{"id":"https://openalex.org/W2058678173","doi":"https://doi.org/10.1109/test.2014.7035359","title":"A diagnosis-friendly LBIST architecture with property checking","display_name":"A diagnosis-friendly LBIST architecture with property checking","publication_year":2014,"publication_date":"2014-10-01","ids":{"openalex":"https://openalex.org/W2058678173","doi":"https://doi.org/10.1109/test.2014.7035359","mag":"2058678173"},"language":"en","primary_location":{"id":"doi:10.1109/test.2014.7035359","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2014.7035359","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 International Test Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5067318054","display_name":"Sarvesh Prabhu","orcid":null},"institutions":[{"id":"https://openalex.org/I859038795","display_name":"Virginia Tech","ror":"https://ror.org/02smfhw86","country_code":"US","type":"education","lineage":["https://openalex.org/I859038795"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Sarvesh Prabhu","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Virginia Tech., USA","Department of Electrical & Computer Engineering, Virginia Tech, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Virginia Tech., USA","institution_ids":["https://openalex.org/I859038795"]},{"raw_affiliation_string":"Department of Electrical & Computer Engineering, Virginia Tech, USA","institution_ids":["https://openalex.org/I859038795"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056040463","display_name":"Vineeth V. Acharya","orcid":null},"institutions":[{"id":"https://openalex.org/I859038795","display_name":"Virginia Tech","ror":"https://ror.org/02smfhw86","country_code":"US","type":"education","lineage":["https://openalex.org/I859038795"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Vineeth V. Acharya","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Virginia Tech., USA","Department of Electrical & Computer Engineering, Virginia Tech, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Virginia Tech., USA","institution_ids":["https://openalex.org/I859038795"]},{"raw_affiliation_string":"Department of Electrical & Computer Engineering, Virginia Tech, USA","institution_ids":["https://openalex.org/I859038795"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009258409","display_name":"Sharad Bagri","orcid":null},"institutions":[{"id":"https://openalex.org/I859038795","display_name":"Virginia Tech","ror":"https://ror.org/02smfhw86","country_code":"US","type":"education","lineage":["https://openalex.org/I859038795"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sharad Bagri","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Virginia Tech., USA","Department of Electrical & Computer Engineering, Virginia Tech, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Virginia Tech., USA","institution_ids":["https://openalex.org/I859038795"]},{"raw_affiliation_string":"Department of Electrical & Computer Engineering, Virginia Tech, USA","institution_ids":["https://openalex.org/I859038795"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5108516165","display_name":"Michael S. Hsiao","orcid":null},"institutions":[{"id":"https://openalex.org/I859038795","display_name":"Virginia Tech","ror":"https://ror.org/02smfhw86","country_code":"US","type":"education","lineage":["https://openalex.org/I859038795"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Michael S. Hsiao","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Virginia Tech., USA","Department of Electrical & Computer Engineering, Virginia Tech, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Virginia Tech., USA","institution_ids":["https://openalex.org/I859038795"]},{"raw_affiliation_string":"Department of Electrical & Computer Engineering, Virginia Tech, USA","institution_ids":["https://openalex.org/I859038795"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5067318054"],"corresponding_institution_ids":["https://openalex.org/I859038795"],"apc_list":null,"apc_paid":null,"fwci":0.3065,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.59304595,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"18","issue":null,"first_page":"1","last_page":"9"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6920728087425232},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.6793960332870483},{"id":"https://openalex.org/keywords/property","display_name":"Property (philosophy)","score":0.6362462639808655},{"id":"https://openalex.org/keywords/architecture","display_name":"Architecture","score":0.5876896381378174},{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.538609504699707},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.49097421765327454},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.4753006398677826},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.4519887864589691},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.44269368052482605},{"id":"https://openalex.org/keywords/test-vector","display_name":"Test vector","score":0.43337130546569824},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.43186354637145996},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.4294726252555847},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16347944736480713},{"id":"https://openalex.org/keywords/test-set","display_name":"Test