{"id":"https://openalex.org/W2185129993","doi":"https://doi.org/10.1109/test.2015.7342410","title":"Stepped parity: A low-cost multiple bit upset detection technique","display_name":"Stepped parity: A low-cost multiple bit upset detection technique","publication_year":2015,"publication_date":"2015-10-01","ids":{"openalex":"https://openalex.org/W2185129993","doi":"https://doi.org/10.1109/test.2015.7342410","mag":"2185129993"},"language":"en","primary_location":{"id":"doi:10.1109/test.2015.7342410","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2015.7342410","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Test Conference (ITC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5110517906","display_name":"Mojtaba Ebrahimi","orcid":null},"institutions":[{"id":"https://openalex.org/I102335020","display_name":"Karlsruhe Institute of Technology","ror":"https://ror.org/04t3en479","country_code":"DE","type":"education","lineage":["https://openalex.org/I102335020","https://openalex.org/I1305996414"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Mojtaba Ebrahimi","raw_affiliation_strings":["Karlsruhe Institute of Technology, Karlsruhe, Germany"],"affiliations":[{"raw_affiliation_string":"Karlsruhe Institute of Technology, Karlsruhe, Germany","institution_ids":["https://openalex.org/I102335020"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5064445713","display_name":"Mehdi B. Tahoori","orcid":"https://orcid.org/0000-0002-8829-5610"},"institutions":[{"id":"https://openalex.org/I102335020","display_name":"Karlsruhe Institute of Technology","ror":"https://ror.org/04t3en479","country_code":"DE","type":"education","lineage":["https://openalex.org/I102335020","https://openalex.org/I1305996414"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Mehdi B. Tahoori","raw_affiliation_strings":["Karlsruhe Institute of Technology, Karlsruhe, Germany"],"affiliations":[{"raw_affiliation_string":"Karlsruhe Institute of Technology, Karlsruhe, Germany","institution_ids":["https://openalex.org/I102335020"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5110517906"],"corresponding_institution_ids":["https://openalex.org/I102335020"],"apc_list":null,"apc_paid":null,"fwci":0.5919,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.7282228,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"8"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/parity-bit","display_name":"Parity bit","score":0.6275640726089478},{"id":"https://openalex.org/keywords/upset","display_name":"Upset","score":0.5850346684455872},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5841064453125},{"id":"https://openalex.org/keywords/error-detection-and-correction","display_name":"Error detection and correction","score":0.5180073380470276},{"id":"https://openalex.org/keywords/parity","display_name":"Parity (physics)","score":0.49436259269714355},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.47578370571136475},{"id":"https://openalex.org/keywords/bit-error-rate","display_name":"Bit error rate","score":0.4569987654685974},{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.42176929116249084},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.38902777433395386},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3556402623653412},{"id":"https://openalex.org/keywords/decoding-methods","display_name":"Decoding methods","score":0.26270735263824463},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.24483755230903625},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.17251056432724},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17113235592842102},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1415823996067047},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.07948082685470581}],"concepts":[{"id":"https://openalex.org/C131521367","wikidata":"https://www.wikidata.org/wiki/Q625502","display_name":"Parity bit","level":2,"score":0.6275640726089478},{"id":"https://openalex.org/C2778002589","wikidata":"https://www.wikidata.org/wiki/Q2406791","display_name":"Upset","level":2,"score":0.5850346684455872},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5841064453125},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.5180073380470276},{"id":"https://openalex.org/C2777151079","wikidata":"https://www.wikidata.org/wiki/Q141160","display_name":"Parity (physics)","level":2,"score":0.49436259269714355},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.47578370571136475},{"id":"https://openalex.org/C56296756","wikidata":"https://www.wikidata.org/wiki/Q840922","display_name":"Bit error