{"id":"https://openalex.org/W2782385765","doi":"https://doi.org/10.1109/test.2017.8242030","title":"Low cost dynamic error detection in linearity testing of SAR ADCs","display_name":"Low cost dynamic error detection in linearity testing of SAR ADCs","publication_year":2017,"publication_date":"2017-10-01","ids":{"openalex":"https://openalex.org/W2782385765","doi":"https://doi.org/10.1109/test.2017.8242030","mag":"2782385765"},"language":"en","primary_location":{"id":"doi:10.1109/test.2017.8242030","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2017.8242030","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE International Test Conference (ITC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5111449269","display_name":"Nimit Jain","orcid":null},"institutions":[{"id":"https://openalex.org/I24676775","display_name":"Indian Institute of Technology Madras","ror":"https://ror.org/03v0r5n49","country_code":"IN","type":"facility","lineage":["https://openalex.org/I24676775"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"Nimit Jain","raw_affiliation_strings":["Indian Institute of Technology Madras, Chennai, India"],"affiliations":[{"raw_affiliation_string":"Indian Institute of Technology Madras, Chennai, India","institution_ids":["https://openalex.org/I24676775"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002577265","display_name":"Nitin Agarwal","orcid":"https://orcid.org/0000-0003-4940-1967"},"institutions":[{"id":"https://openalex.org/I4210109535","display_name":"Texas Instruments (India)","ror":"https://ror.org/01t305n31","country_code":"IN","type":"company","lineage":["https://openalex.org/I4210109535","https://openalex.org/I74760111"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Nitin Agarwal","raw_affiliation_strings":["Texas Instruments (India) Pvt. Ltd., Bangalore, India"],"affiliations":[{"raw_affiliation_string":"Texas Instruments (India) Pvt. Ltd., Bangalore, India","institution_ids":["https://openalex.org/I4210109535"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078810240","display_name":"Rajavelu Thinakaran","orcid":null},"institutions":[{"id":"https://openalex.org/I4210109535","display_name":"Texas Instruments (India)","ror":"https://ror.org/01t305n31","country_code":"IN","type":"company","lineage":["https://openalex.org/I4210109535","https://openalex.org/I74760111"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Rajavelu Thinakaran","raw_affiliation_strings":["Texas Instruments (India) Pvt. Ltd., Bangalore, India"],"affiliations":[{"raw_affiliation_string":"Texas Instruments (India) Pvt. Ltd., Bangalore, India","institution_ids":["https://openalex.org/I4210109535"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5028519358","display_name":"Rubin Parekhji","orcid":"https://orcid.org/0009-0000-6625-2786"},"institutions":[{"id":"https://openalex.org/I4210109535","display_name":"Texas Instruments (India)","ror":"https://ror.org/01t305n31","country_code":"IN","type":"company","lineage":["https://openalex.org/I4210109535","https://openalex.org/I74760111"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Rubin Parekhji","raw_affiliation_strings":["Texas Instruments (India) Pvt. Ltd., Bangalore, India"],"affiliations":[{"raw_affiliation_string":"Texas Instruments (India) Pvt. Ltd., Bangalore, India","institution_ids":["https://openalex.org/I4210109535"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5111449269"],"corresponding_institution_ids":["https://openalex.org/I24676775"],"apc_list":null,"apc_paid":null,"fwci":0.4506,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.64305274,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"8"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/histogram","display_name":"Histogram","score":0.8044040203094482},{"id":"https://openalex.org/keywords/linearity","display_name":"Linearity","score":0.7793339490890503},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6412580609321594},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.45596522092819214},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.40595483779907227},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.2830345630645752},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.18039962649345398},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.15965256094932556}],"concepts":[{"id":"https://openalex.org/C53533937","wikidata":"https://www.wikidata.org/wiki/Q185020","display_name":"Histogram","level":3,"score":0.8044040203094482},{"id":"https://openalex.org/C77170095","wikidata":"https://www.wikidata.org/wiki/Q1753188","display_name":"Linearity","level":2,"score":0.7793339490890503},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6412580609321594},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.45596522092819214},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.40595483779907227},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.2830345630645752},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.18039962649345398},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15965256094932556},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2017.8242030","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2017.8242030","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2017 IEEE International Test Conference (ITC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320311090","display_name":"Iowa State University","ror":"https://ror.org/04rswrd78"},{"id":"https://openalex.org/F4320322211","display_name":"Indian Institute of Technology Madras","ror":"https://ror.org/03v0r5n49"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W291003596","https://openalex.org/W1529971285","https://openalex.org/W1556870831","https://openalex.org/W2006786321","https://openalex.org/W2053451635","https://openalex.org/W2068822021","https://openalex.org/W2084128131","https://openalex.org/W2111032961","https://openalex.org/W2123582706","https://openalex.org/W2131477866","https://openalex.org/W2161325091","https://openalex.org/W2161944474","https://openalex.org/W2402294174","https://openalex.org/W3024999395"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2051487156","https://openalex.org/W2023858428","https://openalex.org/W2073681303","https://openalex.org/W2390279801","https://openalex.org/W2126963364","https://openalex.org/W2358668433","https://openalex.org/W2538259895","https://openalex.org/W2051287254","https://openalex.org/W2317200988"],"abstract_inverted_index":{"High":[0],"resolution":[1],"ADCs":[2,68],"employing":[3],"histogram":[4,103,120,133,161],"test":[5,12,15,31,48,72,134,162],"for":[6,33,50,168],"linearity":[7,34,93,169],"measurement":[8,170],"suffer":[9],"from":[10],"high":[11],"time.":[13],"This":[14,61,78],"time":[16],"is":[17],"an":[18,155],"important":[19],"factor":[20],"in":[21,36,66,114,131],"determining":[22],"the":[23,27,37,51,83,101,115,127,132,159,172],"overall":[24],"cost":[25,47],"of":[26,39,53,92,129,146,149],"ADC.":[28],"While":[29],"alternate":[30],"methods":[32],"checks":[35],"presence":[38],"static":[40],"errors":[41,55,65],"have":[42],"been":[43,57],"proposed,":[44],"no":[45],"low":[46],"method":[49,73,174],"detection":[52],"dynamic":[54,64,139],"has":[56],"reported":[58,85],"so":[59],"far.":[60],"paper":[62],"analyzes":[63],"SAR":[67],"and":[69,135,171],"proposes":[70],"a":[71,143,150],"to":[74,125],"detect":[75,138],"these":[76],"errors.":[77,140],"algorithm,":[79],"when":[80],"combined":[81],"with":[82,163,175],"previously":[84],"uSMILE":[86],"(ultra":[87],"fast":[88],"segmented":[89],"model":[90],"identification":[91],"errors),":[94],"gives":[95],"better":[96],"noise":[97,130],"averaging":[98],"capability":[99],"than":[100],"conventional":[102],"test.":[104],"By":[105],"applying":[106],"constrained":[107],"polynomial":[108],"fit":[109],"technique":[110],"over":[111],"strategic":[112],"points":[113],"reduced":[116],"hits":[117,165,178],"per":[118,166,179],"code":[119,167],"data,":[121],"we":[122],"are":[123],"able":[124],"suppress":[126],"effect":[128],"thus,":[136],"accurately":[137],"Results":[141],"on":[142],"sample":[144],"set":[145],"50":[147],"devices":[148],"12":[151],"bit":[152],"ADC":[153],"indicate":[154],"excellent":[156],"match":[157],"between":[158],"sine":[160],"240":[164],"proposed":[173],"just":[176],"4":[177],"code.":[180]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2018,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}