{"id":"https://openalex.org/W2023991496","doi":"https://doi.org/10.1109/test.2014.7035295","title":"Mitigating voltage droop during scan with variable shift frequency","display_name":"Mitigating voltage droop during scan with variable shift frequency","publication_year":2014,"publication_date":"2014-10-01","ids":{"openalex":"https://openalex.org/W2023991496","doi":"https://doi.org/10.1109/test.2014.7035295","mag":"2023991496"},"language":"en","primary_location":{"id":"doi:10.1109/test.2014.7035295","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2014.7035295","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 International Test Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5083646184","display_name":"John Schulze","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104401","display_name":"Austin Independent School District","ror":"https://ror.org/01g9rp025","country_code":"US","type":"education","lineage":["https://openalex.org/I4210104401"]},{"id":"https://openalex.org/I1311921367","display_name":"Advanced Micro Devices (Canada)","ror":"https://ror.org/02yh0k313","country_code":"CA","type":"company","lineage":["https://openalex.org/I1311921367","https://openalex.org/I4210137977"]}],"countries":["CA","US"],"is_corresponding":true,"raw_author_name":"John Schulze","raw_affiliation_strings":["AMD Inc., Austin, USA","AMD, Inc., Austin, USA"],"affiliations":[{"raw_affiliation_string":"AMD Inc., Austin, USA","institution_ids":["https://openalex.org/I4210104401"]},{"raw_affiliation_string":"AMD, Inc., Austin, USA","institution_ids":["https://openalex.org/I1311921367"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5018336230","display_name":"Ryan Tally","orcid":null},"institutions":[{"id":"https://openalex.org/I4210104401","display_name":"Austin Independent School District","ror":"https://ror.org/01g9rp025","country_code":"US","type":"education","lineage":["https://openalex.org/I4210104401"]},{"id":"https://openalex.org/I1311921367","display_name":"Advanced Micro Devices (Canada)","ror":"https://ror.org/02yh0k313","country_code":"CA","type":"company","lineage":["https://openalex.org/I1311921367","https://openalex.org/I4210137977"]}],"countries":["CA","US"],"is_corresponding":false,"raw_author_name":"Ryan Tally","raw_affiliation_strings":["AMD Inc., Austin, USA","AMD, Inc., Austin, USA"],"affiliations":[{"raw_affiliation_string":"AMD Inc., Austin, USA","institution_ids":["https://openalex.org/I4210104401"]},{"raw_affiliation_string":"AMD, Inc., Austin, USA","institution_ids":["https://openalex.org/I1311921367"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5083646184"],"corresponding_institution_ids":["https://openalex.org/I1311921367","https://openalex.org/I4210104401"],"apc_list":null,"apc_paid":null,"fwci":1.2259,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.78765301,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"8"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/voltage-droop","display_name":"Voltage droop","score":0.9693788290023804},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.6716098189353943},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.6698709726333618},{"id":"https://openalex.org/keywords/shift-register","display_name":"Shift register","score":0.5244389176368713},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4842779040336609},{"id":"https://openalex.org/keywords/frequency-shift","display_name":"Frequency shift","score":0.4352194666862488},{"id":"https://openalex.org/keywords/voltage-reduction","display_name":"Voltage reduction","score":0.4319286048412323},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3204527795314789},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.28363895416259766},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2140401303768158},{"id":"https://openalex.org/keywords/voltage-source","display_name":"Voltage source","score":0.19152209162712097},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.13053247332572937},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.10962268710136414},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.09282702207565308},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.06324824690818787}],"concepts":[{"id":"https://openalex.org/C40760162","wikidata":"https://www.wikidata.org/wiki/Q10920295","display_name":"Voltage droop","level":4,"score":0.9693788290023804},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.6716098189353943},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.6698709726333618},{"id":"https://openalex.org/C49654631","wikidata":"https://www.wikidata.org/wiki/Q746165","display_name":"Shift register","level":3,"score":0.5244389176368713},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4842779040336609},{"id":"https://openalex.org/C2984878632","wikidata":"https://www.wikidata.org/wiki/Q5502879","display_name":"Frequency shift","level":2,"score":0.4352194666862488},{"id":"https://openalex.org/C2780745134","wikidata":"https://www.wikidata.org/wiki/Q7940751","display_name":"Voltage reduction","level":3,"score":0.4319286048412323},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3204527795314789},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.28363895416259766},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2140401303768158},{"id":"https://openalex.org/C144655898","wikidata":"https://www.wikidata.org/wiki/Q1161128","display_name":"Voltage source","level":3,"score":0.19152209162712097},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.13053247332572937},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.10962268710136414},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.09282702207565308},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.06324824690818787},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2014.7035295","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2014.7035295","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 International Test Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7099999785423279,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1557977552","https://openalex.org/W1986143702","https://openalex.org/W2040241863","https://openalex.org/W2077380902","https://openalex.org/W2111531873","https://openalex.org/W2111569953","https://openalex.org/W2121129715","https://openalex.org/W2121466258","https://openalex.org/W2136567303","https://openalex.org/W2153171864","https://openalex.org/W2169839635","https://openalex.org/W3141277457"],"related_works":["https://openalex.org/W2523432015","https://openalex.org/W2765340260","https://openalex.org/W2153130273","https://openalex.org/W2076823813","https://openalex.org/W3008686614","https://openalex.org/W2143080380","https://openalex.org/W4362552047","https://openalex.org/W4294043886","https://openalex.org/W2028791936","https://openalex.org/W1994043094"],"abstract_inverted_index":{"This":[0],"paper":[1],"describes":[2],"an":[3],"innovative":[4],"approach":[5],"for":[6],"executing":[7],"scan":[8,20,33],"patterns":[9,86],"on":[10],"the":[11,25,29,49,76],"tester":[12],"that":[13],"significantly":[14],"reduces":[15],"peak":[16],"voltage":[17,53],"droop":[18],"during":[19,28],"shift":[21,26,60,85],"by":[22],"stepping":[23],"up":[24],"frequency":[27,45],"beginning":[30],"of":[31,78],"each":[32],"load/unload":[34],"procedure.":[35],"A":[36],"methodology":[37],"is":[38],"presented":[39,74],"to":[40,47,82,89],"tune":[41],"one":[42],"or":[43],"more":[44],"steps":[46],"achieve":[48,90],"largest":[50],"reduction":[51,95],"in":[52,96],"droop.":[54],"Using":[55],"this":[56],"approach,":[57],"higher":[58],"target":[59],"frequencies":[61],"can":[62],"be":[63],"achieved":[64],"which":[65,83],"directly":[66],"reduce":[67],"test":[68,93],"time":[69,94],"and":[70],"cost.":[71],"Results":[72],"are":[73],"from":[75],"GPU":[77],"a":[79,91],"32-nm":[80],"APU":[81],"variable":[84],"were":[87],"applied":[88],"23.3%":[92],"high":[97],"volume":[98],"production.":[99]},"counts_by_year":[{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}