{"id":"https://openalex.org/W2086671265","doi":"https://doi.org/10.1109/test.2013.6651921","title":"Zero-overhead self test and calibration of RF transceivers","display_name":"Zero-overhead self test and calibration of RF transceivers","publication_year":2013,"publication_date":"2013-09-01","ids":{"openalex":"https://openalex.org/W2086671265","doi":"https://doi.org/10.1109/test.2013.6651921","mag":"2086671265"},"language":"en","primary_location":{"id":"doi:10.1109/test.2013.6651921","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2013.6651921","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE International Test Conference (ITC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5062953417","display_name":"Afsaneh Nassery","orcid":null},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Afsaneh Nassery","raw_affiliation_strings":["Electrical Engineering Tempe, Arizona State University, AZ","Electr. Eng., Arizona State Univ., Tempe, AZ, USA"],"affiliations":[{"raw_affiliation_string":"Electrical Engineering Tempe, Arizona State University, AZ","institution_ids":["https://openalex.org/I55732556"]},{"raw_affiliation_string":"Electr. Eng., Arizona State Univ., Tempe, AZ, USA","institution_ids":["https://openalex.org/I55732556"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101755936","display_name":"Jae Woong Jeong","orcid":"https://orcid.org/0000-0001-6827-3193"},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jae Woong Jeong","raw_affiliation_strings":["Electrical Engineering Tempe, Arizona State University, AZ","Electr. Eng., Arizona State Univ., Tempe, AZ, USA"],"affiliations":[{"raw_affiliation_string":"Electrical Engineering Tempe, Arizona State University, AZ","institution_ids":["https://openalex.org/I55732556"]},{"raw_affiliation_string":"Electr. Eng., Arizona State Univ., Tempe, AZ, USA","institution_ids":["https://openalex.org/I55732556"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5058946013","display_name":"Sule Ozev","orcid":"https://orcid.org/0000-0002-3636-715X"},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sule Ozev","raw_affiliation_strings":["Electrical Engineering Tempe, Arizona State University, AZ","Electr. Eng., Arizona State Univ., Tempe, AZ, USA"],"affiliations":[{"raw_affiliation_string":"Electrical Engineering Tempe, Arizona State University, AZ","institution_ids":["https://openalex.org/I55732556"]},{"raw_affiliation_string":"Electr. Eng., Arizona State Univ., Tempe, AZ, USA","institution_ids":["https://openalex.org/I55732556"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5062953417"],"corresponding_institution_ids":["https://openalex.org/I55732556"],"apc_list":null,"apc_paid":null,"fwci":1.1822,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.81860402,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"9"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/transceiver","display_name":"Transceiver","score":0.7373482584953308},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6402341723442078},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.5476495027542114},{"id":"https://openalex.org/keywords/attenuator","display_name":"Attenuator (electronics)","score":0.5229343175888062},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.5151930451393127},{"id":"https://openalex.org/keywords/device-under-test","display_name":"Device under test","score":0.49017080664634705},{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.4704025387763977},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.45189714431762695},{"id":"https://openalex.org/keywords/usable","display_name":"USable","score":0.4439276456832886},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.29817816615104675},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2191120982170105},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.13085684180259705},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.11056295037269592},{"id":"https://openalex.org/keywords/wireless","display_name":"Wireless","score":0.09150135517120361},{"id":"https://openalex.org/keywords/attenuation","display_name":"Attenuation","score":0.0784544050693512}],"concepts":[{"id":"https://openalex.org/C7720470","wikidata":"https://www.wikidata.org/wiki/Q954187","display_name":"Transceiver","level":3,"score":0.7373482584953308},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6402341723442078},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.5476495027542114},{"id":"https://openalex.org/C174847166","wikidata":"https://www.wikidata.org/wiki/Q1269728","display_name":"Attenuator (electronics)","level":3,"score":0.5229343175888062},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.5151930451393127},{"id":"https://openalex.org/C76249512","wikidata":"https://www.wikidata.org/wiki/Q1206780","display_name":"Device under