{"id":"https://openalex.org/W1994359746","doi":"https://doi.org/10.1109/test.2014.7035324","title":"A Tag based solution for efficient utilization of efuse for memory repair","display_name":"A Tag based solution for efficient utilization of efuse for memory repair","publication_year":2014,"publication_date":"2014-10-01","ids":{"openalex":"https://openalex.org/W1994359746","doi":"https://doi.org/10.1109/test.2014.7035324","mag":"1994359746"},"language":"en","primary_location":{"id":"doi:10.1109/test.2014.7035324","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2014.7035324","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 International Test Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5025118361","display_name":"Harsharaj Ellur","orcid":null},"institutions":[{"id":"https://openalex.org/I4210109535","display_name":"Texas Instruments (India)","ror":"https://ror.org/01t305n31","country_code":"IN","type":"company","lineage":["https://openalex.org/I4210109535","https://openalex.org/I74760111"]},{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["IN","US"],"is_corresponding":true,"raw_author_name":"Harsharaj Ellur","raw_affiliation_strings":["Texas Instruments, Inc., Bangalore, India","Texas Instruments, Inc. Bangalore, India"],"affiliations":[{"raw_affiliation_string":"Texas Instruments, Inc., Bangalore, India","institution_ids":["https://openalex.org/I4210109535"]},{"raw_affiliation_string":"Texas Instruments, Inc. Bangalore, India","institution_ids":["https://openalex.org/I74760111"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5102089451","display_name":"Kalpesh Shah","orcid":null},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]},{"id":"https://openalex.org/I4210109535","display_name":"Texas Instruments (India)","ror":"https://ror.org/01t305n31","country_code":"IN","type":"company","lineage":["https://openalex.org/I4210109535","https://openalex.org/I74760111"]}],"countries":["IN","US"],"is_corresponding":false,"raw_author_name":"Kalpesh Shah","raw_affiliation_strings":["Texas Instruments, Inc., Bangalore, India","Texas Instruments, Inc. Bangalore, India"],"affiliations":[{"raw_affiliation_string":"Texas Instruments, Inc., Bangalore, India","institution_ids":["https://openalex.org/I4210109535"]},{"raw_affiliation_string":"Texas Instruments, Inc. Bangalore, India","institution_ids":["https://openalex.org/I74760111"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5025118361"],"corresponding_institution_ids":["https://openalex.org/I4210109535","https://openalex.org/I74760111"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.06865354,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"7"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9958999752998352,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7746704816818237},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.6004723310470581},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5039724707603455},{"id":"https://openalex.org/keywords/compression","display_name":"Compression (physics)","score":0.4665638506412506},{"id":"https://openalex.org/keywords/data-compression","display_name":"Data compression","score":0.4530167877674103},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.42200767993927},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.23703932762145996},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.09124863147735596}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7746704816818237},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.6004723310470581},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5039724707603455},{"id":"https://openalex.org/C180016635","wikidata":"https://www.wikidata.org/wiki/Q2712821","display_name":"Compression (physics)","level":2,"score":0.4665638506412506},{"id":"https://openalex.org/C78548338","wikidata":"https://www.wikidata.org/wiki/Q2493","display_name":"Data compression","level":2,"score":0.4530167877674103},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.42200767993927},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.23703932762145996},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.09124863147735596},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2014.7035324","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2014.7035324","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 International Test Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1527081965","https://openalex.org/W1528272859","https://openalex.org/W2020860185","https://openalex.org/W2065293528","https://openalex.org/W2072717808","https://openalex.org/W2099158291","https://openalex.org/W2122442616","https://openalex.org/W2146999492","https://openalex.org/W2169342007","https://openalex.org/W6655490732","https://openalex.org/W6684814692"],"related_works":["https://openalex.org/W2952348651","https://openalex.org/W2375742443","https://openalex.org/W2149381099","https://openalex.org/W4200520489","https://openalex.org/W1483190388","https://openalex.org/W2061536531","https://openalex.org/W193873054","https://openalex.org/W2153990583","https://openalex.org/W2612632602","https://openalex.org/W2321805087"],"abstract_inverted_index":{"Efuse":[0,43],"or":[1],"FuseROMs":[2],"play":[3],"a":[4,62,103,146],"major":[5],"role":[6],"in":[7,21,31,49],"embedded":[8],"memory":[9],"BIST":[10],"and":[11,26,51,93,115,145],"repair":[12,40,89,99,104,117],"flows.":[13],"The":[14],"trend":[15],"of":[16,74,82,129,149,159],"increasing":[17],"demand":[18],"for":[19,23,34,70,113],"SRAMs":[20],"SoCs":[22],"graphics,":[24],"DSP":[25],"application":[27],"processors":[28],"have":[29],"resulted":[30],"the":[32,80,98,120,127],"need":[33,102],"more":[35],"efuses":[36],"on":[37],"die":[38],"to":[39,96],"these":[41,67],"memories.":[42],"bit":[44],"cell":[45],"is":[46],"comparatively":[47],"large":[48],"size":[50],"does":[52],"not":[53],"scale":[54],"well":[55],"at":[56],"lower":[57],"technology":[58],"nodes,":[59],"thus":[60],"becoming":[61],"floor":[63],"plan":[64],"nightmare.":[65],"All":[66],"factors":[68],"call":[69],"an":[71,83],"efficient":[72],"use":[73],"available":[75],"efuses.":[76],"This":[77,122],"paper":[78],"describes":[79],"implementation":[81,123],"efuse":[84,95],"compression":[85,132,139,154],"scheme":[86],"that":[87,101],"identifies":[88],"registers":[90,100],"by":[91],"tags":[92],"allocates":[94],"only":[97],"code.":[105],"Linked":[106],"list":[107],"based":[108,153],"data":[109],"structure":[110],"was":[111,124],"utilized":[112],"storing":[114],"retrieving":[116],"codes":[118],"from":[119],"FuseROM.":[121],"designed":[125],"with":[126,156],"goal":[128],"achieving":[130],"good":[131],"when":[133],"using":[134],"incremental":[135],"repair.":[136],"Analysis":[137],"indicate":[138],"ratio":[140],"as":[141,143],"high":[142],"88.5%":[144],"max":[147],"improvement":[148],"35%":[150],"over":[151],"RLE":[152],"schemes":[155],"logic":[157],"overhead":[158],"~10K":[160],"gates.":[161]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}