{"id":"https://openalex.org/W2033750734","doi":"https://doi.org/10.1109/test.2013.6651924","title":"Representative critical-path selection for aging-induced delay monitoring","display_name":"Representative critical-path selection for aging-induced delay monitoring","publication_year":2013,"publication_date":"2013-09-01","ids":{"openalex":"https://openalex.org/W2033750734","doi":"https://doi.org/10.1109/test.2013.6651924","mag":"2033750734"},"language":"en","primary_location":{"id":"doi:10.1109/test.2013.6651924","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2013.6651924","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE International Test Conference (ITC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5018615087","display_name":"Farshad Firouzi","orcid":"https://orcid.org/0000-0002-8359-4304"},"institutions":[{"id":"https://openalex.org/I102335020","display_name":"Karlsruhe Institute of Technology","ror":"https://ror.org/04t3en479","country_code":"DE","type":"education","lineage":["https://openalex.org/I102335020","https://openalex.org/I1305996414"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Farshad Firouzi","raw_affiliation_strings":["Karlsruhe Institute of Technology, Germany","Karlsruhe Institute of Technology, Karlsruhe,#N#Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Karlsruhe Institute of Technology, Germany","institution_ids":["https://openalex.org/I102335020"]},{"raw_affiliation_string":"Karlsruhe Institute of Technology, Karlsruhe,#N#Germany","institution_ids":["https://openalex.org/I102335020"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018889229","display_name":"Fangming Ye","orcid":null},"institutions":[{"id":"https://openalex.org/I170897317","display_name":"Duke University","ror":"https://ror.org/00py81415","country_code":"US","type":"education","lineage":["https://openalex.org/I170897317"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Fangming Ye","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Duke University, Durham, NC, USA","Dept. of Electr. & Comput. Eng., Duke Univ., Durham, NC, USA#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Duke University, Durham, NC, USA","institution_ids":["https://openalex.org/I170897317"]},{"raw_affiliation_string":"Dept. of Electr. & Comput. Eng., Duke Univ., Durham, NC, USA#TAB#","institution_ids":["https://openalex.org/I170897317"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033880864","display_name":"Krishnendu Chakrabarty","orcid":"https://orcid.org/0000-0003-4475-6435"},"institutions":[{"id":"https://openalex.org/I170897317","display_name":"Duke University","ror":"https://ror.org/00py81415","country_code":"US","type":"education","lineage":["https://openalex.org/I170897317"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Krishnendu Chakrabarty","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Duke University, Durham, NC, USA","Dept. of Electr. & Comput. Eng., Duke Univ., Durham, NC, USA#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Duke University, Durham, NC, USA","institution_ids":["https://openalex.org/I170897317"]},{"raw_affiliation_string":"Dept. of Electr. & Comput. Eng., Duke Univ., Durham, NC, USA#TAB#","institution_ids":["https://openalex.org/I170897317"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5064445713","display_name":"Mehdi B. Tahoori","orcid":"https://orcid.org/0000-0002-8829-5610"},"institutions":[{"id":"https://openalex.org/I102335020","display_name":"Karlsruhe Institute of Technology","ror":"https://ror.org/04t3en479","country_code":"DE","type":"education","lineage":["https://openalex.org/I102335020","https://openalex.org/I1305996414"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Mehdi B. Tahoori","raw_affiliation_strings":["Karlsruhe Institute of Technology, Germany","Karlsruhe Institute of Technology, Karlsruhe,#N#Germany"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Karlsruhe Institute of Technology, Germany","institution_ids":["https://openalex.org/I102335020"]},{"raw_affiliation_string":"Karlsruhe Institute of Technology, Karlsruhe,#N#Germany","institution_ids":["https://openalex.org/I102335020"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":4.0806,"has_fulltext":false,"cited_by_count":32,"citation_normalized_percentile":{"value":0.94260142,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"10"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/path","display_name":"Path (computing)","score":0.6657701134681702},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6513333916664124},{"id":"https://openalex.org/keywords/critical-path-method","display_name":"Critical path method","score":0.6186530590057373},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.5898141860961914},{"id":"https://openalex.org/keywords/static-timing-analysis","display_name":"Static timing analysis","score":0.5731952786445618},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.5651869773864746},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5617459416389465},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4535577595233917},{"id":"https://openalex.org/keywords/selection","display_name":"Selection (genetic algorithm)","score":0.4495641887187958},{"id":"https://openalex.org/keywords/tracking","display_name":"Tracking (education)","score":0.4142473042011261},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.3220323324203491},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.2545374035835266},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.15618231892585754},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.15219593048095703},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.13620790839195251},{"id":"https://openalex.org/keywords/computer-network","display_name":"Computer network","score":0.09467950463294983},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.09432342648506165}],"concepts":[{"id":"https://openalex.org/C2777735758","wikidata":"https://www.wikidata.org/wiki/Q817765","display_name":"Path (computing)","level":2,"score":0.6657701134681702},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6513333916664124},{"id":"https://openalex.org/C115874739","wikidata":"https://www.wikidata.org/wiki/Q825377","display_name":"Critical path method","level":2,"score":0.6186530590057373},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.5898141860961914},{"id":"https://openalex.org/C93682380","wikidata":"https://www.wikidata.org/wiki/Q2025226","display_name":"Static timing analysis","level":2,"score":0.5731952786445618},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.5651869773864746},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5617459416389465},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4535577595233917},{"id":"https://openalex.org/C81917197","wikidata":"https://www.wikidata.org/wiki/Q628760","display_name":"Selection (genetic algorithm)","level":2,"score":0.4495641887187958},{"id":"https://openalex.org/C2775936607","wikidata":"https://www.wikidata.org/wiki/Q466845","display_name":"Tracking (education)","level":2,"score":0.4142473042011261},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.3220323324203491},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.2545374035835266},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15618231892585754},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.15219593048095703},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.13620790839195251},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.09467950463294983},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.09432342648506165},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C19417346","wikidata":"https://www.wikidata.org/wiki/Q7922","display_name":"Pedagogy","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C15744967","wikidata":"https://www.wikidata.org/wiki/Q9418","display_name":"Psychology","level":0,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2013.6651924","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2013.6651924","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE International Test Conference (ITC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":44,"referenced_works":["https://openalex.org/W1495441429","https://openalex.org/W1911029421","https://openalex.org/W1966986741","https://openalex.org/W1977476862","https://openalex.org/W1980144252","https://openalex.org/W1984089077","https://openalex.org/W1995450389","https://openalex.org/W2058002953","https://openalex.org/W2060473790","https://openalex.org/W2066698193","https://openalex.org/W2074324895","https://openalex.org/W2079706534","https://openalex.org/W2081714388","https://openalex.org/W2098764315","https://openalex.org/W2100661413","https://openalex.org/W2102729267","https://openalex.org/W2103792078","https://openalex.org/W2105619224","https://openalex.org/W2111600990","https://openalex.org/W2112414127","https://openalex.org/W2121437951","https://openalex.org/W2125240242","https://openalex.org/W2126302041","https://openalex.org/W2129960401","https://openalex.org/W2135277685","https://openalex.org/W2140316535","https://openalex.org/W2141565132","https://openalex.org/W2143821614","https://openalex.org/W2145238276","https://openalex.org/W2149866574","https://openalex.org/W2154319697","https://openalex.org/W2156770737","https://openalex.org/W2161171165","https://openalex.org/W2164321834","https://openalex.org/W2170333286","https://openalex.org/W2171474236","https://openalex.org/W3143337210","https://openalex.org/W3145424647","https://openalex.org/W3149694916","https://openalex.org/W3150336644","https://openalex.org/W6629602544","https://openalex.org/W6640006728","https://openalex.org/W6646419960","https://openalex.org/W6664625427"],"related_works":["https://openalex.org/W2378211422","https://openalex.org/W4321353415","https://openalex.org/W2745001401","https://openalex.org/W2130974462","https://openalex.org/W2028665553","https://openalex.org/W4235807419","https://openalex.org/W2144633290","https://openalex.org/W2890026549","https://openalex.org/W2827496155","https://openalex.org/W2550704533"],"abstract_inverted_index":{"Transistor":[0],"aging":[1,114],"degrades":[2],"path":[3,21,70,140,157],"delay":[4,32,66,86,96,158],"over":[5],"time":[6],"and":[7,25,50,93,120,125,131],"may":[8],"eventually":[9],"induce":[10],"circuit":[11],"failure":[12],"due":[13,42,108],"to":[14,26,28,43,63,83,106,109,134],"timing":[15],"variations.":[16],"Therefore,":[17],"in-field":[18],"tracking":[19],"of":[20,47,54,67,87,91,97,101,150],"delays":[22],"is":[23,61,115],"essential":[24],"respond":[27],"this":[29],"need,":[30],"several":[31],"sensor":[33],"designs":[34,49],"have":[35],"been":[36],"proposed":[37,152],"in":[38,57,71,123],"the":[39,44,51,65,85,95,148,151,161],"literature.":[40],"However,":[41],"significant":[45],"overhead":[46],"these":[48,136],"large":[52],"number":[53],"critical":[55,69,156],"paths":[56,92,102],"today's":[58],"IC,":[59],"it":[60],"infeasible":[62],"monitor":[64],"every":[68],"silicon.":[72],"We":[73],"present":[74],"an":[75],"aging-aware":[76],"representative":[77,139,163],"path-selection":[78],"method":[79],"that":[80,103],"allows":[81],"us":[82],"measure":[84],"a":[88,98],"small":[89],"set":[90],"infer":[94],"larger":[99],"pool":[100],"are":[104],"likely":[105],"fail":[107],"transistor":[110],"aging.":[111],"Moreover,":[112],"since":[113],"affected":[116],"by":[117],"process":[118],"variations":[119,122,137],"runtime":[121],"temperature":[124],"voltage,":[126],"we":[127],"use":[128],"machine":[129],"learning":[130],"linear":[132],"algebra":[133],"incorporate":[135],"during":[138],"selection.":[141],"Simulation":[142],"results":[143],"for":[144,154],"benchmark":[145],"circuits":[146],"highlight":[147],"accuracy":[149],"approach":[153],"predicting":[155],"based":[159],"on":[160],"selected":[162],"paths.":[164]},"counts_by_year":[{"year":2023,"cited_by_count":4},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":2},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":6},{"year":2015,"cited_by_count":9},{"year":2014,"cited_by_count":2}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}