{"id":"https://openalex.org/W2004516571","doi":"https://doi.org/10.1109/test.2014.7035345","title":"Logic characterization vehicle design for maximal information extraction for yield learning","display_name":"Logic characterization vehicle design for maximal information extraction for yield learning","publication_year":2014,"publication_date":"2014-10-01","ids":{"openalex":"https://openalex.org/W2004516571","doi":"https://doi.org/10.1109/test.2014.7035345","mag":"2004516571"},"language":"en","primary_location":{"id":"doi:10.1109/test.2014.7035345","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2014.7035345","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 International Test Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5039038157","display_name":"R. D. Blanton","orcid":"https://orcid.org/0000-0001-6108-2925"},"institutions":[{"id":"https://openalex.org/I74973139","display_name":"Carnegie Mellon University","ror":"https://ror.org/05x2bcf33","country_code":"US","type":"education","lineage":["https://openalex.org/I74973139"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"R. D. Blanton","raw_affiliation_strings":["Carnegie Mellon University, Pittsburgh, PA, US","Advanced Chip Testing Laboratory, ECE Department, Carnegie Mellon University, USA"],"affiliations":[{"raw_affiliation_string":"Carnegie Mellon University, Pittsburgh, PA, US","institution_ids":["https://openalex.org/I74973139"]},{"raw_affiliation_string":"Advanced Chip Testing Laboratory, ECE Department, Carnegie Mellon University, USA","institution_ids":["https://openalex.org/I74973139"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003670191","display_name":"Ben Niewenhuis","orcid":null},"institutions":[{"id":"https://openalex.org/I74973139","display_name":"Carnegie Mellon University","ror":"https://ror.org/05x2bcf33","country_code":"US","type":"education","lineage":["https://openalex.org/I74973139"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ben Niewenhuis","raw_affiliation_strings":["ECE Department Carnegie, Mellon University","Advanced Chip Testing Laboratory, ECE Department, Carnegie Mellon University, USA"],"affiliations":[{"raw_affiliation_string":"ECE Department Carnegie, Mellon University","institution_ids":["https://openalex.org/I74973139"]},{"raw_affiliation_string":"Advanced Chip Testing Laboratory, ECE Department, Carnegie Mellon University, USA","institution_ids":["https://openalex.org/I74973139"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5101239812","display_name":"Carl Taylor","orcid":null},"institutions":[{"id":"https://openalex.org/I74973139","display_name":"Carnegie Mellon University","ror":"https://ror.org/05x2bcf33","country_code":"US","type":"education","lineage":["https://openalex.org/I74973139"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Carl Taylor","raw_affiliation_strings":["ECE Department Carnegie, Mellon University","Advanced Chip Testing Laboratory, ECE Department, Carnegie Mellon University, USA"],"affiliations":[{"raw_affiliation_string":"ECE Department Carnegie, Mellon University","institution_ids":["https://openalex.org/I74973139"]},{"raw_affiliation_string":"Advanced Chip Testing Laboratory, ECE Department, Carnegie Mellon University, USA","institution_ids":["https://openalex.org/I74973139"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5039038157"],"corresponding_institution_ids":["https://openalex.org/I74973139"],"apc_list":null,"apc_paid":null,"fwci":2.4518,"has_fulltext":false,"cited_by_count":18,"citation_normalized_percentile":{"value":0.88673053,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":"2","issue":null,"first_page":"1","last_page":"10"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9954000115394592,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.7095293998718262},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.6654387712478638},{"id":"https://openalex.org/keywords/testability","display_name":"Testability","score":0.6334075927734375},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6246276497840881},{"id":"https://openalex.org/keywords/parameterized-complexity","display_name":"Parameterized complexity","score":0.6035845875740051},{"id":"https://openalex.org/keywords/constant","display_name":"Constant (computer programming)","score":0.49166518449783325},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.45264625549316406},{"id":"https://openalex.org/keywords/code-coverage","display_name":"Code coverage","score":0.4404311776161194},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.37245237827301025},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.2893578112125397},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.2742069363594055},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.2518036365509033},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22602015733718872},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.1564083993434906},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.10915973782539368}],"concepts":[{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.7095293998718262},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.6654387712478638},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.6334075927734375},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6246276497840881},{"id":"https://openalex.org/C165464430","wikidata":"https://www.wikidata.org/wiki/Q1570441","display_name":"Parameterized