test","level":3,"score":0.49017080664634705},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.4704025387763977},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.45189714431762695},{"id":"https://openalex.org/C2780615836","wikidata":"https://www.wikidata.org/wiki/Q2471869","display_name":"USable","level":2,"score":0.4439276456832886},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.29817816615104675},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2191120982170105},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.13085684180259705},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.11056295037269592},{"id":"https://openalex.org/C555944384","wikidata":"https://www.wikidata.org/wiki/Q249","display_name":"Wireless","level":2,"score":0.09150135517120361},{"id":"https://openalex.org/C184652730","wikidata":"https://www.wikidata.org/wiki/Q2357982","display_name":"Attenuation","level":2,"score":0.0784544050693512},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C136764020","wikidata":"https://www.wikidata.org/wiki/Q466","display_name":"World Wide Web","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C44838205","wikidata":"https://www.wikidata.org/wiki/Q127995","display_name":"Microwave","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2013.6651921","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2013.6651921","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE International Test Conference (ITC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":33,"referenced_works":["https://openalex.org/W2013536534","https://openalex.org/W2096952729","https://openalex.org/W2098422688","https://openalex.org/W2102771100","https://openalex.org/W2103323616","https://openalex.org/W2106661578","https://openalex.org/W2113223154","https://openalex.org/W2113551176","https://openalex.org/W2117496770","https://openalex.org/W2119003682","https://openalex.org/W2122421777","https://openalex.org/W2124647791","https://openalex.org/W2126025466","https://openalex.org/W2130688260","https://openalex.org/W2135838871","https://openalex.org/W2136162940","https://openalex.org/W2138030335","https://openalex.org/W2138143426","https://openalex.org/W2141190432","https://openalex.org/W2143267788","https://openalex.org/W2145612150","https://openalex.org/W2149509899","https://openalex.org/W2154440992","https://openalex.org/W2161181093","https://openalex.org/W2161922577","https://openalex.org/W2170265514","https://openalex.org/W2171395034","https://openalex.org/W2916491290","https://openalex.org/W3148712655","https://openalex.org/W4232477441","https://openalex.org/W4239764910","https://openalex.org/W4241148352","https://openalex.org/W6678456271"],"related_works":["https://openalex.org/W1977813107","https://openalex.org/W2542834418","https://openalex.org/W2470882745","https://openalex.org/W4253204527","https://openalex.org/W2767274403","https://openalex.org/W2782649943","https://openalex.org/W4360597175","https://openalex.org/W2060961221","https://openalex.org/W1999107542","https://openalex.org/W2307848966"],"abstract_inverted_index":{"In":[0],"this":[1,134],"paper":[2],"we":[3,132],"present":[4],"a":[5,140],"self-test":[6],"method":[7],"for":[8,63],"RF":[9],"transceivers":[10],"to":[11,113],"determine":[12],"IQ":[13],"imbalance,":[14],"time":[15,48],"skews,":[16],"IIP3,":[17],"IIP5,":[18],"AM/AM,":[19],"and":[20,70,93,137],"AM/PM":[21],"distortion":[22],"with":[23],"no":[24],"hardware":[25,82],"overhead.":[26],"The":[27,45,57,109],"analysis":[28],"is":[29,41,49,117],"done":[30],"through":[31,81],"the":[32,54,74,77,85,94,121,129],"loop-back":[33,122],"set-up":[34],"over":[35],"two":[36],"frames,":[37],"each":[38],"of":[39,76],"which":[40,66,124],"200us":[42],"in":[43,120],"duration.":[44],"overall":[46],"measurement":[47],"less":[50],"than":[51,100],"10ms":[52],"including":[53],"computation":[55],"time.":[56],"determined":[58,91],"parameters":[59,88],"can":[60,89,96,125],"be":[61,90,97,126],"used":[62],"digital":[64],"calibration,":[65],"greatly":[67],"enhances":[68],"reliability":[69],"yield":[71],"by":[72],"widening":[73],"tolerance":[75],"parameters.":[78],"We":[79],"show":[80],"measurements":[83],"that":[84],"target":[86],"performance":[87],"accurately":[92],"EVM":[95],"reduced":[98],"more":[99],"5":[101],"folds,":[102],"making":[103],"even":[104],"highly":[105],"impaired":[106],"systems":[107],"usable.":[108],"only":[110],"additional":[111],"component":[112],"enable":[114],"our":[115],"approach":[116,139],"an":[118],"attenuator":[119],"path,":[123],"placed":[127],"outside":[128],"chip.":[130],"Hence,":[131],"call":[133],"self":[135],"test":[136],"calibration":[138],"zero":[141],"overhead":[142],"approach.":[143]},"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2016,"cited_by_count":3},{"year":2015,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}