{"id":"https://openalex.org/W2082317094","doi":"https://doi.org/10.1109/test.2012.6401563","title":"Root cause identification of an hard-to-find on-chip power supply coupling fail","display_name":"Root cause identification of an hard-to-find on-chip power supply coupling fail","publication_year":2012,"publication_date":"2012-11-01","ids":{"openalex":"https://openalex.org/W2082317094","doi":"https://doi.org/10.1109/test.2012.6401563","mag":"2082317094"},"language":"en","primary_location":{"id":"doi:10.1109/test.2012.6401563","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2012.6401563","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 IEEE International Test Conference","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5043549704","display_name":"Franco Stellari","orcid":"https://orcid.org/0000-0002-1510-6882"},"institutions":[{"id":"https://openalex.org/I4210114115","display_name":"IBM Research - Thomas J. Watson Research Center","ror":"https://ror.org/0265w5591","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]},{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Franco Stellari","raw_affiliation_strings":["IBM T.J. Watson Research Center, Yorktown Height, NY","IBM T.J. Watson Research Center, Yorktown Height, NY#TAB#"],"affiliations":[{"raw_affiliation_string":"IBM T.J. Watson Research Center, Yorktown Height, NY","institution_ids":["https://openalex.org/I4210114115"]},{"raw_affiliation_string":"IBM T.J. Watson Research Center, Yorktown Height, NY#TAB#","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063925333","display_name":"Thomas Cowell","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Thomas Cowell","raw_affiliation_strings":["IBM System and Technology Group, Hopewell Junction, NY","[IBM System and Technology Group, Hopewell Junction, NY]"],"affiliations":[{"raw_affiliation_string":"IBM System and Technology Group, Hopewell Junction, NY","institution_ids":["https://openalex.org/I1341412227"]},{"raw_affiliation_string":"[IBM System and Technology Group, Hopewell Junction, NY]","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080343787","display_name":"Peilin Song","orcid":"https://orcid.org/0000-0003-4793-3230"},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]},{"id":"https://openalex.org/I4210114115","display_name":"IBM Research - Thomas J. Watson Research Center","ror":"https://ror.org/0265w5591","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Peilin Song","raw_affiliation_strings":["IBM T.J. Watson Research Center, Yorktown Height, NY","IBM T.J. Watson Research Center, Yorktown Height, NY#TAB#"],"affiliations":[{"raw_affiliation_string":"IBM T.J. Watson Research Center, Yorktown Height, NY","institution_ids":["https://openalex.org/I4210114115"]},{"raw_affiliation_string":"IBM T.J. Watson Research Center, Yorktown Height, NY#TAB#","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032014641","display_name":"M. Sorna","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Michael Sorna","raw_affiliation_strings":["IBM System and Technology Group, Hopewell Junction, NY","[IBM System and Technology Group, Hopewell Junction, NY]"],"affiliations":[{"raw_affiliation_string":"IBM System and Technology Group, Hopewell Junction, NY","institution_ids":["https://openalex.org/I1341412227"]},{"raw_affiliation_string":"[IBM System and Technology Group, Hopewell Junction, NY]","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071609532","display_name":"Zeynep Toprak-Deniz","orcid":"https://orcid.org/0000-0003-2588-6912"},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]},{"id":"https://openalex.org/I4210114115","display_name":"IBM Research - Thomas J. Watson Research Center","ror":"https://ror.org/0265w5591","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Zeynep Toprak Deniz","raw_affiliation_strings":["IBM T.J. Watson Research Center, Yorktown Height, NY","IBM T.J. Watson Research Center, Yorktown Height, NY#TAB#"],"affiliations":[{"raw_affiliation_string":"IBM T.J. Watson Research Center, Yorktown Height, NY","institution_ids":["https://openalex.org/I4210114115"]},{"raw_affiliation_string":"IBM T.J. Watson Research Center, Yorktown Height, NY#TAB#","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063150723","display_name":"John F. Bulzacchelli","orcid":"https://orcid.org/0000-0002-8803-9553"},"institutions":[{"id":"https://openalex.org/I4210114115","display_name":"IBM Research - Thomas J. Watson Research Center","ror":"https://ror.org/0265w5591","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"]},{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"John F. Bulzacchelli","raw_affiliation_strings":["IBM T.J. Watson Research Center, Yorktown Height, NY","IBM T.J. Watson Research Center, Yorktown Height, NY#TAB#"],"affiliations":[{"raw_affiliation_string":"IBM T.J. Watson Research Center, Yorktown Height, NY","institution_ids":["https://openalex.org/I4210114115"]},{"raw_affiliation_string":"IBM T.J. Watson Research Center, Yorktown Height, NY#TAB#","institution_ids":["https://openalex.org/I1341412227"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5006990877","display_name":"Nandita Mitra","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Nandita A. Mitra","raw_affiliation_strings":["IBM System and Technology Group, Hopewell Junction, NY","[IBM System and Technology Group, Hopewell Junction, NY]"],"affiliations":[{"raw_affiliation_string":"IBM System and Technology Group, Hopewell Junction, NY","institution_ids":["https://openalex.org/I1341412227"]},{"raw_affiliation_string":"[IBM System and Technology Group, Hopewell Junction, NY]","institution_ids":["https://openalex.org/I1341412227"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5043549704"],"corresponding_institution_ids":["https://openalex.org/I1341412227","https://openalex.org/I4210114115"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.13645157,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"7"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9965000152587891,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/iddq-testing","display_name":"Iddq