{"id":"https://openalex.org/W2084734875","doi":"https://doi.org/10.1109/test.2013.6651923","title":"A design-for-reliability approach based on grading library cells for aging effects","display_name":"A design-for-reliability approach based on grading library cells for aging effects","publication_year":2013,"publication_date":"2013-09-01","ids":{"openalex":"https://openalex.org/W2084734875","doi":"https://doi.org/10.1109/test.2013.6651923","mag":"2084734875"},"language":"en","primary_location":{"id":"doi:10.1109/test.2013.6651923","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2013.6651923","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE International Test Conference (ITC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5109170308","display_name":"Senthil Arasu","orcid":null},"institutions":[{"id":"https://openalex.org/I162577319","display_name":"The University of Texas at Dallas","ror":"https://ror.org/049emcs32","country_code":"US","type":"education","lineage":["https://openalex.org/I162577319"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Senthil Arasu","raw_affiliation_strings":["Department of Electrical Eng, University of Texas, Dallas Richardson, TX","Dept. of Electr. Eng., Univ. of Texas at Dallas, Richardson, TX, USA#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Eng, University of Texas, Dallas Richardson, TX","institution_ids":["https://openalex.org/I162577319"]},{"raw_affiliation_string":"Dept. of Electr. Eng., Univ. of Texas at Dallas, Richardson, TX, USA#TAB#","institution_ids":["https://openalex.org/I162577319"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040401289","display_name":"Mehrdad Nourani","orcid":"https://orcid.org/0000-0001-5077-4424"},"institutions":[{"id":"https://openalex.org/I162577319","display_name":"The University of Texas at Dallas","ror":"https://ror.org/049emcs32","country_code":"US","type":"education","lineage":["https://openalex.org/I162577319"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mehrdad Nourani","raw_affiliation_strings":["Department of Electrical Eng, University of Texas, Dallas Richardson, TX","Dept. of Electr. Eng., Univ. of Texas at Dallas, Richardson, TX, USA#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Eng, University of Texas, Dallas Richardson, TX","institution_ids":["https://openalex.org/I162577319"]},{"raw_affiliation_string":"Dept. of Electr. Eng., Univ. of Texas at Dallas, Richardson, TX, USA#TAB#","institution_ids":["https://openalex.org/I162577319"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039431688","display_name":"John M. Carulli","orcid":null},"institutions":[{"id":"https://openalex.org/I160014373","display_name":"Analogic (United States)","ror":"https://ror.org/03ge13j80","country_code":"US","type":"company","lineage":["https://openalex.org/I160014373"]},{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"John M. Carulli","raw_affiliation_strings":["Analog Engineering Operations","Analog Eng. Oper., Texas Instrum. Inc., Dallas, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Analog Engineering Operations","institution_ids":["https://openalex.org/I160014373"]},{"raw_affiliation_string":"Analog Eng. Oper., Texas Instrum. Inc., Dallas, TX, USA","institution_ids":["https://openalex.org/I74760111"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110130179","display_name":"Kenneth M. Butler","orcid":null},"institutions":[{"id":"https://openalex.org/I160014373","display_name":"Analogic (United States)","ror":"https://ror.org/03ge13j80","country_code":"US","type":"company","lineage":["https://openalex.org/I160014373"]},{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kenneth M. Butler","raw_affiliation_strings":["Analog Engineering Operations","Analog Eng. Oper., Texas Instrum. Inc., Dallas, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Analog Engineering Operations","institution_ids":["https://openalex.org/I160014373"]},{"raw_affiliation_string":"Analog Eng. Oper., Texas Instrum. Inc., Dallas, TX, USA","institution_ids":["https://openalex.org/I74760111"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5050326051","display_name":"Vijay Reddy","orcid":"https://orcid.org/0000-0002-0687-672X"},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Vijay Reddy","raw_affiliation_strings":["CMOS Reliability Texas Instruments Inc., Dallas, TX","CMOS Reliability, Texas Instrum. Inc., Dallas, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"CMOS Reliability Texas Instruments Inc., Dallas, TX","institution_ids":["https://openalex.org/I74760111"]},{"raw_affiliation_string":"CMOS Reliability, Texas