{"id":"https://openalex.org/W2046775479","doi":"https://doi.org/10.1109/test.2014.7035277","title":"On the testing of hazard activated open defects","display_name":"On the testing of hazard activated open defects","publication_year":2014,"publication_date":"2014-10-01","ids":{"openalex":"https://openalex.org/W2046775479","doi":"https://doi.org/10.1109/test.2014.7035277","mag":"2046775479"},"language":"en","primary_location":{"id":"doi:10.1109/test.2014.7035277","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2014.7035277","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 International Test Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5066939989","display_name":"Chao Han","orcid":"https://orcid.org/0000-0002-8283-0184"},"institutions":[{"id":"https://openalex.org/I82497590","display_name":"Auburn University","ror":"https://ror.org/02v80fc35","country_code":"US","type":"education","lineage":["https://openalex.org/I82497590"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Chao Han","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Auburn University, Auburn, AL","Department of Electrical and Computer Engineering, Auburn University, AL 36849, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Auburn University, Auburn, AL","institution_ids":["https://openalex.org/I82497590"]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Auburn University, AL 36849, USA","institution_ids":["https://openalex.org/I82497590"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5104362993","display_name":"Adit D. Singh","orcid":null},"institutions":[{"id":"https://openalex.org/I82497590","display_name":"Auburn University","ror":"https://ror.org/02v80fc35","country_code":"US","type":"education","lineage":["https://openalex.org/I82497590"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Adit D. Singh","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Auburn University, Auburn, AL","Department of Electrical and Computer Engineering, Auburn University, AL 36849, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Auburn University, Auburn, AL","institution_ids":["https://openalex.org/I82497590"]},{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Auburn University, AL 36849, USA","institution_ids":["https://openalex.org/I82497590"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5066939989"],"corresponding_institution_ids":["https://openalex.org/I82497590"],"apc_list":null,"apc_paid":null,"fwci":1.256,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.82510461,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9483000040054321,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/hazard","display_name":"Hazard","score":0.4917629063129425},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.48293253779411316},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3630937933921814},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.1495763659477234},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.14888671040534973}],"concepts":[{"id":"https://openalex.org/C49261128","wikidata":"https://www.wikidata.org/wiki/Q1132455","display_name":"Hazard","level":2,"score":0.4917629063129425},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.48293253779411316},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3630937933921814},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.1495763659477234},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14888671040534973},{"id":"https://openalex.org/C178790620","wikidata":"https://www.wikidata.org/wiki/Q11351","display_name":"Organic chemistry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2014.7035277","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2014.7035277","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 International Test Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1581327216","https://openalex.org/W1969903927","https://openalex.org/W2043905562","https://openalex.org/W2069802878","https://openalex.org/W2085661058","https://openalex.org/W2099766762","https://openalex.org/W2106884550","https://openalex.org/W2112559786","https://openalex.org/W2125792382","https://openalex.org/W2156443301","https://openalex.org/W2159209860","https://openalex.org/W2170093219","https://openalex.org/W2171020103","https://openalex.org/W6678738400"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W2358668433","https://openalex.org/W4396701345","https://openalex.org/W2376932109","https://openalex.org/W2001405890","https://openalex.org/W4396696052","https://openalex.org/W4402327032","https://openalex.org/W2382290278"],"abstract_inverted_index":{"Open":[0],"defects":[1,25,113,158,194,239],"in":[2,52,133,173,182,209,213,277,288],"CMOS":[3,120],"circuits":[4,121],"can":[5,155,208],"cause":[6,216],"a":[7,13,75,101,123,161,183,231,249,285],"gate":[8,163,180],"output":[9,164,181],"to":[10,35,59,80,109,165,188,199,261],"go":[11],"into":[12],"high":[14,76,184,263],"impedance,":[15],"or":[16,95],"\u201cfloating\u201d":[17],"mode,":[18],"for":[19,234],"some":[20],"input":[21],"patterns.":[22],"Since":[23],"such":[24],"display":[26],"(large)":[27],"delay":[28],"fault":[29],"behavior,":[30],"they":[31],"are":[32,49,100,196,276],"commonly":[33,197],"assumed":[34,198],"be":[36,200,211,221],"covered":[37],"during":[38,128,223],"structural":[39],"testing":[40],"by":[41,146,159],"scan":[42,56,78],"based":[43,203],"TDF":[44,47],"timing":[45,64,85,89],"tests.":[46,86,225],"tests":[48,90],"generally":[50],"applied":[51],"the":[53,62,175,179,189,256,272,289],"launch-on-capture":[54],"(LOC)":[55],"test":[57,258],"mode":[58],"avoid":[60],"\u201covertesting\u201d":[61],"circuit":[63,118,141,217],"from":[65,91,150],"non-functional":[66],"launch":[67,259],"states;":[68],"also":[69,248],"many":[70,134,192],"designs":[71],"do":[72,282],"not":[73,107,241,283],"support":[74],"speed":[77],"enable":[79],"allow":[81],"at-speed":[82],"launch-on-shift":[83],"(LOS)":[84],"Unfortunately,":[87],"launching":[88],"functional":[92,104,151],"states":[93,98,260],"alone,":[94],"even":[96,287],"LOC":[97,243],"(which":[99],"superset":[102],"of":[103,115,126,271,291],"states),":[105],"is":[106,170],"sufficient":[108],"screen":[110],"all":[111,270],"open":[112,157,193,238],"capable":[114],"generating":[116],"erroneous":[117],"outputs.":[119],"experience":[122],"large":[124],"number":[125],"hazards":[127,154],"switching":[129],"transitions,":[130],"which":[131,169],"result":[132],"more":[135],"transient":[136],"logic":[137],"levels":[138],"at":[139],"internal":[140],"nodes":[142],"than":[143],"those":[144],"predicted":[145],"steady":[147,205],"state":[148,186,206],"analysis":[149],"states.":[152],"Such":[153],"activate":[156],"precharging":[160],"faulty":[162],"an":[166],"incorrect":[167],"value":[168],"then":[171],"locked":[172],"once":[174],"inputs":[176],"stabilize":[177],"with":[178],"impedance":[185],"due":[187],"open.":[190],"Consequently,":[191],"that":[195,253,268],"functionally":[201],"redundant":[202],"on":[204],"analysis,":[207],"fact":[210,278],"activated":[212,237],"operation":[214],"and":[215,244,281],"failure.":[218],"These":[219],"must":[220],"targeted":[222],"manufacturing":[224],"In":[226],"this":[227],"paper":[228],"we":[229],"present":[230],"deterministic":[232],"methodology":[233],"targeting":[235],"hazard":[236],"using":[240],"only":[242],"LOS":[245],"tests,":[246],"but":[247],"new":[250],"DFT":[251],"approach":[252],"further":[254,266],"increases":[255],"available":[257],"achieve":[262],"coverage.":[264],"We":[265],"show":[267],"virtually":[269],"remaining":[273],"undetected":[274],"opens":[275],"truly":[279],"redundant,":[280],"pose":[284],"threat":[286],"presence":[290],"hazards.":[292]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}