{"id":"https://openalex.org/W2911501307","doi":"https://doi.org/10.1109/test.2018.8624678","title":"Generating Compact Test Patterns for DC and AC Faults Using One ATPG Run","display_name":"Generating Compact Test Patterns for DC and AC Faults Using One ATPG Run","publication_year":2018,"publication_date":"2018-10-01","ids":{"openalex":"https://openalex.org/W2911501307","doi":"https://doi.org/10.1109/test.2018.8624678","mag":"2911501307"},"language":"en","primary_location":{"id":"doi:10.1109/test.2018.8624678","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2018.8624678","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE International Test Conference (ITC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5019488876","display_name":"Yi-Cheng Kung","orcid":null},"institutions":[{"id":"https://openalex.org/I91807558","display_name":"National Cheng Kung University","ror":"https://ror.org/01b8kcc49","country_code":"TW","type":"education","lineage":["https://openalex.org/I91807558"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Yi-Cheng Kung","raw_affiliation_strings":["Dept. of EE, National Cheng Kung University, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept. of EE, National Cheng Kung University, Taiwan","institution_ids":["https://openalex.org/I91807558"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079657769","display_name":"Kuen-Jong Lee","orcid":"https://orcid.org/0000-0002-6690-0074"},"institutions":[{"id":"https://openalex.org/I91807558","display_name":"National Cheng Kung University","ror":"https://ror.org/01b8kcc49","country_code":"TW","type":"education","lineage":["https://openalex.org/I91807558"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Kuen-Jong Lee","raw_affiliation_strings":["Dept. of EE, National Cheng Kung University, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept. of EE, National Cheng Kung University, Taiwan","institution_ids":["https://openalex.org/I91807558"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5077101123","display_name":"S.M. Reddy","orcid":"https://orcid.org/0000-0001-9208-8262"},"institutions":[{"id":"https://openalex.org/I126307644","display_name":"University of Iowa","ror":"https://ror.org/036jqmy94","country_code":"US","type":"education","lineage":["https://openalex.org/I126307644"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sudhakar M. Reddy","raw_affiliation_strings":["Dept. ECE, University of Iowa, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept. ECE, University of Iowa, USA","institution_ids":["https://openalex.org/I126307644"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.4751,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.66508999,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"10"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.996999979019165,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.9107904434204102},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.6704009771347046},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.6435428261756897},{"id":"https://openalex.org/keywords/bridging","display_name":"Bridging (networking)","score":0.5446982979774475},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5399603247642517},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5177899599075317},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.500899076461792},{"id":"https://openalex.org/keywords/stuck-at-fault","display_name":"Stuck-at fault","score":0.48338809609413147},{"id":"https://openalex.org/keywords/test-set","display_name":"Test set","score":0.44564709067344666},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.3976112902164459},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.321222722530365},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.2670243978500366},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.25340425968170166},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.10056477785110474},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.07479235529899597}],"concepts":[{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.9107904434204102},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.6704009771347046},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.6435428261756897},{"id":"https://openalex.org/C174348530","wikidata":"https://www.wikidata.org/wiki/Q188635","display_name":"Bridging (networking)","level":2,"score":0.5446982979774475},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5399603247642517},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5177899599075317},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.500899076461792},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.48338809609413147},{"id":"https://openalex.org/C169903167","wikidata":"https://www.wikidata.org/wiki/Q3985153","display_name":"Test set","level":2,"score":0.44564709067344666},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.3976112902164459},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.321222722530365},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.2670243978500366},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.25340425968170166},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.10056477785110474},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.07479235529899597},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2018.8624678","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2018.8624678","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE International Test Conference (ITC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W1849928240","https://openalex.org/W1971601082","https://openalex.org/W2015281050","https://openalex.org/W2036584993","https://openalex.org/W2070302634","https://openalex.org/W2096146619","https://openalex.org/W2101637552","https://openalex.org/W2108103162","https://openalex.org/W2118744758","https://openalex.org/W2122054055","https://openalex.org/W2148271311","https://openalex.org/W2149147759","https://openalex.org/W2158401235","https://openalex.org/W2163558178","https://openalex.org/W2568949342","https://openalex.org/W2891553693","https://openalex.org/W4247981882","https://openalex.org/W6673776565","https://openalex.org/W6754960209"],"related_works":["https://openalex.org/W2340957901","https://openalex.org/W4256030018","https://openalex.org/W2147400189","https://openalex.org/W3147038789","https://openalex.org/W2068571131","https://openalex.org/W1555400249","https://openalex.org/W2115005577","https://openalex.org/W2092357065","https://openalex.org/W2913077774","https://openalex.org/W2952274626"],"abstract_inverted_index":{"A":[0,81],"novel":[1],"test":[2,93,98,139,149],"pattern":[3,84,140],"generation":[4],"flow":[5],"for":[6,63],"both":[7,64],"DC":[8,65],"and":[9,66,96,113,120,145,147,155],"AC":[10,67],"faults":[11,15,23,37,68,112],"is":[12,47],"presented.":[13],"All":[14],"to":[16,58,76,127],"be":[17,39,88],"processed":[18],"are":[19],"transformed":[20],"into":[21],"stuck-at":[22,109],"with":[24,73],"some":[25],"constraints":[26],"in":[27,69,105],"a":[28],"proposed":[29],"two-timeframe":[30],"circuit":[31],"model":[32,45],"such":[33],"that":[34],"all":[35,60],"considered":[36,104],"can":[38,87,137],"represented":[40],"utilizing":[41],"the":[42,78,128],"user-defined":[43],"fault":[44,102,160],"which":[46,90],"supported":[48],"by":[49,142,152],"most":[50,129],"commercial":[51],"ATPG":[52,71,79],"tools.":[53],"This":[54],"makes":[55],"it":[56],"possible":[57],"generate":[59],"required":[61],"patterns":[62],"one":[70],"run":[72],"no":[74],"need":[75],"modify":[77],"tool.":[80],"highly":[82],"compact":[83],"set":[85],"thus":[86],"obtained":[89],"requires":[91],"smaller":[92],"data":[94],"volume":[95],"shorter":[97],"application":[99,150],"time.":[100],"The":[101],"models":[103],"this":[106],"paper":[107],"include":[108],"faults,":[110],"bridging":[111],"transition":[114],"faults.":[115],"Experiments":[116],"on":[117,133],"ISCAS`89,":[118],"IWLS`05":[119],"ITC`99":[121],"benchmark":[122],"circuits":[123],"show":[124],"that,":[125],"compared":[126],"efficient":[130],"conventional":[131],"methods,":[132],"average":[134],"our":[135],"method":[136],"reduce":[138,148],"counts":[141],"14.55%,":[143],"11.26%":[144],"13.69%":[146],"time":[151],"25.93%,":[153],"24.47%":[154],"31.67%,":[156],"respectively,":[157],"without":[158],"degrading":[159],"coverage.":[161]},"counts_by_year":[{"year":2019,"cited_by_count":2}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}