{"id":"https://openalex.org/W2015108039","doi":"https://doi.org/10.1109/test.2013.6651929","title":"Diagnosis and Layout Aware (DLA) scan chain stitching","display_name":"Diagnosis and Layout Aware (DLA) scan chain stitching","publication_year":2013,"publication_date":"2013-09-01","ids":{"openalex":"https://openalex.org/W2015108039","doi":"https://doi.org/10.1109/test.2013.6651929","mag":"2015108039"},"language":"en","primary_location":{"id":"doi:10.1109/test.2013.6651929","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2013.6651929","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE International Test Conference (ITC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100394414","display_name":"Jing Ye","orcid":"https://orcid.org/0000-0002-8023-5090"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210090176","display_name":"Institute of Computing Technology","ror":"https://ror.org/0090r4d87","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210090176"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jing Ye","raw_affiliation_strings":["State Key Laboratory of Computer Architecture, Institute of Computing Technology, Beijing, P. R. China","State Key Laboratory of Computer Architecture, Institute of Computing Technology, Chinese Academy of Sciences, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Computer Architecture, Institute of Computing Technology, Beijing, P. R. China","institution_ids":["https://openalex.org/I4210090176"]},{"raw_affiliation_string":"State Key Laboratory of Computer Architecture, Institute of Computing Technology, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210090176","https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101775144","display_name":"Yu Huang","orcid":"https://orcid.org/0000-0003-2619-4686"},"institutions":[{"id":"https://openalex.org/I4210156212","display_name":"Mentor Technologies","ror":"https://ror.org/05vewsj04","country_code":"US","type":"other","lineage":["https://openalex.org/I4210156212"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yu Huang","raw_affiliation_strings":["Silicon Test Solutions, Mentor Graphics Corp., Wilsonville, OR, USA","[Silicon Test Solutions, Mentor Graphics Corporation, Wilsonville, OR, USA]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Silicon Test Solutions, Mentor Graphics Corp., Wilsonville, OR, USA","institution_ids":["https://openalex.org/I4210156212"]},{"raw_affiliation_string":"[Silicon Test Solutions, Mentor Graphics Corporation, Wilsonville, OR, USA]","institution_ids":["https://openalex.org/I4210156212"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100721270","display_name":"Yu Hu","orcid":"https://orcid.org/0000-0001-8818-4075"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210090176","display_name":"Institute of Computing Technology","ror":"https://ror.org/0090r4d87","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210090176"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yu Hu","raw_affiliation_strings":["State Key Laboratory of Computer Architecture, Institute of Computing Technology, Beijing, P. R. China","State Key Laboratory of Computer Architecture, Institute of Computing Technology, Chinese Academy of Sciences, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Computer Architecture, Institute of Computing Technology, Beijing, P. R. China","institution_ids":["https://openalex.org/I4210090176"]},{"raw_affiliation_string":"State Key Laboratory of Computer Architecture, Institute of Computing Technology, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210090176","https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020407423","display_name":"Wu-Tung Cheng","orcid":"https://orcid.org/0000-0001-6327-2394"},"institutions":[{"id":"https://openalex.org/I4210156212","display_name":"Mentor Technologies","ror":"https://ror.org/05vewsj04","country_code":"US","type":"other","lineage":["https://openalex.org/I4210156212"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Wu-Tung Cheng","raw_affiliation_strings":["Silicon Test Solutions, Mentor Graphics Corp., Wilsonville, OR, USA","[Silicon Test Solutions, Mentor Graphics