set","score":0.13203415274620056},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.107476145029068},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.07617288827896118}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6920728087425232},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.6793960332870483},{"id":"https://openalex.org/C189950617","wikidata":"https://www.wikidata.org/wiki/Q937228","display_name":"Property (philosophy)","level":2,"score":0.6362462639808655},{"id":"https://openalex.org/C123657996","wikidata":"https://www.wikidata.org/wiki/Q12271","display_name":"Architecture","level":2,"score":0.5876896381378174},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.538609504699707},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.49097421765327454},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.4753006398677826},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.4519887864589691},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.44269368052482605},{"id":"https://openalex.org/C100767440","wikidata":"https://www.wikidata.org/wiki/Q7705816","display_name":"Test vector","level":3,"score":0.43337130546569824},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.43186354637145996},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.4294726252555847},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16347944736480713},{"id":"https://openalex.org/C169903167","wikidata":"https://www.wikidata.org/wiki/Q3985153","display_name":"Test set","level":2,"score":0.13203415274620056},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.107476145029068},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.07617288827896118},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C153349607","wikidata":"https://www.wikidata.org/wiki/Q36649","display_name":"Visual arts","level":1,"score":0.0},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2014.7035359","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2014.7035359","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 International Test Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/11","score":0.5799999833106995,"display_name":"Sustainable cities and communities"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":47,"referenced_works":["https://openalex.org/W34400337","https://openalex.org/W197391467","https://openalex.org/W260727648","https://openalex.org/W1507615093","https://openalex.org/W1515082873","https://openalex.org/W1559956812","https://openalex.org/W2002068169","https://openalex.org/W2021463588","https://openalex.org/W2026549012","https://openalex.org/W2088716948","https://openalex.org/W2102364390","https://openalex.org/W2104309038","https://openalex.org/W2104350151","https://openalex.org/W2106772577","https://openalex.org/W2108785072","https://openalex.org/W2110221285","https://openalex.org/W2115005577","https://openalex.org/W2115963450","https://openalex.org/W2121760724","https://openalex.org/W2122581382","https://openalex.org/W2123887307","https://openalex.org/W2128971504","https://openalex.org/W2132340347","https://openalex.org/W2133447618","https://openalex.org/W2134636371","https://openalex.org/W2144756088","https://openalex.org/W2149397116","https://openalex.org/W2153336129","https://openalex.org/W2155829270","https://openalex.org/W2157482771","https://openalex.org/W2159676542","https://openalex.org/W2164290165","https://openalex.org/W2171426318","https://openalex.org/W3141551298","https://openalex.org/W4229634260","https://openalex.org/W4233158255","https://openalex.org/W4234040450","https://openalex.org/W4249806673","https://openalex.org/W4251324159","https://openalex.org/W6601399959","https://openalex.org/W6607990715","https://openalex.org/W6675580371","https://openalex.org/W6676575705","https://openalex.org/W6679585836","https://openalex.org/W6679869917","https://openalex.org/W6681890761","https://openalex.org/W6685378013"],"related_works":["https://openalex.org/W2989159162","https://openalex.org/W2153201966","https://openalex.org/W2122754719","https://openalex.org/W2139513292","https://openalex.org/W1982569681","https://openalex.org/W1874778078","https://openalex.org/W2154529098","https://openalex.org/W1749299286","https://openalex.org/W2550725449","https://openalex.org/W2157348262"],"abstract_inverted_index":{"LBIST":[0,56],"is":[1,69,102],"a":[2,51,110],"popular":[3],"technique":[4],"for":[5,79,113],"on-chip":[6],"at-speed":[7],"testing":[8],"of":[9,23],"digital":[10],"circuits.":[11,115],"In":[12],"LBIST,":[13],"output":[14,40,64],"compression":[15,29],"techniques":[16],"are":[17,47,77],"used":[18],"to":[19,41,104],"reduce":[20],"hardware":[21,89],"overhead":[22],"storing":[24],"test":[25],"responses":[26],"but":[27],"such":[28],"makes":[30],"diagnosis":[31],"extremely":[32],"challenging":[33],"as":[34],"the":[35,39,43,63,71,95,105],"failing":[36,72],"vector":[37,73],"and":[38,74],"which":[42,58],"fault":[44],"effect":[45],"propagated":[46],"unknown.":[48],"We":[49],"propose":[50],"new":[52],"property":[53,68,75],"checking":[54],"based":[55],"architecture":[57,83,101],"monitors":[59],"certain":[60],"properties":[61],"in":[62,109],"responses.":[65],"If":[66],"any":[67],"violated,":[70],"number":[76],"stored":[78],"diagnosis.":[80],"The":[81],"proposed":[82],"improves":[84],"diagnosability":[85],"considerably":[86],"with":[87],"minimal":[88],"overhead.":[90],"Experimental":[91],"results":[92],"show":[93],"that":[94],"diagnostic":[96,106],"resolution":[97,107],"achieved":[98,108],"by":[99],"our":[100],"comparable":[103],"non-BIST":[111],"setup":[112],"many":[114]},"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2014,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}