abalhassan Sheikh","raw_affiliation_strings":["Iowa State University, Ames, USA"],"affiliations":[{"raw_affiliation_string":"Iowa State University, Ames, USA","institution_ids":["https://openalex.org/I173911158"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019340603","display_name":"Sumit Dubey","orcid":null},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sumit Dubey","raw_affiliation_strings":["Texas Instruments Inc"],"affiliations":[{"raw_affiliation_string":"Texas Instruments Inc","institution_ids":["https://openalex.org/I74760111"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5026420932","display_name":"Frank Ankapong","orcid":null},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Frank Ankapong","raw_affiliation_strings":["Texas Instruments Inc"],"affiliations":[{"raw_affiliation_string":"Texas Instruments Inc","institution_ids":["https://openalex.org/I74760111"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002577265","display_name":"Nitin Agarwal","orcid":"https://orcid.org/0000-0003-4940-1967"},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Nitin Agarwal","raw_affiliation_strings":["Texas Instruments Inc"],"affiliations":[{"raw_affiliation_string":"Texas Instruments Inc","institution_ids":["https://openalex.org/I74760111"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101873076","display_name":"Degang Chen","orcid":"https://orcid.org/0000-0002-5938-6329"},"institutions":[{"id":"https://openalex.org/I173911158","display_name":"Iowa State University","ror":"https://ror.org/04rswrd78","country_code":"US","type":"education","lineage":["https://openalex.org/I173911158"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Degang Chen","raw_affiliation_strings":["Iowa State University, Ames, USA"],"affiliations":[{"raw_affiliation_string":"Iowa State University, Ames, USA","institution_ids":["https://openalex.org/I173911158"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5023673688"],"corresponding_institution_ids":["https://openalex.org/I173911158"],"apc_list":null,"apc_paid":null,"fwci":0.5049,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.65204107,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"10"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/linearity","display_name":"Linearity","score":0.8718760013580322},{"id":"https://openalex.org/keywords/converters","display_name":"Converters","score":0.7368566989898682},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6538712978363037},{"id":"https://openalex.org/keywords/interpolation","display_name":"Interpolation (computer graphics)","score":0.5933992266654968},{"id":"https://openalex.org/keywords/parametric-statistics","display_name":"Parametric statistics","score":0.4886765778064728},{"id":"https://openalex.org/keywords/test-method","display_name":"Test method","score":0.4579090476036072},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.43415436148643494},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.28455018997192383},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16144919395446777},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.13530948758125305},{"id":"https://openalex.org/keywords/frame","display_name":"Frame (networking)","score":0.11743968725204468},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.09246501326560974}],"concepts":[{"id":"https://openalex.org/C77170095","wikidata":"https://www.wikidata.org/wiki/Q1753188","display_name":"Linearity","level":2,"score":0.8718760013580322},{"id":"https://openalex.org/C2778422915","wikidata":"https://www.wikidata.org/wiki/Q10302051","display_name":"Converters","level":3,"score":0.7368566989898682},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6538712978363037},{"id":"https://openalex.org/C137800194","wikidata":"https://www.wikidata.org/wiki/Q11713455","display_name":"Interpolation (computer graphics)","level":3,"score":0.5933992266654968},{"id":"https://openalex.org/C117251300","wikidata":"https://www.wikidata.org/wiki/Q1849855","display_name":"Parametric statistics","level":2,"score":0.4886765778064728},{"id":"https://openalex.org/C132519959","wikidata":"https://www.wikidata.org/wiki/Q3077373","display_name":"Test