{"id":"https://openalex.org/W2571247453","doi":"https://doi.org/10.1109/test.2016.7805854","title":"Recycled FPGA detection using exhaustive LUT path delay characterization","display_name":"Recycled FPGA detection using exhaustive LUT path delay characterization","publication_year":2016,"publication_date":"2016-11-01","ids":{"openalex":"https://openalex.org/W2571247453","doi":"https://doi.org/10.1109/test.2016.7805854","mag":"2571247453"},"language":"en","primary_location":{"id":"doi:10.1109/test.2016.7805854","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2016.7805854","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE International Test Conference (ITC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102009667","display_name":"Md Mahbub Alam","orcid":"https://orcid.org/0000-0002-9675-2789"},"institutions":[{"id":"https://openalex.org/I33213144","display_name":"University of Florida","ror":"https://ror.org/02y3ad647","country_code":"US","type":"education","lineage":["https://openalex.org/I33213144"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Md Mahbub Alam","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Florida, Gainesville, Florida"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Florida, Gainesville, Florida","institution_ids":["https://openalex.org/I33213144"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073054890","display_name":"Mark Tehranipoor","orcid":"https://orcid.org/0000-0003-4699-3231"},"institutions":[{"id":"https://openalex.org/I33213144","display_name":"University of Florida","ror":"https://ror.org/02y3ad647","country_code":"US","type":"education","lineage":["https://openalex.org/I33213144"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mark Tehranipoor","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Florida, Gainesville, Florida"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Florida, Gainesville, Florida","institution_ids":["https://openalex.org/I33213144"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5009243659","display_name":"Domenic Forte","orcid":"https://orcid.org/0000-0002-2794-7320"},"institutions":[{"id":"https://openalex.org/I33213144","display_name":"University of Florida","ror":"https://ror.org/02y3ad647","country_code":"US","type":"education","lineage":["https://openalex.org/I33213144"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Domenic Forte","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Florida, Gainesville, Florida"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Florida, Gainesville, Florida","institution_ids":["https://openalex.org/I33213144"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":3.2046,"has_fulltext":false,"cited_by_count":29,"citation_normalized_percentile":{"value":0.9211101,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":91,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"10"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.8225975036621094},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.70301753282547},{"id":"https://openalex.org/keywords/counterfeit","display_name":"Counterfeit","score":0.5866674184799194},{"id":"https://openalex.org/keywords/lookup-table","display_name":"Lookup table","score":0.538995087146759},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5200561881065369},{"id":"https://openalex.org/keywords/ring-oscillator","display_name":"Ring oscillator","score":0.489148885011673},{"id":"https://openalex.org/keywords/cluster-analysis","display_name":"Cluster analysis","score":0.4838944375514984},{"id":"https://openalex.org/keywords/exploit","display_name":"Exploit","score":0.4643922448158264},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.45908892154693604},{"id":"https://openalex.org/keywords/visibility","display_name":"Visibility","score":0.4399750232696533},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.39872604608535767},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.3267739415168762},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.1823868453502655},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17385262250900269},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.14158183336257935},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.12857064604759216},{"id":"https://openalex.org/keywords/computer-security","display_name":"Computer security","score":0.08832907676696777}],"concepts":[{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.8225975036621094},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.70301753282547},{"id":"https://openalex.org/C2779356469","wikidata":"https://www.wikidata.org/wiki/Q502918","display_name":"Counterfeit","level":2,"score":0.5866674184799194},{"id":"https://openalex.org/C134835016","wikidata":"https://www.wikidata.org/wiki/Q690265","display_name":"Lookup table","level":2,"score":0.538995087146759},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5200561881065369},{"id":"https://openalex.org/C104111718","wikidata":"https://www.wikidata.org/wiki/Q2153973","display_name":"Ring oscillator","level":3,"score":0.489148885011673},{"id":"https://openalex.org/C73555534","wikidata":"https://www.wikidata.org/wiki/Q622825","display_name":"Cluster