{"id":"https://openalex.org/W2569718542","doi":"https://doi.org/10.1109/test.2016.7805816","title":"Plenary keynote address Tuesday: The business of test: Test and semiconductor economics","display_name":"Plenary keynote address Tuesday: The business of test: Test and semiconductor economics","publication_year":2016,"publication_date":"2016-11-01","ids":{"openalex":"https://openalex.org/W2569718542","doi":"https://doi.org/10.1109/test.2016.7805816","mag":"2569718542"},"language":"en","primary_location":{"id":"doi:10.1109/test.2016.7805816","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2016.7805816","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE International Test Conference (ITC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5110371381","display_name":"Walden C. Rhines","orcid":null},"institutions":[{"id":"https://openalex.org/I4210099704","display_name":"Mentor","ror":"https://ror.org/016grqh48","country_code":"GB","type":"nonprofit","lineage":["https://openalex.org/I4210099704"]},{"id":"https://openalex.org/I105695857","display_name":"Siemens (Hungary)","ror":"https://ror.org/01rk7mv85","country_code":"HU","type":"company","lineage":["https://openalex.org/I105695857","https://openalex.org/I1325886976"]}],"countries":["GB","HU"],"is_corresponding":true,"raw_author_name":"Walden C. Rhines","raw_affiliation_strings":["Mentor Graphics"],"affiliations":[{"raw_affiliation_string":"Mentor Graphics","institution_ids":["https://openalex.org/I105695857","https://openalex.org/I4210099704"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5110371381"],"corresponding_institution_ids":["https://openalex.org/I105695857","https://openalex.org/I4210099704"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.15995862,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"9","last_page":"9"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.7310000061988831,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.7310000061988831,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.7918537855148315},{"id":"https://openalex.org/keywords/classification-of-discontinuities","display_name":"Classification of discontinuities","score":0.6319445967674255},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4558471739292145},{"id":"https://openalex.org/keywords/cost-reduction","display_name":"Cost reduction","score":0.4409109652042389},{"id":"https://openalex.org/keywords/semiconductor-industry","display_name":"Semiconductor industry","score":0.4161815345287323},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3648679852485657},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.31601792573928833},{"id":"https://openalex.org/keywords/economics","display_name":"Economics","score":0.2675324082374573},{"id":"https://openalex.org/keywords/management","display_name":"Management","score":0.24367356300354004},{"id":"https://openalex.org/keywords/manufacturing-engineering","display_name":"Manufacturing engineering","score":0.16896295547485352},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.12882688641548157},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.0859137773513794}],"concepts":[{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.7918537855148315},{"id":"https://openalex.org/C15627037","wikidata":"https://www.wikidata.org/wiki/Q541961","display_name":"Classification of discontinuities","level":2,"score":0.6319445967674255},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4558471739292145},{"id":"https://openalex.org/C2778820799","wikidata":"https://www.wikidata.org/wiki/Q3454688","display_name":"Cost reduction","level":2,"score":0.4409109652042389},{"id":"https://openalex.org/C2987888538","wikidata":"https://www.wikidata.org/wiki/Q2986369","display_name":"Semiconductor industry","level":2,"score":0.4161815345287323},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3648679852485657},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.31601792573928833},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.2675324082374573},{"id":"https://openalex.org/C187736073","wikidata":"https://www.wikidata.org/wiki/Q2920921","display_name":"Management","level":1,"score":0.24367356300354004},{"id":"https://openalex.org/C117671659","wikidata":"https://www.wikidata.org/wiki/Q11049265","display_name":"Manufacturing engineering","level":1,"score":0.16896295547485352},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.12882688641548157},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0859137773513794},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2016.7805816","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2016.7805816","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IEEE International Test Conference (ITC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W1972096828","https://openalex.org/W2529137940","https://openalex.org/W4302048708","https://openalex.org/W2359913921","https://openalex.org/W1595194509","https://openalex.org/W4239740410","https://openalex.org/W1996195943","https://openalex.org/W4205298958","https://openalex.org/W2074668432","https://openalex.org/W2536279223"],"abstract_inverted_index":{"Summary":[0],"form":[1],"only":[2],"given:":[3],"Test":[4],"methodology":[5],"changes":[6],"have":[7],"historically":[8],"been":[9],"driven":[10],"largely":[11],"by":[12],"necessity-critical":[13],"needs":[14],"for":[15,37],"cost":[16],"reduction":[17],"or":[18],"quality":[19],"improvements.":[20],"This":[21],"history":[22],"makes":[23],"possible":[24],"the":[25,34,43,53,63],"prediction":[26],"of":[27,45,47],"future":[28],"changes.":[29],"Dr.":[30],"Rhines":[31],"will":[32,57],"review":[33],"driving":[35],"forces":[36,55],"prior":[38],"discontinuities":[39],"in":[40,62],"design-for-test,":[41],"analyze":[42],"rates":[44],"adoption":[46],"new":[48],"test":[49,60],"methodologies,":[50],"and":[51],"discuss":[52],"likely":[54],"that":[56],"change":[58],"our":[59],"priorities":[61],"future.":[64]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}