testing","score":0.9123445749282837},{"id":"https://openalex.org/keywords/root-cause","display_name":"Root cause","score":0.8734258413314819},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.7143192887306213},{"id":"https://openalex.org/keywords/root-cause-analysis","display_name":"Root cause analysis","score":0.6469262838363647},{"id":"https://openalex.org/keywords/identification","display_name":"Identification (biology)","score":0.5289849042892456},{"id":"https://openalex.org/keywords/ibm","display_name":"IBM","score":0.4935799837112427},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4757142663002014},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4736253619194031},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.46301528811454773},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4379183351993561},{"id":"https://openalex.org/keywords/path","display_name":"Path (computing)","score":0.42113491892814636},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3306349515914917},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.29538553953170776},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.23074230551719666},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.12678799033164978},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.12104609608650208},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.09037035703659058}],"concepts":[{"id":"https://openalex.org/C206678392","wikidata":"https://www.wikidata.org/wiki/Q5987815","display_name":"Iddq testing","level":3,"score":0.9123445749282837},{"id":"https://openalex.org/C84945661","wikidata":"https://www.wikidata.org/wiki/Q7366567","display_name":"Root cause","level":2,"score":0.8734258413314819},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.7143192887306213},{"id":"https://openalex.org/C130963320","wikidata":"https://www.wikidata.org/wiki/Q1401207","display_name":"Root cause analysis","level":2,"score":0.6469262838363647},{"id":"https://openalex.org/C116834253","wikidata":"https://www.wikidata.org/wiki/Q2039217","display_name":"Identification (biology)","level":2,"score":0.5289849042892456},{"id":"https://openalex.org/C70388272","wikidata":"https://www.wikidata.org/wiki/Q5968558","display_name":"IBM","level":2,"score":0.4935799837112427},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4757142663002014},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4736253619194031},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.46301528811454773},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4379183351993561},{"id":"https://openalex.org/C2777735758","wikidata":"https://www.wikidata.org/wiki/Q817765","display_name":"Path (computing)","level":2,"score":0.42113491892814636},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3306349515914917},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.29538553953170776},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.23074230551719666},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.12678799033164978},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.12104609608650208},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.09037035703659058},{"id":"https://openalex.org/C59822182","wikidata":"https://www.wikidata.org/wiki/Q441","display_name":"Botany","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/test.2012.6401563","is_oa":false,"landing_page_url":"https://doi.org/10.1109/test.2012.6401563","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 IEEE International Test Conference","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1515972437","https://openalex.org/W1967227789","https://openalex.org/W2023322592","https://openalex.org/W2033582260","https://openalex.org/W2045664507","https://openalex.org/W2112074693","https://openalex.org/W2138476745","https://openalex.org/W2138717158","https://openalex.org/W2167258210","https://openalex.org/W2532999790","https://openalex.org/W3113418477","https://openalex.org/W6630645674"],"related_works":["https://openalex.org/W2030594396","https://openalex.org/W2754538212","https://openalex.org/W3045668461","https://openalex.org/W2490884653","https://openalex.org/W4200610016","https://openalex.org/W4255366506","https://openalex.org/W2183996497","https://openalex.org/W2056250485","https://openalex.org/W129587375","https://openalex.org/W2110363179"],"abstract_inverted_index":{"In":[0,31,67],"this":[1,122,128],"paper,":[2],"we":[3,33,69],"will":[4,34,70],"present":[5],"a":[6,11,22,59,106,137],"diagnostic":[7],"test":[8,114],"case":[9],"of":[10,21,45,64,76],"hard-to-find":[12],"fail":[13,37],"condition":[14,38],"causing":[15],"an":[16,117],"unexpected":[17],"partial":[18],"power":[19],"on":[20],"chip":[23,87],"fabricated":[24],"in":[25,90],"IBM":[26],"65":[27],"nm":[28],"bulk":[29],"technology.":[30],"particular,":[32],"describe":[35],"the":[36,42,65,77,86,92,96],"as":[39,41],"well":[40],"combined":[43],"use":[44],"electrical":[46],"testing,":[47],"optical":[48],"methodologies,":[49],"and":[50,131],"detailed":[51],"circuit":[52],"analysis":[53],"that":[54,115],"were":[55],"used":[56,108],"to":[57,95,105,127,134],"reach":[58],"successful":[60],"root":[61,98],"cause":[62],"identification":[63],"problem.":[66],"addition,":[68],"show":[71],"how":[72],"high":[73],"resolution":[74],"mapping":[75],"Light":[78],"Emission":[79],"from":[80,85],"Off-State":[81],"Leakage":[82],"Current":[83],"(LEOSLC)":[84],"was":[88,102,125,132],"instrumental":[89],"leading":[91],"investigative":[93],"effort":[94],"right":[97],"cause.":[99],"The":[100],"problem":[101],"successfully":[103],"traced":[104],"p-FET":[107],"for":[109],"IDDQ":[110],"measurement":[111],"during":[112],"manufacturing":[113],"caused":[116],"undesirable":[118],"coupling":[119],"path.":[120],"Fortunately":[121],"specific":[123],"configuration":[124],"unique":[126],"particular":[129],"design":[130],"easy":[133],"fix":[135],"with":[136],"single":[138],"mask":[139],"change.":[140]},"counts_by_year":[{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}