{"id":"https://openalex.org/W2567975304","doi":"https://doi.org/10.1109/test.2016.7805830","title":"Effective DC fault models and testing approach for open defects in analog circuits","display_name":"Effective DC fault models and testing approach for open defects in analog circuits","publication_year":2016,"publication_date":"2016-11-01","ids":{"openalex":"https://openalex.org/W2567975304","doi":"https://doi.org/10.1109/test.2016.7805830","mag":"2567975304"},"language":"en","primary_location":{"id":"doi:10.1109/test.2016.7805830","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2016.7805830","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE International Test Conference (ITC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://lirias.kuleuven.be/bitstream/123456789/617863/2/07805830%281%29.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5005068808","display_name":"Baris Esen","orcid":"https://orcid.org/0000-0002-5540-4374"},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":true,"raw_author_name":"Baris Esen","raw_affiliation_strings":["Department of Electrical Engineering (ESAT), KU Leuven Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering (ESAT), KU Leuven Leuven, Belgium","institution_ids":["https://openalex.org/I99464096"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017481892","display_name":"Anthony Coyette","orcid":"https://orcid.org/0000-0002-3221-4578"},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Anthony Coyette","raw_affiliation_strings":["Department of Electrical Engineering (ESAT), KU Leuven Leuven, Belgium"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering (ESAT), KU Leuven Leuven, Belgium","institution_ids":["https://openalex.org/I99464096"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5029270525","display_name":"Georges Gielen","orcid":"https://orcid.org/0000-0002-4061-9428"},"institutions":[{"id":"https://openalex.org/I4210110772","display_name":"ON Semiconductor (Belgium)","ror":"https://ror.org/0212gej90","country_code":"BE","type":"company","lineage":["https://openalex.org/I100625452","https://openalex.org/I4210110772"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Georges Gielen","raw_affiliation_strings":["APG Automotive Mixed Signal, ON Semiconductor Belgium, Oudenaarde"],"affiliations":[{"raw_affiliation_string":"APG Automotive Mixed Signal, ON Semiconductor Belgium, Oudenaarde","institution_ids":["https://openalex.org/I4210110772"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028691975","display_name":"Wim Dobbelaere","orcid":null},"institutions":[{"id":"https://openalex.org/I4210110772","display_name":"ON Semiconductor (Belgium)","ror":"https://ror.org/0212gej90","country_code":"BE","type":"company","lineage":["https://openalex.org/I100625452","https://openalex.org/I4210110772"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Wim Dobbelaere","raw_affiliation_strings":["APG Automotive Mixed Signal, ON Semiconductor Belgium, Oudenaarde"],"affiliations":[{"raw_affiliation_string":"APG Automotive Mixed Signal, ON Semiconductor Belgium, Oudenaarde","institution_ids":["https://openalex.org/I4210110772"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5062808173","display_name":"Ronny Vanhooren","orcid":null},"institutions":[{"id":"https://openalex.org/I4210110772","display_name":"ON Semiconductor (Belgium)","ror":"https://ror.org/0212gej90","country_code":"BE","type":"company","lineage":["https://openalex.org/I100625452","https://openalex.org/I4210110772"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Ronny Vanhooren","raw_affiliation_strings":["APG Automotive Mixed Signal, ON Semiconductor Belgium, Oudenaarde"],"affiliations":[{"raw_affiliation_string":"APG Automotive Mixed Signal, ON Semiconductor Belgium, Oudenaarde","institution_ids":["https://openalex.org/I4210110772"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5005068808"],"corresponding_institution_ids":["https://openalex.org/I99464096"],"apc_list":null,"apc_paid":null,"fwci":2.2398,"has_fulltext":false,"cited_by_count":23,"citation_normalized_percentile":{"value":0.8803022,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"9"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/analogue-electronics","display_name":"Analogue electronics","score":0.6622591018676758},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6376656293869019},{"id":"https://openalex.org/keywords/stuck-at-fault","display_name":"Stuck-at fault","score":0.575715184211731},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5617349147796631},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5490489602088928},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.5330411791801453},{"id":"https://openalex.org/keywords/fault-model","display_name":"Fault model","score":0.5283437967300415},{"id":"https://openalex.org/keywords/mixed-signal-integrated-circuit","display_name":"Mixed-signal integrated circuit","score":0.5256363153457642},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5172784328460693},{"id":"https://openalex.org/keywords/forcing","display_name":"Forcing (mathematics)","score":0.5048788189888},{"id":"https://openalex.org/keywords/iddq-testing","display_name":"Iddq testing","score":0.5042418241500854},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.48774152994155884},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.4234706163406372},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.42338305711746216},{"id":"https://openalex.org/keywords/automotive-industry","display_name":"Automotive industry","score":0.4112180173397064},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.409803569316864},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.34404775500297546},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.22960606217384338},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.15404000878334045},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.07362747192382812}],"concepts":[{"id":"https://openalex.org/C29074008","wikidata":"https://www.wikidata.org/wiki/Q174925","display_name":"Analogue electronics","level":3,"score":0.6622591018676758},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6376656293869019},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.575715184211731},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5617349147796631},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5490489602088928},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.5330411791801453},{"id":"https://openalex.org/C167391956","wikidata":"https://www.wikidata.org/wiki/Q1401211","display_name":"Fault