analysis","level":2,"score":0.4838944375514984},{"id":"https://openalex.org/C165696696","wikidata":"https://www.wikidata.org/wiki/Q11287","display_name":"Exploit","level":2,"score":0.4643922448158264},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.45908892154693604},{"id":"https://openalex.org/C123403432","wikidata":"https://www.wikidata.org/wiki/Q654068","display_name":"Visibility","level":2,"score":0.4399750232696533},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.39872604608535767},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.3267739415168762},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.1823868453502655},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17385262250900269},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.14158183336257935},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.12857064604759216},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.08832907676696777},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C17744445","wikidata":"https://www.wikidata.org/wiki/Q36442","display_name":"Political science","level":0,"score":0.0},{"id":"https://openalex.org/C199539241","wikidata":"https://www.wikidata.org/wiki/Q7748","display_name":"Law","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2016.7805854","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2016.7805854","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE International Test Conference (ITC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure","score":0.5199999809265137}],"awards":[],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":32,"referenced_works":["https://openalex.org/W1483713657","https://openalex.org/W1592930191","https://openalex.org/W1987971958","https://openalex.org/W1992413325","https://openalex.org/W1993023092","https://openalex.org/W2005671831","https://openalex.org/W2007280892","https://openalex.org/W2037697582","https://openalex.org/W2040298438","https://openalex.org/W2043457853","https://openalex.org/W2070072592","https://openalex.org/W2073459066","https://openalex.org/W2096089482","https://openalex.org/W2097579272","https://openalex.org/W2100294832","https://openalex.org/W2105497548","https://openalex.org/W2106156825","https://openalex.org/W2109943925","https://openalex.org/W2116750875","https://openalex.org/W2117525326","https://openalex.org/W2127218421","https://openalex.org/W2141682861","https://openalex.org/W2150593711","https://openalex.org/W2158902938","https://openalex.org/W2167583372","https://openalex.org/W2170058139","https://openalex.org/W2171768221","https://openalex.org/W2300806133","https://openalex.org/W2517606133","https://openalex.org/W3129931346","https://openalex.org/W6628951430","https://openalex.org/W6678914141"],"related_works":["https://openalex.org/W3191226418","https://openalex.org/W2357749344","https://openalex.org/W2155289750","https://openalex.org/W3195700791","https://openalex.org/W2024574431","https://openalex.org/W2117300767","https://openalex.org/W2374017528","https://openalex.org/W4285503609","https://openalex.org/W2126248441","https://openalex.org/W2071074983"],"abstract_inverted_index":{"Field":[0],"programmable":[1],"gate":[2],"arrays":[3],"(FPGAs)":[4],"have":[5,127],"been":[6],"extensively":[7],"used":[8,110],"because":[9,64],"of":[10,23,42,61,71,141,191],"their":[11],"lower":[12],"non-recurring":[13],"engineering":[14],"and":[15,20,27,58,69,75,86,132,143,164,185],"design":[16,107],"costs,":[17],"instant":[18],"availability":[19],"reduced":[21],"visibility":[22],"failure,":[24],"high":[25,189],"performance":[26],"power":[28],"benefits.":[29],"Reports":[30],"indicate":[31],"that":[32,89],"counterfeit":[33],"FPGAs":[34],"are":[35,44],"infiltrating":[36],"the":[37,56,62,67,72,114,194],"IC":[38],"supply":[39],"chain,":[40],"most":[41],"which":[43,160],"recycled":[45,122,179],"type":[46],"(previously":[47],"used).":[48],"Counterfeit":[49],"components":[50,180],"pose":[51],"a":[52,103,145],"significant":[53],"threat":[54],"to":[55,111,126,177],"government":[57],"industrial":[59],"sectors":[60],"economy":[63],"they":[65],"undermine":[66],"security":[68],"reliability":[70],"critical":[73],"systems":[74],"networks.":[76],"Recycled":[77],"FPGA":[78,123],"detection":[79],"procedures":[80],"include":[81],"parametric":[82],"test,":[83,85],"functional":[84],"burn-in":[87],"test":[88],"requires":[90],"golden":[91,182],"data":[92],"and/or":[93],"parts":[94],"specifications":[95],"from":[96,157],"original":[97],"component":[98],"manufacturers.":[99],"In":[100],"this":[101],"work,":[102],"sophisticated":[104],"ring":[105],"oscillator":[106],"method":[108,169],"is":[109,124,152,174],"exploit":[112],"all":[113,139],"possible":[115],"paths":[116,140],"in":[117],"look-up":[118],"tables":[119],"(LUTs).":[120],"A":[121,148],"likely":[125],"fully":[128],"used,":[129,131],"partially":[130],"unused":[133,158,163],"LUTs.":[134],"The":[135],"proposed":[136,176,195],"mapping":[137],"targets":[138],"LUTs":[142],"forms":[144],"frequency":[146,155],"array.":[147],"support":[149],"vector":[150],"machine":[151],"trained":[153],"with":[154],"array":[156],"FPGAs,":[159],"differentiates":[161],"between":[162],"aged":[165],"FPGAs.":[166],"An":[167],"unsupervised":[168],"based":[170],"on":[171],"k-means":[172],"clustering":[173],"also":[175],"classify":[178],"without":[181],"information.":[183],"Simulation":[184],"silicon":[186],"results":[187],"demonstrate":[188],"rates":[190],"success":[192],"using":[193],"methods.":[196]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":3},{"year":2023,"cited_by_count":4},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":4},{"year":2020,"cited_by_count":5},{"year":2019,"cited_by_count":4},{"year":2018,"cited_by_count":4},{"year":2017,"cited_by_count":2}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}