Instrum. Inc., Dallas, TX, USA","institution_ids":["https://openalex.org/I74760111"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.4402,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.84321958,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9944000244140625,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6951985955238342},{"id":"https://openalex.org/keywords/parametric-statistics","display_name":"Parametric statistics","score":0.6436744928359985},{"id":"https://openalex.org/keywords/grading","display_name":"Grading (engineering)","score":0.6149521470069885},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5277353525161743},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5088837146759033},{"id":"https://openalex.org/keywords/pessimism","display_name":"Pessimism","score":0.4763241708278656},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.4265543818473816},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.26067590713500977},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.17994460463523865},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.12155643105506897},{"id":"https://openalex.org/keywords/philosophy","display_name":"Philosophy","score":0.08010539412498474},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.0731530487537384},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.0710616409778595}],"concepts":[{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6951985955238342},{"id":"https://openalex.org/C117251300","wikidata":"https://www.wikidata.org/wiki/Q1849855","display_name":"Parametric statistics","level":2,"score":0.6436744928359985},{"id":"https://openalex.org/C2777286243","wikidata":"https://www.wikidata.org/wiki/Q5591926","display_name":"Grading (engineering)","level":2,"score":0.6149521470069885},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5277353525161743},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5088837146759033},{"id":"https://openalex.org/C9992130","wikidata":"https://www.wikidata.org/wiki/Q484954","display_name":"Pessimism","level":2,"score":0.4763241708278656},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.4265543818473816},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.26067590713500977},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.17994460463523865},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.12155643105506897},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.08010539412498474},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0731530487537384},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0710616409778595},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C147176958","wikidata":"https://www.wikidata.org/wiki/Q77590","display_name":"Civil engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2013.6651923","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2013.6651923","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE International Test Conference (ITC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Responsible consumption and production","id":"https://metadata.un.org/sdg/12","score":0.4699999988079071}],"awards":[],"funders":[{"id":"https://openalex.org/F4320306087","display_name":"Semiconductor Research Corporation","ror":"https://ror.org/047z4n946"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W1584309135","https://openalex.org/W1974368829","https://openalex.org/W1991837639","https://openalex.org/W2037727480","https://openalex.org/W2048309072","https://openalex.org/W2088115909","https://openalex.org/W2103792078","https://openalex.org/W2122507955","https://openalex.org/W2136500761","https://openalex.org/W2139370583","https://openalex.org/W2141565132","https://openalex.org/W2156064231","https://openalex.org/W2164178706","https://openalex.org/W2165633463","https://openalex.org/W2171670365","https://openalex.org/W2540699116","https://openalex.org/W3141915443","https://openalex.org/W4233474994","https://openalex.org/W6660023963","https://openalex.org/W6682867480"],"related_works":["https://openalex.org/W4380987628","https://openalex.org/W2418537576","https://openalex.org/W2557514562","https://openalex.org/W214945085","https://openalex.org/W1987935396","https://openalex.org/W3126025002","https://openalex.org/W2354456418","https://openalex.org/W3197683035","https://openalex.org/W1815542355","https://openalex.org/W2152540334"],"abstract_inverted_index":{"A":[0],"realistic,":[1],"as":[2],"opposed":[3],"to":[4,9,15,19,29,36],"fixed":[5],"pessimistic":[6],"end-of-life":[7],"method":[8],"identify":[10],"paths":[11],"that":[12],"are":[13],"at-risk":[14],"excessive":[16],"degradation":[17],"due":[18],"aging":[20],"is":[21],"presented.":[22],"It":[23],"uses":[24],"library":[25],"cell":[26],"grading":[27],"information":[28],"assess":[30],"the":[31],"cells/instances":[32],"for":[33],"their":[34],"sensitivity":[35],"parametric":[37],"degradation.":[38]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":3},{"year":2014,"cited_by_count":2}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}