{"id":"https://openalex.org/W2569048993","doi":"https://doi.org/10.1109/test.2016.7805874","title":"Memory repair for high fault rates","display_name":"Memory repair for high fault rates","publication_year":2016,"publication_date":"2016-11-01","ids":{"openalex":"https://openalex.org/W2569048993","doi":"https://doi.org/10.1109/test.2016.7805874","mag":"2569048993"},"language":"en","primary_location":{"id":"doi:10.1109/test.2016.7805874","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2016.7805874","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE International Test Conference (ITC)","raw_type":"proceedings-article"},"type":"preprint","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5003384880","display_name":"Panagiota Papavramidou","orcid":null},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"funder","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I177483745","display_name":"Universit\u00e9 Joseph Fourier","ror":"https://ror.org/02aj0kh94","country_code":"FR","type":"education","lineage":["https://openalex.org/I177483745"]},{"id":"https://openalex.org/I106785703","display_name":"Institut polytechnique de Grenoble","ror":"https://ror.org/05sbt2524","country_code":"FR","type":"education","lineage":["https://openalex.org/I106785703","https://openalex.org/I899635006"]},{"id":"https://openalex.org/I899635006","display_name":"Universit\u00e9 Grenoble Alpes","ror":"https://ror.org/02rx3b187","country_code":"FR","type":"education","lineage":["https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"Panagiota Papavramidou","raw_affiliation_strings":["TIMA (CNRS, Grenoble INP, UJF), Grenoble, France"],"affiliations":[{"raw_affiliation_string":"TIMA (CNRS, Grenoble INP, UJF), Grenoble, France","institution_ids":["https://openalex.org/I106785703","https://openalex.org/I177483745","https://openalex.org/I899635006","https://openalex.org/I1294671590"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5003384880"],"corresponding_institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I177483745","https://openalex.org/I106785703","https://openalex.org/I899635006"],"apc_list":null,"apc_paid":null,"fwci":0.31904403,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.6875015,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10054","display_name":"Parallel Computing and Optimization Techniques","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6724033355712891},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.649517834186554},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6140584349632263},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5352379083633423},{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.47505924105644226},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.4713137745857239},{"id":"https://openalex.org/keywords/scaling","display_name":"Scaling","score":0.46487095952033997},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.44574418663978577},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4323529005050659},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20333650708198547}],"concepts":[{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6724033355712891},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.649517834186554},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6140584349632263},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5352379083633423},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.47505924105644226},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.4713137745857239},{"id":"https://openalex.org/C99844830","wikidata":"https://www.wikidata.org/wiki/Q102441924","display_name":"Scaling","level":2,"score":0.46487095952033997},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.44574418663978577},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4323529005050659},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20333650708198547},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2016.7805874","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2016.7805874","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE International Test Conference (ITC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W646173351","https://openalex.org/W1605892042","https://openalex.org/W1667843264","https://openalex.org/W1792362277","https://openalex.org/W1967547903","https://openalex.org/W1973194889","https://openalex.org/W2018755671","https://openalex.org/W2061180973","https://openalex.org/W2112727903","https://openalex.org/W2119239540","https://openalex.org/W2129780639","https://openalex.org/W2134822007","https://openalex.org/W2160093572","https://openalex.org/W2162925991","https://openalex.org/W2163439504","https://openalex.org/W2169087039","https://openalex.org/W2170382128","https://openalex.org/W2171019527","https://openalex.org/W2171372273","https://openalex.org/W2416449194","https://openalex.org/W4229821096","https://openalex.org/W6679523228","https://openalex.org/W6684586602"],"related_works":["https://openalex.org/W2372318178","https://openalex.org/W3209466718","https://openalex.org/W2337334590","https://openalex.org/W2524718329","https://openalex.org/W3216201951","https://openalex.org/W1530507059","https://openalex.org/W2355543518","https://openalex.org/W2267274201","https://openalex.org/W2889865234","https://openalex.org/W3168522962"],"abstract_inverted_index":{"We":[0],"illustrate":[1],"that":[2],"memory":[3,40],"repair":[4,41],"for":[5,42,64],"high":[6,43],"fault":[7,44],"rates":[8],"allows":[9],"improving":[10,18],"yield,":[11],"extending":[12],"circuit":[13],"life,":[14],"reducing":[15],"power,":[16],"and":[17,20],"reliability,":[19],"can":[21],"be":[22],"used":[23],"to":[24],"push":[25],"aggressively":[26],"the":[27,54],"limits":[28],"of":[29,56],"technology":[30],"scaling.":[31],"Then":[32],"we":[33],"present":[34],"several":[35],"new":[36],"concepts":[37],"enabling":[38],"low-cost":[39],"rates,":[45],"which":[46,61],"allow":[47],"realizing":[48],"this":[49],"promise,":[50],"as":[51,53],"well":[52],"resolution":[55],"complex":[57],"theoretical":[58],"problems":[59],"for,":[60],"is":[62],"mandatory":[63],"making":[65],"practical":[66],"these":[67],"concepts.":[68]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}