{"id":"https://openalex.org/W2088797164","doi":"https://doi.org/10.1109/test.2014.7035281","title":"Practical random sampling of potential defects for analog fault simulation","display_name":"Practical random sampling of potential defects for analog fault simulation","publication_year":2014,"publication_date":"2014-10-01","ids":{"openalex":"https://openalex.org/W2088797164","doi":"https://doi.org/10.1109/test.2014.7035281","mag":"2088797164"},"language":"en","primary_location":{"id":"doi:10.1109/test.2014.7035281","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2014.7035281","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 International Test Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5063906167","display_name":"Stephen Sunter","orcid":null},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Stephen Sunter","raw_affiliation_strings":["Mentor Graphics, Ottawa, Canada","Mentor Graphics, Ottawa Canada"],"affiliations":[{"raw_affiliation_string":"Mentor Graphics, Ottawa, Canada","institution_ids":[]},{"raw_affiliation_string":"Mentor Graphics, Ottawa Canada","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068603918","display_name":"Krzysztof Jurga","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Krzysztof Jurga","raw_affiliation_strings":["Mentor Graphics, Poznan, Poland"],"affiliations":[{"raw_affiliation_string":"Mentor Graphics, Poznan, Poland","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066386719","display_name":"Peter Dingenen","orcid":null},"institutions":[{"id":"https://openalex.org/I100625452","display_name":"ON Semiconductor (United States)","ror":"https://ror.org/03nw6pt28","country_code":"US","type":"company","lineage":["https://openalex.org/I100625452"]},{"id":"https://openalex.org/I4210110772","display_name":"ON Semiconductor (Belgium)","ror":"https://ror.org/0212gej90","country_code":"BE","type":"company","lineage":["https://openalex.org/I100625452","https://openalex.org/I4210110772"]}],"countries":["BE","US"],"is_corresponding":false,"raw_author_name":"Peter Dingenen","raw_affiliation_strings":["ON Semiconductor, Belgium","[ON Semiconductor, Belgium]"],"affiliations":[{"raw_affiliation_string":"ON Semiconductor, Belgium","institution_ids":["https://openalex.org/I4210110772"]},{"raw_affiliation_string":"[ON Semiconductor, Belgium]","institution_ids":["https://openalex.org/I100625452"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5062808173","display_name":"Ronny Vanhooren","orcid":null},"institutions":[{"id":"https://openalex.org/I100625452","display_name":"ON Semiconductor (United States)","ror":"https://ror.org/03nw6pt28","country_code":"US","type":"company","lineage":["https://openalex.org/I100625452"]},{"id":"https://openalex.org/I4210110772","display_name":"ON Semiconductor (Belgium)","ror":"https://ror.org/0212gej90","country_code":"BE","type":"company","lineage":["https://openalex.org/I100625452","https://openalex.org/I4210110772"]}],"countries":["BE","US"],"is_corresponding":false,"raw_author_name":"Ronny Vanhooren","raw_affiliation_strings":["ON Semiconductor, Belgium","[ON Semiconductor, Belgium]"],"affiliations":[{"raw_affiliation_string":"ON Semiconductor, Belgium","institution_ids":["https://openalex.org/I4210110772"]},{"raw_affiliation_string":"[ON Semiconductor, Belgium]","institution_ids":["https://openalex.org/I100625452"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5063906167"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":6.3166,"has_fulltext":false,"cited_by_count":52,"citation_normalized_percentile":{"value":0.96812543,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"10"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9908999800682068,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.7427312731742859},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.623992383480072},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6174691319465637},{"id":"https://openalex.org/keywords/selection","display_name":"Selection (genetic algorithm)","score":0.6054072380065918},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.4357193410396576},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.43411874771118164},{"id":"https://openalex.org/keywords/analogue-electronics","display_name":"Analogue electronics","score":0.42742660641670227},{"id":"https://openalex.org/keywords/importance-sampling","display_name":"Importance sampling","score":0.413049578666687},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2348860204219818},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.231784850358963},{"id":"https://openalex.org/keywords/monte-carlo-method","display_name":"Monte Carlo method","score":0.16354992985725403},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.159507155418396},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.13782376050949097}],"concepts":[{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.7427312731742859},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.623992383480072},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6174691319465637},{"id":"https://openalex.org/C81917197","wikidata":"https://www.wikidata.org/wiki/Q628760","display_name":"Selection (genetic algorithm)","level":2,"score":0.6054072380065918},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.4357193410396576},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.43411874771118164},{"id":"https://openalex.org/C29074008","wikidata":"https://www.wikidata.org/wiki/Q174925","display_name":"Analogue electronics","level":3,"score":0.42742660641670227},{"id":"https://openalex.org/C52740198","wikidata":"https://www.wikidata.org/wiki/Q1539564","display_name":"Importance sampling","level":3,"score":0.413049578666687},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2348860204219818},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.231784850358963},{"id":"https://openalex.org/C19499675","wikidata":"https://www.wikidata.org/wiki/Q232207","display_name":"Monte Carlo method","level":2,"score":0.16354992985725403},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.159507155418396},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13782376050949097},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.0},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2014.7035281","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2014.7035281","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 International Test Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":29,"referenced_works":["https://openalex.org/W1686846969","https://openalex.org/W1791686945","https://openalex.org/W1970655797","https://openalex.org/W1988192422","https://openalex.org/W1993765721","https://openalex.org/W1998316224","https://openalex.org/W2014417962","https://openalex.org/W2054187805","https://openalex.org/W2057296358","https://openalex.org/W2061254534","https://openalex.org/W2073654891","https://openalex.org/W2098112833","https://openalex.org/W2098786960","https://openalex.org/W2101456051","https://openalex.org/W2109172132","https://openalex.org/W2112559786","https://openalex.org/W2120956034","https://openalex.org/W2139895946","https://openalex.org/W2146312921","https://openalex.org/W2146685901","https://openalex.org/W2148818967","https://openalex.org/W2155298777","https://openalex.org/W2156747864","https://openalex.org/W2165015944","https://openalex.org/W4231025771","https://openalex.org/W4235485521","https://openalex.org/W6648679001","https://openalex.org/W6669057211","https://openalex.org/W6845883598"],"related_works":["https://openalex.org/W4205762803","https://openalex.org/W2535856026","https://openalex.org/W2265065644","https://openalex.org/W2134699697","https://openalex.org/W3017188156","https://openalex.org/W2742914308","https://openalex.org/W3163522598","https://openalex.org/W2330004501","https://openalex.org/W2017089693","https://openalex.org/W2703295919"],"abstract_inverted_index":{"Analog":[0],"simulation":[1],"is":[2,11,36,46,82],"much":[3,126],"less":[4,96],"efficient":[5],"than":[6,120],"digital":[7,41],"simulation,":[8],"so":[9],"it":[10,81],"essential":[12],"to":[13,20],"reduce":[14],"the":[15,57,85],"number":[16],"of":[17,27,62,88,129],"potential":[18],"defects":[19,94,123],"be":[21,113],"simulated":[22],"when":[23],"assessing":[24],"defect":[25,58,109,135],"coverage":[26,59,110],"an":[28,47],"analog":[29,51],"circuit's":[30],"test.":[31],"Simple":[32],"random":[33],"sampling":[34,45,64],"(SRS)":[35],"a":[37,121],"published":[38],"technique":[39],"for":[40,50],"fault":[42,52],"sampling;":[43],"stratified":[44],"improvement":[48],"explored":[49],"simulation.":[53],"This":[54],"paper":[55],"compares":[56],"estimation":[60,86],"accuracy":[61,87,104],"several":[63],"techniques":[65],"and":[66,134],"our":[67],"improvements":[68],"based":[69],"on":[70],"defect-likelihood-weighted":[71],"selection,":[72,103],"as":[73,93],"measured":[74],"by":[75,117],"confidence":[76],"interval.":[77],"For":[78],"practical":[79],"cases,":[80],"shown":[83],"that":[84,108],"SRS":[89],"gets":[90],"progressively":[91],"worse":[92],"become":[95],"uniform":[97],"in":[98],"likelihood,":[99],"but":[100],"with":[101],"weighted":[102],"improves.":[105],"We":[106],"conclude":[107],"can":[111],"always":[112],"estimated":[114],"sufficiently":[115],"accurately":[116],"simulating":[118],"fewer":[119],"thousand":[122],"(and":[124],"usually":[125],"fewer),":[127],"regardless":[128],"circuit":[130],"size,":[131],"analog/digital":[132],"content,":[133],"likelihood":[136],"distribution.":[137]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":4},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":4},{"year":2019,"cited_by_count":5},{"year":2018,"cited_by_count":9},{"year":2017,"cited_by_count":6},{"year":2016,"cited_by_count":9},{"year":2015,"cited_by_count":5}],"updated_date":"2026-03-13T16:22:10.518609","created_date":"2025-10-10T00:00:00"}