Corporation, Wilsonville, OR, USA]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Silicon Test Solutions, Mentor Graphics Corp., Wilsonville, OR, USA","institution_ids":["https://openalex.org/I4210156212"]},{"raw_affiliation_string":"[Silicon Test Solutions, Mentor Graphics Corporation, Wilsonville, OR, USA]","institution_ids":["https://openalex.org/I4210156212"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019655330","display_name":"Ruifeng Guo","orcid":"https://orcid.org/0009-0000-9075-1884"},"institutions":[{"id":"https://openalex.org/I4210156212","display_name":"Mentor Technologies","ror":"https://ror.org/05vewsj04","country_code":"US","type":"other","lineage":["https://openalex.org/I4210156212"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ruifeng Guo","raw_affiliation_strings":["Silicon Test Solutions, Mentor Graphics Corp., Wilsonville, OR, USA","[Silicon Test Solutions, Mentor Graphics Corporation, Wilsonville, OR, USA]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Silicon Test Solutions, Mentor Graphics Corp., Wilsonville, OR, USA","institution_ids":["https://openalex.org/I4210156212"]},{"raw_affiliation_string":"[Silicon Test Solutions, Mentor Graphics Corporation, Wilsonville, OR, USA]","institution_ids":["https://openalex.org/I4210156212"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080887026","display_name":"Liyang Lai","orcid":"https://orcid.org/0000-0003-1041-8980"},"institutions":[{"id":"https://openalex.org/I4210156212","display_name":"Mentor Technologies","ror":"https://ror.org/05vewsj04","country_code":"US","type":"other","lineage":["https://openalex.org/I4210156212"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Liyang Lai","raw_affiliation_strings":["Silicon Test Solutions, Mentor Graphics Corp., Wilsonville, OR, USA","[Silicon Test Solutions, Mentor Graphics Corporation, Wilsonville, OR, USA]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Silicon Test Solutions, Mentor Graphics Corp., Wilsonville, OR, USA","institution_ids":["https://openalex.org/I4210156212"]},{"raw_affiliation_string":"[Silicon Test Solutions, Mentor Graphics Corporation, Wilsonville, OR, USA]","institution_ids":["https://openalex.org/I4210156212"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109610004","display_name":"Ting-Pu Tai","orcid":null},"institutions":[{"id":"https://openalex.org/I4210156212","display_name":"Mentor Technologies","ror":"https://ror.org/05vewsj04","country_code":"US","type":"other","lineage":["https://openalex.org/I4210156212"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ting-Pu Tai","raw_affiliation_strings":["Silicon Test Solutions, Mentor Graphics Corp., Wilsonville, OR, USA","[Silicon Test Solutions, Mentor Graphics Corporation, Wilsonville, OR, USA]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Silicon Test Solutions, Mentor Graphics Corp., Wilsonville, OR, USA","institution_ids":["https://openalex.org/I4210156212"]},{"raw_affiliation_string":"[Silicon Test Solutions, Mentor Graphics Corporation, Wilsonville, OR, USA]","institution_ids":["https://openalex.org/I4210156212"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5023380073","display_name":"Xiaowei Li","orcid":"https://orcid.org/0000-0002-0874-814X"},"institutions":[{"id":"https://openalex.org/I19820366","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35","country_code":"CN","type":"government","lineage":["https://openalex.org/I19820366"]},{"id":"https://openalex.org/I4210090176","display_name":"Institute of Computing Technology","ror":"https://ror.org/0090r4d87","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210090176"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaowei Li","raw_affiliation_strings":["State Key Laboratory of Computer Architecture, Institute of Computing Technology, Beijing, P. R. China","State Key Laboratory of Computer Architecture, Institute of Computing Technology, Chinese Academy of Sciences, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"State Key Laboratory of Computer Architecture, Institute of Computing Technology, Beijing, P. R. China","institution_ids":["https://openalex.org/I4210090176"]},{"raw_affiliation_string":"State Key Laboratory of Computer