{"id":"https://openalex.org/W2050224073","doi":"https://doi.org/10.1109/test.2014.7035293","title":"Isometric test compression with low toggling activity","display_name":"Isometric test compression with low toggling activity","publication_year":2014,"publication_date":"2014-10-01","ids":{"openalex":"https://openalex.org/W2050224073","doi":"https://doi.org/10.1109/test.2014.7035293","mag":"2050224073"},"language":"en","primary_location":{"id":"doi:10.1109/test.2014.7035293","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2014.7035293","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 International Test Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5029407896","display_name":"Amit Kumar","orcid":"https://orcid.org/0000-0002-3965-6627"},"institutions":[{"id":"https://openalex.org/I126307644","display_name":"University of Iowa","ror":"https://ror.org/036jqmy94","country_code":"US","type":"education","lineage":["https://openalex.org/I126307644"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"A. Kumar","raw_affiliation_strings":["University of Iowa Iowa City, IA, USA","University of Iowa, 52242 USA"],"affiliations":[{"raw_affiliation_string":"University of Iowa Iowa City, IA, USA","institution_ids":["https://openalex.org/I126307644"]},{"raw_affiliation_string":"University of Iowa, 52242 USA","institution_ids":["https://openalex.org/I126307644"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088212941","display_name":"Mark Kassab","orcid":null},"institutions":[{"id":"https://openalex.org/I105695857","display_name":"Siemens (Hungary)","ror":"https://ror.org/01rk7mv85","country_code":"HU","type":"company","lineage":["https://openalex.org/I105695857","https://openalex.org/I1325886976"]},{"id":"https://openalex.org/I4210156212","display_name":"Mentor Technologies","ror":"https://ror.org/05vewsj04","country_code":"US","type":"other","lineage":["https://openalex.org/I4210156212"]}],"countries":["HU","US"],"is_corresponding":false,"raw_author_name":"M. Kassab","raw_affiliation_strings":["Mentor Graphics Corporation, Wilsonville, OR, USA","Mentor Graphics Corp., Wilsonville, OR 97070 USA"],"affiliations":[{"raw_affiliation_string":"Mentor Graphics Corporation, Wilsonville, OR, USA","institution_ids":["https://openalex.org/I4210156212"]},{"raw_affiliation_string":"Mentor Graphics Corp., Wilsonville, OR 97070 USA","institution_ids":["https://openalex.org/I105695857"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060680839","display_name":"Elham Moghaddam","orcid":"https://orcid.org/0000-0001-8697-9544"},"institutions":[{"id":"https://openalex.org/I4210156212","display_name":"Mentor Technologies","ror":"https://ror.org/05vewsj04","country_code":"US","type":"other","lineage":["https://openalex.org/I4210156212"]},{"id":"https://openalex.org/I105695857","display_name":"Siemens (Hungary)","ror":"https://ror.org/01rk7mv85","country_code":"HU","type":"company","lineage":["https://openalex.org/I105695857","https://openalex.org/I1325886976"]}],"countries":["HU","US"],"is_corresponding":false,"raw_author_name":"E. Moghaddam","raw_affiliation_strings":["Mentor Graphics Corporation, Wilsonville, OR, USA","Mentor Graphics Corp., Wilsonville, OR 97070 USA"],"affiliations":[{"raw_affiliation_string":"Mentor Graphics Corporation, Wilsonville, OR, USA","institution_ids":["https://openalex.org/I4210156212"]},{"raw_affiliation_string":"Mentor Graphics Corp., Wilsonville, OR 97070 USA","institution_ids":["https://openalex.org/I105695857"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075158519","display_name":"Nilanjan Mukherjee","orcid":"https://orcid.org/0000-0001-6689-7525"},"institutions":[{"id":"https://openalex.org/I4210156212","display_name":"Mentor Technologies","ror":"https://ror.org/05vewsj04","country_code":"US","type":"other","lineage":["https://openalex.org/I4210156212"]},{"id":"https://openalex.org/I105695857","display_name":"Siemens (Hungary)","ror":"https://ror.org/01rk7mv85","country_code":"HU","type":"company","lineage":["https://openalex.org/I105695857","https://openalex.org/I1325886976"]}],"countries":["HU","US"],"is_corresponding":false,"raw_author_name":"N. Mukherjee","raw_affiliation_strings":["Mentor Graphics Corporation, Wilsonville, OR, USA","Mentor Graphics Corp., Wilsonville, OR 97070 USA"],"affiliations":[{"raw_affiliation_string":"Mentor Graphics Corporation, Wilsonville, OR, USA","institution_ids":["https://openalex.org/I4210156212"]},{"raw_affiliation_string":"Mentor Graphics Corp., Wilsonville, OR 97070 USA","institution_ids":["https://openalex.org/I105695857"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080960636","display_name":"Janusz