rate","level":3,"score":0.4569987654685974},{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.42176929116249084},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.38902777433395386},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3556402623653412},{"id":"https://openalex.org/C57273362","wikidata":"https://www.wikidata.org/wiki/Q576722","display_name":"Decoding methods","level":2,"score":0.26270735263824463},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.24483755230903625},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.17251056432724},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17113235592842102},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1415823996067047},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.07948082685470581},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C109214941","wikidata":"https://www.wikidata.org/wiki/Q18334","display_name":"Particle physics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2015.7342410","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2015.7342410","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Test Conference (ITC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320320879","display_name":"Deutsche Forschungsgemeinschaft","ror":"https://ror.org/018mejw64"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":46,"referenced_works":["https://openalex.org/W1535801681","https://openalex.org/W1580415659","https://openalex.org/W1686420892","https://openalex.org/W1952392627","https://openalex.org/W1965425138","https://openalex.org/W1969531659","https://openalex.org/W1975904133","https://openalex.org/W1982796553","https://openalex.org/W1986722376","https://openalex.org/W2006030027","https://openalex.org/W2025761671","https://openalex.org/W2030989963","https://openalex.org/W2033990287","https://openalex.org/W2050320264","https://openalex.org/W2059625562","https://openalex.org/W2066019803","https://openalex.org/W2067829530","https://openalex.org/W2070655964","https://openalex.org/W2087826268","https://openalex.org/W2102850678","https://openalex.org/W2103415152","https://openalex.org/W2104886115","https://openalex.org/W2118033476","https://openalex.org/W2138815251","https://openalex.org/W2140370341","https://openalex.org/W2140373207","https://openalex.org/W2149288978","https://openalex.org/W2150182783","https://openalex.org/W2151529344","https://openalex.org/W2152652532","https://openalex.org/W2157447136","https://openalex.org/W2160343432","https://openalex.org/W2166046854","https://openalex.org/W2167839483","https://openalex.org/W2168133003","https://openalex.org/W2173097224","https://openalex.org/W2291356006","https://openalex.org/W2498844334","https://openalex.org/W4229741704","https://openalex.org/W4231535434","https://openalex.org/W4232751114","https://openalex.org/W4233023221","https://openalex.org/W4236024374","https://openalex.org/W6640729338","https://openalex.org/W6667121796","https://openalex.org/W6667623866"],"related_works":["https://openalex.org/W4247694028","https://openalex.org/W2333533828","https://openalex.org/W2306469233","https://openalex.org/W2065356549","https://openalex.org/W2118844295","https://openalex.org/W4400983058","https://openalex.org/W2181665053","https://openalex.org/W2087943997","https://openalex.org/W2109390513","https://openalex.org/W2184233008"],"abstract_inverted_index":{"Radiation-induced":[0],"Multiple":[1],"Bit":[2],"Upsets":[3],"(MBUs)":[4],"are":[5],"major":[6],"reliability":[7,110],"concerns":[8],"for":[9,107],"embedded":[10],"memory":[11,52],"arrays":[12],"fabricated":[13],"in":[14,51,66],"advanced":[15],"technology":[16],"nodes.":[17],"Although":[18],"various":[19],"error":[20],"correction":[21],"techniques":[22],"with":[23,62],"different":[24],"attributes":[25],"have":[26],"been":[27,31],"developed,":[28],"there":[29],"has":[30],"limited":[32],"efforts":[33],"towards":[34],"pure":[35],"MBU":[36,73],"detection.":[37],"In":[38,54],"this":[39,55],"paper,":[40],"we":[41],"present":[42],"stepped":[43,92],"parity,":[44],"a":[45,67,108],"cost-efficient":[46],"technique":[47],"to":[48],"detect":[49],"MBUs":[50],"arrays.":[53],"technique,":[56],"each":[57],"data":[58],"bit":[59],"is":[60],"associated":[61],"several":[63],"parity":[64,84,93],"bits":[65],"way":[68],"that":[69,90],"the":[70,83,91,95,101],"most":[71],"common":[72],"patterns":[74],"could":[75],"be":[76],"detected":[77],"by":[78,104],"at":[79],"least":[80],"one":[81],"of":[82,100],"bits.":[85],"The":[86],"experimental":[87],"results":[88],"reveal":[89],"reduces":[94],"area":[96],"and":[97],"power":[98],"overheads":[99],"stat-of-the-art":[102],"solutions":[103],"about":[105],"30%":[106],"given":[109],"constraint.":[111]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":2},{"year":2015,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}