{"id":"https://openalex.org/W2781984181","doi":"https://doi.org/10.1109/test.2017.8242061","title":"Selecting target bridging faults for uniform circuit coverage","display_name":"Selecting target bridging faults for uniform circuit coverage","publication_year":2017,"publication_date":"2017-10-01","ids":{"openalex":"https://openalex.org/W2781984181","doi":"https://doi.org/10.1109/test.2017.8242061","mag":"2781984181"},"language":"en","primary_location":{"id":"doi:10.1109/test.2017.8242061","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2017.8242061","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE International Test Conference (ITC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5032651920","display_name":"Irith Pomeranz","orcid":"https://orcid.org/0000-0002-5491-7282"},"institutions":[{"id":"https://openalex.org/I219193219","display_name":"Purdue University West Lafayette","ror":"https://ror.org/02dqehb95","country_code":"US","type":"education","lineage":["https://openalex.org/I219193219"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Irith Pomeranz","raw_affiliation_strings":["School of Electrical and Computer Engineering Purdue University, West Lafayette, IN, U. S. A"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering Purdue University, West Lafayette, IN, U. S. A","institution_ids":["https://openalex.org/I219193219"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5032651920"],"corresponding_institution_ids":["https://openalex.org/I219193219"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.20514347,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"7"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/bridging","display_name":"Bridging (networking)","score":0.9338446855545044},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.6643025875091553},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.6510229706764221},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.631266713142395},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5636216402053833},{"id":"https://openalex.org/keywords/test-set","display_name":"Test set","score":0.5258160829544067},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.47227156162261963},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.43234050273895264},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.36160579323768616},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.3076614439487457},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2009895145893097},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.10365679860115051},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.09347537159919739}],"concepts":[{"id":"https://openalex.org/C174348530","wikidata":"https://www.wikidata.org/wiki/Q188635","display_name":"Bridging (networking)","level":2,"score":0.9338446855545044},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.6643025875091553},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.6510229706764221},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.631266713142395},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5636216402053833},{"id":"https://openalex.org/C169903167","wikidata":"https://www.wikidata.org/wiki/Q3985153","display_name":"Test set","level":2,"score":0.5258160829544067},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.47227156162261963},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.43234050273895264},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.36160579323768616},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.3076614439487457},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2009895145893097},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.10365679860115051},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.09347537159919739},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2017.8242061","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2017.8242061","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE International Test Conference (ITC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W1554885925","https://openalex.org/W1569813649","https://openalex.org/W1625402502","https://openalex.org/W1695545649","https://openalex.org/W2008990681","https://openalex.org/W2028483337","https://openalex.org/W2041508134","https://openalex.org/W2047146916","https://openalex.org/W2095734407","https://openalex.org/W2098335643","https://openalex.org/W2109768518","https://openalex.org/W2114063437","https://openalex.org/W2123181463","https://openalex.org/W2128054363","https://openalex.org/W2131924443","https://openalex.org/W2140723188","https://openalex.org/W2144016413","https://openalex.org/W2145062710","https://openalex.org/W2156443301","https://openalex.org/W2157545815","https://openalex.org/W2162442179","https://openalex.org/W2286452981","https://openalex.org/W6680707473"],"related_works":["https://openalex.org/W1991935474","https://openalex.org/W2091533492","https://openalex.org/W2129713538","https://openalex.org/W2341817401","https://openalex.org/W2408214455","https://openalex.org/W2128148266","https://openalex.org/W1493811107","https://openalex.org/W2118133071","https://openalex.org/W2119780831","https://openalex.org/W3038280805"],"abstract_inverted_index":{"The":[0,18,134,155],"prevalence":[1],"of":[2,21,35,40,67,79,81,93,122,146],"bridging":[3,6,22,41,55,82,125,147],"defects":[4],"makes":[5],"fault":[7,13],"models":[8],"important":[9],"to":[10,32,46,88,98,127,161,171,196,199],"consider":[11],"during":[12],"simulation":[14],"and":[15,53],"test":[16,69,107,153,179,187,192],"generation.":[17,154],"large":[19],"number":[20],"faults":[23,42,56,83,126,148],"that":[24,43,84,149,163],"can":[25,181],"be":[26,172,182],"defined":[27],"for":[28,37,64,76,131,141,152,184],"a":[29,60,68,74,90,120,143,186],"circuit":[30,51,95,132],"led":[31],"the":[33,50,65,77,86,94,113,164,167,201],"development":[34],"procedures":[36],"selecting":[38],"subsets":[39,80],"are":[44,139,150],"likely":[45],"occur":[47],"based":[48],"on":[49],"layout,":[52],"hard-to-detect":[54],"whose":[57],"coverage":[58,92,103,129],"provides":[59],"more":[61],"effective":[62],"representation":[63],"quality":[66],"set.":[70],"This":[71],"paper":[72,118],"develops":[73],"procedure":[75,114],"selection":[78],"addresses":[85],"need":[87],"provide":[89],"uniform":[91],"in":[96,106,116],"order":[97],"prevent":[99],"areas":[100],"with":[101,136,166,194],"low":[102,137],"from":[104],"resulting":[105],"escapes.":[108],"In":[109],"an":[110],"iterative":[111,156],"process,":[112],"described":[115],"this":[117,159],"uses":[119],"set":[121,145,188],"randomly":[123],"selected":[124],"compute":[128],"metrics":[130],"lines.":[133],"lines":[135,165],"coverages":[138,169],"used":[140,183],"defining":[142],"new":[144],"targeted":[151],"process":[157],"updates":[158],"information":[160],"ensure":[162],"lowest":[168],"continue":[170],"targeted.":[173],"A":[174],"single":[175],"iteration":[176],"without":[177],"performing":[178],"generation":[180],"evaluating":[185],"or":[189],"comparing":[190],"different":[191],"sets":[193],"respect":[195],"their":[197],"ability":[198],"cover":[200],"circuit.":[202]},"counts_by_year":[{"year":2024,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}