Rajski","orcid":"https://orcid.org/0000-0003-2124-447X"},"institutions":[{"id":"https://openalex.org/I105695857","display_name":"Siemens (Hungary)","ror":"https://ror.org/01rk7mv85","country_code":"HU","type":"company","lineage":["https://openalex.org/I105695857","https://openalex.org/I1325886976"]},{"id":"https://openalex.org/I4210156212","display_name":"Mentor Technologies","ror":"https://ror.org/05vewsj04","country_code":"US","type":"other","lineage":["https://openalex.org/I4210156212"]}],"countries":["HU","US"],"is_corresponding":false,"raw_author_name":"J. Rajski","raw_affiliation_strings":["Mentor Graphics Corporation, Wilsonville, OR, USA","Mentor Graphics Corp., Wilsonville, OR 97070 USA"],"affiliations":[{"raw_affiliation_string":"Mentor Graphics Corporation, Wilsonville, OR, USA","institution_ids":["https://openalex.org/I4210156212"]},{"raw_affiliation_string":"Mentor Graphics Corp., Wilsonville, OR 97070 USA","institution_ids":["https://openalex.org/I105695857"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077101123","display_name":"S.M. Reddy","orcid":"https://orcid.org/0000-0001-9208-8262"},"institutions":[{"id":"https://openalex.org/I126307644","display_name":"University of Iowa","ror":"https://ror.org/036jqmy94","country_code":"US","type":"education","lineage":["https://openalex.org/I126307644"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"S.M. Reddy","raw_affiliation_strings":["University of Iowa Iowa City, IA, USA","University of Iowa, 52242 USA"],"affiliations":[{"raw_affiliation_string":"University of Iowa Iowa City, IA, USA","institution_ids":["https://openalex.org/I126307644"]},{"raw_affiliation_string":"University of Iowa, 52242 USA","institution_ids":["https://openalex.org/I126307644"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072675590","display_name":"Jerzy Tyszer","orcid":"https://orcid.org/0000-0001-9722-2344"},"institutions":[{"id":"https://openalex.org/I46597724","display_name":"Pozna\u0144 University of Technology","ror":"https://ror.org/00p7p3302","country_code":"PL","type":"education","lineage":["https://openalex.org/I46597724"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"J. Tyszer","raw_affiliation_strings":["Poznan University of Technology, Pozna\u00f1, Poland","Pozna\u0144 University of Technology, 60-965, Poland"],"affiliations":[{"raw_affiliation_string":"Poznan University of Technology, Pozna\u00f1, Poland","institution_ids":["https://openalex.org/I46597724"]},{"raw_affiliation_string":"Pozna\u0144 University of Technology, 60-965, Poland","institution_ids":["https://openalex.org/I46597724"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5058949924","display_name":"C. Wang","orcid":null},"institutions":[{"id":"https://openalex.org/I105695857","display_name":"Siemens (Hungary)","ror":"https://ror.org/01rk7mv85","country_code":"HU","type":"company","lineage":["https://openalex.org/I105695857","https://openalex.org/I1325886976"]},{"id":"https://openalex.org/I4210156212","display_name":"Mentor Technologies","ror":"https://ror.org/05vewsj04","country_code":"US","type":"other","lineage":["https://openalex.org/I4210156212"]}],"countries":["HU","US"],"is_corresponding":false,"raw_author_name":"C. Wang","raw_affiliation_strings":["Mentor Graphics Corporation, Wilsonville, OR, USA","Mentor Graphics Corp., Wilsonville, OR 97070 USA"],"affiliations":[{"raw_affiliation_string":"Mentor Graphics Corporation, Wilsonville, OR, USA","institution_ids":["https://openalex.org/I4210156212"]},{"raw_affiliation_string":"Mentor Graphics Corp., Wilsonville, OR 97070 USA","institution_ids":["https://openalex.org/I105695857"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5029407896"],"corresponding_institution_ids":["https://openalex.org/I126307644"],"apc_list":null,"apc_paid":null,"fwci":1.5324,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.82721306,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":"31","issue":null,"first_page":"1","last_page":"7"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.972599983215332,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/cube","display_name":"Cube (algebra)","score":0.8335486054420471},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.7875064611434937},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7176095843315125},{"id":"https://openalex.org/keywords/compression","display_name":"Compression (physics)","score":0.6120882034301758},{"id":"https://openalex.org/keywords/test-compression","display_name":"Test compression","score":0.5752408504486084},{"id":"https://openalex.org/keywords/scheme","display_name":"Scheme (mathematics)","score":0.5723630785942078},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.49339690804481506},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.4742164611816406},{"id":"https://openalex.org/keywords/template","display_name":"Template","score":0.47307950258255005},{"id":"https://openalex.org/keywords/test-vector","display_name":"Test vector","score":0.45410120487213135},{"id":"https://openalex.org/keywords/data-compression","display_name":"Data compression","score":0.45246976613998413},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.44906654953956604},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.44235676527023315},{"id":"https://openalex.org/keywords/scan-chain","display_name":"Scan chain","score":0.43425628542900085},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4333422780036926},{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.4228877127170563},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.41387686133384705},{"id":"https://openalex.org/keywords/test-data","display_name":"Test data","score":0.4121990203857422},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.40699338912963867},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.18312495946884155},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.16652116179466248},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.16199564933776855},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.1585453748703003},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.12008154392242432},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.11783674359321594}],"concepts":[{"id":"https://openalex.org/C53051483","wikidata":"https://www.wikidata.org/wiki/Q861555","display_name":"Cube (algebra)","level":2,"score":0.8335486054420471},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.7875064611434937},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7176095843315125},{"id":"https://openalex.org/C180016635","wikidata":"https://www.wikidata.org/wiki/Q2712821","display_name":"Compression (physics)","level":2,"score":0.6120882034301758},{"id":"https://openalex.org/C29652920","wikidata":"https://www.wikidata.org/wiki/Q7705757","display_name":"Test compression","level":4,"score":0.5752408504486084},{"id":"https://openalex.org/C77618280","wikidata":"https://www.wikidata.org/wiki/Q1155772","display_name":"Scheme (mathematics)","level":2,"score":0.5723630785942078},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.49339690804481506},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.4742164611816406},{"id":"https://openalex.org/C82714645","wikidata":"https://www.wikidata.org/wiki/Q438331","display_name":"Template","level":2,"score":0.47307950258255005},{"id":"https://openalex.org/C100767440","wikidata":"https://www.wikidata.org/wiki/Q7705816","display_name":"Test vector","level":3,"score":0.45410120487213135},{"id":"https://openalex.org/C78548338","wikidata":"https://www.wikidata.org/wiki/Q2493","display_name":"Data compression","level":2,"score":0.45246976613998413},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.44906654953956604},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.44235676527023315},{"id":"https://openalex.org/C150012182","wikidata":"https://www.wikidata.org/wiki/Q225990","display_name":"Scan chain","level":3,"score":0.43425628542900085},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4333422780036926},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.4228877127170563},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.41387686133384705},{"id":"https://openalex.org/C16910744","wikidata":"https://www.wikidata.org/wiki/Q7705759","display_name":"Test data","level":2,"score":0.4121990203857422},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.40699338912963867},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.18312495946884155},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.16652116179466248},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.16199564933776855},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.1585453748703003},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.12008154392242432},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.11783674359321594},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C114614502","wikidata":"https://www.wikidata.org/wiki/Q76592","display_name":"Combinatorics","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C169903167","wikidata":"https://www.wikidata.org/wiki/Q3985153","display_name":"Test set","level":2,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2014.7035293","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2014.7035293","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 