Architecture, Institute of Computing Technology, Chinese Academy of Sciences, Beijing, China","institution_ids":["https://openalex.org/I4210090176","https://openalex.org/I19820366"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5052308644","display_name":"Wei-Pin Changchien","orcid":null},"institutions":[{"id":"https://openalex.org/I1334877674","display_name":"Taiwan Semiconductor Manufacturing Company (United States)","ror":"https://ror.org/02rvfjx92","country_code":"US","type":"company","lineage":["https://openalex.org/I1334877674","https://openalex.org/I4210120917"]},{"id":"https://openalex.org/I4210120917","display_name":"Taiwan Semiconductor Manufacturing Company (Taiwan)","ror":"https://ror.org/02wx79d08","country_code":"TW","type":"company","lineage":["https://openalex.org/I4210120917"]}],"countries":["TW","US"],"is_corresponding":false,"raw_author_name":"Weipin Changchien","raw_affiliation_strings":["Hsinchu Science Park, Taiwan Semiconductor Manufacturing Company, Hsinchu, Taiwan","[Taiwan Semiconductor Manufacturing Company, Hsinchu, Taiwan.]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hsinchu Science Park, Taiwan Semiconductor Manufacturing Company, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210120917"]},{"raw_affiliation_string":"[Taiwan Semiconductor Manufacturing Company, Hsinchu, Taiwan.]","institution_ids":["https://openalex.org/I1334877674"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5062563998","display_name":"Daw-Ming Lee","orcid":null},"institutions":[{"id":"https://openalex.org/I1334877674","display_name":"Taiwan Semiconductor Manufacturing Company (United States)","ror":"https://ror.org/02rvfjx92","country_code":"US","type":"company","lineage":["https://openalex.org/I1334877674","https://openalex.org/I4210120917"]},{"id":"https://openalex.org/I4210120917","display_name":"Taiwan Semiconductor Manufacturing Company (Taiwan)","ror":"https://ror.org/02wx79d08","country_code":"TW","type":"company","lineage":["https://openalex.org/I4210120917"]}],"countries":["TW","US"],"is_corresponding":false,"raw_author_name":"Daw-Ming Lee","raw_affiliation_strings":["Hsinchu Science Park, Taiwan Semiconductor Manufacturing Company, Hsinchu, Taiwan","[Taiwan Semiconductor Manufacturing Company, Hsinchu, Taiwan.]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hsinchu Science Park, Taiwan Semiconductor Manufacturing Company, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210120917"]},{"raw_affiliation_string":"[Taiwan Semiconductor Manufacturing Company, Hsinchu, Taiwan.]","institution_ids":["https://openalex.org/I1334877674"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063980328","display_name":"Ji-Jan Chen","orcid":null},"institutions":[{"id":"https://openalex.org/I1334877674","display_name":"Taiwan Semiconductor Manufacturing Company (United States)","ror":"https://ror.org/02rvfjx92","country_code":"US","type":"company","lineage":["https://openalex.org/I1334877674","https://openalex.org/I4210120917"]},{"id":"https://openalex.org/I4210120917","display_name":"Taiwan Semiconductor Manufacturing Company (Taiwan)","ror":"https://ror.org/02wx79d08","country_code":"TW","type":"company","lineage":["https://openalex.org/I4210120917"]}],"countries":["TW","US"],"is_corresponding":false,"raw_author_name":"Ji-Jan Chen","raw_affiliation_strings":["Hsinchu Science Park, Taiwan Semiconductor Manufacturing Company, Hsinchu, Taiwan","[Taiwan Semiconductor Manufacturing Company, Hsinchu, Taiwan.]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hsinchu Science Park, Taiwan Semiconductor Manufacturing Company, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210120917"]},{"raw_affiliation_string":"[Taiwan Semiconductor Manufacturing Company, Hsinchu, Taiwan.]","institution_ids":["https://openalex.org/I1334877674"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013898643","display_name":"Sandeep C. Eruvathi","orcid":null},"institutions":[{"id":"https://openalex.org/I1334877674","display_name":"Taiwan Semiconductor Manufacturing Company (United States)","ror":"https://ror.org/02rvfjx92","country_code":"US","type":"company","lineage":["https://openalex.org/I1334877674","https://openalex.org/I4210120917"]},{"id":"https://openalex.org/I4210120917","display_name":"Taiwan Semiconductor Manufacturing Company (Taiwan)","ror":"https://ror.org/02wx79d08","country_code":"TW","type":"company","lineage":["https://openalex.org/I4210120917"]}],"countries":["TW","US"],"is_corresponding":false,"raw_author_name":"Sandeep C. Eruvathi","raw_affiliation_strings":["Hsinchu Science Park, Taiwan Semiconductor Manufacturing Company, Hsinchu, Taiwan","[Taiwan Semiconductor Manufacturing Company, Hsinchu, Taiwan.]