model","level":3,"score":0.5283437967300415},{"id":"https://openalex.org/C62907940","wikidata":"https://www.wikidata.org/wiki/Q1541329","display_name":"Mixed-signal integrated circuit","level":3,"score":0.5256363153457642},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5172784328460693},{"id":"https://openalex.org/C197115733","wikidata":"https://www.wikidata.org/wiki/Q1003136","display_name":"Forcing (mathematics)","level":2,"score":0.5048788189888},{"id":"https://openalex.org/C206678392","wikidata":"https://www.wikidata.org/wiki/Q5987815","display_name":"Iddq testing","level":3,"score":0.5042418241500854},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.48774152994155884},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.4234706163406372},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.42338305711746216},{"id":"https://openalex.org/C526921623","wikidata":"https://www.wikidata.org/wiki/Q190117","display_name":"Automotive industry","level":2,"score":0.4112180173397064},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.409803569316864},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.34404775500297546},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.22960606217384338},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.15404000878334045},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.07362747192382812},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C49204034","wikidata":"https://www.wikidata.org/wiki/Q52139","display_name":"Climatology","level":1,"score":0.0},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/test.2016.7805830","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2016.7805830","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE International Test Conference (ITC)","raw_type":"proceedings-article"},{"id":"pmh:oai:lirias2repo.kuleuven.be:123456789/617863","is_oa":true,"landing_page_url":"https://lirias.kuleuven.be/bitstream/123456789/617863/2/07805830%281%29.pdf","pdf_url":null,"source":{"id":"https://openalex.org/S4306401954","display_name":"Lirias (KU Leuven)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I99464096","host_organization_name":"KU Leuven","host_organization_lineage":["https://openalex.org/I99464096"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE International Test Conference (ITC), Fort Worth, TX, 15-17 November 2016","raw_type":"info:eu-repo/semantics/publishedVersion"}],"best_oa_location":{"id":"pmh:oai:lirias2repo.kuleuven.be:123456789/617863","is_oa":true,"landing_page_url":"https://lirias.kuleuven.be/bitstream/123456789/617863/2/07805830%281%29.pdf","pdf_url":null,"source":{"id":"https://openalex.org/S4306401954","display_name":"Lirias (KU Leuven)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I99464096","host_organization_name":"KU Leuven","host_organization_lineage":["https://openalex.org/I99464096"],"host_organization_lineage_names":[],"type":"repository"},"license":"other-oa","license_id":"https://openalex.org/licenses/other-oa","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IEEE International Test Conference (ITC), Fort Worth, TX, 15-17 November 2016","raw_type":"info:eu-repo/semantics/publishedVersion"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W92241081","https://openalex.org/W1522904141","https://openalex.org/W1533614470","https://openalex.org/W1686846969","https://openalex.org/W1909547679","https://openalex.org/W1982436879","https://openalex.org/W1993765721","https://openalex.org/W2008534549","https://openalex.org/W2044617956","https://openalex.org/W2068778760","https://openalex.org/W2102995085","https://openalex.org/W2105290633","https://openalex.org/W2110362580","https://openalex.org/W2114803257","https://openalex.org/W2115084866","https://openalex.org/W2117195793","https://openalex.org/W2117648153","https://openalex.org/W2120589080","https://openalex.org/W2121167987","https://openalex.org/W2121331887","https://openalex.org/W2133201500","https://openalex.org/W2151393930","https://openalex.org/W2546239477","https://openalex.org/W4237332068","https://openalex.org/W6631825456"],"related_works":["https://openalex.org/W2183492790","https://openalex.org/W4206788129","https://openalex.org/W2067323993","https://openalex.org/W2149717872","https://openalex.org/W2080010366","https://openalex.org/W2612538664","https://openalex.org/W1578030032","https://openalex.org/W2063270126","https://openalex.org/W2084233556","https://openalex.org/W2149980863"],"abstract_inverted_index":{"The":[0],"detection":[1],"level":[2],"of":[3,15,37,55],"defects":[4,125],"in":[5,26,65,97,126],"today's":[6],"mixed-signal":[7],"ICs":[8,28],"lags":[9],"behind":[10],"the":[11,38,43,53,73,105,110,122,136],"extremely":[12],"high":[13,30],"demand":[14],"industries":[16],"such":[17],"as":[18,34],"automotive.":[19],"This":[20,82],"is":[21,67,129,132],"mainly":[22],"because":[23],"analog":[24,61,127],"blocks":[25],"these":[27],"have":[29,48],"test":[31,95],"escape":[32],"rates":[33],"a":[35,85,116],"result":[36],"typical":[39],"testing":[40,118],"based":[41,133],"on":[42,93,134],"performance":[44],"specifications.":[45],"Defect-oriented":[46],"techniques":[47],"been":[49],"proposed":[50,106],"to":[51,72,78,103,120],"solve":[52],"problem":[54],"this":[56],"poor":[57],"fault":[58,75,89,107],"coverage":[59],"for":[60],"circuits.":[62],"Their":[63],"effectiveness":[64],"practice":[66],"however":[68],"still":[69],"limited":[70],"due":[71],"inadequate":[74],"models":[76],"used":[77,102,112],"represent":[79],"physical":[80],"failures.":[81],"paper":[83],"presents":[84],"new":[86,117],"open-gate":[87],"DC":[88],"model.":[90,114],"Experimental":[91],"results":[92],"fabricated":[94],"circuits":[96,128],"0.35\u03bcm":[98],"BCD":[99],"technology":[100],"are":[101],"validate":[104],"model":[108],"and":[109],"commonly":[111],"high-value-resistance":[113],"Finally,":[115],"approach":[119],"detect":[121],"corresponding":[123],"open":[124],"discussed,":[130],"which":[131],"forcing":[135],"transistors":[137],"outside":[138],"their":[139],"designed":[140],"operation":[141],"region.":[142]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":4},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":2}],"updated_date":"2026-04-19T08:26:33.389920","created_date":"2017-01-13T00:00:00"}