{"id":"https://openalex.org/W2569877732","doi":"https://doi.org/10.1109/test.2016.7805829","title":"Analog fault coverage improvement using final-test dynamic part average testing","display_name":"Analog fault coverage improvement using final-test dynamic part average testing","publication_year":2016,"publication_date":"2016-11-01","ids":{"openalex":"https://openalex.org/W2569877732","doi":"https://doi.org/10.1109/test.2016.7805829","mag":"2569877732"},"language":"en","primary_location":{"id":"doi:10.1109/test.2016.7805829","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2016.7805829","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE International Test Conference (ITC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5028691975","display_name":"Wim Dobbelaere","orcid":null},"institutions":[{"id":"https://openalex.org/I4210110772","display_name":"ON Semiconductor (Belgium)","ror":"https://ror.org/0212gej90","country_code":"BE","type":"company","lineage":["https://openalex.org/I100625452","https://openalex.org/I4210110772"]}],"countries":["BE"],"is_corresponding":true,"raw_author_name":"Wim Dobbelaere","raw_affiliation_strings":["APG Automotive Mixed Signal ON Semiconductor Belgium, Oudenaarde, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"APG Automotive Mixed Signal ON Semiconductor Belgium, Oudenaarde, Belgium","institution_ids":["https://openalex.org/I4210110772"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5062808173","display_name":"Ronny Vanhooren","orcid":null},"institutions":[{"id":"https://openalex.org/I4210110772","display_name":"ON Semiconductor (Belgium)","ror":"https://ror.org/0212gej90","country_code":"BE","type":"company","lineage":["https://openalex.org/I100625452","https://openalex.org/I4210110772"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Ronny Vanhooren","raw_affiliation_strings":["APG Automotive Mixed Signal ON Semiconductor Belgium, Oudenaarde, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"APG Automotive Mixed Signal ON Semiconductor Belgium, Oudenaarde, Belgium","institution_ids":["https://openalex.org/I4210110772"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5062658940","display_name":"Willy De Man","orcid":null},"institutions":[{"id":"https://openalex.org/I4210110772","display_name":"ON Semiconductor (Belgium)","ror":"https://ror.org/0212gej90","country_code":"BE","type":"company","lineage":["https://openalex.org/I100625452","https://openalex.org/I4210110772"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Willy De Man","raw_affiliation_strings":["APG Automotive Mixed Signal ON Semiconductor Belgium, Oudenaarde, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"APG Automotive Mixed Signal ON Semiconductor Belgium, Oudenaarde, Belgium","institution_ids":["https://openalex.org/I4210110772"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112213713","display_name":"Koen Matthijs","orcid":null},"institutions":[{"id":"https://openalex.org/I4210110772","display_name":"ON Semiconductor (Belgium)","ror":"https://ror.org/0212gej90","country_code":"BE","type":"company","lineage":["https://openalex.org/I100625452","https://openalex.org/I4210110772"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Koen Matthijs","raw_affiliation_strings":["APG Automotive Mixed Signal ON Semiconductor Belgium, Oudenaarde, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"APG Automotive Mixed Signal ON Semiconductor Belgium, Oudenaarde, Belgium","institution_ids":["https://openalex.org/I4210110772"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5017481892","display_name":"Anthony Coyette","orcid":"https://orcid.org/0000-0002-3221-4578"},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Anthony Coyette","raw_affiliation_strings":["Dept. Electrical Engineering - MICAS KU Leuven, Leuven, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept. Electrical Engineering - MICAS KU Leuven, Leuven, Belgium","institution_ids":["https://openalex.org/I99464096"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005068808","display_name":"Baris Esen","orcid":"https://orcid.org/0000-0002-5540-4374"},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Baris Esen","raw_affiliation_strings":["Dept. Electrical Engineering - MICAS KU Leuven, Leuven, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept. Electrical Engineering - MICAS KU Leuven, Leuven, Belgium","institution_ids":["https://openalex.org/I99464096"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5029270525","display_name":"Georges Gielen","orcid":"https://orcid.org/0000-0002-4061-9428"},"institutions":[{"id":"https://openalex.org/I99464096","display_name":"KU Leuven","ror":"https://ror.org/05f950310","country_code":"BE","type":"education","lineage":["https://openalex.org/I99464096"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Georges Gielen","raw_affiliation_strings":["Dept. Electrical Engineering - MICAS KU Leuven, Leuven, Belgium"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept. Electrical Engineering - MICAS KU