{"id":"https://openalex.org/W2003676354","doi":"https://doi.org/10.1109/test.2013.6651914","title":"On the generation of compact test sets","display_name":"On the generation of compact test sets","publication_year":2013,"publication_date":"2013-09-01","ids":{"openalex":"https://openalex.org/W2003676354","doi":"https://doi.org/10.1109/test.2013.6651914","mag":"2003676354"},"language":"en","primary_location":{"id":"doi:10.1109/test.2013.6651914","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2013.6651914","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE International Test Conference (ITC)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5029407896","display_name":"Amit Kumar","orcid":"https://orcid.org/0000-0002-3965-6627"},"institutions":[{"id":"https://openalex.org/I126307644","display_name":"University of Iowa","ror":"https://ror.org/036jqmy94","country_code":"US","type":"education","lineage":["https://openalex.org/I126307644"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Amit Kumar","raw_affiliation_strings":["Dept. of ECE, Univ. of Iowa, Iowa City, USA","[Dept. of ECE, University of Iowa, Iowa City, IA, USA]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept. of ECE, Univ. of Iowa, Iowa City, USA","institution_ids":["https://openalex.org/I126307644"]},{"raw_affiliation_string":"[Dept. of ECE, University of Iowa, Iowa City, IA, USA]","institution_ids":["https://openalex.org/I126307644"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110218833","display_name":"J. Rajski","orcid":null},"institutions":[{"id":"https://openalex.org/I4210156212","display_name":"Mentor Technologies","ror":"https://ror.org/05vewsj04","country_code":"US","type":"other","lineage":["https://openalex.org/I4210156212"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Janusz Rajski","raw_affiliation_strings":["Mentor Graphics, Wilsonville, USA","Mentor Graphics, Wilsonville, OR, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Mentor Graphics, Wilsonville, USA","institution_ids":["https://openalex.org/I4210156212"]},{"raw_affiliation_string":"Mentor Graphics, Wilsonville, OR, USA","institution_ids":["https://openalex.org/I4210156212"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077101123","display_name":"S.M. Reddy","orcid":"https://orcid.org/0000-0001-9208-8262"},"institutions":[{"id":"https://openalex.org/I126307644","display_name":"University of Iowa","ror":"https://ror.org/036jqmy94","country_code":"US","type":"education","lineage":["https://openalex.org/I126307644"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sudhakar M. Reddy","raw_affiliation_strings":["Dept. of ECE, Univ. of Iowa, Iowa City, USA","[Dept. of ECE, University of Iowa, Iowa City, IA, USA]"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Dept. of ECE, Univ. of Iowa, Iowa City, USA","institution_ids":["https://openalex.org/I126307644"]},{"raw_affiliation_string":"[Dept. of ECE, University of Iowa, Iowa City, IA, USA]","institution_ids":["https://openalex.org/I126307644"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100337619","display_name":"Chen Wang","orcid":"https://orcid.org/0000-0002-8000-6685"},"institutions":[{"id":"https://openalex.org/I4210156212","display_name":"Mentor Technologies","ror":"https://ror.org/05vewsj04","country_code":"US","type":"other","lineage":["https://openalex.org/I4210156212"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Chen Wang","raw_affiliation_strings":["Mentor Graphics, Wilsonville, USA","Mentor Graphics, Wilsonville, OR, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Mentor Graphics, Wilsonville, USA","institution_ids":["https://openalex.org/I4210156212"]},{"raw_affiliation_string":"Mentor Graphics, Wilsonville, OR, USA","institution_ids":["https://openalex.org/I4210156212"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9919999837875366,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.6591801643371582},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.6134161353111267},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.5938310623168945},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5704659223556519},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.5206479430198669},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.5046087503433228},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.49187564849853516},{"id":"https://openalex.org/keywords/test-set","display_name":"Test set","score":0.45045971870422363},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.421132355928421},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2883129119873047},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.18347957730293274},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1522526741027832},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.10527804493904114},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.06438374519348145}],"concepts":[{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.6591801643371582},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.6134161353111267},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.5938310623168945},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5704659223556519},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.5206479430198669},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.5046087503433228},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.49187564849853516},{"id":"https://openalex.org/C169903167","wikidata":"https://www.wikidata.org/wiki/Q3985153","display_name":"Test set","level":2,"score":0.45045971870422363},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.421132355928421},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2883129119873047},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.18347957730293274},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1522526741027832},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.10527804493904114},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.06438374519348145},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2013.6651914","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2013.6651914","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IEEE International Test Conference (ITC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5400000214576721,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W1554885925","https://openalex.org/W1967660531","https://openalex.org/W1977294468","https://openalex.org/W1980115987","https://openalex.org/W2111994103","https://openalex.org/W2112151377","https://openalex.org/W2122983144","https://openalex.org/W2124629253","https://openalex.org/W2134998505","https://openalex.org/W2135627440","https://openalex.org/W2146594632","https://openalex.org/W2147893937","https://openalex.org/W2151526282","https://openalex.org/W2152056415","https://openalex.org/W2152168977","https://openalex.org/W2168873569","https://openalex.org/W2230837107","https://openalex.org/W2427394675","https://openalex.org/W3149075706","https://openalex.org/W4244880115"],"related_works":["https://openalex.org/W2091833418","https://openalex.org/W1991935474","https://openalex.org/W2091533492","https://openalex.org/W2129713538","https://openalex.org/W2341817401","https://openalex.org/W2408214455","https://openalex.org/W1953724919","https://openalex.org/W2128148266","https://openalex.org/W1493811107","https://openalex.org/W3038280805"],"abstract_inverted_index":{"New":[0],"methods":[1],"are":[2],"proposed":[3],"to":[4,15],"guide":[5],"line":[6],"justification":[7],"and":[8],"fault":[9],"propagation":[10],"in":[11,30],"test":[12,18,31],"generation":[13],"procedures":[14],"derive":[16],"compact":[17],"sets.":[19],"Experiments":[20],"on":[21,26],"several":[22],"industrial":[23],"designs":[24],"yielded,":[25],"average,":[27],"24%":[28],"reduction":[29],"set":[32],"sizes.":[33]},"counts_by_year":[{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}