International Test Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure","score":0.47999998927116394}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":70,"referenced_works":["https://openalex.org/W992534570","https://openalex.org/W1014556330","https://openalex.org/W1037336624","https://openalex.org/W1488032639","https://openalex.org/W1517139843","https://openalex.org/W1557977552","https://openalex.org/W1562699972","https://openalex.org/W1569101961","https://openalex.org/W1589740774","https://openalex.org/W1590209153","https://openalex.org/W1763985980","https://openalex.org/W1843801354","https://openalex.org/W1900996732","https://openalex.org/W1966348745","https://openalex.org/W1967660531","https://openalex.org/W1978040115","https://openalex.org/W1979305473","https://openalex.org/W1985440524","https://openalex.org/W1987257369","https://openalex.org/W2001352955","https://openalex.org/W2006322321","https://openalex.org/W2011363932","https://openalex.org/W2023155196","https://openalex.org/W2096852695","https://openalex.org/W2099814124","https://openalex.org/W2101818740","https://openalex.org/W2101900253","https://openalex.org/W2102404182","https://openalex.org/W2104107023","https://openalex.org/W2109043970","https://openalex.org/W2110232289","https://openalex.org/W2113809744","https://openalex.org/W2121466258","https://openalex.org/W2125014350","https://openalex.org/W2127737927","https://openalex.org/W2128921091","https://openalex.org/W2131432014","https://openalex.org/W2132881562","https://openalex.org/W2135615172","https://openalex.org/W2135627440","https://openalex.org/W2136567303","https://openalex.org/W2137427575","https://openalex.org/W2138284668","https://openalex.org/W2138530143","https://openalex.org/W2140283778","https://openalex.org/W2144033909","https://openalex.org/W2144888713","https://openalex.org/W2150448461","https://openalex.org/W2150895785","https://openalex.org/W2157198810","https://openalex.org/W2159871346","https://openalex.org/W2160621850","https://openalex.org/W2165516518","https://openalex.org/W2168419390","https://openalex.org/W2169451209","https://openalex.org/W2169854732","https://openalex.org/W2210456985","https://openalex.org/W2269336381","https://openalex.org/W2270332701","https://openalex.org/W3035062237","https://openalex.org/W3141221995","https://openalex.org/W4254056430","https://openalex.org/W6631122638","https://openalex.org/W6635160734","https://openalex.org/W6639759450","https://openalex.org/W6675519197","https://openalex.org/W6678356202","https://openalex.org/W6680410900","https://openalex.org/W6681008240","https://openalex.org/W6684123354"],"related_works":["https://openalex.org/W4246671099","https://openalex.org/W2122643352","https://openalex.org/W2078848070","https://openalex.org/W2098411556","https://openalex.org/W2888456858","https://openalex.org/W2101853736","https://openalex.org/W2354343740","https://openalex.org/W2131499522","https://openalex.org/W2074302528","https://openalex.org/W2620614665"],"abstract_inverted_index":{"The":[0,9,45,77],"paper":[1],"presents":[2],"a":[3,13,18,23,34,57,96],"novel":[4],"test":[5,20,52,75,120],"data":[6],"compression":[7,82],"scheme.":[8],"invention":[10],"follows":[11],"from":[12],"fundamental":[14],"observation":[15],"that":[16],"in":[17,95,101],"typical":[19],"cube":[21],"only":[22],"small":[24],"portion":[25],"of":[26,38,117],"the":[27,39,61,118],"specified":[28],"positions":[29],"are":[30,48,123],"necessary":[31,46,62],"to":[32,50,59,67,71,84],"detect":[33],"fault,":[35],"and":[36,64,122],"most":[37],"remaining":[40],"ones":[41],"have":[42],"many":[43],"alternatives.":[44],"assignments":[47,63,70],"used":[49],"form":[51],"templates":[53],"which":[54],"both":[55],"control":[56],"decompressor":[58],"guarantee":[60],"guide":[65],"ATPG":[66],"find":[68],"alternative":[69],"produce":[72],"highly":[73],"compressible":[74],"cubes.":[76],"proposed":[78,119],"approach":[79],"synergistically":[80],"elevates":[81],"ratios":[83],"values":[85],"typically":[86],"unachievable":[87],"through":[88],"conventional":[89],"reseeding-based":[90],"solutions.":[91],"It":[92],"also":[93],"reduces,":[94],"user-controlled":[97],"manner,":[98],"switching":[99],"rates":[100],"scan":[102],"chains":[103],"with":[104],"minimal":[105],"hardware":[106],"modification.":[107],"Experimental":[108],"results":[109],"obtained":[110],"for":[111],"large":[112],"industrial":[113],"designs":[114],"illustrate":[115],"feasibility":[116],"scheme":[121],"reported":[124],"herein.":[125]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":3},{"year":2014,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}