Leuven, Leuven, Belgium","institution_ids":["https://openalex.org/I99464096"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5028691975"],"corresponding_institution_ids":["https://openalex.org/I4210110772"],"apc_list":null,"apc_paid":null,"fwci":2.563,"has_fulltext":false,"cited_by_count":25,"citation_normalized_percentile":{"value":0.89633203,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"9"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9950000047683716,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/automotive-industry","display_name":"Automotive industry","score":0.8428483605384827},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6254389882087708},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5433952808380127},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.522209107875824},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4612210690975189},{"id":"https://openalex.org/keywords/automotive-electronics","display_name":"Automotive electronics","score":0.41059887409210205},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3937278091907501},{"id":"https://openalex.org/keywords/automotive-engineering","display_name":"Automotive engineering","score":0.37832117080688477},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.21830543875694275},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.15966397523880005}],"concepts":[{"id":"https://openalex.org/C526921623","wikidata":"https://www.wikidata.org/wiki/Q190117","display_name":"Automotive industry","level":2,"score":0.8428483605384827},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6254389882087708},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5433952808380127},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.522209107875824},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4612210690975189},{"id":"https://openalex.org/C2778520156","wikidata":"https://www.wikidata.org/wiki/Q449343","display_name":"Automotive electronics","level":3,"score":0.41059887409210205},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3937278091907501},{"id":"https://openalex.org/C171146098","wikidata":"https://www.wikidata.org/wiki/Q124192","display_name":"Automotive engineering","level":1,"score":0.37832117080688477},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.21830543875694275},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.15966397523880005},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2016.7805829","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2016.7805829","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE International Test Conference (ITC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","score":0.41999998688697815,"id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W581425779","https://openalex.org/W1486817281","https://openalex.org/W1542705969","https://openalex.org/W1579373034","https://openalex.org/W1595368737","https://openalex.org/W1595372038","https://openalex.org/W1965515431","https://openalex.org/W1970655797","https://openalex.org/W2034176285","https://openalex.org/W2044500680","https://openalex.org/W2068778760","https://openalex.org/W2099992850","https://openalex.org/W2104047485","https://openalex.org/W2111265284","https://openalex.org/W2131302668","https://openalex.org/W2159449186","https://openalex.org/W4210462867","https://openalex.org/W6616904104","https://openalex.org/W6634368208","https://openalex.org/W6635424516"],"related_works":["https://openalex.org/W2132658806","https://openalex.org/W2758348730","https://openalex.org/W3210666397","https://openalex.org/W2350662357","https://openalex.org/W2160915513","https://openalex.org/W2378051443","https://openalex.org/W3036272329","https://openalex.org/W2769711664","https://openalex.org/W2885986920","https://openalex.org/W2383699822"],"abstract_inverted_index":{"The":[0],"growing":[1],"number":[2],"of":[3,47,66],"chips":[4],"in":[5,17,58],"automotive":[6,35,69],"applications":[7],"has":[8],"created":[9],"an":[10,74,78],"increasing":[11],"urge":[12],"to":[13,29,60,86],"avoid":[14],"electronic":[15],"failures":[16,33],"the":[18,45,54,62],"field.":[19],"Part":[20,49],"Average":[21,50],"Testing":[22,51],"(PAT)":[23],"is":[24,90],"a":[25,67],"generally":[26],"used":[27],"technique":[28],"screen":[30],"out":[31],"early-life":[32],"for":[34],"products.":[36],"In":[37],"this":[38],"paper":[39],"we":[40],"demonstrate":[41],"with":[42,92],"industrial":[43,75],"data":[44],"application":[46],"Dynamic":[48],"(DPAT)":[52],"at":[53],"final":[55],"testing":[56],"stage":[57],"order":[59],"improve":[61],"analog":[63,79],"fault":[64,80],"coverage":[65,81],"mixed-signal":[68],"product.":[70],"Simulation":[71],"results":[72],"on":[73],"circuit":[76],"indicate":[77],"improvement":[82],"from":[83],"31.3":[84],"%":[85],"82.7":[87],"%.":[88],"This":[89],"demonstrated":[91],"experimental":[93],"data.":[94]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":3},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":3},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":7},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":6}],"updated_date":"2026-06-04T09:04:59.091469","created_date":"2025-10-10T00:00:00"}