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hsinchu Science Park, Taiwan Semiconductor Manufacturing Company, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210120917"]},{"raw_affiliation_string":"[Taiwan Semiconductor Manufacturing Company, Hsinchu, Taiwan.]","institution_ids":["https://openalex.org/I1334877674"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032073560","display_name":"Kartik K. Kumara","orcid":null},"institutions":[{"id":"https://openalex.org/I1334877674","display_name":"Taiwan Semiconductor Manufacturing Company (United States)","ror":"https://ror.org/02rvfjx92","country_code":"US","type":"company","lineage":["https://openalex.org/I1334877674","https://openalex.org/I4210120917"]},{"id":"https://openalex.org/I4210120917","display_name":"Taiwan Semiconductor Manufacturing Company (Taiwan)","ror":"https://ror.org/02wx79d08","country_code":"TW","type":"company","lineage":["https://openalex.org/I4210120917"]}],"countries":["TW","US"],"is_corresponding":false,"raw_author_name":"Kartik K. Kumara","raw_affiliation_strings":["Hsinchu Science Park, Taiwan Semiconductor Manufacturing Company, Hsinchu, Taiwan","[Taiwan Semiconductor Manufacturing Company, Hsinchu, Taiwan.]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hsinchu Science Park, Taiwan Semiconductor Manufacturing Company, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210120917"]},{"raw_affiliation_string":"[Taiwan Semiconductor Manufacturing Company, Hsinchu, Taiwan.]","institution_ids":["https://openalex.org/I1334877674"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5016156250","display_name":"Charles Y. Liu","orcid":"https://orcid.org/0000-0001-6423-8577"},"institutions":[{"id":"https://openalex.org/I1334877674","display_name":"Taiwan Semiconductor Manufacturing Company (United States)","ror":"https://ror.org/02rvfjx92","country_code":"US","type":"company","lineage":["https://openalex.org/I1334877674","https://openalex.org/I4210120917"]},{"id":"https://openalex.org/I4210120917","display_name":"Taiwan Semiconductor Manufacturing Company (Taiwan)","ror":"https://ror.org/02wx79d08","country_code":"TW","type":"company","lineage":["https://openalex.org/I4210120917"]}],"countries":["TW","US"],"is_corresponding":false,"raw_author_name":"Charles Liu","raw_affiliation_strings":["Hsinchu Science Park, Taiwan Semiconductor Manufacturing Company, Hsinchu, Taiwan","[Taiwan Semiconductor Manufacturing Company, Hsinchu, Taiwan.]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hsinchu Science Park, Taiwan Semiconductor Manufacturing Company, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210120917"]},{"raw_affiliation_string":"[Taiwan Semiconductor Manufacturing Company, Hsinchu, Taiwan.]","institution_ids":["https://openalex.org/I1334877674"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5102167404","display_name":"Sam Pan","orcid":null},"institutions":[{"id":"https://openalex.org/I1334877674","display_name":"Taiwan Semiconductor Manufacturing Company (United States)","ror":"https://ror.org/02rvfjx92","country_code":"US","type":"company","lineage":["https://openalex.org/I1334877674","https://openalex.org/I4210120917"]},{"id":"https://openalex.org/I4210120917","display_name":"Taiwan Semiconductor Manufacturing Company (Taiwan)","ror":"https://ror.org/02wx79d08","country_code":"TW","type":"company","lineage":["https://openalex.org/I4210120917"]}],"countries":["TW","US"],"is_corresponding":false,"raw_author_name":"Sam Pan","raw_affiliation_strings":["Hsinchu Science Park, Taiwan Semiconductor Manufacturing Company, Hsinchu, Taiwan","[Taiwan Semiconductor Manufacturing Company, Hsinchu, Taiwan.]