method","level":2,"score":0.4579090476036072},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.43415436148643494},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.28455018997192383},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16144919395446777},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.13530948758125305},{"id":"https://openalex.org/C126042441","wikidata":"https://www.wikidata.org/wiki/Q1324888","display_name":"Frame (networking)","level":2,"score":0.11743968725204468},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.09246501326560974},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2018.8624753","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2018.8624753","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE International Test Conference (ITC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure","score":0.5199999809265137}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W1529971285","https://openalex.org/W2006786321","https://openalex.org/W2035839306","https://openalex.org/W2084128131","https://openalex.org/W2097832094","https://openalex.org/W2131477866","https://openalex.org/W2145780891","https://openalex.org/W2148481133","https://openalex.org/W2152310581","https://openalex.org/W2160322785","https://openalex.org/W2770188706","https://openalex.org/W2781664087","https://openalex.org/W2871035070","https://openalex.org/W4243270004","https://openalex.org/W4245334825","https://openalex.org/W6746358713"],"related_works":["https://openalex.org/W631083485","https://openalex.org/W4313452936","https://openalex.org/W2097026685","https://openalex.org/W2480068220","https://openalex.org/W2102542442","https://openalex.org/W1986220761","https://openalex.org/W2070883797","https://openalex.org/W2354856110","https://openalex.org/W2088446200","https://openalex.org/W2772849248"],"abstract_inverted_index":{"Production":[0],"test":[1,44,52,63,69,78,85,89,205],"of":[2,13,30,64,100,116,121,208],"parametric":[3],"specifications":[4],"is":[5],"a":[6,112,132],"significant":[7],"contributor":[8],"to":[9,83,105,127,143,191],"the":[10,48,81,95,98,119,151,162],"overall":[11,49],"cost":[12],"build":[14],"for":[15,169,175,200,217,229],"analog":[16],"and":[17,23,36,66,135,147,185,189,221],"mixed-signal":[18],"products.":[19],"Data":[20],"converters":[21],"(ADCs":[22],"DACs)":[24],"in":[25,34,80,155,212,225],"particular":[26],"are":[27,72,172],"critical":[28],"components":[29],"integrated":[31],"circuits":[32],"used":[33],"control/actuation":[35],"sensing":[37],"applications.":[38],"If":[39],"left":[40],"un-optimized,":[41],"their":[42],"production":[43],"time":[45,86,134,206],"often":[46],"dominates":[47],"system-on-chip":[50],"(SoC)":[51],"time.":[53],"In":[54],"this":[55],"paper,":[56],"we":[57],"specifically":[58],"focus":[59],"on":[60,150],"static":[61],"linearity":[62,77,106,125,204],"DACs":[65,220],"propose":[67],"architecture-aware":[68],"methods":[70,93,195],"that":[71,97,160,196],"combined":[73],"with":[74],"best-in-class":[75],"fast":[76],"concepts":[79],"literature":[82],"minimize":[84],"without":[87],"compromising":[88],"quality.":[90],"The":[91],"proposed":[92],"exploit":[94],"hypothesis":[96],"number":[99,115,120],"device":[101],"errors":[102,107],"which":[103,124],"contribute":[104],"can":[108],"be":[109,128],"captured":[110],"by":[111],"significantly":[113],"fewer":[114],"variables":[117],"than":[118],"codes":[122],"at":[123],"needs":[126],"tested.":[129],"We":[130,157,178],"introduce":[131],"new":[133,194],"memory":[136],"efficient":[137],"method":[138],"called":[139],"Extrapolated":[140],"Reconstruction":[141],"(ER)":[142],"calculate":[144],"DAC":[145],"INL":[146],"DNL,":[148],"based":[149],"segmented":[152,163,183],"model":[153,164,184],"introduced":[154],"uSMILE.":[156],"also":[158],"demonstrate":[159],"since":[161],"techniques":[165],"do":[166],"not":[167,173],"account":[168],"interpolation,":[170],"they":[171],"suitable":[174],"interpolated":[176,182,201],"DACs.":[177,202,232],"thus":[179],"develop":[180],"an":[181],"enhance":[186],"both":[187],"uSMILE":[188],"ER":[190],"obtain":[192],"two":[193],"provide":[197],"correct":[198],"estimations":[199],"A":[203],"reduction":[207],"15\u00d7-20\u00d7":[209],"was":[210,223],"seen":[211,224],"actual":[213],"silicon":[214],"measurement":[215],"results":[216],"multiple":[218],"12-bit":[219],">100\u00d7":[222],"simulation":[226],"case":[227],"studies":[228],"many":[230],"16-bit":[231]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2019,"cited_by_count":1}],"updated_date":"2025-11-25T21:42:39.735039","created_date":"2025-10-10T00:00:00"}