{"id":"https://openalex.org/W4230656352","doi":"https://doi.org/10.1109/test.2016.7805843","title":"Low cost ultra-pure sine wave generation with self calibration","display_name":"Low cost ultra-pure sine wave generation with self calibration","publication_year":2016,"publication_date":"2016-11-01","ids":{"openalex":"https://openalex.org/W4230656352","doi":"https://doi.org/10.1109/test.2016.7805843"},"language":"en","primary_location":{"id":"doi:10.1109/test.2016.7805843","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2016.7805843","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE International Test Conference (ITC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5016130371","display_name":"Yuming Zhuang","orcid":"https://orcid.org/0000-0001-7744-5268"},"institutions":[{"id":"https://openalex.org/I173911158","display_name":"Iowa State University","ror":"https://ror.org/04rswrd78","country_code":"US","type":"education","lineage":["https://openalex.org/I173911158"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yuming Zhuang","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Iowa State University, Ames, IA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Iowa State University, Ames, IA, USA","institution_ids":["https://openalex.org/I173911158"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072122310","display_name":"Akhilesh Kesavan Unnithan","orcid":null},"institutions":[{"id":"https://openalex.org/I4210109535","display_name":"Texas Instruments (India)","ror":"https://ror.org/01t305n31","country_code":"IN","type":"company","lineage":["https://openalex.org/I4210109535","https://openalex.org/I74760111"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Akhilesh Kesavan Unnithan","raw_affiliation_strings":["Texas Instruments India Pvt Ltd"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Texas Instruments India Pvt Ltd","institution_ids":["https://openalex.org/I4210109535"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5029220013","display_name":"Arun Joseph","orcid":"https://orcid.org/0000-0003-1662-2413"},"institutions":[{"id":"https://openalex.org/I4210109535","display_name":"Texas Instruments (India)","ror":"https://ror.org/01t305n31","country_code":"IN","type":"company","lineage":["https://openalex.org/I4210109535","https://openalex.org/I74760111"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Arun Joseph","raw_affiliation_strings":["Texas Instruments India Pvt Ltd"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Texas Instruments India Pvt Ltd","institution_ids":["https://openalex.org/I4210109535"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5086564481","display_name":"Siva Sudani","orcid":null},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Siva Sudani","raw_affiliation_strings":["Texas Instruments Inc., USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Texas Instruments Inc., USA","institution_ids":["https://openalex.org/I74760111"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041346375","display_name":"Benjamin Magstadt","orcid":"https://orcid.org/0000-0002-5841-8712"},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Benjamin Magstadt","raw_affiliation_strings":["Texas Instruments Inc., USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Texas Instruments Inc., USA","institution_ids":["https://openalex.org/I74760111"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101873076","display_name":"Degang Chen","orcid":"https://orcid.org/0000-0002-5938-6329"},"institutions":[{"id":"https://openalex.org/I173911158","display_name":"Iowa State University","ror":"https://ror.org/04rswrd78","country_code":"US","type":"education","lineage":["https://openalex.org/I173911158"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Degang Chen","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Iowa State University, Ames, IA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Iowa State University, Ames, IA, USA","institution_ids":["https://openalex.org/I173911158"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.3021,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.83471452,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"9"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9957000017166138,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/sine-wave","display_name":"Sine wave","score":0.9027911424636841},{"id":"https://openalex.org/keywords/sine","display_name":"Sine","score":0.7301493883132935},{"id":"https://openalex.org/keywords/total-harmonic-distortion","display_name":"Total harmonic distortion","score":0.7162397503852844},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.6348710060119629},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5514942407608032},{"id":"https://openalex.org/keywords/measure","display_name":"Measure (data warehouse)","score":0.549062192440033},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.47274717688560486},{"id":"https://openalex.org/keywords/distortion","display_name":"Distortion (music)","score":0.4318027198314667},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.20561352372169495},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20012056827545166},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.1689884066581726},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.10778489708900452},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.08576050400733948},{"id":"https://openalex.org/keywords/bandwidth","display_name":"Bandwidth (computing)","score":0.08489808440208435}],"concepts":[{"id":"https://openalex.org/C66907618","wikidata":"https://www.wikidata.org/wiki/Q207527","display_name":"Sine wave","level":3,"score":0.9027911424636841},{"id":"https://openalex.org/C186661526","wikidata":"https://www.wikidata.org/wiki/Q13647261","display_name":"Sine","level":2,"score":0.7301493883132935},{"id":"https://openalex.org/C42156128","wikidata":"https://www.wikidata.org/wiki/Q162641","display_name":"Total harmonic distortion","level":3,"score":0.7162397503852844},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.6348710060119629},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5514942407608032},{"id":"https://openalex.org/C2780009758","wikidata":"https://www.wikidata.org/wiki/Q6804172","display_name":"Measure (data warehouse)","level":2,"score":0.549062192440033},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.47274717688560486},{"id":"https://openalex.org/C126780896","wikidata":"https://www.wikidata.org/wiki/Q899871","display_name":"Distortion (music)","level":4,"score":0.4318027198314667},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.20561352372169495},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20012056827545166},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.1689884066581726},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.10778489708900452},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.08576050400733948},{"id":"https://openalex.org/C2776257435","wikidata":"https://www.wikidata.org/wiki/Q1576430","display_name":"Bandwidth (computing)","level":2,"score":0.08489808440208435},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2016.7805843","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2016.7805843","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE International Test Conference (ITC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320306087","display_name":"Semiconductor Research Corporation","ror":"https://ror.org/047z4n946"},{"id":"https://openalex.org/F4320307801","display_name":"Texas Instruments","ror":"https://ror.org/03vsmv677"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W123386764","https://openalex.org/W1965831799","https://openalex.org/W1977179387","https://openalex.org/W2053903311","https://openalex.org/W2069168463","https://openalex.org/W2074971209","https://openalex.org/W2079866614","https://openalex.org/W2084128131","https://openalex.org/W2147084331","https://openalex.org/W2403592864","https://openalex.org/W2576558450","https://openalex.org/W2970906998","https://openalex.org/W6620044767","https://openalex.org/W6671256958"],"related_works":["https://openalex.org/W2886467464","https://openalex.org/W2379854577","https://openalex.org/W2544509054","https://openalex.org/W1977430766","https://openalex.org/W3174698889","https://openalex.org/W2362063739","https://openalex.org/W2351293857","https://openalex.org/W2424761688","https://openalex.org/W3044335280","https://openalex.org/W2487672730"],"abstract_inverted_index":{"As":[0],"data":[1],"acquisition":[2],"systems'":[3],"performance":[4],"continues":[5],"to":[6,18,90,102],"increase,":[7],"so":[8],"does":[9],"the":[10,35,75,86,92,96,108,115,149],"need":[11],"for":[12,44],"a":[13,41,120],"test":[14,22,135],"and":[15,128,140],"characterization":[16],"solution":[17],"have":[19],"an":[20,129,157],"input":[21],"signal":[23],"with":[24,66,82,131,159],"purity":[25,84,151],"that":[26,49,68,144,152],"exceeds":[27],"what":[28],"is":[29,60,88,100,153],"currently":[30],"available":[31,64,80],"in":[32,53,107],"state":[33],"of":[34,155],"art":[36],"instruments.":[37],"This":[38],"paper":[39],"presents":[40],"new":[42],"method":[43,117],"generating":[45,119],"ultra-pure":[46,122],"sine":[47,58,110,123,146],"wave":[48,59,124,147],"can":[50],"be":[51,70],"used":[52,89,101],"such":[54],"applications.":[55],"The":[56],"pure":[57],"generated":[61,94,109,145],"by":[62,95,118],"readily":[63],"DACs":[65,127],"distortions":[67,93,105],"could":[69],"thousands":[71],"time":[72],"worse":[73],"than":[74],"required":[76],"system":[77],"purity.":[78],"Readily":[79],"ADC":[81,130,158],"similar":[83],"as":[85],"DAC":[87],"measure":[91],"DAC.":[97],"Innovative":[98],"algorithm":[99],"iteratively":[103],"remove":[104],"present":[106],"wave.":[111],"Simulation":[112],"results":[113,142],"verified":[114],"proposed":[116],"-140dB":[121],"using":[125],"two":[126],"-85dB":[132],"THD.":[133],"A":[134],"board":[136],"has":[137,148],"been":[138],"designed":[139],"measurement":[141],"demonstrated":[143],"high":[150],"capable":[154],"testing":[156],"-120dB":[160],"THD":[161],"accurately.":[162]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":1},{"year":2018,"cited_by_count":4},{"year":2017,"cited_by_count":3}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}