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hsinchu Science Park, Taiwan Semiconductor Manufacturing Company, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210120917"]},{"raw_affiliation_string":"[Taiwan Semiconductor Manufacturing Company, Hsinchu, Taiwan.]","institution_ids":["https://openalex.org/I1334877674"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":15,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.9515,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.75439201,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":"25","issue":null,"first_page":"1","last_page":"10"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","score":0.9983000159263611,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/image-stitching","display_name":"Image stitching","score":0.9534645080566406},{"id":"https://openalex.org/keywords/scan-chain","display_name":"Scan chain","score":0.8589335680007935},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6468596458435059},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.6390860676765442},{"id":"https://openalex.org/keywords/resolution","display_name":"Resolution (logic)","score":0.5537470579147339},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.4411258399486542},{"id":"https://openalex.org/keywords/scan-line","display_name":"Scan line","score":0.41768965125083923},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.41741806268692017},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3550143837928772},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.32778388261795044},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.29002243280410767},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.2627195715904236},{"id":"https://openalex.org/keywords/pixel","display_name":"Pixel","score":0.1327521800994873},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.11754310131072998},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.07432189583778381}],"concepts":[{"id":"https://openalex.org/C29081049","wikidata":"https://www.wikidata.org/wiki/Q1364242","display_name":"Image stitching","level":2,"score":0.9534645080566406},{"id":"https://openalex.org/C150012182","wikidata":"https://www.wikidata.org/wiki/Q225990","display_name":"Scan chain","level":3,"score":0.8589335680007935},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6468596458435059},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.6390860676765442},{"id":"https://openalex.org/C138268822","wikidata":"https://www.wikidata.org/wiki/Q1051925","display_name":"Resolution (logic)","level":2,"score":0.5537470579147339},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.4411258399486542},{"id":"https://openalex.org/C142748172","wikidata":"https://www.wikidata.org/wiki/Q3240002","display_name":"Scan line","level":4,"score":0.41768965125083923},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.41741806268692017},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3550143837928772},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.32778388261795044},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.29002243280410767},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.2627195715904236},{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.1327521800994873},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.11754310131072998},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.07432189583778381},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C78201319","wikidata":"https://www.wikidata.org/wiki/Q685727","display_name":"Grayscale","level":3,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2013.6651929","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2013.6651929","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE International Test Conference (ITC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","score":0.6399999856948853,"id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":59,"referenced_works":["https://openalex.org/W1521778956","https://openalex.org/W1835662651","https://openalex.org/W1971016512","https://openalex.org/W1992804472","https://openalex.org/W2008800734","https://openalex.org/W2023611416","https://openalex.org/W2024060531","https://openalex.org/W2025078381","https://openalex.org/W2037589385","https://openalex.org/W2089642511","https://openalex.org/W2102485710","https://openalex.org/W2103018851","https://openalex.org/W2103573206","https://openalex.org/W2108361034","https://openalex.org/W2110164501","https://openalex.org/W2110731889","https://openalex.org/W2111702018","https://openalex.org/W2113302182","https://openalex.org/W2113382110","https://openalex.org/W2119597189","https://openalex.org/W2122520060","https://openalex.org/W2123072391","https://openalex.org/W2130044303","https://openalex.org/W2130439920","https://openalex.org/W2132430481","https://openalex.org/W2136360046","https://openalex.org/W2139664386","https://openalex.org/W2144727130","https://openalex.org/W2144980415","https://openalex.org/W2148277259","https://openalex.org/W2149546205","https://openalex.org/W2153923571","https://openalex.org/W2155038322","https://openalex.org/W2157200201","https://openalex.org/W2160713416","https://openalex.org/W2160843080","https://openalex.org/W2163721513","https://openalex.org/W2164994924","https://openalex.org/W2167258210","https://openalex.org/W2167428122","https://openalex.org/W2168662307","https://openalex.org/W2170538292","https://openalex.org/W2297395784","https://openalex.org/W3115008418","https://openalex.org/W3117049843","https://openalex.org/W3118935120","https://openalex.org/W4231670536","https://openalex.org/W6647978404","https://openalex.org/W6669005560","https://openalex.org/W6675181658","https://openalex.org/W6675422323","https://openalex.org/W6678335153","https://openalex.org/W6678830865","https://openalex.org/W6682082474","https://openalex.org/W6682481907","https://openalex.org/W6683494264","https://openalex.org/W6685022266","https://openalex.org/W6697634807","https://openalex.org/W6787420993"],"related_works":["https://openalex.org/W2143881398","https://openalex.org/W2118952760","https://openalex.org/W2075356617","https://openalex.org/W1974621628","https://openalex.org/W2274367941","https://openalex.org/W2121956161","https://openalex.org/W2390529848","https://openalex.org/W2763030692","https://openalex.org/W2092894550","https://openalex.org/W2073042086"],"abstract_inverted_index":{"Without":[0],"appropriate":[1],"stitching":[2,41,89,127],"of":[3,62],"scan":[4,21,39,50,64,77,81,90,125,140],"chains,":[5],"even":[6,152],"with":[7,117,133],"good":[8],"diagnosis":[9],"algorithm":[10],"and":[11,35,47,108,145],"diagnostic":[12,23,28,70],"pattern":[13,45],"generation,":[14],"it":[15],"may":[16],"still":[17],"result":[18],"in":[19],"bad":[20],"chain":[22,40,126],"resolution.":[24],"To":[25],"improve":[26],"the":[27,60,75,80,85,100,122,131,162],"resolution,":[29,132],"we":[30],"propose":[31],"a":[32,109],"novel":[33],"Diagnosis":[34],"Layout":[36],"Aware":[37],"(DLA)":[38],"method,":[42],"which":[43,66],"is":[44,53],"independent":[46],"supports":[48],"embedded":[49,139],"compaction.":[51],"It":[52],"based":[54,92,113],"on":[55,93,104,114,136],"three":[56],"ideas:":[57],"(1)":[58],"increasing":[59],"number":[61],"sensitive":[63,76],"cells,":[65],"can":[67],"capture":[68],"useful":[69],"information;":[71],"(2)":[72],"properly":[73],"distributing":[74],"cells":[78,91],"along":[79],"chains":[82],"to":[83,98,159],"enhance":[84],"overall":[86],"resolution;":[87],"(3)":[88],"their":[94],"placement":[95],"at":[96],"layout":[97],"preserve":[99],"chip":[101,137],"performance.":[102],"Experiments":[103],"ISCAS'89/ITC'99":[105],"benchmark":[106],"circuits":[107],"real":[110],"industry":[111],"circuit":[112],"20nm":[115],"technology":[116],"silicon":[118,150],"results":[119,151],"show":[120,153],"that,":[121],"proposed":[123,163],"DLA":[124],"method":[128],"effectively":[129],"improves":[130],"negligible":[134],"impact":[135],"performance,":[138],"compaction,":[141],"transition":[142],"fault":[143],"coverage,":[144],"test":[146],"power":[147],"dissipation.":[148],"The":[149],"7X":[154],"average":[155],"resolution":[156],"improvement":[157],"comparing":[158],"without":[160],"using":[161],"method.":[164]},"counts_by_year":[{"year":2016,"cited_by_count":2},{"year":2014,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}