{"id":"https://openalex.org/W2071783517","doi":"https://doi.org/10.1109/test.2014.7035299","title":"Statistical silicon results of dynamic power integrity control of ATE for eliminating overkills and underkills","display_name":"Statistical silicon results of dynamic power integrity control of ATE for eliminating overkills and underkills","publication_year":2014,"publication_date":"2014-10-01","ids":{"openalex":"https://openalex.org/W2071783517","doi":"https://doi.org/10.1109/test.2014.7035299","mag":"2071783517"},"language":"en","primary_location":{"id":"doi:10.1109/test.2014.7035299","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2014.7035299","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 International Test Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5109203606","display_name":"Masahiro Ishida","orcid":"https://orcid.org/0009-0000-7712-4966"},"institutions":[{"id":"https://openalex.org/I4210103901","display_name":"Advantest (Japan)","ror":"https://ror.org/01bvpmp82","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210103901"]},{"id":"https://openalex.org/I177844149","display_name":"Advantest (Singapore)","ror":"https://ror.org/04dyk5z88","country_code":"SG","type":"company","lineage":["https://openalex.org/I177844149","https://openalex.org/I4210103901"]}],"countries":["JP","SG"],"is_corresponding":true,"raw_author_name":"Masahiro Ishida","raw_affiliation_strings":["Kabushiki Kaisha Advantest, Chiyoda-ku, Tokyo, JP","Advantest Corporation, Meiwa-machi, Gunma, 370-0718, JAPAN"],"affiliations":[{"raw_affiliation_string":"Kabushiki Kaisha Advantest, Chiyoda-ku, Tokyo, JP","institution_ids":["https://openalex.org/I4210103901"]},{"raw_affiliation_string":"Advantest Corporation, Meiwa-machi, Gunma, 370-0718, JAPAN","institution_ids":["https://openalex.org/I177844149"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5012141183","display_name":"Takashi Kusaka","orcid":"https://orcid.org/0000-0002-2963-3245"},"institutions":[{"id":"https://openalex.org/I177844149","display_name":"Advantest (Singapore)","ror":"https://ror.org/04dyk5z88","country_code":"SG","type":"company","lineage":["https://openalex.org/I177844149","https://openalex.org/I4210103901"]},{"id":"https://openalex.org/I4210103901","display_name":"Advantest (Japan)","ror":"https://ror.org/01bvpmp82","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210103901"]}],"countries":["JP","SG"],"is_corresponding":false,"raw_author_name":"Takashi Kusaka","raw_affiliation_strings":["Kabushiki Kaisha Advantest, Chiyoda-ku, Tokyo, JP","Advantest Corporation, Meiwa-machi, Gunma, 370-0718, JAPAN"],"affiliations":[{"raw_affiliation_string":"Kabushiki Kaisha Advantest, Chiyoda-ku, Tokyo, JP","institution_ids":["https://openalex.org/I4210103901"]},{"raw_affiliation_string":"Advantest Corporation, Meiwa-machi, Gunma, 370-0718, JAPAN","institution_ids":["https://openalex.org/I177844149"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071803491","display_name":"Toru Nakura","orcid":"https://orcid.org/0000-0001-5945-3918"},"institutions":[{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Toru Nakura","raw_affiliation_strings":["VLSI Design and Education Center, The University of Tokyo, Tokyo, Japan","VLSI Design and Education Center, the University of Tokyo, 113-0032, JAPAN"],"affiliations":[{"raw_affiliation_string":"VLSI Design and Education Center, The University of Tokyo, Tokyo, Japan","institution_ids":["https://openalex.org/I74801974"]},{"raw_affiliation_string":"VLSI Design and Education Center, the University of Tokyo, 113-0032, JAPAN","institution_ids":["https://openalex.org/I74801974"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103025045","display_name":"Satoshi Komatsu","orcid":"https://orcid.org/0000-0002-9180-9053"},"institutions":[{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Satoshi Komatsu","raw_affiliation_strings":["Tokyo Daigaku, Bunkyo-ku, Tokyo, JP","VLSI Design and Education Center, the University of Tokyo, 113-0032, JAPAN"],"affiliations":[{"raw_affiliation_string":"Tokyo Daigaku, Bunkyo-ku, Tokyo, JP","institution_ids":["https://openalex.org/I74801974"]},{"raw_affiliation_string":"VLSI Design and Education Center, the University of Tokyo, 113-0032, JAPAN","institution_ids":["https://openalex.org/I74801974"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5028680447","display_name":"Kunihiro Asada","orcid":"https://orcid.org/0000-0002-1150-0241"},"institutions":[{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kunihiro Asada","raw_affiliation_strings":["VLSI Design and Education Center, The University of Tokyo, Tokyo, Japan","VLSI Design and Education Center, the University of Tokyo, 113-0032, JAPAN"],"affiliations":[{"raw_affiliation_string":"VLSI Design and Education Center, The University of Tokyo, Tokyo, Japan","institution_ids":["https://openalex.org/I74801974"]},{"raw_affiliation_string":"VLSI Design and Education Center, the University of Tokyo, 113-0032, JAPAN","institution_ids":["https://openalex.org/I74801974"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5109203606"],"corresponding_institution_ids":["https://openalex.org/I177844149","https://openalex.org/I4210103901"],"apc_list":null,"apc_paid":null,"fwci":0.9194,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.75767252,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"10"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/power-integrity","display_name":"Power integrity","score":0.7882750630378723},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.6735159158706665},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.5513064861297607},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.5190242528915405},{"id":"https://openalex.org/keywords/dynamic-demand","display_name":"Dynamic demand","score":0.4978830814361572},{"id":"https://openalex.org/keywords/device-under-test","display_name":"Device under