{"id":"https://openalex.org/W2570637191","doi":"https://doi.org/10.1109/test.2016.7805869","title":"Automated measurement of defect tolerance in mixed-signal ICs","display_name":"Automated measurement of defect tolerance in mixed-signal ICs","publication_year":2016,"publication_date":"2016-11-01","ids":{"openalex":"https://openalex.org/W2570637191","doi":"https://doi.org/10.1109/test.2016.7805869","mag":"2570637191"},"language":"en","primary_location":{"id":"doi:10.1109/test.2016.7805869","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2016.7805869","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE International Test Conference (ITC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5063906167","display_name":"Stephen Sunter","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Stephen Sunter","raw_affiliation_strings":["Mentor Graphics, Ottawa Canada"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Mentor Graphics, Ottawa Canada","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085233052","display_name":"Alessandro Valerio","orcid":null},"institutions":[{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Alessandro Valerio","raw_affiliation_strings":["STMicroelectronics, Milan, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"STMicroelectronics, Milan, Italy","institution_ids":["https://openalex.org/I4210154781"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5045880270","display_name":"Riccardo Miglierina","orcid":null},"institutions":[{"id":"https://openalex.org/I4210154781","display_name":"STMicroelectronics (Italy)","ror":"https://ror.org/053bqv655","country_code":"IT","type":"company","lineage":["https://openalex.org/I131827901","https://openalex.org/I4210154781"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Riccardo Miglierina","raw_affiliation_strings":["STMicroelectronics, Milan, Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"STMicroelectronics, Milan, Italy","institution_ids":["https://openalex.org/I4210154781"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.3205,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.61646952,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"8"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/mixed-signal-integrated-circuit","display_name":"Mixed-signal integrated circuit","score":0.8600190877914429},{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.7592353224754333},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.5440546274185181},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5378085970878601},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.5045109987258911},{"id":"https://openalex.org/keywords/digital-electronics","display_name":"Digital electronics","score":0.4877391755580902},{"id":"https://openalex.org/keywords/metric","display_name":"Metric (unit)","score":0.47352004051208496},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4679272174835205},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.45242607593536377},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.4489811360836029},{"id":"https://openalex.org/keywords/block","display_name":"Block (permutation group theory)","score":0.4485798478126526},{"id":"https://openalex.org/keywords/circuit-reliability","display_name":"Circuit reliability","score":0.4212599992752075},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.40075281262397766},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3691842555999756},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.29302525520324707},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2764390707015991},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.07850366830825806}],"concepts":[{"id":"https://openalex.org/C62907940","wikidata":"https://www.wikidata.org/wiki/Q1541329","display_name":"Mixed-signal integrated circuit","level":3,"score":0.8600190877914429},{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.7592353224754333},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.5440546274185181},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5378085970878601},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.5045109987258911},{"id":"https://openalex.org/C81843906","wikidata":"https://www.wikidata.org/wiki/Q173156","display_name":"Digital electronics","level":3,"score":0.4877391755580902},{"id":"https://openalex.org/C176217482","wikidata":"https://www.wikidata.org/wiki/Q860554","display_name":"Metric (unit)","level":2,"score":0.47352004051208496},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4679272174835205},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.45242607593536377},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.4489811360836029},{"id":"https://openalex.org/C2777210771","wikidata":"https://www.wikidata.org/wiki/Q4927124","display_name":"Block (permutation group theory)","level":2,"score":0.4485798478126526},{"id":"https://openalex.org/C2778309119","wikidata":"https://www.wikidata.org/wiki/Q5121614","display_name":"Circuit reliability","level":4,"score":0.4212599992752075},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.40075281262397766},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3691842555999756},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.29302525520324707},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2764390707015991},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.07850366830825806},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2016.7805869","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2016.7805869","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE International Test Conference (ITC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6299999952316284,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W1906885347","https://openalex.org/W1993765721","https://openalex.org/W2028714461","https://openalex.org/W2068778760","https://openalex.org/W2088797164","https://openalex.org/W2109172132","https://openalex.org/W2120185818","https://openalex.org/W2135743241","https://openalex.org/W2162990087"],"related_works":["https://openalex.org/W2031235560","https://openalex.org/W2161335888","https://openalex.org/W2114773158","https://openalex.org/W2548106609","https://openalex.org/W1852277090","https://openalex.org/W1957521530","https://openalex.org/W1917800633","https://openalex.org/W2357284929","https://openalex.org/W2266281062","https://openalex.org/W2115378302"],"abstract_inverted_index":{"Defect":[0],"tolerance":[1,18,34,99],"can":[2,45],"improve":[3],"system":[4],"reliability":[5],"and":[6,8,42,55,78,105],"safety,":[7],"IC":[9,102],"yield.":[10,103],"This":[11],"paper":[12],"describes":[13],"metrics":[14],"for":[15,32,53,86,97],"measuring":[16],"defect":[17,33,51,72,98],"of":[19],"a":[20],"mixed-signal":[21,56,106],"circuit":[22,107],"block":[23],"within":[24],"an":[25,49],"IC.":[26],"A":[27],"general":[28],"metric":[29],"is":[30,83],"defined":[31],"at":[35],"the":[36,70],"transistor-level,":[37],"consistent":[38],"with":[39],"ISO":[40],"26262,":[41],"how":[43],"it":[44],"be":[46,95],"measured":[47],"by":[48],"analog":[50,71],"simulator,":[52],"digital":[54],"circuits,":[57],"including":[58],"those":[59],"that":[60,100],"have":[61],"redundancy,":[62],"error":[63],"detection,":[64],"and/or":[65],"safe":[66],"states.":[67],"In":[68],"effect,":[69],"simulator":[73],"automatically":[74],"implements":[75],"failure":[76],"modes":[77],"effects":[79],"analysis":[80],"(FMEA).":[81],"It":[82],"especially":[84],"useful":[85,96],"safety-oriented":[87],"applications,":[88],"like":[89],"automotive":[90],"ICs,":[91],"but":[92],"could":[93],"also":[94],"improves":[101],"Digital":[104],"examples":[108],"illustrate":[109],"usage.":[110]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2018,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}