{"id":"https://openalex.org/W2781756121","doi":"https://doi.org/10.1109/test.2017.8242051","title":"High throughput multiple device diagnosis system","display_name":"High throughput multiple device diagnosis system","publication_year":2017,"publication_date":"2017-10-01","ids":{"openalex":"https://openalex.org/W2781756121","doi":"https://doi.org/10.1109/test.2017.8242051","mag":"2781756121"},"language":"en","primary_location":{"id":"doi:10.1109/test.2017.8242051","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2017.8242051","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE International Test Conference (ITC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5048610158","display_name":"Sameer Chillarige","orcid":null},"institutions":[{"id":"https://openalex.org/I4210111610","display_name":"Cadence Design Systems (India)","ror":"https://ror.org/027qdw603","country_code":"IN","type":"company","lineage":["https://openalex.org/I4210111610","https://openalex.org/I66217453"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"Sameer Chillarige","raw_affiliation_strings":["Cadence Design Systems, Noida, UP, India"],"affiliations":[{"raw_affiliation_string":"Cadence Design Systems, Noida, UP, India","institution_ids":["https://openalex.org/I4210111610"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009268782","display_name":"Anil K. Malik","orcid":"https://orcid.org/0000-0002-9653-3068"},"institutions":[{"id":"https://openalex.org/I4210111610","display_name":"Cadence Design Systems (India)","ror":"https://ror.org/027qdw603","country_code":"IN","type":"company","lineage":["https://openalex.org/I4210111610","https://openalex.org/I66217453"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Anil Malik","raw_affiliation_strings":["Cadence Design Systems, Noida, UP, India"],"affiliations":[{"raw_affiliation_string":"Cadence Design Systems, Noida, UP, India","institution_ids":["https://openalex.org/I4210111610"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027264186","display_name":"Sharjinder Singh","orcid":null},"institutions":[{"id":"https://openalex.org/I4210111610","display_name":"Cadence Design Systems (India)","ror":"https://ror.org/027qdw603","country_code":"IN","type":"company","lineage":["https://openalex.org/I4210111610","https://openalex.org/I66217453"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Sharjinder Singh","raw_affiliation_strings":["Cadence Design Systems, Noida, UP, India"],"affiliations":[{"raw_affiliation_string":"Cadence Design Systems, Noida, UP, India","institution_ids":["https://openalex.org/I4210111610"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003215991","display_name":"Joe Swenton","orcid":null},"institutions":[{"id":"https://openalex.org/I66217453","display_name":"Cadence Design Systems (United States)","ror":"https://ror.org/04w8xa018","country_code":"US","type":"company","lineage":["https://openalex.org/I66217453"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Joe Swenton","raw_affiliation_strings":["Cadence Design Systems, Endicott, NY, USA"],"affiliations":[{"raw_affiliation_string":"Cadence Design Systems, Endicott, NY, USA","institution_ids":["https://openalex.org/I66217453"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5016355921","display_name":"Krishna Chakravadhanula","orcid":null},"institutions":[{"id":"https://openalex.org/I66217453","display_name":"Cadence Design Systems (United States)","ror":"https://ror.org/04w8xa018","country_code":"US","type":"company","lineage":["https://openalex.org/I66217453"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Krishna Chakravadhanula","raw_affiliation_strings":["Cadence Design Systems, Endicott, NY, USA"],"affiliations":[{"raw_affiliation_string":"Cadence Design Systems, Endicott, NY, USA","institution_ids":["https://openalex.org/I66217453"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5048610158"],"corresponding_institution_ids":["https://openalex.org/I4210111610"],"apc_list":null,"apc_paid":null,"fwci":0.9013,"has_fulltext":false,"cited_by_count":12,"citation_normalized_percentile":{"value":0.76318609,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"10"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/throughput","display_name":"Throughput","score":0.7585846185684204},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6811752319335938},{"id":"https://openalex.org/keywords/volume","display_name":"Volume (thermodynamics)","score":0.6375690698623657},{"id":"https://openalex.org/keywords/key","display_name":"Key (lock)","score":0.5820633172988892},{"id":"https://openalex.org/keywords/resource","display_name":"Resource (disambiguation)","score":0.4644463360309601},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.41514962911605835},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.33090245723724365},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.32598596811294556},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18546536564826965},{"id":"https://openalex.org/keywords/computer-security","display_name":"Computer security","score":0.08849063515663147},{"id":"https://openalex.org/keywords/computer-network","display_name":"Computer network","score":0.08642515540122986},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.07735222578048706}],"concepts":[{"id":"https://openalex.org/C157764524","wikidata":"https://www.wikidata.org/wiki/Q1383412","display_name":"Throughput","level":3,"score":0.7585846185684204},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6811752319335938},{"id":"https://openalex.org/C20556612","wikidata":"https://www.wikidata.org/wiki/Q4469374","display_name":"Volume (thermodynamics)","level":2,"score":0.6375690698623657},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.5820633172988892},{"id":"https://openalex.org/C206345919","wikidata":"https://www.wikidata.org/wiki/Q20380951","display_name":"Resource (disambiguation)","level":2,"score":0.4644463360309601},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.41514962911605835},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.33090245723724365},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.32598596811294556},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18546536564826965},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.08849063515663147},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.08642515540122986},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.07735222578048706},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C555944384","wikidata":"https://www.wikidata.org/wiki/Q249","display_name":"Wireless","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2017.8242051","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2017.8242051","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE International Test Conference (ITC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.44999998807907104,"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W1564266201","https://openalex.org/W1864256460","https://openalex.org/W2021463588","https://openalex.org/W2048475032","https://openalex.org/W2101503547","https://openalex.org/W2102485710","https://openalex.org/W2108822432","https://openalex.org/W2114584148","https://openalex.org/W2115122973","https://openalex.org/W2131814033","https://openalex.org/W2131819669","https://openalex.org/W2145224769","https://openalex.org/W2147220573","https://openalex.org/W2156294156","https://openalex.org/W2159254834","https://openalex.org/W2161229078","https://openalex.org/W2167012192","https://openalex.org/W3146581747","https://openalex.org/W4230940000"],"related_works":["https://openalex.org/W2136583354","https://openalex.org/W2111238207","https://openalex.org/W2760721665","https://openalex.org/W2107954672","https://openalex.org/W330130819","https://openalex.org/W2288610023","https://openalex.org/W2112044895","https://openalex.org/W3121416282","https://openalex.org/W2281389338","https://openalex.org/W2037453743"],"abstract_inverted_index":{"Volume":[0],"Diagnosis":[1,54],"is":[2,23],"a":[3,37,44,50,70],"proven":[4],"methodology":[5,22],"to":[6,20,26,31,57,90],"significantly":[7,58],"improve":[8,59],"the":[9,15,60,96],"yield":[10],"enhancement":[11],"rates.":[12],"One":[13],"of":[14,18,33,40,62,72,85],"key":[16],"factors":[17],"success":[19],"this":[21],"being":[24],"able":[25],"perform":[27],"diagnosis":[28,64,68],"on":[29,69,77],"hundreds":[30],"thousands":[32],"failing":[34,73,86],"dies":[35],"using":[36],"limited":[38],"amount":[39],"computational":[41],"resource":[42],"in":[43,93],"tractable":[45],"time.":[46],"This":[47],"paper":[48],"presents":[49],"new":[51],"Multiple":[52],"Device":[53],"(MDD)":[55],"system":[56],"throughput":[61],"volume":[63],"by":[65],"performing":[66],"logic":[67],"group":[71],"devices.":[74],"Experiments":[75],"conducted":[76],"large":[78],"industrial":[79],"designs":[80],"with":[81,95],"randomly":[82],"selected":[83],"groups":[84],"devices":[87],"demonstrated":[88],"up":[89],"12X":[91],"increase":[92],"speed-up":[94],"proposed":[97],"system.":[98]},"counts_by_year":[{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}