complexity","level":2,"score":0.6035845875740051},{"id":"https://openalex.org/C2777027219","wikidata":"https://www.wikidata.org/wiki/Q1284190","display_name":"Constant (computer programming)","level":2,"score":0.49166518449783325},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.45264625549316406},{"id":"https://openalex.org/C53942775","wikidata":"https://www.wikidata.org/wiki/Q1211721","display_name":"Code coverage","level":3,"score":0.4404311776161194},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.37245237827301025},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.2893578112125397},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.2742069363594055},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.2518036365509033},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22602015733718872},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.1564083993434906},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.10915973782539368}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2014.7035345","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2014.7035345","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 International Test Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"No poverty","score":0.5600000023841858,"id":"https://metadata.un.org/sdg/1"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":27,"referenced_works":["https://openalex.org/W299002267","https://openalex.org/W1822750977","https://openalex.org/W1993999542","https://openalex.org/W2005960695","https://openalex.org/W2007904745","https://openalex.org/W2009815534","https://openalex.org/W2029130586","https://openalex.org/W2084529966","https://openalex.org/W2096181576","https://openalex.org/W2099624017","https://openalex.org/W2106197724","https://openalex.org/W2114024582","https://openalex.org/W2115920077","https://openalex.org/W2117477421","https://openalex.org/W2120391052","https://openalex.org/W2131819669","https://openalex.org/W2135329032","https://openalex.org/W2142551277","https://openalex.org/W2152489029","https://openalex.org/W2161229078","https://openalex.org/W2166671042","https://openalex.org/W2168958550","https://openalex.org/W2170248741","https://openalex.org/W2170615965","https://openalex.org/W2171484465","https://openalex.org/W2171908682","https://openalex.org/W6680356280"],"related_works":["https://openalex.org/W2947266479","https://openalex.org/W2369589212","https://openalex.org/W2107525390","https://openalex.org/W2157191248","https://openalex.org/W2151694129","https://openalex.org/W2169602749","https://openalex.org/W2150046587","https://openalex.org/W2157212570","https://openalex.org/W1579528621","https://openalex.org/W2141620082"],"abstract_inverted_index":{"A":[0],"new":[1],"type":[2],"of":[3,41,50,55,105],"logic":[4],"characterization":[5],"vehicle":[6],"(LCV)":[7],"that":[8,34,61,81,101],"optimizes":[9],"design,":[10],"test,":[11],"and":[12,26,38,47,64,67,89,94,98],"diagnosis":[13,68],"for":[14,92,119],"yield":[15],"learning":[16],"is":[17,131],"described.":[18],"The":[19],"Carnegie-Mellon":[20],"LCV":[21],"(CM-LCV)":[22],"uses":[23],"constant-testability":[24],"theory":[25],"logic/layout":[27],"regularity":[28],"to":[29,113],"create":[30],"a":[31,42,126],"parameterized":[32],"design":[33,62,124],"exhibits":[35],"both":[36],"front-":[37],"back-end":[39],"characteristics":[40,91],"product-like,":[43],"customer":[44],"design.":[45],"Design":[46],"test":[48,66,79,117],"analysis":[49],"various":[51],"CM-LCV":[52],"designs":[53],"(one":[54],"which":[56],"has":[57],">4M":[58],"gates)":[59],"demonstrates":[60],"time":[63],"density,":[65],"can":[69],"all":[70],"be":[71],"simultaneously":[72],"improved.":[73],"For":[74],"example,":[75],"conventional":[76],"ATPG":[77],"produces":[78],"sets":[80],"are":[82,102],"2X":[83],"larger,":[84],"produce":[85],"significantly":[86],"poorer":[87],"fault-detection":[88],"diagnostic":[90],"standard":[93],"advanced":[95],"fault":[96],"models,":[97],"require":[99],"runtimes":[100],"several":[103],"orders":[104],"magnitude":[106],"larger":[107],"than":[108,134],"the":[109,115,120,123],"simple":[110],"approach":[111],"used":[112],"generate":[114],"constant":[116],"set":[118],"CM-LCV.":[121],"On":[122],"side,":[125],"fully":[127],"designed":[128],"custom":[129],"layout":[130],"25%":[132],"smaller":[133],"its":[135],"synthesized,":[136],"place-and-routed":[137],"counterpart.":[138]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":5},{"year":2015,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}