test","score":0.46125659346580505},{"id":"https://openalex.org/keywords/waveform","display_name":"Waveform","score":0.456236332654953},{"id":"https://openalex.org/keywords/compensation","display_name":"Compensation (psychology)","score":0.4543328881263733},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4215548634529114},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4169125556945801},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4161534905433655},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.4154731035232544},{"id":"https://openalex.org/keywords/power-control","display_name":"Power control","score":0.4123256206512451},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.35049235820770264},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.24118572473526},{"id":"https://openalex.org/keywords/signal-integrity","display_name":"Signal integrity","score":0.22417834401130676},{"id":"https://openalex.org/keywords/printed-circuit-board","display_name":"Printed circuit board","score":0.08656266331672668}],"concepts":[{"id":"https://openalex.org/C2777561913","wikidata":"https://www.wikidata.org/wiki/Q19599527","display_name":"Power integrity","level":4,"score":0.7882750630378723},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.6735159158706665},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.5513064861297607},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.5190242528915405},{"id":"https://openalex.org/C45872418","wikidata":"https://www.wikidata.org/wiki/Q5318966","display_name":"Dynamic demand","level":3,"score":0.4978830814361572},{"id":"https://openalex.org/C76249512","wikidata":"https://www.wikidata.org/wiki/Q1206780","display_name":"Device under test","level":3,"score":0.46125659346580505},{"id":"https://openalex.org/C197424946","wikidata":"https://www.wikidata.org/wiki/Q1165717","display_name":"Waveform","level":3,"score":0.456236332654953},{"id":"https://openalex.org/C2780023022","wikidata":"https://www.wikidata.org/wiki/Q1338171","display_name":"Compensation (psychology)","level":2,"score":0.4543328881263733},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4215548634529114},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4169125556945801},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4161534905433655},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.4154731035232544},{"id":"https://openalex.org/C56685638","wikidata":"https://www.wikidata.org/wiki/Q2300474","display_name":"Power control","level":3,"score":0.4123256206512451},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.35049235820770264},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.24118572473526},{"id":"https://openalex.org/C44938667","wikidata":"https://www.wikidata.org/wiki/Q4503810","display_name":"Signal integrity","level":3,"score":0.22417834401130676},{"id":"https://openalex.org/C120793396","wikidata":"https://www.wikidata.org/wiki/Q173350","display_name":"Printed circuit board","level":2,"score":0.08656266331672668},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C195266298","wikidata":"https://www.wikidata.org/wiki/Q2165620","display_name":"Scattering parameters","level":2,"score":0.0},{"id":"https://openalex.org/C11171543","wikidata":"https://www.wikidata.org/wiki/Q41630","display_name":"Psychoanalysis","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2014.7035299","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2014.7035299","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 International Test Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.6000000238418579}],"awards":[],"funders":[{"id":"https://openalex.org/F4320322832","display_name":"University of Tokyo","ror":"https://ror.org/057zh3y96"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W1921561960","https://openalex.org/W2002510178","https://openalex.org/W2017903695","https://openalex.org/W2033090586","https://openalex.org/W2099211068","https://openalex.org/W2162547872","https://openalex.org/W3151751772","https://openalex.org/W6675229065"],"related_works":["https://openalex.org/W4235454973","https://openalex.org/W4239401071","https://openalex.org/W2067224723","https://openalex.org/W2898734073","https://openalex.org/W2161945483","https://openalex.org/W2007578917","https://openalex.org/W4285407098","https://openalex.org/W2084413026","https://openalex.org/W2150586017","https://openalex.org/W2059864367"],"abstract_inverted_index":{"This":[0],"paper":[1],"demonstrates":[2],"our":[3,100],"dynamic":[4,101],"power":[5,17,43,58,93,102,115,123],"integrity":[6,103,116],"control":[7,117],"for":[8],"eliminating":[9],"the":[10,14,32,42,47,56,63,66,71,91,111,114,120,126,129,133,136,143],"overkills/underkills":[11,88,144],"due":[12,89],"to":[13,90],"difference":[15],"of":[16,31,70,75,87,113,128,142],"supply":[18,44,59,94],"impedance":[19],"between":[20,132],"an":[21],"automatic":[22],"test":[23,35,130],"equipment":[24],"(ATE)":[25],"and":[26,135],"a":[27,51],"practical":[28],"operating":[29,68],"environment":[30,69],"device":[33],"under":[34],"(DUT).":[36],"It":[37],"injects":[38],"compensation":[39],"currents":[40],"into":[41],"nodes":[45],"on":[46,65,119],"ATE":[48,57,134],"system":[49],"in":[50,140],"feed-forward":[52],"manner":[53],"such":[54],"that":[55,85,109],"waveform":[60],"matches":[61],"with":[62,79],"one":[64],"customer's":[67],"DUT.":[72],"Experimental":[73],"results":[74,131],"delay":[76],"fault":[77],"testing":[78],"105":[80],"real":[81],"silicon":[82],"chips":[83],"show":[84],"48%":[86],"different":[92],"characteristics":[95],"can":[96,145],"be":[97,146],"eliminated":[98],"by":[99],"control.":[104],"Furthermore,":[105],"it":[106],"was":[107],"found":[108],"adjusting":[110],"magnitude":[112],"based":[118],"chip-to-chip":[121],"active":[122],"variation":[124],"improves":[125],"correlation":[127],"customer":[137],"environment,":[138],"resulting":[139],"95%":[141],"eliminated.":[147]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2016,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}